chopper

Industry

CPC
G01N2223/314

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/314chopper

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Enclosed x-ray chopper wheel
- Patent number 11,940,395
- Issue date Mar 26, 2024
- Videray Technologies, LLC
- Paul Bradshaw
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer and X-ray fluorescence analysis method
- Patent number 11,391,680
- Issue date Jul 19, 2022
- Shimadzu Corporation
- Yuta Saito
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzing system for x-ray scattering analysis
- Patent number 9,958,404
- Issue date May 1, 2018
- Bruker AXS GmbH
- Jan Skov Pedersen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Masks that selectively attentuate radiation for inspection of print...
- Patent number 9,869,643
- Issue date Jan 16, 2018
- Cisco Technology, Inc.
- ShiJie Wen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging apparatus and method of controlling the same
- Patent number 9,743,901
- Issue date Aug 29, 2017
- Samsung Electronics Co., Ltd.
- Jae Mock Yi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical axis adjustment device for X-ray analyzer
- Patent number 9,562,867
- Issue date Feb 7, 2017
- Rigaku Corporation
- Kouji Kakefuda
- G01 - MEASURING TESTING
Information Patent Grant
Scanning illuminating device, imaging device comprising same and me...
- Patent number 9,557,284
- Issue date Jan 31, 2017
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Rene Vogler
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Imaging system for imaging fast-moving objects
- Patent number 9,046,760
- Issue date Jun 2, 2015
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Pierre Bleuet
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for inspecting objects using coded beam
- Patent number 7,623,614
- Issue date Nov 24, 2009
- Thermo NITON Analyzers LLC
- Stephen I. Shefsky
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ENCLOSED X-RAY CHOPPER WHEEL
- Publication number 20240230560
- Publication date Jul 11, 2024
- VIDERAY TECHNOLOGIES, INC.
- PAUL Bradshaw
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTION PORTALS
- Publication number 20230251209
- Publication date Aug 10, 2023
- SMITHS DETECTION INC.
- Joseph BENDAHAN
- G01 - MEASURING TESTING
Information Patent Application
ENCLOSED X-RAY CHOPPER WHEEL
- Publication number 20220283103
- Publication date Sep 8, 2022
- VIDERAY TECHNOLOGIES, INC.
- PAUL Bradshaw
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Radiation Scanning System with Variable Field of View
- Publication number 20190346382
- Publication date Nov 14, 2019
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
ION GROUP IRRADIATION DEVICE AND SECONDARY ION MASS SPECTROMETER
- Publication number 20140374587
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
X-ray analyzing system for x-ray scattering analysis
- Publication number 20140270079
- Publication date Sep 18, 2014
- Jan Skov Pedersen
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM FOR IMAGING FAST-MOVING OBJECTS
- Publication number 20130028380
- Publication date Jan 31, 2013
- COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE. ALT.
- Pierre Bleuet
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INSPECTING OBJECTS USING CODED BEAM
- Publication number 20080095298
- Publication date Apr 24, 2008
- STEPHEN I. SHEFSKY
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Enclosed x-ray chopper wheel

Apparatuses and methods for combined simultaneous analyses of mater...

X-ray fluorescence analyzer and X-ray fluorescence analysis method

X-ray analyzing system for x-ray scattering analysis

Masks that selectively attentuate radiation for inspection of print...

X-ray imaging apparatus and method of controlling the same

Optical axis adjustment device for X-ray analyzer

Scanning illuminating device, imaging device comprising same and me...

Imaging system for imaging fast-moving objects

Apparatus for inspecting objects using coded beam

Patents Applicationslast 30 patents

ENCLOSED X-RAY CHOPPER WHEEL

SYSTEMS AND METHODS FOR INSPECTION PORTALS

ENCLOSED X-RAY CHOPPER WHEEL

Radiation Scanning System with Variable Field of View

ION GROUP IRRADIATION DEVICE AND SECONDARY ION MASS SPECTROMETER

X-ray analyzing system for x-ray scattering analysis

IMAGING SYSTEM FOR IMAGING FAST-MOVING OBJECTS

APPARATUS FOR INSPECTING OBJECTS USING CODED BEAM