combination of at least 2 measurements (transmission and scatter)

Industry

CPC
G01N2223/045

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/045combination of at least 2 measurements (transmission and scatter)

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample inspection system comprising a beam former to project a poly...
- Patent number 11,971,371
- Issue date Apr 30, 2024
- The Nottingham Trent University
- Paul Evans
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
X-ray examination device
- Patent number 11,821,856
- Issue date Nov 21, 2023
- Anton Paar GmbH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Grant
Through-tubing, cased-hole sealed material density evaluation using...
- Patent number 11,815,478
- Issue date Nov 14, 2023
- Halliburton Energy Services, Inc.
- Pablo Vieira Rego
- E21 - EARTH DRILLING MINING
Information Patent Grant
Defect detection device, defect detection method, and defect observ...
- Patent number 11,802,841
- Issue date Oct 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spot-size control in reflection-based and scatterometry-based X-ray...
- Patent number 11,781,999
- Issue date Oct 10, 2023
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
- Patent number 11,774,380
- Issue date Oct 3, 2023
- Sichuan University
- Yuanjun Xu
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection system comprising neutron radiation sour...
- Patent number 11,747,288
- Issue date Sep 5, 2023
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging apparatus and method
- Patent number 11,681,068
- Issue date Jun 20, 2023
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Edge phase effects removal using wavelet correction and particle cl...
- Patent number 11,645,792
- Issue date May 9, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,519,871
- Issue date Dec 6, 2022
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for diffraction pattern acquisition
- Patent number 11,499,926
- Issue date Nov 15, 2022
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- G01 - MEASURING TESTING
Information Patent Grant
Combined scanning x-ray generator, composite inspection apparatus,...
- Patent number 11,467,105
- Issue date Oct 11, 2022
- Nuctech Company Limited
- Zhiqiang Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and devices for determining metrology sites
- Patent number 11,436,506
- Issue date Sep 6, 2022
- Carl Zeiss SMT GmbH
- Abhilash Srikantha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray imaging system and method of x-ray imaging
- Patent number 11,226,298
- Issue date Jan 18, 2022
- Siemens Healthcare GmbH
- Steffen Kappler
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Dark field tensor tomography method, specimen holder and device
- Patent number 11,143,603
- Issue date Oct 12, 2021
- Technische Universitat Munchen
- Florian Schaff
- G01 - MEASURING TESTING
Information Patent Grant
CT apparatus, CT imaging method, and storage medium
- Patent number 10,980,495
- Issue date Apr 20, 2021
- Canon Kabushiki Kaisha
- Jumpei Shirono
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Hybrid inspection system
- Patent number 10,983,073
- Issue date Apr 20, 2021
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer system
- Patent number 10,976,273
- Issue date Apr 13, 2021
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection device
- Patent number 10,705,032
- Issue date Jul 7, 2020
- SHARP KABUSHIKI KAISHA
- Hiroaki Miyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing an object in two stages using a transmission sp...
- Patent number 10,605,749
- Issue date Mar 31, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Caroline Paulus
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing a sample combining an X-ray characterizat...
- Patent number 10,481,109
- Issue date Nov 19, 2019
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Agnieszka Priebe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for analyzing an object by diffractometry using a...
- Patent number 10,352,882
- Issue date Jul 16, 2019
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Caroline Paulus
- G01 - MEASURING TESTING
Information Patent Grant
Detection system and method
- Patent number 10,295,481
- Issue date May 21, 2019
- Tsinghua University
- Zhiqiang Chen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray transmission spectrometer system
- Patent number 10,295,485
- Issue date May 21, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for estimation of heat value using dual energy...
- Patent number 10,197,513
- Issue date Feb 5, 2019
- MANTEX IP AB
- Ragnar Kullenberg
- G01 - MEASURING TESTING
Information Patent Grant
Combined handheld XRF and OES systems and methods
- Patent number 10,012,603
- Issue date Jul 3, 2018
- SciAps, Inc.
- Donald W. Sackett
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam apparatus, method for observing cross-section of s...
- Patent number 9,934,938
- Issue date Apr 3, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...
- Publication number 20240328970
- Publication date Oct 3, 2024
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING SYSTEM AND PHASE ANALYSIS SYSTEM
- Publication number 20240192152
- Publication date Jun 13, 2024
- Hitachi, Ltd
- Toshiaki TANIGAKI
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
- Publication number 20240110880
- Publication date Apr 4, 2024
- FEI Company
- Maurice PEEMEN
- G01 - MEASURING TESTING
Information Patent Application
A SCREENING SYSTEM
- Publication number 20240044813
- Publication date Feb 8, 2024
- Halo X Ray Technologies Limited
- Anthony DICKEN
- G01 - MEASURING TESTING
Information Patent Application
PARAMETERIZING X-RAY SCATTERING MEASUREMENT USING SLICE-AND-IMAGE T...
- Publication number 20230343619
- Publication date Oct 26, 2023
- Carl Zeiss SMT GMBH
- Hans-Michael Stiepan
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION
- Publication number 20230112447
- Publication date Apr 13, 2023
- ASML NETHERLANDS B.V.
- Weiming REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD
- Publication number 20230096574
- Publication date Mar 30, 2023
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- G01 - MEASURING TESTING
Information Patent Application
Spot-size control in reflection-based and scatterometry-based X-ray...
- Publication number 20230075421
- Publication date Mar 9, 2023
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Application
X-RAY COMPUTED TOMOGRAPHY APPARATUS AND IMAGE GENERATION METHOD
- Publication number 20220404295
- Publication date Dec 22, 2022
- Toyota Jidosha Kabushiki Kaisha
- Akihiro TOYODA
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20220390395
- Publication date Dec 8, 2022
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
A SAMPLE INSPECTION SYSTEM
- Publication number 20220381710
- Publication date Dec 1, 2022
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
X-RAY EXAMINATION DEVICE
- Publication number 20220381712
- Publication date Dec 1, 2022
- ANTON PAAR GMBH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Application
THROUGH-TUBING, CASED-HOLE SEALED MATERIAL DENSITY EVALUATION USING...
- Publication number 20220373484
- Publication date Nov 24, 2022
- Halliburton Energy Services, Inc.
- Pablo Vieira Rego
- E21 - EARTH DRILLING MINING
Information Patent Application
Edge Phase Effects Removal Using Wavelet Correction and Particle Cl...
- Publication number 20220366620
- Publication date Nov 17, 2022
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DIFFRACTION PATTERN ACQUISITIONMETHOD FOR DIFFRACTION PA...
- Publication number 20210404978
- Publication date Dec 30, 2021
- FEI Company
- Tomás Vystavel
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING SYSTEM, NEUTRON RADIATION SOURCE, AND NEU...
- Publication number 20210396688
- Publication date Dec 23, 2021
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND DEFECT OBSERV...
- Publication number 20210109035
- Publication date Apr 15, 2021
- Hitachi High-Tech Corporation
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam System and Overlay Shift Amount Measurement M...
- Publication number 20210055098
- Publication date Feb 25, 2021
- HITACHI HIGH-TECH CORPORATION
- Takuma YAMAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200355633
- Publication date Nov 12, 2020
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
DARK FIELD TENSOR TOMOGRAPHY METHOD, SPECIMEN HOLDER AND DEVICE
- Publication number 20190331616
- Publication date Oct 31, 2019
- TECHNISCHE UNIVERSITAT MUNCHEN
- Florian Schaff
- G01 - MEASURING TESTING
Information Patent Application
HYBRID INSPECTION SYSTEM
- Publication number 20190227006
- Publication date Jul 25, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TRANSMISSION SPECTROMETER SYSTEM
- Publication number 20190145917
- Publication date May 16, 2019
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY TRANSMISSION SPECTROMETER SYSTEM
- Publication number 20170336334
- Publication date Nov 23, 2017
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF X-RAY NANO-RADIOGRAPHY AND NANOTOMOGRAPHY AND A DEVICE...
- Publication number 20170269009
- Publication date Sep 21, 2017
- ADVACAM s.r.o.
- Jan SOHAR
- G01 - MEASURING TESTING
Information Patent Application
NEUTRON DETECTOR AND METHOD FOR DETECTING NEUTRONS
- Publication number 20170184736
- Publication date Jun 29, 2017
- SYMETRICA LIMITED
- DAVID RAMSDEN
- G01 - MEASURING TESTING
Information Patent Application
A Method And System For Analyzing An Object By Diffractometry Using...
- Publication number 20170153189
- Publication date Jun 1, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Caroline PAULUS
- G01 - MEASURING TESTING
Information Patent Application
A Method Of Analyzing An Object In Two Stages Using A Transmission...
- Publication number 20170131224
- Publication date May 11, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Caroline PAULUS
- G01 - MEASURING TESTING
Information Patent Application
FOCUSED ION BEAM APPARATUS, METHOD FOR OBSERVING CROSS-SECTION OF S...
- Publication number 20140291508
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130082176
- Publication date Apr 4, 2013
- Yo YAMAMOTO
- G01 - MEASURING TESTING

combination of at least 2 measurements (transmission and scatter)

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Rotational X-ray inspection system and method

Patterned x-ray emitting target

Sample inspection system comprising a beam former to project a poly...

Screening system

X-ray examination device

Through-tubing, cased-hole sealed material density evaluation using...

Defect detection device, defect detection method, and defect observ...

Spot-size control in reflection-based and scatterometry-based X-ray...

Diffraction analysis device and method for full-field x-ray fluores...

Non-destructive inspection system comprising neutron radiation sour...

X-ray imaging apparatus and method

Edge phase effects removal using wavelet correction and particle cl...

Method of examining a sample using a charged particle microscope

Method for diffraction pattern acquisition

Combined scanning x-ray generator, composite inspection apparatus,...

Method and devices for determining metrology sites

X-ray imaging system and method of x-ray imaging

Dark field tensor tomography method, specimen holder and device

CT apparatus, CT imaging method, and storage medium

Hybrid inspection system

X-ray spectrometer system

X-ray inspection device

Method of analyzing an object in two stages using a transmission sp...

Method for characterizing a sample combining an X-ray characterizat...

Method and system for analyzing an object by diffractometry using a...

Detection system and method

X-ray transmission spectrometer system

Method and apparatus for estimation of heat value using dual energy...

Combined handheld XRF and OES systems and methods

Focused ion beam apparatus, method for observing cross-section of s...

Patents Applicationslast 30 patents

PATTERNED X-RAY EMITTING TARGET

METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...

INFORMATION PROCESSING SYSTEM AND PHASE ANALYSIS SYSTEM

Dynamic Data Driven Detector Tuning for Improved Investigation of S...

A SCREENING SYSTEM

PARAMETERIZING X-RAY SCATTERING MEASUREMENT USING SLICE-AND-IMAGE T...

SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION

CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD

Spot-size control in reflection-based and scatterometry-based X-ray...

X-RAY COMPUTED TOMOGRAPHY APPARATUS AND IMAGE GENERATION METHOD

PATTERNED X-RAY EMITTING TARGET

A SAMPLE INSPECTION SYSTEM

X-RAY EXAMINATION DEVICE

THROUGH-TUBING, CASED-HOLE SEALED MATERIAL DENSITY EVALUATION USING...

Edge Phase Effects Removal Using Wavelet Correction and Particle Cl...

METHOD FOR DIFFRACTION PATTERN ACQUISITIONMETHOD FOR DIFFRACTION PA...

NONDESTRUCTIVE INSPECTING SYSTEM, NEUTRON RADIATION SOURCE, AND NEU...

DEFECT DETECTION DEVICE, DEFECT DETECTION METHOD, AND DEFECT OBSERV...

Charged Particle Beam System and Overlay Shift Amount Measurement M...

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

DARK FIELD TENSOR TOMOGRAPHY METHOD, SPECIMEN HOLDER AND DEVICE

HYBRID INSPECTION SYSTEM

X-RAY TRANSMISSION SPECTROMETER SYSTEM

X-RAY TRANSMISSION SPECTROMETER SYSTEM

A METHOD OF X-RAY NANO-RADIOGRAPHY AND NANOTOMOGRAPHY AND A DEVICE...

NEUTRON DETECTOR AND METHOD FOR DETECTING NEUTRONS

A Method And System For Analyzing An Object By Diffractometry Using...

A Method Of Analyzing An Object In Two Stages Using A Transmission...

FOCUSED ION BEAM APPARATUS, METHOD FOR OBSERVING CROSS-SECTION OF S...

COMPOSITE CHARGED PARTICLE BEAM APPARATUS