TREA

Compensating for variations in ambient conditions

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  • CPC
  • G01R11/18
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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R11/00Electromechanical arrangements for measuring time integral of electric power i.e. electric energy or current

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G01R11/18Compensating for variations in ambient conditions
Industries

Patents Grantslast 30 patents

  • Information Patent Grant

    Electronic component handling apparatus and electronic component te...
    • Patent number 10,514,416
    • Issue date Dec 24, 2019
    • Advantest Corporation
    • Katsuhiko Watanabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Attachment of leads having low thermoelectric errors
    • Patent number 9,470,724
    • Issue date Oct 18, 2016
    • Sendyne Corporation
    • Victor Marten
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor device and method of manufacture and use
    • Patent number 9,453,858
    • Issue date Sep 27, 2016
    • Current Technologies, L.L.C.
    • Lowell G. Seal
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electronic component, in particular current sensor
    • Patent number 9,435,832
    • Issue date Sep 6, 2016
    • Isabellenhuette Heusler GmbH & Co. KG
    • Ullrich Hetzler
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electronic component, in particular current sensor
    • Patent number 9,255,946
    • Issue date Feb 9, 2016
    • Isabellenhuette Heusler GmbH & Co. KG
    • Ullrich Hetzler
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method and apparatus for temperature adjusted control of BATFET cur...
    • Patent number 9,000,750
    • Issue date Apr 7, 2015
    • QUALCOMM Incorporated
    • Baiying Yu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    System and method for digitally compensating frequency and temperat...
    • Patent number 6,618,684
    • Issue date Sep 9, 2003
    • Elster Electricity, LLC
    • Edward John Beroset
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Ambient light filter
    • Patent number 5,874,731
    • Issue date Feb 23, 1999
    • Schlumberger Industries, Inc.
    • Scott C. Swanson
    • G08 - SIGNALLING
  • Information Patent Grant

    Temperature compensated magnetic damping assembly for induction meters
    • Patent number 4,449,094
    • Issue date May 15, 1984
    • Westinghouse Electric Corp.
    • John A. MacFadden
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Brake magnet for watt-hour meters
    • Patent number 4,386,316
    • Issue date May 31, 1983
    • Max Baermann
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Magnetic damping system having low induction magnet
    • Patent number 4,238,729
    • Issue date Dec 9, 1980
    • Westinghouse Electric Corp.
    • John A. MacFadden
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Temperature compensated magnetic bearing system for a watthour meter
    • Patent number 4,196,946
    • Issue date Apr 8, 1980
    • Westinghouse Electric Corp.
    • George W. Lipscomb
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    2968548
    • Patent number 2,968,548
    • Issue date Jan 17, 1961
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2924759
    • Patent number 2,924,759
    • Issue date Feb 9, 1960
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2900603
    • Patent number 2,900,603
    • Issue date Aug 18, 1959
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2858508
    • Patent number 2,858,508
    • Issue date Oct 28, 1958
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2849680
    • Patent number 2,849,680
    • Issue date Aug 26, 1958
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2720604
    • Patent number 2,720,604
    • Issue date Oct 11, 1955
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2645756
    • Patent number 2,645,756
    • Issue date Jul 14, 1953
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2572639
    • Patent number 2,572,639
    • Issue date Oct 23, 1951
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2527237
    • Patent number 2,527,237
    • Issue date Oct 24, 1950
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2478625
    • Patent number 2,478,625
    • Issue date Aug 9, 1949
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2454201
    • Patent number 2,454,201
    • Issue date Nov 16, 1948
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2371299
    • Patent number 2,371,299
    • Issue date Mar 13, 1945
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2365588
    • Patent number 2,365,588
    • Issue date Dec 19, 1944
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2363284
    • Patent number 2,363,284
    • Issue date Nov 21, 1944
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2328728
    • Patent number 2,328,728
    • Issue date Sep 7, 1943
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2321437
    • Patent number 2,321,437
    • Issue date Jun 8, 1943
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2315579
    • Patent number 2,315,579
    • Issue date Apr 6, 1943
    • G01 - MEASURING TESTING
  • Information Patent Grant

    2309414
    • Patent number 2,309,414
    • Issue date Jan 26, 1943
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents