Circuits for inserting reference markers

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G01R13/30

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

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G01R13/30Circuits for inserting reference markers

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Patents Grantslast 30 patents

Information Patent Grant
System and method for performing lossless compressed serial decoding
- Patent number 11,698,391
- Issue date Jul 11, 2023
- Keysight Technologies, Inc.
- Joseph D. Shaker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement method and measurement apparatus
- Patent number 10,976,350
- Issue date Apr 13, 2021
- Rohde & Schwarz GmbH & Co. KG
- Andrew Schaefer
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system as well as method for analyzing an analog signal
- Patent number 10,620,264
- Issue date Apr 14, 2020
- Rohde & Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for timestamping electrical data in a panel m...
- Patent number 10,211,673
- Issue date Feb 19, 2019
- Siemens Industry, Inc.
- Paul Terricciano
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method of setting grids and/or markers in measuring apparatus
- Patent number 7,026,805
- Issue date Apr 11, 2006
- Yokogawa Electric Corporation
- Hiroki Saito
- G01 - MEASURING TESTING
Information Patent Grant
Serial data cursor
- Patent number 6,847,349
- Issue date Jan 25, 2005
- Tektronix, Inc.
- Frederick A. Azinger
- G01 - MEASURING TESTING
Information Patent Grant
Method of setting gribs and/or markers in measuring apparatus
- Patent number 6,784,655
- Issue date Aug 31, 2004
- Ando Electric Co., Ltd.
- Hiroki Saito
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument having telecommunications mask test...
- Patent number 6,728,648
- Issue date Apr 27, 2004
- Tektronix, Inc.
- Peter J. Letts
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test and measurement instrument having telecommunications mask test...
- Patent number 6,642,926
- Issue date Nov 4, 2003
- Tektronix, Inc.
- Peter J. Letts
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of waveform time stamping for minimizing digitization artifa...
- Patent number 6,571,186
- Issue date May 27, 2003
- Textronix, Inc.
- Benjamin A. Ward
- G01 - MEASURING TESTING
Information Patent Grant
Method of time stamping a waveform edge of an input signal
- Patent number 6,549,859
- Issue date Apr 15, 2003
- Tektronix Inc.
- Benjamin A. Ward
- G01 - MEASURING TESTING
Information Patent Grant
Display controlling device, display controlling method and memory m...
- Patent number 6,359,620
- Issue date Mar 19, 2002
- Ando Electric Co., Ltd.
- Tatsuyuki Fujita
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Apparatus and method for displaying a signal waveform
- Patent number 6,064,365
- Issue date May 16, 2000
- Leader Electronics, Corporation
- Kentaro Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
Digital cursors for serial digital television waveform monitors
- Patent number 5,949,495
- Issue date Sep 7, 1999
- Tektronix, Inc.
- James L. Tallman
- G01 - MEASURING TESTING
Information Patent Grant
Method of displaying graphs with markers
- Patent number 5,909,192
- Issue date Jun 1, 1999
- Wiltron Company
- David Peter Finch
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for analyzing and displaying waveform data
- Patent number 5,877,620
- Issue date Mar 2, 1999
- Advantest Corporation
- Takahisa Tomi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for displaying a signal waveform
- Patent number 5,742,275
- Issue date Apr 21, 1998
- Leader Electronics Corp.
- Kentaro Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
Dual linked zoom boxes for instrument display
- Patent number 5,517,105
- Issue date May 14, 1996
- Tektronix, Inc.
- Benton Holzwarth
- G01 - MEASURING TESTING
Information Patent Grant
Calibrated voltage cursors
- Patent number 5,047,709
- Issue date Sep 10, 1991
- Tektronix, Inc.
- Davorin Fundak
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable electronic graticules for measuring waveform distortions
- Patent number 5,004,975
- Issue date Apr 2, 1991
- Tektronix, Inc.
- Dale A. Jordan
- G01 - MEASURING TESTING
Information Patent Grant
Operation display method and apparatus for variables of an oscillos...
- Patent number 4,975,689
- Issue date Dec 4, 1990
- Iwatsu Electric Company, Ltd.
- Kiichirou Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for increasing the resolution of measurements taken using a...
- Patent number 4,972,139
- Issue date Nov 20, 1990
- Tektronix, Inc.
- Todd M. Beazley
- G01 - MEASURING TESTING
Information Patent Grant
Method to expand an analog signal and device to implement the method
- Patent number 4,920,279
- Issue date Apr 24, 1990
- SGS-Thomson Microelectronics S.A.
- Pascal Charlet
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum display device for x-ray microanalyzer or the like
- Patent number 4,885,465
- Issue date Dec 5, 1989
- Jeol, Ltd.
- Yoshitaka Nagatsuka
- G01 - MEASURING TESTING
Information Patent Grant
Vector analyzer with display markers and linear transform capability
- Patent number 4,818,931
- Issue date Apr 4, 1989
- Hewlett-Packard Company
- Andrew H. Naegeli
- G01 - MEASURING TESTING
Information Patent Grant
Sweep marker display apparatus for polar coordinate display
- Patent number 4,802,106
- Issue date Jan 31, 1989
- Anritsu Corporation
- Goro Saito
- G01 - MEASURING TESTING
Information Patent Grant
Digital storage oscilloscope with marker for trigger location
- Patent number 4,779,028
- Issue date Oct 18, 1988
- Tektronix, Inc.
- Bruce W. Blair
- G01 - MEASURING TESTING
Information Patent Grant
Locking scales to waveform displays
- Patent number 4,764,721
- Issue date Aug 16, 1988
- Tektronix, Inc.
- Keith R. Slavin
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope having a displayed trigger indicator
- Patent number 4,763,067
- Issue date Aug 9, 1988
- Tektronix, Inc.
- Gary R. Fladstol
- G01 - MEASURING TESTING
Information Patent Grant
Positioning cursors at specific points on a waveform display
- Patent number 4,761,640
- Issue date Aug 2, 1988
- Tektronix, Inc.
- Keith R. Slavin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measurement method and measurement apparatus
- Publication number 20200341034
- Publication date Oct 29, 2020
- Rohde& Schwarz GmbH & Co. KG
- Andrew Schaefer
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM AS WELL AS METHOD FOR ANALYZING AN ANALOG SIGNAL
- Publication number 20180335474
- Publication date Nov 22, 2018
- ROHDE & SCHWARZ GMBH & CO. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Application
Method of setting grids and/or markers in measuring apparatus
- Publication number 20040257062
- Publication date Dec 23, 2004
- Ando Electric Co., Ltd., a Tokyo, Japan corporation
- Hiroki Saito
- G01 - MEASURING TESTING
Information Patent Application
Serial data cursor
- Publication number 20030095099
- Publication date May 22, 2003
- Frederick A. Azinger
- G01 - MEASURING TESTING
Information Patent Application
Method of setting gribs and/or markers in measuring apparatus
- Publication number 20020140415
- Publication date Oct 3, 2002
- Hiroki Saito
- G01 - MEASURING TESTING
Information Patent Application
TOUCH CONTROL OF CURSONR POSITION
- Publication number 20010040587
- Publication date Nov 15, 2001
- E. J. SCHECK
- G01 - MEASURING TESTING

Circuits for inserting reference markers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for performing lossless compressed serial decoding

Measurement method and measurement apparatus

Measuring system as well as method for analyzing an analog signal

Apparatus and methods for timestamping electrical data in a panel m...

Method of setting grids and/or markers in measuring apparatus

Serial data cursor

Method of setting gribs and/or markers in measuring apparatus

Test and measurement instrument having telecommunications mask test...

Test and measurement instrument having telecommunications mask test...

Method of waveform time stamping for minimizing digitization artifa...

Method of time stamping a waveform edge of an input signal

Display controlling device, display controlling method and memory m...

Apparatus and method for displaying a signal waveform

Digital cursors for serial digital television waveform monitors

Method of displaying graphs with markers

Method and system for analyzing and displaying waveform data

Apparatus and method for displaying a signal waveform

Dual linked zoom boxes for instrument display

Calibrated voltage cursors

Adjustable electronic graticules for measuring waveform distortions

Operation display method and apparatus for variables of an oscillos...

Method for increasing the resolution of measurements taken using a...

Method to expand an analog signal and device to implement the method

Spectrum display device for x-ray microanalyzer or the like

Vector analyzer with display markers and linear transform capability

Sweep marker display apparatus for polar coordinate display

Digital storage oscilloscope with marker for trigger location

Locking scales to waveform displays

Oscilloscope having a displayed trigger indicator

Positioning cursors at specific points on a waveform display

Patents Applicationslast 30 patents

Measurement method and measurement apparatus

MEASURING SYSTEM AS WELL AS METHOD FOR ANALYZING AN ANALOG SIGNAL

Method of setting grids and/or markers in measuring apparatus

Serial data cursor

Method of setting gribs and/or markers in measuring apparatus

TOUCH CONTROL OF CURSONR POSITION