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Comparing spectra of two light sources
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G01J2003/003
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/003
Comparing spectra of two light sources
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last 30 patents
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Patent Grant
Observation assisting device, information processing method, and pr...
Patent number
11,719,920
Issue date
Aug 8, 2023
Leica Microsystems (Schweiz) AG
Kyosuke Kamada
G02 - OPTICS
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Patent Grant
Observation assisting device, information processing method, and pr...
Patent number
10,852,517
Issue date
Dec 1, 2020
National University Corporation Asahikawa Medical University
Kyosuke Kamada
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
WAVELENGTH MEASUREMENT APPARATUS, NARROWED-LINE LASER APPARATUS, AN...
Publication number
20240044711
Publication date
Feb 8, 2024
Gigaphoton Inc.
Takuma YAMANAKA
G01 - MEASURING TESTING
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Patent Application
OBSERVATION ASSISTING DEVICE, INFORMATION PROCESSING METHOD, AND PR...
Publication number
20210109333
Publication date
Apr 15, 2021
National University Corporation ASAHIKAWA MEDICAL UNIVERSITY
Kyosuke KAMADA
G01 - MEASURING TESTING
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Patent Application
ACTIVE ILLUMINATION 2D AND/OR 3D IMAGING DEVICE FOR AGRICULTURE
Publication number
20200182697
Publication date
Jun 11, 2020
GroView Pty Ltd
Ran Asher Peleg
G01 - MEASURING TESTING