Cold-cathode sources

Industry

CPC
H01J2237/06325

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/06325Cold-cathode sources

Industries

Patents Grantslast 30 patents

Information Patent Grant
High brightness electron gun, system using the same, and method of...
- Patent number 8,987,692
- Issue date Mar 24, 2015
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High brightness electron gun with moving condenser lens
- Patent number 8,921,804
- Issue date Dec 30, 2014
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation device
- Patent number 8,426,835
- Issue date Apr 23, 2013
- Hitachi High-Technologies Corporation
- Keigo Kasuya
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle beam apparatus, and method of controlling the same
- Patent number 8,319,193
- Issue date Nov 27, 2012
- Hitachi High-Technologies Corporation
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetically insulated cold-cathode electron gun
- Patent number 8,129,910
- Issue date Mar 6, 2012
- L-3 Communications Corporation
- David Riley Whaley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam emitting device and method for operating a ch...
- Patent number 7,595,490
- Issue date Sep 29, 2009
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Fang Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin film electron emitter, display device using the same and appli...
- Patent number 6,818,941
- Issue date Nov 16, 2004
- Hitachi, Ltd.
- Mutsumi Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and method for driving the same
- Patent number 5,233,196
- Issue date Aug 3, 1993
- Canon Kabushiki Kaisha
- Masahiko Okunuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging beta tracer microscope
- Patent number 5,130,539
- Issue date Jul 14, 1992
- Brandeis University
- Karl F. Canter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam gun
- Patent number 4,931,700
- Issue date Jun 5, 1990
- Jay L. Reed
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH BRIGHTNESS ELECTRON GUN, SYSTEM USING THE SAME, AND METHOD OF...
- Publication number 20140264063
- Publication date Sep 18, 2014
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH BRIGHTNESS ELECTRON GUN WITH MOVING CONDENSER LENS
- Publication number 20130327951
- Publication date Dec 12, 2013
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME
- Publication number 20130063029
- Publication date Mar 14, 2013
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE RADIATION DEVICE
- Publication number 20120085925
- Publication date Apr 12, 2012
- Hitachi High-Technologies Corporation
- Keigo Kasuya
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME
- Publication number 20110089336
- Publication date Apr 21, 2011
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETICALLY INSULATED COLD-CATHODE ELECTRON GUN
- Publication number 20100320912
- Publication date Dec 23, 2010
- L-3 COMMUNICATONS CORPORATION
- DAVID RILEY WHALEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM EMITTING DEVICE AND METHOD FOR OPERATING A CH...
- Publication number 20070158588
- Publication date Jul 12, 2007
- Fang Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Diamond electron emitter and electron beam source using same
- Publication number 20060244352
- Publication date Nov 2, 2006
- Sumitomo Electric Industries, Ltd.
- Natsuo Tatsumi
- H01 - BASIC ELECTRIC ELEMENTS

Cold-cathode sources

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High brightness electron gun, system using the same, and method of...

High brightness electron gun with moving condenser lens

Charged particle radiation device

Charged particle beam apparatus, and method of controlling the same

Magnetically insulated cold-cathode electron gun

Charged particle beam emitting device and method for operating a ch...

Thin film electron emitter, display device using the same and appli...

Electron beam apparatus and method for driving the same

Imaging beta tracer microscope

Electron beam gun

Patents Applicationslast 30 patents

HIGH BRIGHTNESS ELECTRON GUN, SYSTEM USING THE SAME, AND METHOD OF...

HIGH BRIGHTNESS ELECTRON GUN WITH MOVING CONDENSER LENS

CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME

CHARGED PARTICLE RADIATION DEVICE

CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME

MAGNETICALLY INSULATED COLD-CATHODE ELECTRON GUN

CHARGED PARTICLE BEAM EMITTING DEVICE AND METHOD FOR OPERATING A CH...

Diamond electron emitter and electron beam source using same