characterised by their application

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CPC
H01J2237/2505

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2505characterised by their application

Industries

Patents Grantslast 30 patents

Information Patent Grant
Virtual wireless multitrack recording system
- Patent number 9,336,307
- Issue date May 10, 2016
- Zaxcom, Inc.
- Glenn Norman Sanders
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Electron beam interference device and electron beam interferometry
- Patent number 8,946,628
- Issue date Feb 3, 2015
- Hitachi, Ltd.
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for investigating a characteristic of a materia...
- Patent number 8,835,842
- Issue date Sep 16, 2014
- EDAX
- Stuart I. Wright
- G01 - MEASURING TESTING
Information Patent Grant
Virtual wireless multitrack recording system
- Patent number 8,385,814
- Issue date Feb 26, 2013
- Zaxcom, Inc.
- Glenn Norman Sanders
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Virtual wireless multitrack recording system
- Patent number 7,929,902
- Issue date Apr 19, 2011
- Zaxcom, Inc.
- Glenn Norman Sanders
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Systems and methods for a gas field ion microscope
- Patent number 7,601,953
- Issue date Oct 13, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM
- Publication number 20240339287
- Publication date Oct 10, 2024
- Applied Materials, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM
- Publication number 20240339288
- Publication date Oct 10, 2024
- Applied Materials, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Interference Device and Electron Beam Interferometry
- Publication number 20140332684
- Publication date Nov 13, 2014
- Hitachi, Ltd
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Application
VIRTUAL WIRELESS MULTITRACK RECORDING SYSTEM
- Publication number 20140067102
- Publication date Mar 6, 2014
- ZAXCOM, INC.
- Glenn Norman Sanders
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Systems and Methods for Investigating a Characteristic of a Materia...
- Publication number 20130193321
- Publication date Aug 1, 2013
- EDAX Inc.
- Stuart I. Wright
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR IMPROVING THE BIOACTIVITY CHARACTERISTICS OF A SURFACE...
- Publication number 20100227523
- Publication date Sep 9, 2010
- Exogenesis Corporation
- Joseph Khoury
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Virtual Wireless Multitrack Recording System
- Publication number 20100217414
- Publication date Aug 26, 2010
- Zaxcom, Inc.
- Glenn Norman Sanders
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Substrate-examining apparatus
- Publication number 20090278045
- Publication date Nov 12, 2009
- Kusuo Ueno
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for a gas field ion microscope
- Publication number 20070215802
- Publication date Sep 20, 2007
- Alis Technology Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer-level testing of light-emitting resonant structures
- Publication number 20070200063
- Publication date Aug 30, 2007
- Virgin Islands Microsystems, Inc.
- Jonathan Gorrell
- G01 - MEASURING TESTING
Information Patent Application
Substrate-examining apparatus
- Publication number 20070085004
- Publication date Apr 19, 2007
- Kusuo Ueno
- G01 - MEASURING TESTING

characterised by their application

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Virtual wireless multitrack recording system

Electron beam interference device and electron beam interferometry

Systems and methods for investigating a characteristic of a materia...

Virtual wireless multitrack recording system

Virtual wireless multitrack recording system

Systems and methods for a gas field ion microscope

Patents Applicationslast 30 patents

APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM

HYBRID APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM

Electron Beam Interference Device and Electron Beam Interferometry

VIRTUAL WIRELESS MULTITRACK RECORDING SYSTEM

Systems and Methods for Investigating a Characteristic of a Materia...

METHODS FOR IMPROVING THE BIOACTIVITY CHARACTERISTICS OF A SURFACE...

Virtual Wireless Multitrack Recording System

Substrate-examining apparatus

Systems and methods for a gas field ion microscope

Wafer-level testing of light-emitting resonant structures

Substrate-examining apparatus