Circuits for representing a single waveform by sampling

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G01R13/34

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

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G01R13/34Circuits for representing a single waveform by sampling

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for digital compensation of dynamic distortion in...
- Patent number 12,034,573
- Issue date Jul 9, 2024
- MARVELL ASIA PTE. LTD.
- Dragos Cartina
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Pattern acquisitions in equivalent time sampling systems
- Patent number 12,019,098
- Issue date Jun 25, 2024
- Tektronix, Inc.
- Noah Brummer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Waveform segmentation device and waveform segmentation method
- Patent number 12,000,868
- Issue date Jun 4, 2024
- Kabushiki Kaisha Toshiba
- Topon Paul
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus providing a trained signal classification neur...
- Patent number 11,580,382
- Issue date Feb 14, 2023
- Rohde & Schwarz GmbH & Co. KG
- Andreas Werner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement apparatus and measurement method
- Patent number 11,567,106
- Issue date Jan 31, 2023
- Rohde & Schwarz GmbH & Co. KG
- Gerd Bresser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Jitter insertion system for waveform generation
- Patent number 11,422,584
- Issue date Aug 23, 2022
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photocurrent scanning system
- Patent number 11,190,132
- Issue date Nov 30, 2021
- Tsinghua University
- Ke Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Continuous-time sampler circuits
- Patent number 11,063,794
- Issue date Jul 13, 2021
- Analog Devices International Unlimited Company
- Hajime Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus and measurement method
- Patent number 11,023,114
- Issue date Jun 1, 2021
- Rohde & Schwarz GmbH & Co. KG
- Sven Barthel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for digital compensation of dynamic distortion in...
- Patent number 11,005,690
- Issue date May 11, 2021
- INPHI CORPORATION
- Dragos Cartina
- G01 - MEASURING TESTING
Information Patent Grant
Coherent sampling
- Patent number 10,944,481
- Issue date Mar 9, 2021
- National Institute of Information and Communications Technology
- Takahide Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device and configuration method
- Patent number 10,908,197
- Issue date Feb 2, 2021
- Rohde & Schwarz GmbH & Co. KG
- Mario Guenther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Variable resolution oscilloscope
- Patent number 10,725,070
- Issue date Jul 28, 2020
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
High input impedance electro-optic sensor
- Patent number 10,684,311
- Issue date Jun 16, 2020
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Analog transitional storage
- Patent number 10,670,632
- Issue date Jun 2, 2020
- Tektronix, Inc.
- David A. Holaday
- G01 - MEASURING TESTING
Information Patent Grant
Continuous-time sampler circuits
- Patent number 10,608,851
- Issue date Mar 31, 2020
- Analog Devices Global Unlimited Company
- Hajime Shibata
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measuring device and a method for improved imaging of the spectral...
- Patent number 10,571,491
- Issue date Feb 25, 2020
- Rohde & Schwarz GmbH & Co. KG
- Nico Tonder
- G01 - MEASURING TESTING
Information Patent Grant
Variable resolution oscilloscope
- Patent number 10,534,019
- Issue date Jan 14, 2020
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and method with automated trigger function
- Patent number 10,495,670
- Issue date Dec 3, 2019
- Rohde & Schwarz GmbH & Co. KG
- Johann Huber
- G01 - MEASURING TESTING
Information Patent Grant
Real-time spectrum analyzer having frequency content based trigger...
- Patent number 10,024,895
- Issue date Jul 17, 2018
- Keysight Technologies, Inc.
- Joeri Melis
- G01 - MEASURING TESTING
Information Patent Grant
Conversion rate control for analog to digital conversion
- Patent number 9,841,446
- Issue date Dec 12, 2017
- NXP USA, INC.
- Lukas Vaculik
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Logical triggering in the frequency domain
- Patent number 9,784,776
- Issue date Oct 10, 2017
- Tektronix, Inc.
- John A. Dement
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Equivalent-time sampling techninque for non-coherently modulated si...
- Patent number 9,772,353
- Issue date Sep 26, 2017
- Tektronix, Inc.
- Michael A. Nelson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Precise estimation of arrival time of switching events close in tim...
- Patent number 9,632,136
- Issue date Apr 25, 2017
- International Business Machines Corporation
- Franco Stellari
- G01 - MEASURING TESTING
Information Patent Grant
Integration of current measurement in wiring structure of an electr...
- Patent number 9,140,735
- Issue date Sep 22, 2015
- Infineon Technologies AG
- Martin Gruber
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and system for gathering signal states for debugging a circuit
- Patent number 8,983,790
- Issue date Mar 17, 2015
- Xilinx, Inc.
- Ushasri Merugu
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope probe
- Patent number 8,791,689
- Issue date Jul 29, 2014
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Scanning temporal ultrafast delay and methods and apparatuses therefor
- Patent number 8,630,321
- Issue date Jan 14, 2014
- IMRA America, Inc.
- Gregg D. Sucha
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring terahertz wave and apparatus therefor
- Patent number 8,513,940
- Issue date Aug 20, 2013
- Canon Kabushiki Kaisha
- Takeaki Itsuji
- G01 - MEASURING TESTING
Information Patent Grant
Scanning temporal ultrafast delay and methods and apparatuses therefor
- Patent number 8,265,105
- Issue date Sep 11, 2012
- IMRA America, Inc.
- Gregg D. Sucha
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TERMINATION TRIGGER PICK-OFF FOR REMOTE HEAD SAMPLER
- Publication number 20230213556
- Publication date Jul 6, 2023
- Tektronix, Inc.
- Pavel R. Zivny
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CTLE ESTIMATION USING CHANNEL STEP-RESPONSE FOR TRANSMITT...
- Publication number 20230204629
- Publication date Jun 29, 2023
- Tektronix, Inc.
- Subhankar Ghose
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING A SIGNAL AND SIGNAL ANALYSIS DEVICE
- Publication number 20220043031
- Publication date Feb 10, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DIGITAL COMPENSATION OF DYNAMIC DISTORTION IN...
- Publication number 20210297294
- Publication date Sep 23, 2021
- INPHI CORPORATION
- Dragos CARTINA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DERIVING INFORMATION FROM SAMPLED DATA ON A...
- Publication number 20210148952
- Publication date May 20, 2021
- SCHNEIDER ELECTRIC USA, INC.
- Erin C. McPhalen
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY DATA GENERATION DEVICE, DISPLAY DATA GENERATION METHOD, AND...
- Publication number 20200393497
- Publication date Dec 17, 2020
- Mitsubishi Electric Corporation
- Osamu NASU
- G01 - MEASURING TESTING
Information Patent Application
PATTERN ACQUISITIONS IN EQUIVALENT TIME SAMPLING SYSTEMS
- Publication number 20200386791
- Publication date Dec 10, 2020
- Tektronix, Inc.
- Noah Brummer
- G01 - MEASURING TESTING
Information Patent Application
WAVEFORM SEGMENTATION DEVICE AND WAVEFORM SEGMENTATION METHOD
- Publication number 20200379016
- Publication date Dec 3, 2020
- KABUSHIKI KAISHA TOSHIBA
- Topon PAUL
- G01 - MEASURING TESTING
Information Patent Application
Measurement apparatus and measurement method
- Publication number 20200341620
- Publication date Oct 29, 2020
- Rohde& Schwarz GmbH & Co. KG
- Sven Barthel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus providing a trained signal classification neur...
- Publication number 20200342308
- Publication date Oct 29, 2020
- Rohde& Schwarz GmbH & Co. KG
- Andreas Werner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Coherent Sampling
- Publication number 20200322060
- Publication date Oct 8, 2020
- Takahide SAKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS-TIME SAMPLER CIRCUITS
- Publication number 20200295977
- Publication date Sep 17, 2020
- Analog Devices Global Unlimited Company
- Hajime SHIBATA
- G11 - INFORMATION STORAGE
Information Patent Application
Variable Resolution Oscilloscope
- Publication number 20200088766
- Publication date Mar 19, 2020
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20200041545
- Publication date Feb 6, 2020
- Rohde& Schwarz GmbH & Co. KG
- Gerd Bresser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHOTOCURRENT SCANNING SYSTEM
- Publication number 20190245484
- Publication date Aug 8, 2019
- TSINGHUA UNIVERSITY
- KE ZHANG
- G01 - MEASURING TESTING
Information Patent Application
High Input Impedance Electro-Optic Sensor
- Publication number 20180328964
- Publication date Nov 15, 2018
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE RESOLUTION OSCILLOSCOPE
- Publication number 20180059143
- Publication date Mar 1, 2018
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Application
SIMULATION METHOD FOR MIXED-SIGNAL CIRCUIT SYSTEM AND RELATED ELECT...
- Publication number 20170364619
- Publication date Dec 21, 2017
- Realtek Semiconductor Corp.
- Ying-Chieh Chen
- G01 - MEASURING TESTING
Information Patent Application
CONVERSION RATE CONTROL FOR ANALOG TO DIGITAL CONVERSION
- Publication number 20170356937
- Publication date Dec 14, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Lukas Vaculik
- G01 - MEASURING TESTING
Information Patent Application
INTENSITY INFORMATION DISPLAY
- Publication number 20160293144
- Publication date Oct 6, 2016
- Tektronix, Inc.
- Peter J. Letts
- G01 - MEASURING TESTING
Information Patent Application
Circuit for compensating an offset voltage in an amplifier
- Publication number 20160258982
- Publication date Sep 8, 2016
- ROHDE & SCHWARZ GMBH & CO. KG
- Thorsten Siera
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A CORRELATED WAVEFORM ON A REAL TIME OSCILLO...
- Publication number 20160018443
- Publication date Jan 21, 2016
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
Real-time Oscilloscope For Generating a Fast Real-time Eye Diagram
- Publication number 20150066409
- Publication date Mar 5, 2015
- Keysight Technologies, Inc.
- Christopher P. Duff
- G01 - MEASURING TESTING
Information Patent Application
EQUIVALENT-TIME SAMPLING TECHNINQUE FOR NON-COHERENTLY MODULATED SI...
- Publication number 20140358464
- Publication date Dec 4, 2014
- Tektronix, Inc.
- Michael A. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Integration of current measurement in wiring structure of an electr...
- Publication number 20140327458
- Publication date Nov 6, 2014
- Martin GRUBER
- G01 - MEASURING TESTING
Information Patent Application
LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN
- Publication number 20140012526
- Publication date Jan 9, 2014
- Tektronix, Inc.
- John A. Dement
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TEMPORAL ULTRAFAST DELAY AND METHODS AND APPARATUSES THEREFOR
- Publication number 20130010818
- Publication date Jan 10, 2013
- IMRA AMERICA, INC.
- Gregg D. SUCHA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING TERAHERTZ WAVE AND APPARATUS THEREFOR
- Publication number 20110285383
- Publication date Nov 24, 2011
- Canon Kabushiki Kaisha
- TAKEAKI ITSUJI
- G01 - MEASURING TESTING
Information Patent Application
LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN
- Publication number 20110274150
- Publication date Nov 10, 2011
- Tektronix, Inc.
- JOHN A. DEMENT
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OSCILLOSCOPE PROBE
- Publication number 20100176795
- Publication date Jul 15, 2010
- ROHDE &SCHWARZ GMBH & CO. KG
- Martin Peschke
- G01 - MEASURING TESTING

Circuits for representing a single waveform by sampling

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and device for digital compensation of dynamic distortion in...

Pattern acquisitions in equivalent time sampling systems

Waveform segmentation device and waveform segmentation method

Method and apparatus providing a trained signal classification neur...

Measurement apparatus and measurement method

Jitter insertion system for waveform generation

Photocurrent scanning system

Continuous-time sampler circuits

Measurement apparatus and measurement method

Method and device for digital compensation of dynamic distortion in...

Coherent sampling

Measurement device and configuration method

Variable resolution oscilloscope

High input impedance electro-optic sensor

Analog transitional storage

Continuous-time sampler circuits

Measuring device and a method for improved imaging of the spectral...

Variable resolution oscilloscope

Measuring device and method with automated trigger function

Real-time spectrum analyzer having frequency content based trigger...

Conversion rate control for analog to digital conversion

Logical triggering in the frequency domain

Equivalent-time sampling techninque for non-coherently modulated si...

Precise estimation of arrival time of switching events close in tim...

Integration of current measurement in wiring structure of an electr...

Method and system for gathering signal states for debugging a circuit

Oscilloscope probe

Scanning temporal ultrafast delay and methods and apparatuses therefor

Method of measuring terahertz wave and apparatus therefor

Scanning temporal ultrafast delay and methods and apparatuses therefor

Patents Applicationslast 30 patents

TERMINATION TRIGGER PICK-OFF FOR REMOTE HEAD SAMPLER

METHOD OF CTLE ESTIMATION USING CHANNEL STEP-RESPONSE FOR TRANSMITT...

METHOD OF ANALYZING A SIGNAL AND SIGNAL ANALYSIS DEVICE

METHOD AND DEVICE FOR DIGITAL COMPENSATION OF DYNAMIC DISTORTION IN...

SYSTEMS AND METHODS FOR DERIVING INFORMATION FROM SAMPLED DATA ON A...

DISPLAY DATA GENERATION DEVICE, DISPLAY DATA GENERATION METHOD, AND...

PATTERN ACQUISITIONS IN EQUIVALENT TIME SAMPLING SYSTEMS

WAVEFORM SEGMENTATION DEVICE AND WAVEFORM SEGMENTATION METHOD

Measurement apparatus and measurement method

Method and apparatus providing a trained signal classification neur...

Coherent Sampling

CONTINUOUS-TIME SAMPLER CIRCUITS

Variable Resolution Oscilloscope

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

PHOTOCURRENT SCANNING SYSTEM

High Input Impedance Electro-Optic Sensor

VARIABLE RESOLUTION OSCILLOSCOPE

SIMULATION METHOD FOR MIXED-SIGNAL CIRCUIT SYSTEM AND RELATED ELECT...

CONVERSION RATE CONTROL FOR ANALOG TO DIGITAL CONVERSION

INTENSITY INFORMATION DISPLAY

Circuit for compensating an offset voltage in an amplifier

METHOD FOR DETERMINING A CORRELATED WAVEFORM ON A REAL TIME OSCILLO...

Real-time Oscilloscope For Generating a Fast Real-time Eye Diagram

EQUIVALENT-TIME SAMPLING TECHNINQUE FOR NON-COHERENTLY MODULATED SI...

Integration of current measurement in wiring structure of an electr...

LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN

SCANNING TEMPORAL ULTRAFAST DELAY AND METHODS AND APPARATUSES THEREFOR

METHOD OF MEASURING TERAHERTZ WAVE AND APPARATUS THEREFOR

LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN

OSCILLOSCOPE PROBE