Common path interferometry; Point diffraction interferometry

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G01J2009/0223

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2009/0223Common path interferometry; Point diffraction interferometry

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Patents Grantslast 30 patents

Information Patent Grant
Holographic wavefront sensing
- Patent number 10,634,562
- Issue date Apr 28, 2020
- Imec VZW
- Abdulkadir Yurt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Collimation evaluation device and collimation evaluation method
- Patent number 10,309,836
- Issue date Jun 4, 2019
- Hamamatsu Photonics K.K.
- Junji Okuma
- G01 - MEASURING TESTING
Information Patent Grant
Spatial-domain low-coherence quantitative phase microscopy
- Patent number 10,156,479
- Issue date Dec 18, 2018
- University of Pittsburgh of the Commonwealth System of Higher Education
- Yang Liu
- G02 - OPTICS
Information Patent Grant
Measuring device having ideal wavefront generator for detecting poi...
- Patent number 9,863,841
- Issue date Jan 9, 2018
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Xiangzhao Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for approximating an influence of an optical system on the s...
- Patent number 7,924,436
- Issue date Apr 12, 2011
- Carl Zeiss SMT GmbH
- Markus Mengel
- G01 - MEASURING TESTING
Information Patent Grant
Image amplifying, servo-loop controlled, point diffraction interometer
- Patent number 7,633,630
- Issue date Dec 15, 2009
- Northrop Grumman Corporation
- Peter Y. M. Livingston
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of in situ and ex situ measurement of spatial...
- Patent number 7,508,527
- Issue date Mar 24, 2009
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Liquid crystal devices especially for use in liquid crystal point d...
- Patent number 7,492,439
- Issue date Feb 17, 2009
- The University of Rochester
- Kenneth L. Marshall
- G01 - MEASURING TESTING
Information Patent Grant
Diffractive null corrector employing a spatial light modulator
- Patent number 7,443,514
- Issue date Oct 28, 2008
- ASML Holding N.V.
- Nora-Jean Harned
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for in situ and ex situ measurements of optica...
- Patent number 7,428,058
- Issue date Sep 23, 2008
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Vibration-insensitive interferometer
- Patent number 7,405,830
- Issue date Jul 29, 2008
- Korea Advanced Institute of Science and Technology (KAIST)
- Seung Woo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Common-path point-diffraction phase-shifting interferometer
- Patent number 7,304,746
- Issue date Dec 4, 2007
- Interphase Technologies, Inc.
- William J. Cottrell
- G01 - MEASURING TESTING
Information Patent Grant
Common-path point-diffraction phase-shifting interferometer
- Patent number 7,106,456
- Issue date Sep 12, 2006
- Interphase Technologies, Inc.
- William J. Cottrell
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring an optical imaging system, and d...
- Patent number 7,088,458
- Issue date Aug 8, 2006
- Carl Zeiss SMT AG
- Ulrich Wegmann
- G01 - MEASURING TESTING
Information Patent Grant
Common-path point-diffraction phase-shifting interferometer incorpo...
- Patent number 7,006,234
- Issue date Feb 28, 2006
- Interphase Technologies, Inc.
- William Jude Cottrell
- G01 - MEASURING TESTING
Information Patent Grant
Fourier transform spectroscope with quadrangular common path interf...
- Patent number 5,495,334
- Issue date Feb 27, 1996
- Research Development Corporation of Japan
- Toshiyuki Nagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic coherent light detector
- Patent number 5,245,408
- Issue date Sep 14, 1993
- The United States of America as represented by the Director, National Securit...
- Jonathan D. Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Real-time diffraction interferometer
- Patent number 4,624,569
- Issue date Nov 25, 1986
- Lockheed Missiles & Space Company, Inc.
- Osuk Y. Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Phase-measuring interferometer
- Patent number 4,575,247
- Issue date Mar 11, 1986
- Rockwell International Corporation
- Richard J. Tansey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COLLIMATION EVALUATION DEVICE AND COLLIMATION EVALUATION METHOD
- Publication number 20170199083
- Publication date Jul 13, 2017
- HAMAMATSU PHOTONICS K. K.
- Junji OKUMA
- G01 - MEASURING TESTING
Information Patent Application
SPATIAL-DOMAIN LOW-COHERENCE QUANTITATIVE PHASE MICROSCOPY
- Publication number 20150204728
- Publication date Jul 23, 2015
- University of Pittsburgh of the Commonwealth System of Higher Education
- Yang Liu
- G01 - MEASURING TESTING
Information Patent Application
Diffractive null corrector employing a spatial light modulator
- Publication number 20080079950
- Publication date Apr 3, 2008
- ASML Holding N.V.
- Nora-Jean Harned
- G01 - MEASURING TESTING
Information Patent Application
Image amplifying, servo-loop controlled, point diffraction interometer
- Publication number 20080037030
- Publication date Feb 14, 2008
- Peter Y. M. Livingston
- G01 - MEASURING TESTING
Information Patent Application
Method for approximating an influence of an optical system on the s...
- Publication number 20070182969
- Publication date Aug 9, 2007
- Markus Mengel
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for in situ and ex situ measurements of optica...
- Publication number 20060285124
- Publication date Dec 21, 2006
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Common-path point-diffraction phase-shifting interferometer
- Publication number 20060274321
- Publication date Dec 7, 2006
- William J. Cottrell
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method of in situ and ex situ measurement of spatial...
- Publication number 20060250620
- Publication date Nov 9, 2006
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Vibration-insensitive interferometer
- Publication number 20060039007
- Publication date Feb 23, 2006
- Seung Woo Kim
- G01 - MEASURING TESTING

Common path interferometry; Point diffraction interferometry

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Holographic wavefront sensing

Collimation evaluation device and collimation evaluation method

Spatial-domain low-coherence quantitative phase microscopy

Measuring device having ideal wavefront generator for detecting poi...

Method for approximating an influence of an optical system on the s...

Image amplifying, servo-loop controlled, point diffraction interometer

Apparatus and method of in situ and ex situ measurement of spatial...

Liquid crystal devices especially for use in liquid crystal point d...

Diffractive null corrector employing a spatial light modulator

Apparatus and method for in situ and ex situ measurements of optica...

Vibration-insensitive interferometer

Common-path point-diffraction phase-shifting interferometer

Common-path point-diffraction phase-shifting interferometer

Apparatus and method for measuring an optical imaging system, and d...

Common-path point-diffraction phase-shifting interferometer incorpo...

Fourier transform spectroscope with quadrangular common path interf...

Electro-optic coherent light detector

Real-time diffraction interferometer

Phase-measuring interferometer

Patents Applicationslast 30 patents

COLLIMATION EVALUATION DEVICE AND COLLIMATION EVALUATION METHOD

SPATIAL-DOMAIN LOW-COHERENCE QUANTITATIVE PHASE MICROSCOPY

Diffractive null corrector employing a spatial light modulator

Image amplifying, servo-loop controlled, point diffraction interometer

Method for approximating an influence of an optical system on the s...

Apparatus and method for in situ and ex situ measurements of optica...

Common-path point-diffraction phase-shifting interferometer

Apparatus and method of in situ and ex situ measurement of spatial...

Vibration-insensitive interferometer