Circuits for multi-testers, i.e. multimeters

Industry

CPC
G01R15/12

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00 and G01R33/00 - G01R35/00

Current Industry

G01R15/12Circuits for multi-testers, i.e. multimeters

Industries

Patents Grantslast 30 patents

Information Patent Grant
Voltage measurement and/or overvoltage protection circuit for a mea...
- Patent number 12,181,497
- Issue date Dec 31, 2024
- Rohde & Schwarz GmbH & Co. KG
- Franz Strasser
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for a power device and graphical user interface
- Patent number 12,100,948
- Issue date Sep 24, 2024
- Solaredge Technologies Ltd.
- Yaron Binder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Split insulated input post for electrical measurement tool
- Patent number 12,078,660
- Issue date Sep 3, 2024
- Fluke Corporation
- Yinhong Yang
- G08 - SIGNALLING
Information Patent Grant
Multimeter with a meter probe module and phasing probe module capab...
- Patent number 12,025,639
- Issue date Jul 2, 2024
- STB Electrical Test Equipment, Inc.
- Gary Brehm
- G08 - SIGNALLING
Information Patent Grant
Plating apparatus and film thickness measuring method for substrate
- Patent number 11,906,299
- Issue date Feb 20, 2024
- Ebara Corporation
- Masaya Seki
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Wire nut electrical connector
- Patent number 11,824,317
- Issue date Nov 21, 2023
- Lyndon Graham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit for a power device and graphical user interface
- Patent number 11,750,025
- Issue date Sep 5, 2023
- Solaredge Technologies Ltd.
- Yaron Binder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit structure for testing through silicon vias in three-dimensi...
- Patent number 11,749,648
- Issue date Sep 5, 2023
- Powerchip Semiconductor Manufacturing Corporation
- Shou-Zen Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Current testing device
- Patent number 11,698,395
- Issue date Jul 11, 2023
- John Alexander
- G01 - MEASURING TESTING
Information Patent Grant
Multimeter with a meter probe module and phasing probe module capab...
- Patent number 11,693,032
- Issue date Jul 4, 2023
- STB Electrical Test Equipment, Inc.
- Gary Brehm
- G01 - MEASURING TESTING
Information Patent Grant
Differential noise cancellation
- Patent number 11,677,369
- Issue date Jun 13, 2023
- Baker Hughes Oilfield Operations LLC
- Daniel Abawi
- E21 - EARTH DRILLING MINING
Information Patent Grant
Systems, devices, and methods for measuring direct current/low freq...
- Patent number 11,635,452
- Issue date Apr 25, 2023
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for a power device and graphical user interface
- Patent number 11,569,683
- Issue date Jan 31, 2023
- Solaredge Technologies Ltd.
- Yaron Binder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Current detection apparatus
- Patent number 11,454,655
- Issue date Sep 27, 2022
- Denso Corporation
- Hirokazu Kasuya
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
In situ data acquisition and real-time analysis system
- Patent number 11,435,269
- Issue date Sep 6, 2022
- HONEYWELL FEDERAL MANUFACTURINGS TECHNOLOGIES, LLC
- Mohammad K. Benyhesan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Differential noise cancellation
- Patent number 11,431,308
- Issue date Aug 30, 2022
- Baker Hughes Oilfield Operations LLC
- Daniel Abawi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Dynamic connection indication
- Patent number 11,415,604
- Issue date Aug 16, 2022
- Baker Hughes Oilfield Operations LLC
- Brian Rhodes
- G01 - MEASURING TESTING
Information Patent Grant
Calibrator lead set for automated calibration
- Patent number 11,398,707
- Issue date Jul 26, 2022
- Fluke Corporation
- William J. Britz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic measuring device and method of use
- Patent number 11,378,589
- Issue date Jul 5, 2022
- POKIT INNOVATIONS PTY LTD
- Paul Moutzouris
- G01 - MEASURING TESTING
Information Patent Grant
Multi-use test lead
- Patent number 11,346,865
- Issue date May 31, 2022
- MEGGER INSTRUMENTS LTD
- Sidney Aaronovitch
- G01 - MEASURING TESTING
Information Patent Grant
Electrical probe
- Patent number 11,320,462
- Issue date May 3, 2022
- INNOVA ELECTRONICS CORPORATION
- Douglass Constable
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor component, assembly and method for manufacturing semi...
- Patent number 11,300,593
- Issue date Apr 12, 2022
- Shindengen Electric Manufacturing Co., Ltd.
- Kenichi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Meter apparatus for measuring parameters of electrical quantity
- Patent number 11,280,810
- Issue date Mar 22, 2022
- Telecom Italia S.p.A.
- Domenico Balsamo
- G01 - MEASURING TESTING
Information Patent Grant
Multimeter with a meter probe module and phasing probe module capab...
- Patent number 11,175,314
- Issue date Nov 16, 2021
- STB Electrical Test Equipment, Inc.
- Gary Brehm
- G08 - SIGNALLING
Information Patent Grant
Leakage current protection system for marinas
- Patent number 11,143,714
- Issue date Oct 12, 2021
- Marina Electrical Equipment, Inc.
- Robert C. Dively
- G01 - MEASURING TESTING
Information Patent Grant
Wireless Rogowski coil system
- Patent number 11,125,783
- Issue date Sep 21, 2021
- Fluke Corporation
- Matthew Carl-Robert Bannister
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact voltage and ground detector
- Patent number 11,119,124
- Issue date Sep 14, 2021
- Rocky Lee Rawls
- G01 - MEASURING TESTING
Information Patent Grant
Industrial wireless multimeter for easy deployment, troubleshooting...
- Patent number 11,067,605
- Issue date Jul 20, 2021
- Honeywell International Inc.
- Yuvaraj Nagendran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrical measurement or inspection apparatus, plug connection for...
- Patent number 11,041,885
- Issue date Jun 22, 2021
- Bernhard Sterzbach
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 10,928,428
- Issue date Feb 23, 2021
- Hioki Denki Kabushiki Kaisha
- Tetsuya Nakamura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPLIT INSULATED INPUT POST FOR ELECTRICAL MEASUREMENT TOOL
- Publication number 20240418748
- Publication date Dec 19, 2024
- FLUKE CORPORATION
- Yinhong YANG
- G08 - SIGNALLING
Information Patent Application
MULTIMETER WITH A METER PROBE MODULE AND PHASING PROBE MODULE CAPAB...
- Publication number 20240319231
- Publication date Sep 26, 2024
- STB Electrical Test Equipment, Inc.
- Gary Brehm
- G01 - MEASURING TESTING
Information Patent Application
MEDICAL ENGINEERING APPARATUS WITH DETERMINING UNIT FOR DETERMINING...
- Publication number 20240288596
- Publication date Aug 29, 2024
- Siemens Healthineers AG
- Ulrich Batzer
- G01 - MEASURING TESTING
Information Patent Application
Electrical Testing Device with Probe Having Portions with Different...
- Publication number 20240288471
- Publication date Aug 29, 2024
- Snap-on Incorporated
- Nicholas A. Gabbey
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING ELECTRICAL QUANTITIES IN AN ELECTRICAL INSTALL...
- Publication number 20240272202
- Publication date Aug 15, 2024
- Schneider Electric Industries SAS
- Stéphane Sicard
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE MEASUREMENT AND/OR OVERVOLTAGE PROTECTION CIRCUIT FOR A MEA...
- Publication number 20240168060
- Publication date May 23, 2024
- ROHDE & SCHWARZ GMBH & CO. KG
- Franz STRASSER
- G01 - MEASURING TESTING
Information Patent Application
MULTI-INSTRUMENT DEVICE BASED ON PARTIAL RECONFIGURATION FPGA
- Publication number 20240159799
- Publication date May 16, 2024
- LIQUID INSTRUMENTS PTY. LTD.
- Daniel Anthony SHADDOCK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Resistance-Based Sensor System for Measuring Atmospheric Corrosion
- Publication number 20240085310
- Publication date Mar 14, 2024
- Antony Trueman
- G01 - MEASURING TESTING
Information Patent Application
Wire Nut Electrical Connector
- Publication number 20240039175
- Publication date Feb 1, 2024
- Lyndon Graham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CURRENT SENSOR
- Publication number 20240036083
- Publication date Feb 1, 2024
- Continental Automotive Technologies GmbH
- Sören Lehmann
- G01 - MEASURING TESTING
Information Patent Application
Circuit for a Power Device and Graphical User Interface
- Publication number 20230352973
- Publication date Nov 2, 2023
- Solaredge Technologies Ltd.
- Yaron Binder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPLIT INSULATED INPUT POST FOR ELECTRICAL MEASUREMENT TOOL
- Publication number 20230296646
- Publication date Sep 21, 2023
- FLUKE CORPORATION
- Yinhong YANG
- G08 - SIGNALLING
Information Patent Application
MULTIMETER WITH A METER PROBE MODULE AND PHASING PROBE MODULE CAPAB...
- Publication number 20230296647
- Publication date Sep 21, 2023
- STB Electrical Test Equipment, Inc.
- Gary Brehm
- G08 - SIGNALLING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR MEASURING DIRECT CURRENT/LOW FREQ...
- Publication number 20230266369
- Publication date Aug 24, 2023
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
Circuit For A Power Device And Graphical User Interface
- Publication number 20230163628
- Publication date May 25, 2023
- Solaredge Technologies Ltd.
- Yaron Binder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PLATING APPARATUS AND FILM THICKNESS MEASURING METHOD FOR SUBSTRATE
- Publication number 20230152077
- Publication date May 18, 2023
- EBARA CORPORATION
- Masaya Seki
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
System and Method for Electrical Power Line Failure Detection
- Publication number 20230146778
- Publication date May 11, 2023
- TRACKONOMY SYSTEMS, INC.
- Hendrik J Volkerink
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL NOISE CANCELLATION
- Publication number 20220407479
- Publication date Dec 22, 2022
- Baker Hughes Oilfield Operations LLC
- Daniel Abawi
- G01 - MEASURING TESTING
Information Patent Application
Wire Nut Electrical Connector
- Publication number 20220224023
- Publication date Jul 14, 2022
- Lyndon Graham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DYNAMIC CONNECTION INDICATION
- Publication number 20220099705
- Publication date Mar 31, 2022
- Baker Hughes Oilfield Operations LLC
- Brian Rhodes
- G01 - MEASURING TESTING
Information Patent Application
Multimeter with a Meter Probe Module and Phasing Probe Module Capab...
- Publication number 20220057437
- Publication date Feb 24, 2022
- STB Electrical Test Equipment, Inc.
- Gary Brehm
- G08 - SIGNALLING
Information Patent Application
CALIBRATOR LEAD SET FOR AUTOMATED CALIBRATION
- Publication number 20220013970
- Publication date Jan 13, 2022
- FLUKE CORPORATION
- William J. Britz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL PROBE
- Publication number 20210181239
- Publication date Jun 17, 2021
- INNOVA ELECTRONICS CORPORATION
- Douglass Constable
- G01 - MEASURING TESTING
Information Patent Application
Corded Probe with Interface
- Publication number 20210116477
- Publication date Apr 22, 2021
- TEGAM, INC.
- Andrew S. Brush
- G01 - MEASURING TESTING
Information Patent Application
CURRENT DETECTION APPARATUS
- Publication number 20210033649
- Publication date Feb 4, 2021
- DENSO CORPORATION
- Hirokazu KASUYA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR COMPONENT, ASSEMBLY AND METHOD FOR MANUFACTURING SEMI...
- Publication number 20200386795
- Publication date Dec 10, 2020
- SHINDENGEN ELECTRIC MANUFACTURING CO., LTD
- Kenichi SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL NOISE CANCELLATION
- Publication number 20200321930
- Publication date Oct 8, 2020
- Baker Hughes Oilfield Operations LLC
- Daniel Abawi
- E21 - EARTH DRILLING MINING
Information Patent Application
METER APPARATUS FOR MEASURING PARAMETERS OF ELECTRICAL QUANTITY
- Publication number 20200278383
- Publication date Sep 3, 2020
- TELECOM ITALIA S.p.A.
- Domenico BALSAMO
- G01 - MEASURING TESTING
Information Patent Application
MULTI-USE TEST LEAD
- Publication number 20200150151
- Publication date May 14, 2020
- Megger Instruments Ltd
- Sidney AARONOVITCH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR MEASURING DIRECT CURRENT/LOW FREQ...
- Publication number 20200132731
- Publication date Apr 30, 2020
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING

Circuits for multi-testers, i.e. multimeters

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Voltage measurement and/or overvoltage protection circuit for a mea...

Circuit for a power device and graphical user interface

Split insulated input post for electrical measurement tool

Multimeter with a meter probe module and phasing probe module capab...

Plating apparatus and film thickness measuring method for substrate

Wire nut electrical connector

Circuit for a power device and graphical user interface

Circuit structure for testing through silicon vias in three-dimensi...

Current testing device

Multimeter with a meter probe module and phasing probe module capab...

Differential noise cancellation

Systems, devices, and methods for measuring direct current/low freq...

Circuit for a power device and graphical user interface

Current detection apparatus

In situ data acquisition and real-time analysis system

Differential noise cancellation

Dynamic connection indication

Calibrator lead set for automated calibration

Electronic measuring device and method of use

Multi-use test lead

Electrical probe

Semiconductor component, assembly and method for manufacturing semi...

Meter apparatus for measuring parameters of electrical quantity

Multimeter with a meter probe module and phasing probe module capab...

Leakage current protection system for marinas

Wireless Rogowski coil system

Non-contact voltage and ground detector

Industrial wireless multimeter for easy deployment, troubleshooting...

Electrical measurement or inspection apparatus, plug connection for...

Measuring apparatus

Patents Applicationslast 30 patents

SPLIT INSULATED INPUT POST FOR ELECTRICAL MEASUREMENT TOOL

MULTIMETER WITH A METER PROBE MODULE AND PHASING PROBE MODULE CAPAB...

MEDICAL ENGINEERING APPARATUS WITH DETERMINING UNIT FOR DETERMINING...

Electrical Testing Device with Probe Having Portions with Different...

DEVICE FOR MEASURING ELECTRICAL QUANTITIES IN AN ELECTRICAL INSTALL...

VOLTAGE MEASUREMENT AND/OR OVERVOLTAGE PROTECTION CIRCUIT FOR A MEA...

MULTI-INSTRUMENT DEVICE BASED ON PARTIAL RECONFIGURATION FPGA

Resistance-Based Sensor System for Measuring Atmospheric Corrosion

Wire Nut Electrical Connector

CURRENT SENSOR

Circuit for a Power Device and Graphical User Interface

SPLIT INSULATED INPUT POST FOR ELECTRICAL MEASUREMENT TOOL

MULTIMETER WITH A METER PROBE MODULE AND PHASING PROBE MODULE CAPAB...

SYSTEMS, DEVICES, AND METHODS FOR MEASURING DIRECT CURRENT/LOW FREQ...

Circuit For A Power Device And Graphical User Interface

PLATING APPARATUS AND FILM THICKNESS MEASURING METHOD FOR SUBSTRATE

System and Method for Electrical Power Line Failure Detection

DIFFERENTIAL NOISE CANCELLATION

Wire Nut Electrical Connector

DYNAMIC CONNECTION INDICATION

Multimeter with a Meter Probe Module and Phasing Probe Module Capab...

CALIBRATOR LEAD SET FOR AUTOMATED CALIBRATION

ELECTRICAL PROBE

Corded Probe with Interface

CURRENT DETECTION APPARATUS

SEMICONDUCTOR COMPONENT, ASSEMBLY AND METHOD FOR MANUFACTURING SEMI...

DIFFERENTIAL NOISE CANCELLATION

METER APPARATUS FOR MEASURING PARAMETERS OF ELECTRICAL QUANTITY

MULTI-USE TEST LEAD

SYSTEMS, DEVICES, AND METHODS FOR MEASURING DIRECT CURRENT/LOW FREQ...