TREA

Circuitry therefor

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  • CPC
  • G01R11/42
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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R11/00Electromechanical arrangements for measuring time integral of electric power i.e. electric energy or current

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G01R11/42Circuitry therefor
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Patents Grantslast 30 patents

  • Information Patent Grant

    Congruent power and timing signals for device
    • Patent number 9,853,560
    • Issue date Dec 26, 2017
    • STMicroelectronics (Shenzhen) R&D Co., Ltd.
    • Henry Ge
    • H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
  • Information Patent Grant

    Congruent power and timing signals for device
    • Patent number 9,099,915
    • Issue date Aug 4, 2015
    • STMicroelectronics (Shenzhen) R&D Co. Ltd.
    • Henry Ge
    • H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
  • Information Patent Grant

    Measuring circuit arrangement for electricity meters for direct con...
    • Patent number 7,005,844
    • Issue date Feb 28, 2006
    • Landis & Gyr AG
    • Jacob De Vries
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3925728
    • Patent number 3,925,728
    • Issue date Dec 9, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3458810
    • Patent number 3,458,810
    • Issue date Jul 29, 1969
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3457506
    • Patent number 3,457,506
    • Issue date Jul 22, 1969
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3155903
    • Patent number 3,155,903
    • Issue date Nov 3, 1964
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2998569
    • Patent number 2,998,569
    • Issue date Aug 29, 1961
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2614139
    • Patent number 2,614,139
    • Issue date Oct 14, 1952
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2513891
    • Patent number 2,513,891
    • Issue date Jul 4, 1950
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2228655
    • Patent number 2,228,655
    • Issue date Jan 14, 1941
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2218668
    • Patent number 2,218,668
    • Issue date Oct 22, 1940
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1915581
    • Patent number 1,915,581
    • Issue date Jun 27, 1933
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1808334
    • Patent number 1,808,334
    • Issue date Jun 2, 1931
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1688858
    • Patent number 1,688,858
    • Issue date Oct 23, 1928
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1673919
    • Patent number 1,673,919
    • Issue date Jun 19, 1928
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1647332
    • Patent number 1,647,332
    • Issue date Nov 1, 1927
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1615731
    • Patent number 1,615,731
    • Issue date Jan 25, 1927
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1578501
    • Patent number 1,578,501
    • Issue date Mar 30, 1926
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1342081
    • Patent number 1,342,081
    • Issue date Jun 1, 1920
    • G01 - MEASURING TESTING
  • Information Patent Grant

    1342082
    • Patent number 1,342,082
    • Issue date Jun 1, 1920
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents