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G01R13/0218

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

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G01R13/0218Circuits therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Swept parameter oscilloscope
- Patent number 12,085,590
- Issue date Sep 10, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Clock anomaly detection
- Patent number 11,962,306
- Issue date Apr 16, 2024
- NVIDIA Corporation
- Kedar Rajpathak
- G01 - MEASURING TESTING
Information Patent Grant
Multiple analog-to-digital converter system to provide simultaneous...
- Patent number 11,936,397
- Issue date Mar 19, 2024
- Tektronix, Inc.
- Alexander Krauska
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measurement instrument
- Patent number 11,867,725
- Issue date Jan 9, 2024
- Rohde & Schwarz GmbH & Co. KG
- Bernhard Sterzbach
- G01 - MEASURING TESTING
Information Patent Grant
On-chip oscilloscope
- Patent number 11,835,551
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Real-equivalent-time oscilloscope
- Patent number 11,789,051
- Issue date Oct 17, 2023
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for performing lossless compressed serial decoding
- Patent number 11,698,391
- Issue date Jul 11, 2023
- Keysight Technologies, Inc.
- Joseph D. Shaker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring waveforms from waveform generator at device under test
- Patent number 11,693,046
- Issue date Jul 4, 2023
- Tektronix, Inc.
- Yufang Li
- G01 - MEASURING TESTING
Information Patent Grant
Differential noise cancellation
- Patent number 11,677,369
- Issue date Jun 13, 2023
- Baker Hughes Oilfield Operations LLC
- Daniel Abawi
- E21 - EARTH DRILLING MINING
Information Patent Grant
Measuring error in signal under test (SUT) using multiple channel m...
- Patent number 11,674,993
- Issue date Jun 13, 2023
- Keysight Technologies, Inc.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement devices, systems and methods associated with a...
- Patent number 11,650,225
- Issue date May 16, 2023
- Tektronix, Inc.
- Tyler B. Niles
- G01 - MEASURING TESTING
Information Patent Grant
DC power rail probes and measurement methods
- Patent number 11,644,488
- Issue date May 9, 2023
- Keysight Technologies, Inc.
- Edward Vernon Brush
- G01 - MEASURING TESTING
Information Patent Grant
Signal analysis method and measurement system
- Patent number 11,639,948
- Issue date May 2, 2023
- Rohde & Schwarz GmbH & Co. KG
- Sven Barthel
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope noise floor de-embedding for high speed toggle signal...
- Patent number 11,614,468
- Issue date Mar 28, 2023
- Intel Corporation
- Liwei Zhao
- G01 - MEASURING TESTING
Information Patent Grant
On-chip oscilloscope
- Patent number 11,567,105
- Issue date Jan 31, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Measuring error in signal under test (SUT) using multiple channel m...
- Patent number 11,536,761
- Issue date Dec 27, 2022
- Keysight Technologies, Inc.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Grant
System for data mapping and storing in digital three-dimensional os...
- Patent number 11,486,901
- Issue date Nov 1, 2022
- University of Electronic Science and Technology of China
- Yuhua Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Differential noise cancellation
- Patent number 11,431,308
- Issue date Aug 30, 2022
- Baker Hughes Oilfield Operations LLC
- Daniel Abawi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for processing oscilloscope signal and oscillo...
- Patent number 11,280,809
- Issue date Mar 22, 2022
- AUTEL INTELLIGENT TECHNOLOGY CORP., LTD.
- Liangliang Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring error in signal under test (SUT) using multiple channel m...
- Patent number 11,255,893
- Issue date Feb 22, 2022
- Keysight Technologies, Inc.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement devices, systems, and methods associated with...
- Patent number 11,187,720
- Issue date Nov 30, 2021
- Tektronix, Inc.
- Tyler B. Niles
- G01 - MEASURING TESTING
Information Patent Grant
On-chip oscilloscope
- Patent number 11,035,886
- Issue date Jun 15, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Multi-domain measurement system as well as use of a multi-domain me...
- Patent number 10,962,575
- Issue date Mar 30, 2021
- Rohde & Schwarz GmbH & Co. KG
- Michael Grimm
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring device under test waveform on signal generator
- Patent number 10,890,604
- Issue date Jan 12, 2021
- Tektronix, Inc.
- Jianjie Huang
- G01 - MEASURING TESTING
Information Patent Grant
Noise source monitoring apparatus and noise source monitoring method
- Patent number 10,816,588
- Issue date Oct 27, 2020
- FANUC CORPORATION
- Makine Yuyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Waveform display device that allows cycle time comparison to be made
- Patent number 10,802,051
- Issue date Oct 13, 2020
- FANUC CORPORATION
- Kouta Tagami
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope, test and measurement system as well as method
- Patent number 10,718,793
- Issue date Jul 21, 2020
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Protection circuit for oscilloscope measurement channel
- Patent number 10,707,673
- Issue date Jul 7, 2020
- Ford Global Technologies, LLC
- Chingchi Chen
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and a measuring device for investigating signal parameters
- Patent number 10,670,631
- Issue date Jun 2, 2020
- Rohde & Schwarz GmbH & Co. KG
- Luke Cirillo
- G01 - MEASURING TESTING
Information Patent Grant
Waveform display device
- Patent number 10,663,489
- Issue date May 26, 2020
- Yokogawa Electric Corporation
- Takeshi Yamashita
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE...
- Publication number 20240393369
- Publication date Nov 28, 2024
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
ISOLATED TEST AND MEASUREMENT PROBE
- Publication number 20240369665
- Publication date Nov 7, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT WITH INTEGRATED ANALOG FRONT END
- Publication number 20240353447
- Publication date Oct 24, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE ANALOG-TO-DIGITAL CONVERTER SYSTEM TO PROVIDE SIMULTANEOUS...
- Publication number 20240223200
- Publication date Jul 4, 2024
- Tektronix, Inc.
- Alexander Krauska
- G01 - MEASURING TESTING
Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE
- Publication number 20240151753
- Publication date May 9, 2024
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPLICATION DEVICE, POSTPROCESSING DEVICE, METHOD AND N...
- Publication number 20240103043
- Publication date Mar 28, 2024
- Rohde& Schwarz GmbH & Co. KG
- Volker OHLEN
- G01 - MEASURING TESTING
Information Patent Application
DE-SKEW METHOD FOR DYNAMIC TESTING USING TRANSFER FUNCTION OF CURRE...
- Publication number 20240069070
- Publication date Feb 29, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Takamasa Arai
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPLICATION DEVICE AND METHOD
- Publication number 20240036075
- Publication date Feb 1, 2024
- Rohde& Schwarz GmbH & Co. KG
- Christoph HOLZLEITNER
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED WAVEFORM ACQUISITIONS AND HISTOGRAMS USING GRAPHICS PROC...
- Publication number 20240027497
- Publication date Jan 25, 2024
- Tektronix, Inc.
- Andy K. Lim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL PROCESSING METHOD AND SIGNAL PROCESSING SYSTEM
- Publication number 20230280373
- Publication date Sep 7, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Florian Ramian
- G01 - MEASURING TESTING
Information Patent Application
DUAL-DETECTOR REAL-TIME SPECTRUM ANALYZER
- Publication number 20230140131
- Publication date May 4, 2023
- KEYSIGHT TECHNOLOGIES, INC.
- Matthew S. Holcomb
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ON-CHIP OSCILLOSCOPE
- Publication number 20230122803
- Publication date Apr 20, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Peng HSIEH
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT WITH REMOVABLE BATTERY PACK
- Publication number 20230077447
- Publication date Mar 16, 2023
- Tektronix, Inc.
- Chris A. Valentine
- G01 - MEASURING TESTING
Information Patent Application
REAL-EQUIVALENT-TIME CLOCK RECOVERY FOR A NEARLY-REAL-TIME REAL-EQU...
- Publication number 20230070298
- Publication date Mar 9, 2023
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE ANALOG-TO-DIGITAL CONVERTER SYSTEM TO PROVIDE SIMULTANEOUS...
- Publication number 20230020628
- Publication date Jan 19, 2023
- Tektronix, Inc.
- Alexander Krauska
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SWEPT PARAMETER OSCILLOSCOPE
- Publication number 20230019734
- Publication date Jan 19, 2023
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Clock Anomaly Detection
- Publication number 20220416776
- Publication date Dec 29, 2022
- NVIDIA Corporation
- Kedar Rajpathak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIFFERENTIAL NOISE CANCELLATION
- Publication number 20220407479
- Publication date Dec 22, 2022
- Baker Hughes Oilfield Operations LLC
- Daniel Abawi
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT DEVICES, SYSTEMS AND METHODS ASSOCIATED WITH A...
- Publication number 20220196701
- Publication date Jun 23, 2022
- Tektronix, Inc.
- Tyler B. Niles
- G01 - MEASURING TESTING
Information Patent Application
SELF-DIAGNOSING MEASUREMENT SYSTEM AND SELF-DIAGNOSIS METHOD
- Publication number 20220163586
- Publication date May 26, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Yi Jin
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR HIGH PERFORMANCE DISTRIBUTION OF LARGE WAVEFO...
- Publication number 20220163566
- Publication date May 26, 2022
- Initial State Technologies, Inc.
- James R. Bailey
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT INSTRUMENT
- Publication number 20220146554
- Publication date May 12, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Bernhard STERZBACH
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...
- Publication number 20220082603
- Publication date Mar 17, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...
- Publication number 20220082604
- Publication date Mar 17, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Application
INSTRUMENT FOR ANALYZING AN INPUT SIGNAL
- Publication number 20220011347
- Publication date Jan 13, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Andrew Schaefer
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE NOISE FLOOR DE-EMBEDDING FOR HIGH SPEED TOGGLE SIGNAL...
- Publication number 20210405090
- Publication date Dec 30, 2021
- Intel Corporation
- Liwei Zhao
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ANALYSIS METHOD AND MEASUREMENT SYSTEM
- Publication number 20210325431
- Publication date Oct 21, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Sven Barthel
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP OSCILLOSCOPE
- Publication number 20210270871
- Publication date Sep 2, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Peng HSIEH
- G01 - MEASURING TESTING
Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE
- Publication number 20210263085
- Publication date Aug 26, 2021
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR DATA MAPPING AND STORING IN DIGITAL THREE-DIMENSIONAL OS...
- Publication number 20210215744
- Publication date Jul 15, 2021
- University of Electronic Science and Technology of China
- Yuhua CHENG
- G01 - MEASURING TESTING

Circuits therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Swept parameter oscilloscope

Clock anomaly detection

Multiple analog-to-digital converter system to provide simultaneous...

Measurement instrument

On-chip oscilloscope

Real-equivalent-time oscilloscope

System and method for performing lossless compressed serial decoding

Monitoring waveforms from waveform generator at device under test

Differential noise cancellation

Measuring error in signal under test (SUT) using multiple channel m...

Test and measurement devices, systems and methods associated with a...

DC power rail probes and measurement methods

Signal analysis method and measurement system

Oscilloscope noise floor de-embedding for high speed toggle signal...

On-chip oscilloscope

Measuring error in signal under test (SUT) using multiple channel m...

System for data mapping and storing in digital three-dimensional os...

Differential noise cancellation

Method and apparatus for processing oscilloscope signal and oscillo...

Measuring error in signal under test (SUT) using multiple channel m...

Test and measurement devices, systems, and methods associated with...

On-chip oscilloscope

Multi-domain measurement system as well as use of a multi-domain me...

Monitoring device under test waveform on signal generator

Noise source monitoring apparatus and noise source monitoring method

Waveform display device that allows cycle time comparison to be made

Oscilloscope, test and measurement system as well as method

Protection circuit for oscilloscope measurement channel

Method and a measuring device for investigating signal parameters

Waveform display device

Patents Applicationslast 30 patents

REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE...

ISOLATED TEST AND MEASUREMENT PROBE

TEST AND MEASUREMENT INSTRUMENT WITH INTEGRATED ANALOG FRONT END

MULTIPLE ANALOG-TO-DIGITAL CONVERTER SYSTEM TO PROVIDE SIMULTANEOUS...

REAL-EQUIVALENT-TIME OSCILLOSCOPE

MEASUREMENT APPLICATION DEVICE, POSTPROCESSING DEVICE, METHOD AND N...

DE-SKEW METHOD FOR DYNAMIC TESTING USING TRANSFER FUNCTION OF CURRE...

MEASUREMENT APPLICATION DEVICE AND METHOD

HIGH SPEED WAVEFORM ACQUISITIONS AND HISTOGRAMS USING GRAPHICS PROC...

SIGNAL PROCESSING METHOD AND SIGNAL PROCESSING SYSTEM

DUAL-DETECTOR REAL-TIME SPECTRUM ANALYZER

ON-CHIP OSCILLOSCOPE

TEST AND MEASUREMENT INSTRUMENT WITH REMOVABLE BATTERY PACK

REAL-EQUIVALENT-TIME CLOCK RECOVERY FOR A NEARLY-REAL-TIME REAL-EQU...

MULTIPLE ANALOG-TO-DIGITAL CONVERTER SYSTEM TO PROVIDE SIMULTANEOUS...

SWEPT PARAMETER OSCILLOSCOPE

Clock Anomaly Detection

DIFFERENTIAL NOISE CANCELLATION

TEST AND MEASUREMENT DEVICES, SYSTEMS AND METHODS ASSOCIATED WITH A...

SELF-DIAGNOSING MEASUREMENT SYSTEM AND SELF-DIAGNOSIS METHOD

SYSTEM AND METHOD FOR HIGH PERFORMANCE DISTRIBUTION OF LARGE WAVEFO...

MEASUREMENT INSTRUMENT

MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...

MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...

INSTRUMENT FOR ANALYZING AN INPUT SIGNAL

OSCILLOSCOPE NOISE FLOOR DE-EMBEDDING FOR HIGH SPEED TOGGLE SIGNAL...

SIGNAL ANALYSIS METHOD AND MEASUREMENT SYSTEM

ON-CHIP OSCILLOSCOPE

REAL-EQUIVALENT-TIME OSCILLOSCOPE

SYSTEM FOR DATA MAPPING AND STORING IN DIGITAL THREE-DIMENSIONAL OS...