Coherent sources lasers

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CPC
G01N2201/06113

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

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G01N2201/06113Coherent sources lasers

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Surface-enhanced Raman scattering substrate for fuel oil analysis
- Patent number 12,366,534
- Issue date Jul 22, 2025
- King Fahd University of Petroleum & Minerals
- Abdulaziz Abdulrahman Al-Saadi
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
System including a fiber laser module
- Patent number 12,366,532
- Issue date Jul 22, 2025
- Atonarp Inc.
- Mateusz Plewicki
- G01 - MEASURING TESTING
Information Patent Grant
Characteristic information extraction method and portable detection...
- Patent number 12,360,047
- Issue date Jul 15, 2025
- Jiangsu University
- Quansheng Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for the estimation of soil unconfined compres...
- Patent number 12,360,048
- Issue date Jul 15, 2025
- King Fahd University of Petroleum & Minerals
- Yakubu Sani Wudil
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for shortwave infrared photothermal (SWIP) mic...
- Patent number 12,352,944
- Issue date Jul 8, 2025
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Ultrafast chemical imaging by widefield photothermal sensing of inf...
- Patent number 12,345,635
- Issue date Jul 1, 2025
- Purdue Research Foundation
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of a subject article
- Patent number 12,345,652
- Issue date Jul 1, 2025
- SENS-TECH LTD.
- Stephen Jaye
- G01 - MEASURING TESTING
Information Patent Grant
Gas detection device and gas detection method
- Patent number 12,345,631
- Issue date Jul 1, 2025
- Kabushiki Kaisha Toshiba
- Yasutomo Shiomi
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus
- Patent number 12,345,653
- Issue date Jul 1, 2025
- Shimadzu Corporation
- Hiroshi Horikawa
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic object detection device, detection system, and detectio...
- Patent number 12,345,625
- Issue date Jul 1, 2025
- University Public Corporation Osaka
- Takuya Iida
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and testing apparatus having the same
- Patent number 12,339,223
- Issue date Jun 24, 2025
- Samsung Electronics Co., Ltd.
- Yasuhiro Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Photoacoustic spectrum phase locking method, apparatus, and system
- Patent number 12,332,162
- Issue date Jun 17, 2025
- ZHEJIANG LAB
- Yonggang Yin
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,326,407
- Issue date Jun 10, 2025
- ASML Netherlands B.V.
- Nitish Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Materials and methods for surface-enhanced Raman scattering (SERS)...
- Patent number 12,313,553
- Issue date May 27, 2025
- King Fahd University of Petroleum & Minerals
- Abdulaziz Abdulrahman Al-Saadi
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Simultaneous ultrasonic vibration and gas sensing based on a tunabl...
- Patent number 12,313,540
- Issue date May 27, 2025
- United States Department of Energy
- Nageswara Rao Lalam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast multiphoton microscope
- Patent number 12,313,548
- Issue date May 27, 2025
- Applikate Technologies, Inc.
- Michael Levene
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting the presence of spores in fields
- Patent number 12,313,559
- Issue date May 27, 2025
- Universite de Geneve
- Jean-Pierre Wolf
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Finishing line automatic inspection system and method
- Patent number 12,313,565
- Issue date May 27, 2025
- Columbia Insurance Company
- Richard Glassell
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Dual beam single spatial mode laser for handheld libs instruments a...
- Patent number 12,316,066
- Issue date May 27, 2025
- SciAps, Inc.
- David Welford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Foreign object debris discrimination with modulated laser light
- Patent number 12,313,562
- Issue date May 27, 2025
- RTX Corporation
- Jose-Rodrigo Castillo-Garza
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with improved charge transfer efficiency and ass...
- Patent number 12,297,496
- Issue date May 13, 2025
- Quantum-Si Incorporated
- Eric A. G. Webster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopic Raman device
- Patent number 12,287,290
- Issue date Apr 29, 2025
- Shimadzu Corporation
- Tomoyo Tao
- G01 - MEASURING TESTING
Information Patent Grant
Ultrafast laser imaging with box lock-in
- Patent number 12,281,982
- Issue date Apr 22, 2025
- Monstr Sense Technologies, LLC
- Eric W. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Homogenized coherent excitation of a sample for determining molecul...
- Patent number 12,281,987
- Issue date Apr 22, 2025
- Indian Institute of Science
- Siva Umapathy
- G01 - MEASURING TESTING
Information Patent Grant
Multi-track Raman well plate reader
- Patent number 12,281,986
- Issue date Apr 22, 2025
- Horiba Instruments Incorporated
- Nicolas Vezard
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for voltage contrast imaging using photoreflect...
- Patent number 12,281,992
- Issue date Apr 22, 2025
- William W. Chism
- G01 - MEASURING TESTING
Information Patent Grant
Temporal magnification spectrometer and performing spectroscopic te...
- Patent number 12,276,599
- Issue date Apr 15, 2025
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- David Francis Plusquellic
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for appraising genuine product using quantum dot
- Patent number 12,276,611
- Issue date Apr 15, 2025
- Pusan National University Industry-University Cooperation Foundation
- Kwang Seuk Kyhm
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field confocal microscopy measurement apparatus and method bas...
- Patent number 12,276,615
- Issue date Apr 15, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed-light spectroscopic device
- Patent number 12,270,704
- Issue date Apr 8, 2025
- Ushio Denki Kabushiki Kaisha
- Kazuki Shinoyama
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
ION BEAM TIME OF ARRIVAL (TOA) GAUGE
- Publication number 20250237546
- Publication date Jul 24, 2025
- Analex Corporation
- Todd Evan Vande Brake
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR RAPID CHARACTERIZATION OF METALLIC POWDERS
- Publication number 20250231113
- Publication date Jul 17, 2025
- RTX Corporation
- David U. Furrer
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL-TYPE FOREIGN MATTER INSPECTION DEVICE
- Publication number 20250224342
- Publication date Jul 10, 2025
- Hitachi High-Tech Corporation
- Tomoharu NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
NONLINEAR OPTICAL STOKES ELLIPSOMETERS
- Publication number 20250224327
- Publication date Jul 10, 2025
- FemtoMetrix, Inc.
- Ken James
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20250216339
- Publication date Jul 3, 2025
- BRIGHTEST TECHNOLOGY TAIWAN CO., LTD.
- ZHONG-HUA DONG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NANOSENSOR METHODS AND APPARATUSES FOR DETERMINATION OF ANALYTES
- Publication number 20250214082
- Publication date Jul 3, 2025
- President and Fellows of Harvard College
- Qimin Quan
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
FIELD QUANTITATIVE ANALYSIS METHOD AND SYSTEM OF LITHIUM
- Publication number 20250216334
- Publication date Jul 3, 2025
- Institute of Geology and Geophysics, CAS
- Zhiyuan LI
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic Mapping System
- Publication number 20250207974
- Publication date Jun 26, 2025
- Board of Trustees of Michigan State University
- Elad HAREL
- G01 - MEASURING TESTING
Information Patent Application
MODE-MATCHING A PLURALITY OF OPTICAL BEAMS TO A CORRESPONDING PLURA...
- Publication number 20250210931
- Publication date Jun 26, 2025
- Rosemount Aerospace Inc.
- Gary E. Halama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MEASURING ELECTRON DENSITY OF PLASMA
- Publication number 20250208034
- Publication date Jun 26, 2025
- Research & Business Foundation Sungkyunkwan University
- Moon Soo BAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE FOR LASER EMISSION SPECTROSCOPIC ANALYSIS, LASER EMI...
- Publication number 20250208030
- Publication date Jun 26, 2025
- NIPPON STEEL CORPORATION
- Norihiro TSUJI
- G01 - MEASURING TESTING
Information Patent Application
TIME-RESOLVED LASER-INDUCED FLUORESCENCE SPECTROSCOPY SYSTEMS AND U...
- Publication number 20250198931
- Publication date Jun 19, 2025
- Pramod BUTTE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Device and Method to Capture High Resolution Images of a Moving Obj...
- Publication number 20250198884
- Publication date Jun 19, 2025
- Derrick Schmenk
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
THERMO-OPTIC COEFFICIENT MEASUREMENT SYSTEMS
- Publication number 20250198920
- Publication date Jun 19, 2025
- Simmonds Precision Products, Inc.
- Joshua Girard
- G01 - MEASURING TESTING
Information Patent Application
ACOUSTIC RESONANCE-BASED METROLOGY OF SAMPLES
- Publication number 20250189435
- Publication date Jun 12, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ori Golani
- G01 - MEASURING TESTING
Information Patent Application
RADIATION EMITTER AND MEASUREMENT SYSTEM
- Publication number 20250189444
- Publication date Jun 12, 2025
- Industrial Technology Research Institute
- Karthickraj Muthuramalingam
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING INTRINSIC AUTOFLUORESCENCE OF A BIOLOGICAL SAM...
- Publication number 20250180483
- Publication date Jun 5, 2025
- FUNDACIÓ INSTITUT DE BIOENGINYERIA DE CATALUNYA
- Denitza Nikolaeva DENKOVA
- G01 - MEASURING TESTING
Information Patent Application
STIMULATED RAMAN PHOTOTHERMAL MICROSCOPE
- Publication number 20250180487
- Publication date Jun 5, 2025
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR FLUORESCENCE DETECTION IN ELECTRONIC DEVIC...
- Publication number 20250180484
- Publication date Jun 5, 2025
- ORBOTECH LTD.
- Ophir Eyal
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SIMULTANEOUSLY MEASURING REFRACTIVE INDEX AND...
- Publication number 20250179410
- Publication date Jun 5, 2025
- Stichting IMEC Nederland
- Mark Zentile
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
OPTICAL APPARATUS
- Publication number 20250180486
- Publication date Jun 5, 2025
- RENISHAW PLC
- Victor Gordon STIMPSON
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ENHANCED ROCK WEATHERING MONITORING, REPORTIN...
- Publication number 20250164404
- Publication date May 22, 2025
- Impossible Sensing LLC
- Pablo Sobron
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PHOTOACOUSTIC MICROSCOPY
- Publication number 20250164387
- Publication date May 22, 2025
- DUKE UNIVERSITY
- Junjie YAO
- G01 - MEASURING TESTING
Information Patent Application
Tunable laser spectroscopy system with gas line resolution
- Publication number 20250164392
- Publication date May 22, 2025
- KineoLabs, Inc.
- Walid A. Atia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Analyzer for Single Molecule Detection and Methods of Use
- Publication number 20250155372
- Publication date May 15, 2025
- NOVILUX, LLC
- Richard Livingston
- G01 - MEASURING TESTING
Information Patent Application
TECHNOLOGIES FOR PHOTOTHERMAL ACTION-BASED TWO-DIMENSIONAL INFRARED...
- Publication number 20250155471
- Publication date May 15, 2025
- LEHIGH UNIVERSITY
- Xiaoji XU
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20250155486
- Publication date May 15, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
CONFOCAL LASER TECHNOLOGY -BASED FULLY AUTOMATIC IMMUNOASSAY ANALYZ...
- Publication number 20250155459
- Publication date May 15, 2025
- SHANGHAI SAGA BIOTECH CO., LTD.
- Xu ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Fluorescence Imaging Flow Cytometry With Enhanced Image Resolution
- Publication number 20250155353
- Publication date May 15, 2025
- Becton, Dickinson and Company
- Eric D. Diebold
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Methods for Fluorescence Imaging Using Radiofrequency...
- Publication number 20250155371
- Publication date May 15, 2025
- The Regents of the University of California
- Eric D. Diebold
- G01 - MEASURING TESTING

Coherent sources lasers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Surface-enhanced Raman scattering substrate for fuel oil analysis

System including a fiber laser module

Characteristic information extraction method and portable detection...

Apparatus and methods for the estimation of soil unconfined compres...

Apparatus and method for shortwave infrared photothermal (SWIP) mic...

Ultrafast chemical imaging by widefield photothermal sensing of inf...

Method and apparatus for inspection of a subject article

Gas detection device and gas detection method

Defect inspection apparatus

Microscopic object detection device, detection system, and detectio...

Measuring apparatus and testing apparatus having the same

Photoacoustic spectrum phase locking method, apparatus, and system

Inspection apparatus and inspection method

Materials and methods for surface-enhanced Raman scattering (SERS)...

Simultaneous ultrasonic vibration and gas sensing based on a tunabl...

Fast multiphoton microscope

System and method for detecting the presence of spores in fields

Finishing line automatic inspection system and method

Dual beam single spatial mode laser for handheld libs instruments a...

Foreign object debris discrimination with modulated laser light

Integrated circuit with improved charge transfer efficiency and ass...

Microscopic Raman device

Ultrafast laser imaging with box lock-in

Homogenized coherent excitation of a sample for determining molecul...

Multi-track Raman well plate reader

Systems and methods for voltage contrast imaging using photoreflect...

Temporal magnification spectrometer and performing spectroscopic te...

Method and system for appraising genuine product using quantum dot

Dark-field confocal microscopy measurement apparatus and method bas...

Pulsed-light spectroscopic device

Patents Applicationslast 30 patents

ION BEAM TIME OF ARRIVAL (TOA) GAUGE

METHOD FOR RAPID CHARACTERIZATION OF METALLIC POWDERS

OPTICAL-TYPE FOREIGN MATTER INSPECTION DEVICE

NONLINEAR OPTICAL STOKES ELLIPSOMETERS

WAFER INSPECTION SYSTEM

NANOSENSOR METHODS AND APPARATUSES FOR DETERMINATION OF ANALYTES

FIELD QUANTITATIVE ANALYSIS METHOD AND SYSTEM OF LITHIUM

Spectroscopic Mapping System

MODE-MATCHING A PLURALITY OF OPTICAL BEAMS TO A CORRESPONDING PLURA...

APPARATUS AND METHOD FOR MEASURING ELECTRON DENSITY OF PLASMA

OPTICAL DEVICE FOR LASER EMISSION SPECTROSCOPIC ANALYSIS, LASER EMI...

TIME-RESOLVED LASER-INDUCED FLUORESCENCE SPECTROSCOPY SYSTEMS AND U...

Device and Method to Capture High Resolution Images of a Moving Obj...

THERMO-OPTIC COEFFICIENT MEASUREMENT SYSTEMS

ACOUSTIC RESONANCE-BASED METROLOGY OF SAMPLES

RADIATION EMITTER AND MEASUREMENT SYSTEM

DEVICE FOR MEASURING INTRINSIC AUTOFLUORESCENCE OF A BIOLOGICAL SAM...

STIMULATED RAMAN PHOTOTHERMAL MICROSCOPE

APPARATUS AND METHOD FOR FLUORESCENCE DETECTION IN ELECTRONIC DEVIC...

SYSTEM AND METHOD FOR SIMULTANEOUSLY MEASURING REFRACTIVE INDEX AND...

OPTICAL APPARATUS

SYSTEM AND METHOD FOR ENHANCED ROCK WEATHERING MONITORING, REPORTIN...

SYSTEMS AND METHODS FOR PHOTOACOUSTIC MICROSCOPY

Tunable laser spectroscopy system with gas line resolution

Scanning Analyzer for Single Molecule Detection and Methods of Use

TECHNOLOGIES FOR PHOTOTHERMAL ACTION-BASED TWO-DIMENSIONAL INFRARED...

WAFER METROLOGY TECHNOLOGIES

CONFOCAL LASER TECHNOLOGY -BASED FULLY AUTOMATIC IMMUNOASSAY ANALYZ...

Fluorescence Imaging Flow Cytometry With Enhanced Image Resolution

Apparatus and Methods for Fluorescence Imaging Using Radiofrequency...