Comparison or superposition of transmission images Moirè

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H01J2237/2617

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2617Comparison or superposition of transmission images Moirè

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for acquiring 3D diffraction data
- Patent number 11,456,149
- Issue date Sep 27, 2022
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffraction pattern detection in a transmission charged particle mi...
- Patent number 11,004,655
- Issue date May 11, 2021
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of image acquisition and electron microscope
- Patent number 10,923,314
- Issue date Feb 16, 2021
- Jeol Ltd.
- Akiho Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reference sample with inclined support base, method for evaluating...
- Patent number 10,847,342
- Issue date Nov 24, 2020
- KWANSEI GAKUIN EDUCATIONAL FOUNDATION
- Tadaaki Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
System and method of analyzing a crystal defect
- Patent number 10,727,025
- Issue date Jul 28, 2020
- Samsung Electronics Co., Ltd.
- Sung-Bo Shim
- G01 - MEASURING TESTING
Information Patent Grant
Reference sample with inclined support base, method for evaluating...
- Patent number 10,699,873
- Issue date Jun 30, 2020
- Kwansei Gakuin Educational Foundation
- Tadaaki Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for computing amount of drift and charged particl...
- Patent number 9,773,315
- Issue date Sep 26, 2017
- Jeol Ltd.
- Masaki Morita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for electron microscope with multiple cathodes
- Patent number 9,464,998
- Issue date Oct 11, 2016
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING
Information Patent Grant
Overlay measuring method and system, and method of manufacturing se...
- Patent number 9,455,206
- Issue date Sep 27, 2016
- Samsung Electronics Co., Ltd.
- Seong-Jin Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and electron microscope for measuring the similarity of two-...
- Patent number 8,351,710
- Issue date Jan 8, 2013
- Forschungszentrum Juelich GmbH
- Andreas Thust
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image forming method and electron microscope
- Patent number 7,838,834
- Issue date Nov 23, 2010
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Grid for transmission electron microscopy tomography and method of...
- Patent number 7,820,982
- Issue date Oct 26, 2010
- Korea Basic Science Institute
- Won Jin Moon
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam apparatus and method for production of its specimen c...
- Patent number 7,566,892
- Issue date Jul 28, 2009
- Hitachi High-Technologies Corporation
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and method for production of its specimen c...
- Patent number 7,435,958
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and method for production of its specimen c...
- Patent number 7,205,550
- Issue date Apr 17, 2007
- Hitachi High-Technologies Corporation
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and method for production of its specimen c...
- Patent number 7,030,376
- Issue date Apr 18, 2006
- Hitachi High-Technologies Corporation
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional structure verification supporting apparatus, thre...
- Patent number 6,828,555
- Issue date Dec 7, 2004
- Center for Advanced Science and Technology Incubation, LTD
- Eisaku Katayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect observing electron microscope
- Patent number 5,744,800
- Issue date Apr 28, 1998
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION APPARATUS, AND METHOD FOR ACQUIRING ALIGNMENT AM...
- Publication number 20230145411
- Publication date May 11, 2023
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING 3D DIFFRACTION DATA
- Publication number 20210305010
- Publication date Sep 30, 2021
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REFERENCE SAMPLE WITH INCLINED SUPPORT BASE, METHOD FOR EVALUATING...
- Publication number 20200279716
- Publication date Sep 3, 2020
- KWANSEI GAKUIN EDUCATIONAL FOUNDATION
- Tadaaki Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFRACTION PATTERN DETECTION IN A TRANSMISSION CHARGED PARTICLE MI...
- Publication number 20200144022
- Publication date May 7, 2020
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD OF ANALYZING A CRYSTAL DEFECT
- Publication number 20200020506
- Publication date Jan 16, 2020
- Samsung Electronics Co., Ltd.
- Sung-Bo Shim
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE SAMPLE WITH INCLINED SUPPORT BASE, METHOD FOR EVALUATING...
- Publication number 20190148107
- Publication date May 16, 2019
- KWANSEI GAKUIN EDUCATIONAL FOUNDATION
- Tadaaki Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN HOLDER ASSEMBLY
- Publication number 20110253905
- Publication date Oct 20, 2011
- University of Sheffield
- Guenter Moebus
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD AND ELECTRON MICROSCOPE FOR MEASURING THE SIMILARITY OF TWO-...
- Publication number 20090268969
- Publication date Oct 29, 2009
- FORSCHUNGSZENTRUM JUELICH GMBH
- Andreas Thust
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MOON GRID FOR TRANSMISSION ELECTRON MICROSCOPY TOMOGRAPHY AND METHO...
- Publication number 20090065708
- Publication date Mar 12, 2009
- KOREA BASIC SCIENCE INSTITUTE
- Won Jin MOON
- G01 - MEASURING TESTING
Information Patent Application
Image Forming Method and Electron Microscope
- Publication number 20080224040
- Publication date Sep 18, 2008
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus and Method for Production of Its Specimen C...
- Publication number 20080048118
- Publication date Feb 28, 2008
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus and method for production of its specimen c...
- Publication number 20060232445
- Publication date Oct 19, 2006
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus and method for production of its specimen c...
- Publication number 20060219946
- Publication date Oct 5, 2006
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus and method for production of its specimen c...
- Publication number 20040135082
- Publication date Jul 15, 2004
- Tsuyoshi Inanobe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Three-dimensional structure verification supporting apparatus, thre...
- Publication number 20040069946
- Publication date Apr 15, 2004
- Eisaku Katayama
- H01 - BASIC ELECTRIC ELEMENTS

Comparison or superposition of transmission images Moirè

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and systems for acquiring 3D diffraction data

Diffraction pattern detection in a transmission charged particle mi...

Method of image acquisition and electron microscope

Reference sample with inclined support base, method for evaluating...

System and method of analyzing a crystal defect

Reference sample with inclined support base, method for evaluating...

Device and method for computing amount of drift and charged particl...

Method and system for electron microscope with multiple cathodes

Overlay measuring method and system, and method of manufacturing se...

Method and electron microscope for measuring the similarity of two-...

Image forming method and electron microscope

Grid for transmission electron microscopy tomography and method of...

Electron beam apparatus and method for production of its specimen c...

Electron beam apparatus and method for production of its specimen c...

Electron beam apparatus and method for production of its specimen c...

Electron beam apparatus and method for production of its specimen c...

Three-dimensional structure verification supporting apparatus, thre...

Defect observing electron microscope

Patents Applicationslast 30 patents

PATTERN INSPECTION APPARATUS, AND METHOD FOR ACQUIRING ALIGNMENT AM...

METHODS AND SYSTEMS FOR ACQUIRING 3D DIFFRACTION DATA

REFERENCE SAMPLE WITH INCLINED SUPPORT BASE, METHOD FOR EVALUATING...

DIFFRACTION PATTERN DETECTION IN A TRANSMISSION CHARGED PARTICLE MI...

SYSTEM AND METHOD OF ANALYZING A CRYSTAL DEFECT

REFERENCE SAMPLE WITH INCLINED SUPPORT BASE, METHOD FOR EVALUATING...

SPECIMEN HOLDER ASSEMBLY

METHOD AND ELECTRON MICROSCOPE FOR MEASURING THE SIMILARITY OF TWO-...

MOON GRID FOR TRANSMISSION ELECTRON MICROSCOPY TOMOGRAPHY AND METHO...

Image Forming Method and Electron Microscope

Electron Beam Apparatus and Method for Production of Its Specimen C...

Electron beam apparatus and method for production of its specimen c...

Electron beam apparatus and method for production of its specimen c...

Electron beam apparatus and method for production of its specimen c...

Three-dimensional structure verification supporting apparatus, thre...