comparative arrangements

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CPC
G01N2223/302

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/302comparative arrangements

Industries

Patents Grantslast 30 patents

Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Diffraction device and method for non-destructive testing of intern...
- Patent number 11,846,595
- Issue date Dec 19, 2023
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing a sample by material basis decomposition
- Patent number 11,808,565
- Issue date Nov 7, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Andrea Brambilla
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of comparative computed tomography (CT) for qua...
- Patent number 11,781,997
- Issue date Oct 10, 2023
- Jon M Frenn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Period-coded containers with a traceable material composition
- Patent number 11,713,268
- Issue date Aug 1, 2023
- Owens-Brockway Glass Container Inc.
- Philippe Floriot
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection device
- Patent number 11,598,729
- Issue date Mar 7, 2023
- ISHIDA CO., LTD.
- Kazuyuki Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for analysing and processing granular material
- Patent number 11,519,868
- Issue date Dec 6, 2022
- Sorterra Global Pty Ltd
- Jan Verboomen
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method for fine structure, and apparatus and program thereof
- Patent number 11,408,837
- Issue date Aug 9, 2022
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
System and method for high-resolution high contrast x-ray ghost dif...
- Patent number 11,402,342
- Issue date Aug 2, 2022
- Bar Ilan University
- Sharon Shwartz
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus and method for analyzing chemical state of battery material
- Patent number 11,378,530
- Issue date Jul 5, 2022
- Shimadzu Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of generating physical component qualification...
- Patent number 11,346,793
- Issue date May 31, 2022
- Jon M Frenn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Full beam metrology for x-ray scatterometry systems
- Patent number 11,313,816
- Issue date Apr 26, 2022
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sorting materials using pattern recognition, such as upgrading nick...
- Patent number 11,219,927
- Issue date Jan 11, 2022
- MineSense Technologies Ltd.
- Andrew Sherliker Bamber
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Characterizing a sample by material basis decomposition
- Patent number 10,969,220
- Issue date Apr 6, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Andrea Brambilla
- G01 - MEASURING TESTING
Information Patent Grant
Optical geometry calibration devices, systems, and related methods...
- Patent number 10,835,199
- Issue date Nov 17, 2020
- The University of North Carolina at Chapel Hill
- Pavel Chtcheprov
- G01 - MEASURING TESTING
Information Patent Grant
Encoding information in chemical concentrations
- Patent number 10,837,924
- Issue date Nov 17, 2020
- Hewlett-Packard Development Company, L.P.
- Paul Howard Mazurkiewicz
- G01 - MEASURING TESTING
Information Patent Grant
X-ray phase contrast imaging with fourier transform determination o...
- Patent number 10,801,971
- Issue date Oct 13, 2020
- SHIMADZU CORPORATION
- Naoki Morimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Full beam metrology for X-ray scatterometry systems
- Patent number 10,775,323
- Issue date Sep 15, 2020
- KLA-Tencor Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods of comparative computed tomography (CT) for qua...
- Patent number 10,718,724
- Issue date Jul 21, 2020
- Jon M Frenn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Evaluating system performance with sparse principal component analy...
- Patent number 10,656,102
- Issue date May 19, 2020
- Battelle Memorial Institute
- Joe Regensburger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Management system for X-ray detector and X-ray diagnosis apparatus
- Patent number 10,499,874
- Issue date Dec 10, 2019
- Canon Medical Systems Corporation
- Seiichirou Nagai
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray diffractometer with multilayer reflection-type monochromator
- Patent number 10,436,723
- Issue date Oct 8, 2019
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
System and method for real-time isotope identification
- Patent number 10,369,521
- Issue date Aug 6, 2019
- Thermo Finnigan LLC.
- Scott R. Kronewitter
- G01 - MEASURING TESTING
Information Patent Grant
Sorting materials using pattern recognition, such as upgrading nick...
- Patent number 10,259,015
- Issue date Apr 16, 2019
- MineSense Technologies Ltd.
- Andrew Sherliker Bamber
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
System for detecting counterfeit goods and method of operating the...
- Patent number 10,215,879
- Issue date Feb 26, 2019
- Morpho Detection, LLC
- Geoffrey Harding
- G01 - MEASURING TESTING
Information Patent Grant
Radiometric measuring arrangement and method for detection of accre...
- Patent number 10,101,192
- Issue date Oct 16, 2018
- ENDRESS+HAUSER SE+CO.KG
- Dirk Glaser
- G01 - MEASURING TESTING
Information Patent Grant
Scanning method
- Patent number 10,067,076
- Issue date Sep 4, 2018
- Johnson Matthey Public Limited Company
- Emanuele Ronchi
- G01 - MEASURING TESTING
Information Patent Grant
Using 3D computed tomography to analyze shaped charge explosives
- Patent number 10,001,447
- Issue date Jun 19, 2018
- Halliburton Energy Services, Inc.
- John Norris Smith
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device, display device, and defect classification...
- Patent number 9,964,500
- Issue date May 8, 2018
- Hitachi High-Technologies Corporation
- Hisashi Hatano
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for determination of the half value layer of...
- Patent number 9,008,264
- Issue date Apr 14, 2015
- The Regents of the University of California
- John M. Boone
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
ELECTROMAGNETIC IMAGING CALIBRATION METHOD
- Publication number 20240402099
- Publication date Dec 5, 2024
- EMvision Medical Devices Ltd
- Amin ABBOSH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND PROCESS FOR DETERMINING THE WATER EQUIVALENT CONTENT OF...
- Publication number 20240272092
- Publication date Aug 15, 2024
- FINAPP S.r.l.
- Luca STEVANATO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
- Publication number 20230366838
- Publication date Nov 16, 2023
- Anritsu Corporation
- Masaru ISHIDA
- G01 - MEASURING TESTING
Information Patent Application
IMPROVEMENTS IN GAMMA-ACTIVATION ANALYSIS MEASUREMENTS
- Publication number 20230273135
- Publication date Aug 31, 2023
- Chrysos Corporation Limited
- James Tickner
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Full Beam Metrology For X-Ray Scatterometry Systems
- Publication number 20220268714
- Publication date Aug 25, 2022
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS OF COMPARATIVE COMPUTED TOMOGRAPHY (CT) FOR QUA...
- Publication number 20220268712
- Publication date Aug 25, 2022
- Jon M. Frenn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIFFRACTION DEVICE AND METHOD FOR NON-DESTRUCTIVE TESTING OF INTERN...
- Publication number 20220074877
- Publication date Mar 10, 2022
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin ZHENG
- G01 - MEASURING TESTING
Information Patent Application
INDUSTRIAL X-RAY WORKPIECE MEASURING SYSTEM AND METHOD FOR OPERATIN...
- Publication number 20220050067
- Publication date Feb 17, 2022
- Intom GmbH
- Severin Ebner
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION
- Publication number 20210199429
- Publication date Jul 1, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Andrea BRAMBILLA
- G01 - MEASURING TESTING
Information Patent Application
Period-Coded Containers with a Traceable Material Composition
- Publication number 20200378935
- Publication date Dec 3, 2020
- Owens-Brockway Glass Container Inc.
- Philippe Floriot
- G01 - MEASURING TESTING
Information Patent Application
Full Beam Metrology For X-Ray Scatterometry Systems
- Publication number 20200300790
- Publication date Sep 24, 2020
- KLA Corporation
- Antonio Arion Gellineau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS OF GENERATING PHYSICAL COMPONENT QUALIFICATION...
- Publication number 20200278305
- Publication date Sep 3, 2020
- Jon M. Frenn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS OF COMPARATIVE COMPUTED TOMOGRAPHY (CT) FOR QUA...
- Publication number 20200141883
- Publication date May 7, 2020
- Jon M. Frenn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20200041423
- Publication date Feb 6, 2020
- Ishida Co., Ltd.
- Kazuyuki SUGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
SORTING MATERIALS USING PATTERN RECOGNITION, SUCH AS UPGRADING NICK...
- Publication number 20190270122
- Publication date Sep 5, 2019
- MineSense Technologies Ltd.
- Andrew Sherliker Bamber
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Device, Display Device, and Defect Classification...
- Publication number 20170328846
- Publication date Nov 16, 2017
- Hitachi High-Technologies Corporation
- Hisashi HATANO
- G01 - MEASURING TESTING
Information Patent Application
EVALUATING SYSTEM PERFORMANCE WITH SPARSE PRINCIPAL COMPONENT ANALY...
- Publication number 20170115238
- Publication date Apr 27, 2017
- Battelle Memorial Institute
- Joe Regensburger
- G01 - MEASURING TESTING
Information Patent Application
SORTING MATERIALS USING PATTERN RECOGNITION, SUCH AS UPGRADING NICK...
- Publication number 20170028443
- Publication date Feb 2, 2017
- MineSense Technologies Ltd.
- Andrew Sherliker Bamber
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
USING 3D COMPUTED TOMOGRAPHY TO ANALYZE SHAPED CHARGE EXPLOSIVES
- Publication number 20160370305
- Publication date Dec 22, 2016
- Halliburton Energy Services, Inc.
- John Norris Smith
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION
- Publication number 20160363442
- Publication date Dec 15, 2016
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Andrea BRAMBILLA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR DETECTING COUNTERFEIT GOODS AND METHOD OF OPERATING THE...
- Publication number 20160327660
- Publication date Nov 10, 2016
- Morpho Detection, LLC
- Geoffrey Harding
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR DETERMINATION OF THE HALF VALUE LAYER OF...
- Publication number 20130016808
- Publication date Jan 17, 2013
- The Regents of the University of California
- John M. Boone
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE IDENTIFICATION METHOD AND NONDESTRUCTIVE IDENTIFICAT...
- Publication number 20100119037
- Publication date May 13, 2010
- Kabushiki Kaisha Toshiba
- Masayo Kato
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Tilted Illumination Observation
- Publication number 20100033560
- Publication date Feb 11, 2010
- Hitachi High-Technologies Corporation
- Takeshi Kawasaki
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS AND METHOD WITH AN X-RAY INTERFEROMETER
- Publication number 20080019482
- Publication date Jan 24, 2008
- Akio Yoneyama
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

comparative arrangements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray collimator and related X-ray inspection apparatus

Diffraction device and method for non-destructive testing of intern...

Characterizing a sample by material basis decomposition

Systems and methods of comparative computed tomography (CT) for qua...

Period-coded containers with a traceable material composition

X-ray inspection device

Apparatus and method for analysing and processing granular material

Analysis method for fine structure, and apparatus and program thereof

System and method for high-resolution high contrast x-ray ghost dif...

Apparatus and method for analyzing chemical state of battery material

Systems and methods of generating physical component qualification...

Full beam metrology for x-ray scatterometry systems

Sorting materials using pattern recognition, such as upgrading nick...

Characterizing a sample by material basis decomposition

Optical geometry calibration devices, systems, and related methods...

Encoding information in chemical concentrations

X-ray phase contrast imaging with fourier transform determination o...

Full beam metrology for X-ray scatterometry systems

Systems and methods of comparative computed tomography (CT) for qua...

Evaluating system performance with sparse principal component analy...

Management system for X-ray detector and X-ray diagnosis apparatus

X-ray diffractometer with multilayer reflection-type monochromator

System and method for real-time isotope identification

Sorting materials using pattern recognition, such as upgrading nick...

System for detecting counterfeit goods and method of operating the...

Radiometric measuring arrangement and method for detection of accre...

Scanning method

Using 3D computed tomography to analyze shaped charge explosives

Defect inspection device, display device, and defect classification...

Apparatus and methods for determination of the half value layer of...

Patents Applicationslast 30 patents

ELECTROMAGNETIC IMAGING CALIBRATION METHOD

SYSTEM AND PROCESS FOR DETERMINING THE WATER EQUIVALENT CONTENT OF...

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD

IMPROVEMENTS IN GAMMA-ACTIVATION ANALYSIS MEASUREMENTS

Full Beam Metrology For X-Ray Scatterometry Systems

SYSTEMS AND METHODS OF COMPARATIVE COMPUTED TOMOGRAPHY (CT) FOR QUA...

DIFFRACTION DEVICE AND METHOD FOR NON-DESTRUCTIVE TESTING OF INTERN...

INDUSTRIAL X-RAY WORKPIECE MEASURING SYSTEM AND METHOD FOR OPERATIN...

CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION

Period-Coded Containers with a Traceable Material Composition

Full Beam Metrology For X-Ray Scatterometry Systems

SYSTEMS AND METHODS OF GENERATING PHYSICAL COMPONENT QUALIFICATION...

SYSTEMS AND METHODS OF COMPARATIVE COMPUTED TOMOGRAPHY (CT) FOR QUA...

X-RAY INSPECTION DEVICE

SORTING MATERIALS USING PATTERN RECOGNITION, SUCH AS UPGRADING NICK...

Defect Inspection Device, Display Device, and Defect Classification...

EVALUATING SYSTEM PERFORMANCE WITH SPARSE PRINCIPAL COMPONENT ANALY...

SORTING MATERIALS USING PATTERN RECOGNITION, SUCH AS UPGRADING NICK...

USING 3D COMPUTED TOMOGRAPHY TO ANALYZE SHAPED CHARGE EXPLOSIVES

CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION

SYSTEM FOR DETECTING COUNTERFEIT GOODS AND METHOD OF OPERATING THE...

APPARATUS AND METHODS FOR DETERMINATION OF THE HALF VALUE LAYER OF...

NONDESTRUCTIVE IDENTIFICATION METHOD AND NONDESTRUCTIVE IDENTIFICAT...

Method and Apparatus of Tilted Illumination Observation

X-RAY IMAGING APPARATUS AND METHOD WITH AN X-RAY INTERFEROMETER