Circuits therefor

Industry

CPC
G01R13/22

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

Current Industry

G01R13/22Circuits therefor

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Measurement input circuit and measurement device
- Patent number 11,852,658
- Issue date Dec 26, 2023
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Frequency converter accessory for a test and measurement instrument
- Patent number 11,619,657
- Issue date Apr 4, 2023
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for recording context information of...
- Patent number 11,543,435
- Issue date Jan 3, 2023
- Rohde & Schwarz GmbH & Co. KG
- Tobias Frede
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Measurement apparatus and method for controlling a measurement appa...
- Patent number 11,531,045
- Issue date Dec 20, 2022
- Rohde & Schwarz GmbH & Co. KG
- Tobias Frede
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement input circuit and measurement device
- Patent number 11,287,447
- Issue date Mar 29, 2022
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
User interface for a testing device configured to guide user testin...
- Patent number 11,268,979
- Issue date Mar 8, 2022
- Fluke Corporation
- Erik Johan Gervedink Nijhuis
- G01 - MEASURING TESTING
Information Patent Grant
Recommending measurements based on detected waveform type
- Patent number 11,181,553
- Issue date Nov 23, 2021
- Tektronix, Inc.
- Ian R. Absher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for performing a bus autoset function and measurement device
- Patent number 10,991,341
- Issue date Apr 27, 2021
- Rohde & Schwarz GmbH & Co. KG
- Philip Diegmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring system as well as method for analyzing an analog signal
- Patent number 10,620,264
- Issue date Apr 14, 2020
- Rohde & Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Grant
Recommending measurements based on detected waveform type
- Patent number 10,585,121
- Issue date Mar 10, 2020
- Tektronix, Inc.
- Ian R. Absher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Matching circuit for matching an impedance value and a correspondin...
- Patent number 9,952,256
- Issue date Apr 24, 2018
- Rohde & Schwarz GmbH & Co. KG
- Oliver Landolt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Band overlay separator
- Patent number 9,933,458
- Issue date Apr 3, 2018
- Tektronix, Inc.
- John J. Pickerd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measuring device with a display memory having memory cells with a r...
- Patent number 9,672,794
- Issue date Jun 6, 2017
- Rohde & Schwarz GmbH & Co. KG
- Michael Reinhold
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Oscilloscope probe
- Patent number 8,791,689
- Issue date Jul 29, 2014
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope based return loss analyzer
- Patent number 7,271,575
- Issue date Sep 18, 2007
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Grant
Generation and execution of instrument control macro files for cont...
- Patent number 6,697,754
- Issue date Feb 24, 2004
- Agilent Technologies, Inc.
- Jay A. Alexander
- G01 - MEASURING TESTING
Information Patent Grant
Signal measurement method and signal measurement apparatus
- Patent number 5,671,164
- Issue date Sep 23, 1997
- Sony Corporation
- Masayoshi Kanno
- G01 - MEASURING TESTING
Information Patent Grant
Input circuit used in apparatus for measuring electric signal
- Patent number 5,457,425
- Issue date Oct 10, 1995
- Hitachi Denshi Kabushiki Kaisha
- Akihiro Tahara
- G01 - MEASURING TESTING
Information Patent Grant
Operator interface for an electronic measurement system
- Patent number 5,321,420
- Issue date Jun 14, 1994
- Motorola, Inc.
- John Rezek
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for setting individual different electronic devices of an...
- Patent number 5,278,565
- Issue date Jan 11, 1994
- Rhode & Schwarz GmbH & Co. K.G.
- Wolfgang Horn
- G01 - MEASURING TESTING
Information Patent Grant
Vertical amplifier system for multitrace oscilloscope and method fo...
- Patent number 5,272,449
- Issue date Dec 21, 1993
- Kikusui Electronics Corporation
- Masao Izawa
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument with digital parameter control
- Patent number 5,227,716
- Issue date Jul 13, 1993
- U.S. Philips Corporation
- Johannes B. Olde Heuvel
- G01 - MEASURING TESTING
Information Patent Grant
Vertical amplifier apparatus with a beam-finding function for an os...
- Patent number 5,138,239
- Issue date Aug 11, 1992
- Kikusui Electronics Corporation
- Masao Izawa
- G01 - MEASURING TESTING
Information Patent Grant
Expansion windowing system for a measurement test instrument
- Patent number 5,129,722
- Issue date Jul 14, 1992
- Tektronix, Inc.
- Josef L. Mader
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital TV raster scan waveform display device with images of selec...
- Patent number 5,057,826
- Issue date Oct 15, 1991
- U.S. Philips Corporation
- Adrianus Soethout
- G01 - MEASURING TESTING
Information Patent Grant
Display tube control system
- Patent number 5,053,684
- Issue date Oct 1, 1991
- PPG Hellige B.V.
- Marinus A. M. Nooyen
- G01 - MEASURING TESTING
Information Patent Grant
Deflection loss protection arrangement for a CRT
- Patent number 5,034,665
- Issue date Jul 23, 1991
- Thomson Consumer Electronics, Inc.
- Leroy S. Wignot
- G01 - MEASURING TESTING
Information Patent Grant
Method which provides debounced inputs from a touch screen panel by...
- Patent number 5,025,411
- Issue date Jun 18, 1991
- Tektronix, Inc.
- James L. Tallman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Precision high voltage FET pulse sense and clamp apparatus statemen...
- Patent number 4,939,450
- Issue date Jul 3, 1990
- The United States of America as represented by the Secretary of the Air Force
- Walter E. Milberger
- G01 - MEASURING TESTING
Information Patent Grant
Measured data display device with strip chart simulation and table...
- Patent number 4,905,165
- Issue date Feb 27, 1990
- Chino Corporation
- Toshikazu Inden
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT INPUT CIRCUIT AND MEASUREMENT DEVICE
- Publication number 20220120786
- Publication date Apr 21, 2022
- Rohde& Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Application
INSTRUMENT FOR ANALYZING AN INPUT SIGNAL
- Publication number 20220011347
- Publication date Jan 13, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Andrew Schaefer
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY CONVERTER ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT
- Publication number 20210148951
- Publication date May 20, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND METHOD FOR CONTROLLING A MEASUREMENT APPA...
- Publication number 20210123952
- Publication date Apr 29, 2021
- Rohde& Schwarz GmbH & Co. KG
- Tobias FREDE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR RECORDING CONTEXT INFORMATION OF...
- Publication number 20200241048
- Publication date Jul 30, 2020
- Rohde& Schwarz GmbH & Co. KG
- Tobias Frede
- G01 - MEASURING TESTING
Information Patent Application
RECOMMENDING MEASUREMENTS BASED ON DETECTED WAVEFORM TYPE
- Publication number 20200209282
- Publication date Jul 2, 2020
- Tektronix, Inc.
- Ian R. Absher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USER INTERFACE FOR A TESTING DEVICE CONFIGURED TO GUIDE USER TESTIN...
- Publication number 20190376999
- Publication date Dec 12, 2019
- FLUKE CORPORATION
- Erik Johan Gervedink Nijhuis
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE SYSTEM
- Publication number 20190324060
- Publication date Oct 24, 2019
- Dell Products L.P.
- Vasa Mallikarjun Goud
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT INPUT CIRCUIT AND MEASUREMENT DEVICE
- Publication number 20180372779
- Publication date Dec 27, 2018
- Rohde& Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM AS WELL AS METHOD FOR ANALYZING AN ANALOG SIGNAL
- Publication number 20180335474
- Publication date Nov 22, 2018
- ROHDE & SCHWARZ GMBH & CO. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PERFORMING A BUS AUTOSET FUNCTION AND MEASUREMENT DEVICE
- Publication number 20180286359
- Publication date Oct 4, 2018
- ROHDE & SCHWARZ GMBH & CO. KG
- Philip Diegmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RECOMMENDING MEASUREMENTS BASED ON DETECTED WAVEFORM TYPE
- Publication number 20180074096
- Publication date Mar 15, 2018
- Tektronix, Inc.
- Ian R. Absher
- G01 - MEASURING TESTING
Information Patent Application
REJECTION OF MECHANICAL VIBRATION INDUCED NOISE IN ELECTRICAL MEASU...
- Publication number 20170285070
- Publication date Oct 5, 2017
- KEITHLEY INSTRUMENTS, LLC
- GREGORY SOBOLEWSKI
- G01 - MEASURING TESTING
Information Patent Application
BAND OVERLAY SEPARATOR
- Publication number 20160291056
- Publication date Oct 6, 2016
- Tektronix, Inc.
- John J. PICKERD
- G01 - MEASURING TESTING
Information Patent Application
MATCHING CIRCUIT FOR MATCHING AN IMPEDANCE VALUE AND A CORRESPONDIN...
- Publication number 20160156336
- Publication date Jun 2, 2016
- ROHDE & SCHWARZ GMBH & CO. KG
- Oliver Landolt
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE WITH A DISPLAY MEMORY HAVING MEMORY CELLS WITH A R...
- Publication number 20160063967
- Publication date Mar 3, 2016
- ROHDE & SCHWARZ GMBH & CO. KG
- Michael REINHOLD
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE PROBE
- Publication number 20100176795
- Publication date Jul 15, 2010
- ROHDE &SCHWARZ GMBH & CO. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Application
Automatically setting gain and offset based on region of interest
- Publication number 20040162041
- Publication date Aug 19, 2004
- Kevin M. Ferguson
- G01 - MEASURING TESTING
Information Patent Application
Oscilloscope based return loss analyzer
- Publication number 20040027138
- Publication date Feb 12, 2004
- John J. Pickerd
- G01 - MEASURING TESTING

Circuits therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measurement input circuit and measurement device

Frequency converter accessory for a test and measurement instrument

Measurement system and method for recording context information of...

Measurement apparatus and method for controlling a measurement appa...

Measurement input circuit and measurement device

User interface for a testing device configured to guide user testin...

Recommending measurements based on detected waveform type

Method for performing a bus autoset function and measurement device

Measuring system as well as method for analyzing an analog signal

Recommending measurements based on detected waveform type

Matching circuit for matching an impedance value and a correspondin...

Band overlay separator

Measuring device with a display memory having memory cells with a r...

Oscilloscope probe

Oscilloscope based return loss analyzer

Generation and execution of instrument control macro files for cont...

Signal measurement method and signal measurement apparatus

Input circuit used in apparatus for measuring electric signal

Operator interface for an electronic measurement system

Apparatus for setting individual different electronic devices of an...

Vertical amplifier system for multitrace oscilloscope and method fo...

Measuring instrument with digital parameter control

Vertical amplifier apparatus with a beam-finding function for an os...

Expansion windowing system for a measurement test instrument

Digital TV raster scan waveform display device with images of selec...

Display tube control system

Deflection loss protection arrangement for a CRT

Method which provides debounced inputs from a touch screen panel by...

Precision high voltage FET pulse sense and clamp apparatus statemen...

Measured data display device with strip chart simulation and table...

Patents Applicationslast 30 patents

MEASUREMENT INPUT CIRCUIT AND MEASUREMENT DEVICE

INSTRUMENT FOR ANALYZING AN INPUT SIGNAL

FREQUENCY CONVERTER ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT

MEASUREMENT APPARATUS AND METHOD FOR CONTROLLING A MEASUREMENT APPA...

MEASUREMENT SYSTEM AND METHOD FOR RECORDING CONTEXT INFORMATION OF...

RECOMMENDING MEASUREMENTS BASED ON DETECTED WAVEFORM TYPE

USER INTERFACE FOR A TESTING DEVICE CONFIGURED TO GUIDE USER TESTIN...

OSCILLOSCOPE SYSTEM

MEASUREMENT INPUT CIRCUIT AND MEASUREMENT DEVICE

MEASURING SYSTEM AS WELL AS METHOD FOR ANALYZING AN ANALOG SIGNAL

METHOD FOR PERFORMING A BUS AUTOSET FUNCTION AND MEASUREMENT DEVICE

RECOMMENDING MEASUREMENTS BASED ON DETECTED WAVEFORM TYPE

REJECTION OF MECHANICAL VIBRATION INDUCED NOISE IN ELECTRICAL MEASU...

BAND OVERLAY SEPARATOR

MATCHING CIRCUIT FOR MATCHING AN IMPEDANCE VALUE AND A CORRESPONDIN...

MEASURING DEVICE WITH A DISPLAY MEMORY HAVING MEMORY CELLS WITH A R...

OSCILLOSCOPE PROBE

Automatically setting gain and offset based on region of interest

Oscilloscope based return loss analyzer