Circuits for altering the indicating characteristic

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G01R15/005

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00 and G01R33/00 - G01R35/00

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G01R15/005Circuits for altering the indicating characteristic

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Patents Grantslast 30 patents

Information Patent Grant
Circuit board comprising a rectifier bridge
- Patent number 12,021,458
- Issue date Jun 25, 2024
- Sagemcom Energy & Telecom SAS
- Fabien De La Cruz
- G01 - MEASURING TESTING
Information Patent Grant
Power detector
- Patent number 11,789,049
- Issue date Oct 17, 2023
- Richwave Technology Corp.
- Shun-Nan Tai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Voltage sensing circuit
- Patent number 11,733,274
- Issue date Aug 22, 2023
- Micron Technology, Inc.
- Leon Zlotnik
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for detecting current flowing to load, using shunt resistor
- Patent number 11,415,603
- Issue date Aug 16, 2022
- Canon Kabushiki Kaisha
- Yutaro Minami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Resistance measuring device and method
- Patent number 11,372,026
- Issue date Jun 28, 2022
- Ulsan National Institute of Science and Technology
- Jae Joon Kim
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detection circuit, semiconductor device, and semiconductor...
- Patent number 11,255,880
- Issue date Feb 22, 2022
- ABLIC INC.
- Yusuke Kanazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Readout circuit for resistive and capacitive sensors
- Patent number 11,099,213
- Issue date Aug 24, 2021
- Infineon Technologies AG
- Richard Gaggl
- G01 - MEASURING TESTING
Information Patent Grant
System and method for current sense resistor compensation
- Patent number 10,768,211
- Issue date Sep 8, 2020
- Oracle International Corporation
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
Linearization circuit and method for linearizing a measurement signal
- Patent number 10,700,698
- Issue date Jun 30, 2020
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Harald Haas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit assembly having a transformer with centre tapping and measu...
- Patent number 10,379,142
- Issue date Aug 13, 2019
- Fronius International GmbH
- Christian Magerl
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and associated methods for monitoring noise level of a si...
- Patent number 10,228,397
- Issue date Mar 12, 2019
- Keysight Technologies, Inc.
- Takashi Kitagaki
- G01 - MEASURING TESTING
Information Patent Grant
Optical current transducer with offset cancellation and current lin...
- Patent number 10,197,603
- Issue date Feb 5, 2019
- General Electric Company
- Daniel Robert Wallace
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring current and method of making same
- Patent number 9,063,178
- Issue date Jun 23, 2015
- Eaton Corporation
- James H. Woelfel
- G01 - MEASURING TESTING
Information Patent Grant
Appending pseudo-random sub-LSB values to prevent intensity banding
- Patent number 9,002,004
- Issue date Apr 7, 2015
- Tektronix, Inc.
- David Eby
- G01 - MEASURING TESTING
Information Patent Grant
Measuring electrical impedance at various frequencies
- Patent number 8,102,183
- Issue date Jan 24, 2012
- Orrcam Limited
- Timothy Orr
- G01 - MEASURING TESTING
Information Patent Grant
Battery current measurement with real time pre-gain adjust and prog...
- Patent number 7,521,934
- Issue date Apr 21, 2009
- Yazaki North America, Inc.
- James Leroy Jones, III
- G01 - MEASURING TESTING
Information Patent Grant
Multimeter with filtered measurement mode
- Patent number 7,342,393
- Issue date Mar 11, 2008
- Fluke Corporation
- Charles B. Newcombe
- G01 - MEASURING TESTING
Information Patent Grant
Multimeter with filtered measurement mode
- Patent number 7,034,517
- Issue date Apr 25, 2006
- Fluke Corporation
- Charles B. Newcombe
- G01 - MEASURING TESTING
Information Patent Grant
Signal analyzer having independent analysis and display scales
- Patent number 6,370,484
- Issue date Apr 9, 2002
- Agilent Technologies, Inc.
- Joseph M Gorin
- G01 - MEASURING TESTING
Information Patent Grant
High voltage transformer for the continuous monitoring of high volt...
- Patent number 5,461,315
- Issue date Oct 24, 1995
- Jenbacher Energiesystem Aktiengesellschaft
- Markus Kraus
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
System for linearizing a non-linear sensor output
- Patent number 5,274,577
- Issue date Dec 28, 1993
- Newport Electronics, Inc.
- Karl Hinrichs
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for the processing of a signal coming from a sensor with a d...
- Patent number 5,245,278
- Issue date Sep 14, 1993
- Thomson-CSF
- Gregoire Eumurian
- G01 - MEASURING TESTING
Information Patent Grant
Meter and meter driving system with indication fluctuation suppress...
- Patent number 5,218,291
- Issue date Jun 8, 1993
- Rohm Co., Ltd.
- Hiroshi Murase
- G01 - MEASURING TESTING
Information Patent Grant
Automatic scaling for display of modulation domain measurements
- Patent number 5,138,252
- Issue date Aug 11, 1992
- Hewlett-Packard Company
- Keith M. Ferguson
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit for producing an input variable for a cross-coil...
- Patent number 5,097,203
- Issue date Mar 17, 1992
- VDO Adolf Schindling AG
- Bernd Haussmann
- G01 - MEASURING TESTING
Information Patent Grant
Automatic scaling for display of modulation domain measurements
- Patent number 5,072,168
- Issue date Dec 10, 1991
- Hewlett-Packard Company
- Keith M. Ferguson
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for measuring the capacity of a battery
- Patent number 4,931,737
- Issue date Jun 5, 1990
- U.S. Philips Corporation
- Teruo Hishiki
- G01 - MEASURING TESTING
Information Patent Grant
Electronic gage amplifier and display
- Patent number 4,926,360
- Issue date May 15, 1990
- Brown & Sharpe Manufacturing Co.
- Stanley T. Spink
- G01 - MEASURING TESTING
Information Patent Grant
Extended range composite head power sensor with three circuit branc...
- Patent number 4,873,484
- Issue date Oct 10, 1989
- Lucas Weinschel, Inc.
- Stephen F. Adam
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer and logarithmic amplifier therefor
- Patent number 4,812,772
- Issue date Mar 14, 1989
- Avcom of Virginia, Inc.
- R. Andrew Hatfield
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-CONTACT DC CURRENT MEASUREMENT DEVICE WITH OPEN LOOP DEGAUSSING
- Publication number 20240345137
- Publication date Oct 17, 2024
- FLUKE CORPORATION
- Bryanna D. Raap
- G01 - MEASURING TESTING
Information Patent Application
PERIODIC JITTER DETERMINATION FOR A PHASE NOISE MEASUREMENT
- Publication number 20240110963
- Publication date Apr 4, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Rishi Mohindra
- G01 - MEASURING TESTING
Information Patent Application
EXTENDED PULSE SAMPLING SYSTEM AND METHOD
- Publication number 20240053393
- Publication date Feb 15, 2024
- Photonic Systems, Inc.
- Charles H. Cox
- G01 - MEASURING TESTING
Information Patent Application
Power Detector
- Publication number 20210318365
- Publication date Oct 14, 2021
- RICHWAVE TECHNOLOGY CORP.
- Shun-Nan Tai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Readout Circuit for Resistive and Capacitive Sensors
- Publication number 20210270872
- Publication date Sep 2, 2021
- INFINEON TECHNOLOGIES AG
- Richard Gaggl
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR DETECTING CURRENT FLOWING TO LOAD, USING SHUNT RESISTOR
- Publication number 20210231708
- Publication date Jul 29, 2021
- Canon Kabushiki Kaisha
- Yutaro Minami
- G01 - MEASURING TESTING
Information Patent Application
RESISTANCE MEASURING DEVICE AND METHOD
- Publication number 20200166547
- Publication date May 28, 2020
- ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY
- Jae Joon KIM
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD COMPRISING A RECTIFIER BRIDGE
- Publication number 20200127579
- Publication date Apr 23, 2020
- SAGEMCOM ENERGY & TELECOM SAS
- Fabien DE LA CRUZ
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
VOLTAGE DETECTION CIRCUIT, SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR...
- Publication number 20200033382
- Publication date Jan 30, 2020
- ABLIC Inc.
- Yusuke KANAZAWA
- G01 - MEASURING TESTING
Information Patent Application
LINEARIZATION CIRCUIT AND METHOD FOR LINEARIZING A MEASUREMENT SIGNAL
- Publication number 20200021306
- Publication date Jan 16, 2020
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Harald HAAS
- G01 - MEASURING TESTING
Information Patent Application
Readout Circuit for Resistive and Capacitive Sensors
- Publication number 20190120879
- Publication date Apr 25, 2019
- INFINEON TECHNOLOGIES AG
- Richard Gaggl
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT ASSEMBLY HAVING A TRANSFORMER WITH CENTRE TAPPING AND MEASU...
- Publication number 20180246145
- Publication date Aug 30, 2018
- FRONIUS INTERNATIONAL GMBH
- Christian MAGERL
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
APPARATUS AND ASSOCIATED METHODS FOR MONITORING NOISE LEVEL OF A SI...
- Publication number 20170146573
- Publication date May 25, 2017
- Keysight Technologies, Inc.
- Takashi Kitagaki
- G01 - MEASURING TESTING
Information Patent Application
Optical Current Transducer With Offset Cancellation and Current Lin...
- Publication number 20160291062
- Publication date Oct 6, 2016
- GENERAL ELECTRIC COMPANY
- Daniel Robert Wallace
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SENSOR
- Publication number 20140015533
- Publication date Jan 16, 2014
- Continental Teves AG & Co. oHG
- Klaus Rink
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR MEASURING CURRENT AND METHOD OF MAKING SAME
- Publication number 20130027022
- Publication date Jan 31, 2013
- James H. Woelfel
- G01 - MEASURING TESTING
Information Patent Application
APPENDING PSEUDO-RANDOM SUB-LSB VALUES TO PREVENT INTENSITY BANDING
- Publication number 20120051538
- Publication date Mar 1, 2012
- Tektronix, Inc.
- DAVID H. EBY
- G01 - MEASURING TESTING
Information Patent Application
Detector
- Publication number 20090128131
- Publication date May 21, 2009
- Masakazu Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Measuring Electrical Impedance at Various Frequencies
- Publication number 20080303538
- Publication date Dec 11, 2008
- Timothy Orr
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Performing External Correction
- Publication number 20080205557
- Publication date Aug 28, 2008
- Tektronix, Inc.
- Yi He
- G01 - MEASURING TESTING
Information Patent Application
Multimeter with filtered measurement mode
- Publication number 20060139024
- Publication date Jun 29, 2006
- Charles B. Newcombe
- G01 - MEASURING TESTING
Information Patent Application
Multimeter with filtered measurement mode
- Publication number 20050200348
- Publication date Sep 15, 2005
- Charles B. Newcombe
- G01 - MEASURING TESTING

Circuits for altering the indicating characteristic

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Circuit board comprising a rectifier bridge

Power detector

Voltage sensing circuit

Circuit for detecting current flowing to load, using shunt resistor

Resistance measuring device and method

Voltage detection circuit, semiconductor device, and semiconductor...

Readout circuit for resistive and capacitive sensors

System and method for current sense resistor compensation

Linearization circuit and method for linearizing a measurement signal

Circuit assembly having a transformer with centre tapping and measu...

Apparatus and associated methods for monitoring noise level of a si...

Optical current transducer with offset cancellation and current lin...

System for measuring current and method of making same

Appending pseudo-random sub-LSB values to prevent intensity banding

Measuring electrical impedance at various frequencies

Battery current measurement with real time pre-gain adjust and prog...

Multimeter with filtered measurement mode

Multimeter with filtered measurement mode

Signal analyzer having independent analysis and display scales

High voltage transformer for the continuous monitoring of high volt...

System for linearizing a non-linear sensor output

Device for the processing of a signal coming from a sensor with a d...

Meter and meter driving system with indication fluctuation suppress...

Automatic scaling for display of modulation domain measurements

Method and circuit for producing an input variable for a cross-coil...

Automatic scaling for display of modulation domain measurements

Circuit for measuring the capacity of a battery

Electronic gage amplifier and display

Extended range composite head power sensor with three circuit branc...

Spectrum analyzer and logarithmic amplifier therefor

Patents Applicationslast 30 patents

NON-CONTACT DC CURRENT MEASUREMENT DEVICE WITH OPEN LOOP DEGAUSSING

PERIODIC JITTER DETERMINATION FOR A PHASE NOISE MEASUREMENT

EXTENDED PULSE SAMPLING SYSTEM AND METHOD

Power Detector

Readout Circuit for Resistive and Capacitive Sensors

CIRCUIT FOR DETECTING CURRENT FLOWING TO LOAD, USING SHUNT RESISTOR

RESISTANCE MEASURING DEVICE AND METHOD

CIRCUIT BOARD COMPRISING A RECTIFIER BRIDGE

VOLTAGE DETECTION CIRCUIT, SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR...

LINEARIZATION CIRCUIT AND METHOD FOR LINEARIZING A MEASUREMENT SIGNAL

Readout Circuit for Resistive and Capacitive Sensors

CIRCUIT ASSEMBLY HAVING A TRANSFORMER WITH CENTRE TAPPING AND MEASU...

APPARATUS AND ASSOCIATED METHODS FOR MONITORING NOISE LEVEL OF A SI...

Optical Current Transducer With Offset Cancellation and Current Lin...

CURRENT SENSOR

SYSTEM FOR MEASURING CURRENT AND METHOD OF MAKING SAME

APPENDING PSEUDO-RANDOM SUB-LSB VALUES TO PREVENT INTENSITY BANDING

Detector

Measuring Electrical Impedance at Various Frequencies

Systems and Methods for Performing External Correction

Multimeter with filtered measurement mode

Multimeter with filtered measurement mode