Cathode-ray oscilloscopes; Oscilloscopes using other screens than CRT's

Industry

CPC
G01R13/20

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

Current Industry

G01R13/20Cathode-ray oscilloscopes; Oscilloscopes using other screens than CRT's

Industries

Patents Grantslast 30 patents

Information Patent Grant
Test probe adapter
- Patent number 12,092,657
- Issue date Sep 17, 2024
- Raytheon Company
- Susanne L. Stuart
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for recording context information of...
- Patent number 11,543,435
- Issue date Jan 3, 2023
- Rohde & Schwarz GmbH & Co. KG
- Tobias Frede
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Modular probe for automated test applications
- Patent number 11,408,916
- Issue date Aug 9, 2022
- National Instruments Corporation
- Mark Whittington
- G01 - MEASURING TESTING
Information Patent Grant
Electrical measurement device
- Patent number 11,307,061
- Issue date Apr 19, 2022
- Rohde & Schwarz GmbH & Co. KG
- Andrew Schaefer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring device for measuring signals and data handling method
- Patent number 11,163,455
- Issue date Nov 2, 2021
- Rohde & Schwarz GmbH & Co. KG
- Mario Guenther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-domain measurement system as well as use of a multi-domain me...
- Patent number 10,962,575
- Issue date Mar 30, 2021
- Rohde & Schwarz GmbH & Co. KG
- Michael Grimm
- G01 - MEASURING TESTING
Information Patent Grant
Surface-mountable apparatus for coupling a test and measurement ins...
- Patent number 10,845,384
- Issue date Nov 24, 2020
- Tektronix Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Variable resolution oscilloscope
- Patent number 10,725,070
- Issue date Jul 28, 2020
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
Analog transitional storage
- Patent number 10,670,632
- Issue date Jun 2, 2020
- Tektronix, Inc.
- David A. Holaday
- G01 - MEASURING TESTING
Information Patent Grant
Test tool for power distribution networks
- Patent number 10,564,191
- Issue date Feb 18, 2020
- Oracle International Corporation
- Istvan Novak
- G01 - MEASURING TESTING
Information Patent Grant
Inductor current measurement probe
- Patent number 10,551,417
- Issue date Feb 4, 2020
- Oracle International Corporation
- Istvan Novak
- G01 - MEASURING TESTING
Information Patent Grant
Variable resolution oscilloscope
- Patent number 10,534,019
- Issue date Jan 14, 2020
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope with internally generated mixed signal oscilloscope de...
- Patent number 10,197,600
- Issue date Feb 5, 2019
- Keysight Technologies, Inc.
- Matthew S. Holcomb
- G01 - MEASURING TESTING
Information Patent Grant
Universal power distribution test tool and methodology
- Patent number 10,126,374
- Issue date Nov 13, 2018
- Oracle International Corporation
- Istvan Novak
- G01 - MEASURING TESTING
Information Patent Grant
Test lead assembly and measurement device
- Patent number 10,054,614
- Issue date Aug 21, 2018
- Fluke Corporation
- Hua Qiu
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating displays of waveforms
- Patent number 9,541,579
- Issue date Jan 10, 2017
- Tektronix, Inc.
- Peter J. Letts
- G01 - MEASURING TESTING
Information Patent Grant
Structure and method of data synchronization for Multi measuring ap...
- Patent number 8,825,449
- Issue date Sep 2, 2014
- Zeroplus Technology Co., Ltd.
- Chiu-Hao Cheng
- G05 - CONTROLLING REGULATING
Information Patent Grant
Oscilloscope probe
- Patent number 8,791,689
- Issue date Jul 29, 2014
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Simple integrated control for zoom/pan functions
- Patent number 7,847,792
- Issue date Dec 7, 2010
- Tektronix, Inc.
- Scott R. Ketterer
- G01 - MEASURING TESTING
Information Patent Grant
Report generating method and apparatus
- Patent number 7,663,624
- Issue date Feb 16, 2010
- LeCroy Corporation
- Anthony Cake
- G01 - MEASURING TESTING
Information Patent Grant
Three dimensional correlated data display
- Patent number 7,236,900
- Issue date Jun 26, 2007
- Tektronix, Inc.
- Michael S. Hagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for operating a measurement and testing instrument
- Patent number 7,010,442
- Issue date Mar 7, 2006
- Agilent Technologies, Inc.
- Michael R. Fender
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for application control in measurement devices
- Patent number 7,005,846
- Issue date Feb 28, 2006
- Agilent Technologies, Inc.
- Michael R. Fender
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for adjusting waveform display position in waveform display
- Patent number 6,987,381
- Issue date Jan 17, 2006
- Leader Electronics Corporation
- Koji Yano
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus and computer program product for implementing enh...
- Patent number 6,917,900
- Issue date Jul 12, 2005
- International Business Machines Corporation
- Steven Paul Jones
- G01 - MEASURING TESTING
Information Patent Grant
Display method of parameter correction conditions and recording med...
- Patent number 6,909,982
- Issue date Jun 21, 2005
- Agilent Technologies, Inc.
- Takashi Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Electronic measurement apparatus having a function to a display a f...
- Patent number 6,907,366
- Issue date Jun 14, 2005
- Anritsu Corporation
- Katsuhisa Iiyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Fast eye diagram analyzer uses nearest neighbor transverse to quick...
- Patent number 6,804,633
- Issue date Oct 12, 2004
- Agilent Technologies, Inc.
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Touch controlled zoom and pan of graphic displays
- Patent number 6,774,890
- Issue date Aug 10, 2004
- Tektronix, Inc.
- Kathryn A. Engholm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for pulse template matching
- Patent number 6,748,336
- Issue date Jun 8, 2004
- Intel Corporation
- Xuye Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test Probe Adapter
- Publication number 20210263073
- Publication date Aug 26, 2021
- Raytheon Company
- Susanne L. Stuart
- G01 - MEASURING TESTING
Information Patent Application
Modular Probe for Automated Test Applications
- Publication number 20200284822
- Publication date Sep 10, 2020
- National Instruments Corporation
- Mark Whittington
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR RECORDING CONTEXT INFORMATION OF...
- Publication number 20200241048
- Publication date Jul 30, 2020
- Rohde& Schwarz GmbH & Co. KG
- Tobias Frede
- G01 - MEASURING TESTING
Information Patent Application
Variable Resolution Oscilloscope
- Publication number 20200088766
- Publication date Mar 19, 2020
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Application
SURFACE-MOUNTABLE APPARATUS FOR COUPLING A TEST AND MEASUREMENT INS...
- Publication number 20190353682
- Publication date Nov 21, 2019
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL MEASUREMENT DEVICE
- Publication number 20190277670
- Publication date Sep 12, 2019
- ROHDE & SCHWARZ GMBH & CO. KG
- Andrew Schaefer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OSILLOSCOPE PERSISTENCE FOR DIGITAL BUS SIGNALS
- Publication number 20180180647
- Publication date Jun 28, 2018
- Tektronix, Inc.
- Kevin C. Spisak
- G01 - MEASURING TESTING
Information Patent Application
INDUCTOR CURRENT MEASUREMENT PROBE
- Publication number 20180143264
- Publication date May 24, 2018
- ORACLE INTERNATIONAL CORPORATION
- Istvan Novak
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR MEASURING SIGNALS AND DATA HANDLING METHOD
- Publication number 20180121113
- Publication date May 3, 2018
- Rohde& Schwarz GmbH & Co. KG
- Mario Guenther
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE RESOLUTION OSCILLOSCOPE
- Publication number 20180059143
- Publication date Mar 1, 2018
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL POWER DISTRIBUTION TEST TOOL AND METHODOLOGY
- Publication number 20180024204
- Publication date Jan 25, 2018
- ORACLE INTERNATIONAL CORPORATION
- Istvan Novak
- G01 - MEASURING TESTING
Information Patent Application
TEST LEAD ASSEMBLY AND MEASUREMENT DEVICE
- Publication number 20170059614
- Publication date Mar 2, 2017
- FLUKE CORPORATION
- Hua Qiu
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING DISPLAYS OF WAVEFORMS
- Publication number 20140088900
- Publication date Mar 27, 2014
- Tektronix, Inc.
- Peter J. Letts
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHOD OF DATA SYNCHRONIZATION FOR MUTI MEASURING APP...
- Publication number 20120191418
- Publication date Jul 26, 2012
- Zeroplus Technology Co., Ltd.
- CHIU-HAO CHENG
- G05 - CONTROLLING REGULATING
Information Patent Application
OSCILLOSCOPE PROBE
- Publication number 20100176795
- Publication date Jul 15, 2010
- ROHDE &SCHWARZ GMBH & CO. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Application
Simple integrated control for zoom/pan functions
- Publication number 20070035658
- Publication date Feb 15, 2007
- Scott R. Ketterer
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for operating a measurement and testing instrument
- Publication number 20060136156
- Publication date Jun 22, 2006
- Michael R. Fender
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for application control in measurement devices
- Publication number 20060123350
- Publication date Jun 8, 2006
- Michael R. Fender
- G01 - MEASURING TESTING
Information Patent Application
Report generating method and apparatus
- Publication number 20060001666
- Publication date Jan 5, 2006
- LeCroy Corporation
- Anthony Cake
- G01 - MEASURING TESTING
Information Patent Application
Three-dimensional correlated data display
- Publication number 20050234670
- Publication date Oct 20, 2005
- Michael S. Hagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method, apparatus and computer program product for implementing enh...
- Publication number 20050060110
- Publication date Mar 17, 2005
- International Business Machines Corporation
- Steven Paul Jones
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for operating a measurement and testing instrument
- Publication number 20050033536
- Publication date Feb 10, 2005
- Michael R. Fender
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Remotely controllable oscilloscope
- Publication number 20040239309
- Publication date Dec 2, 2004
- Andrew Harvey Barr
- G01 - MEASURING TESTING
Information Patent Application
Fast eye diagram analyzer uses nearest neighbor traverse to quickly...
- Publication number 20040153266
- Publication date Aug 5, 2004
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
System and method for application control in measurement devices
- Publication number 20040012382
- Publication date Jan 22, 2004
- Michael R. Fender
- G01 - MEASURING TESTING
Information Patent Application
Electronic measurement apparatus having a function to a display a f...
- Publication number 20030191591
- Publication date Oct 9, 2003
- Katsuhisa Iiyoshi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for adjusting waveform display position in waveform display
- Publication number 20030174134
- Publication date Sep 18, 2003
- Koji Yano
- G01 - MEASURING TESTING
Information Patent Application
Display method of parameter correction conditions and recording med...
- Publication number 20030076115
- Publication date Apr 24, 2003
- AGILENT TECHNOLOGIES, INC.
- Takashi Yamasaki
- G01 - MEASURING TESTING
Information Patent Application
Touch controlled zoom and pan of graphic displays
- Publication number 20020126099
- Publication date Sep 12, 2002
- Kathryn A. Engholm
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for pulse template matching
- Publication number 20020085760
- Publication date Jul 4, 2002
- Xuye Li
- G01 - MEASURING TESTING

Cathode-ray oscilloscopes; Oscilloscopes using other screens than CRT's

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test probe adapter

Measurement system and method for recording context information of...

Modular probe for automated test applications

Electrical measurement device

Measuring device for measuring signals and data handling method

Multi-domain measurement system as well as use of a multi-domain me...

Surface-mountable apparatus for coupling a test and measurement ins...

Variable resolution oscilloscope

Analog transitional storage

Test tool for power distribution networks

Inductor current measurement probe

Variable resolution oscilloscope

Oscilloscope with internally generated mixed signal oscilloscope de...

Universal power distribution test tool and methodology

Test lead assembly and measurement device

Methods and systems for generating displays of waveforms

Structure and method of data synchronization for Multi measuring ap...

Oscilloscope probe

Simple integrated control for zoom/pan functions

Report generating method and apparatus

Three dimensional correlated data display

Systems and methods for operating a measurement and testing instrument

System and method for application control in measurement devices

Apparatus for adjusting waveform display position in waveform display

Method, apparatus and computer program product for implementing enh...

Display method of parameter correction conditions and recording med...

Electronic measurement apparatus having a function to a display a f...

Fast eye diagram analyzer uses nearest neighbor transverse to quick...

Touch controlled zoom and pan of graphic displays

Method and apparatus for pulse template matching

Patents Applicationslast 30 patents

Test Probe Adapter

Modular Probe for Automated Test Applications

MEASUREMENT SYSTEM AND METHOD FOR RECORDING CONTEXT INFORMATION OF...

Variable Resolution Oscilloscope

SURFACE-MOUNTABLE APPARATUS FOR COUPLING A TEST AND MEASUREMENT INS...

ELECTRICAL MEASUREMENT DEVICE

OSILLOSCOPE PERSISTENCE FOR DIGITAL BUS SIGNALS

INDUCTOR CURRENT MEASUREMENT PROBE

MEASURING DEVICE FOR MEASURING SIGNALS AND DATA HANDLING METHOD

VARIABLE RESOLUTION OSCILLOSCOPE

UNIVERSAL POWER DISTRIBUTION TEST TOOL AND METHODOLOGY

TEST LEAD ASSEMBLY AND MEASUREMENT DEVICE

METHODS AND SYSTEMS FOR GENERATING DISPLAYS OF WAVEFORMS

STRUCTURE AND METHOD OF DATA SYNCHRONIZATION FOR MUTI MEASURING APP...

OSCILLOSCOPE PROBE

Simple integrated control for zoom/pan functions

Systems and methods for operating a measurement and testing instrument

System and method for application control in measurement devices

Report generating method and apparatus

Three-dimensional correlated data display

Method, apparatus and computer program product for implementing enh...

Systems and methods for operating a measurement and testing instrument

Remotely controllable oscilloscope

Fast eye diagram analyzer uses nearest neighbor traverse to quickly...

System and method for application control in measurement devices

Electronic measurement apparatus having a function to a display a f...

Apparatus for adjusting waveform display position in waveform display

Display method of parameter correction conditions and recording med...

Touch controlled zoom and pan of graphic displays

Method and apparatus for pulse template matching