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Compensating own radiation in apparatus
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G01N2201/12792
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G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
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G01N2201/12792
Compensating own radiation in apparatus
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Patents Grants
last 30 patents
Information
Patent Grant
Devices, systems and methods for sorting and labelling food products
Patent number
12,162,042
Issue date
Dec 10, 2024
P & P OPTICA INC.
Romuald Pawluczyk
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Swept frequency fluorometer
Patent number
12,061,149
Issue date
Aug 13, 2024
YSI, Inc.
Kevin Flanagan
G01 - MEASURING TESTING
Information
Patent Grant
Extended solid angle turbidity sensor
Patent number
11,860,096
Issue date
Jan 2, 2024
YSI, Inc.
Kevin Flanagan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Spatial gradient-based fluorometer
Patent number
11,604,143
Issue date
Mar 14, 2023
YSI, Inc.
Kevin Flanagan
G01 - MEASURING TESTING
Information
Patent Grant
System and apparatus for point-of-care diagnostics
Patent number
11,131,666
Issue date
Sep 28, 2021
Quidel Corporation
Richard L. Egan
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
System and apparatus for point-of-care diagnostics
Patent number
10,281,462
Issue date
May 7, 2019
Quidel Corporation
Richard L. Egan
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Aqueous solution constituent analyzer
Patent number
9,983,122
Issue date
May 29, 2018
Sea-Bird Electronics, Inc.
Ronnie Van Dommelen
G01 - MEASURING TESTING
Information
Patent Grant
Temperature calibration methods and apparatus for optical absorptio...
Patent number
9,285,306
Issue date
Mar 15, 2016
GAS SENSING SOLUTIONS LTD.
Calum John MacGregor
G01 - MEASURING TESTING
Information
Patent Grant
System and apparatus for point-of-care diagnostics
Patent number
9,207,181
Issue date
Dec 8, 2015
Quidel Corporation
Richard L. Egan
G01 - MEASURING TESTING
Information
Patent Grant
On-site analysis system with central processor and method of analyzing
Patent number
8,010,309
Issue date
Aug 30, 2011
Cognis IP Management GmbH
Alan P. Lundstedt
G01 - MEASURING TESTING
Information
Patent Grant
Portable device and method for on-site detection and quantification...
Patent number
7,843,556
Issue date
Nov 30, 2010
NarTest AS
Sergey Babichenko
G01 - MEASURING TESTING
Information
Patent Grant
Gas sensors and methods of controlling light sources therefor
Patent number
7,835,004
Issue date
Nov 16, 2010
Mine Safety Appliances Company
Robert E. Uber
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Chemical vapor sensor
Patent number
7,700,044
Issue date
Apr 20, 2010
Delphi Technologies, Inc.
David K. Lambert
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Real-time calibration for downhole spectrometer
Patent number
7,609,380
Issue date
Oct 27, 2009
Schlumberger Technology Corporation
Stephane Vannuffelen
G01 - MEASURING TESTING
Information
Patent Grant
Light source wavelength correction
Patent number
7,254,503
Issue date
Aug 7, 2007
Siemens Medical Solutions Diagnostics
Willis E. Howard, III
G01 - MEASURING TESTING
Information
Patent Grant
On-site analysis system with central processor and method of analyzing
Patent number
7,194,369
Issue date
Mar 20, 2007
Cognis Corporation
Alan P. Lundstedt
G01 - MEASURING TESTING
Information
Patent Grant
Tray assembly for optical inspection apparatus
Patent number
7,118,713
Issue date
Oct 10, 2006
Bayer HealthCare LLC
David A. Brock
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for eliminating and compensating thermal trans...
Patent number
7,069,768
Issue date
Jul 4, 2006
Instrumentarium Corp.
Kurt Weckström
G01 - MEASURING TESTING
Information
Patent Grant
Spectrophotometer
Patent number
4,577,966
Issue date
Mar 25, 1986
Japan Spectroscopic Co., Ltd.
Yoshiro Fukasawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PHOTONIC INTEGRATED CHIP
Publication number
20230204496
Publication date
Jun 29, 2023
ROCKLEY PHOTONICS LIMITED
Benjamin VER STEEG
G01 - MEASURING TESTING
Information
Patent Application
DEVICES, SYSTEMS AND METHODS FOR SORTING AND LABELLING FOOD PRODUCTS
Publication number
20220323997
Publication date
Oct 13, 2022
P & P OPTICA INC.
Romuald PAWLUCZYK
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
SYSTEM AND APPARATUS FOR POINT-OF-CARE DIAGNOSTICS
Publication number
20210389316
Publication date
Dec 16, 2021
Quidel Corporation
Richard L. Egan
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND APPARATUS FOR POINT-OF-CARE DIAGNOSTICS
Publication number
20190271695
Publication date
Sep 5, 2019
Quidel Corporation
Richard L. Egan
G01 - MEASURING TESTING
Information
Patent Application
Automatic Analytical Apparatus
Publication number
20170131306
Publication date
May 11, 2017
Hitachi High-Technologies Corporation
Shinji TARUMI
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE CALIBRATION METHODS AND APPARATUS FOR OPTICAL ABSORPTIO...
Publication number
20130301052
Publication date
Nov 14, 2013
Calum John MacGregor
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND APPARATUS FOR POINT-OF-CARE DIAGNOSTICS
Publication number
20130230844
Publication date
Sep 5, 2013
Quidel Corporation
Richard L. Egan
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASURING UNIT AND METHOD FOR CARRYING OUT A REFLECTIVE MEA...
Publication number
20110122411
Publication date
May 26, 2011
77 ELEKTRONIKA MVSZERIPARI KFT.
Karoly Kunstar
G01 - MEASURING TESTING
Information
Patent Application
ON-SITE ANALYSIS SYSTEM WITH CENTRAL PROCESSOR AND METHOD OF ANALYZING
Publication number
20110054864
Publication date
Mar 3, 2011
COGNIS IP MANAGEMENT GMBH
ALAN P. LUNDSTEDT
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR READING TEST STRIPS
Publication number
20090155921
Publication date
Jun 18, 2009
ARBOR VITA CORPORATION
Peter S. Lu
G01 - MEASURING TESTING
Information
Patent Application
Gas sensors and methods of controlling light sources therefor
Publication number
20090009769
Publication date
Jan 8, 2009
Robert E. Uber
G01 - MEASURING TESTING
Information
Patent Application
Portable Device and Method for On-Site Detection and Quantification...
Publication number
20080192249
Publication date
Aug 14, 2008
AS LASER DIAGNOSTIC INSTRUMENTS INTERNATIONAL, INC.
Sergey Babichenko
G01 - MEASURING TESTING
Information
Patent Application
On-site analysis system with central processor and method of analyzing
Publication number
20070143037
Publication date
Jun 21, 2007
Alan P. Lundstedt
G01 - MEASURING TESTING
Information
Patent Application
Real-time calibration for downhole spectrometer
Publication number
20070109537
Publication date
May 17, 2007
Stephane Vannuffelen
G01 - MEASURING TESTING
Information
Patent Application
Compact analyzer for dry biochemical analysis of blood samples
Publication number
20070077173
Publication date
Apr 5, 2007
Francois Melet
G01 - MEASURING TESTING
Information
Patent Application
Chemical vapor sensor
Publication number
20060154377
Publication date
Jul 13, 2006
David K. Lambert
B60 - VEHICLES IN GENERAL
Information
Patent Application
Light source wavelength correction
Publication number
20060139649
Publication date
Jun 29, 2006
Willis E Howard
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Light modulated microarray reader and methods relating thereto
Publication number
20050269523
Publication date
Dec 8, 2005
Calum E. MacAulay
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for eliminating and compensating thermal trans...
Publication number
20050268690
Publication date
Dec 8, 2005
Kurt Weckstrom
G01 - MEASURING TESTING
Information
Patent Application
Tray assembly for optical inspection apparatus
Publication number
20040247491
Publication date
Dec 9, 2004
David A. Brock
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
On-site analysis system with central processor and method of analyzing
Publication number
20030154044
Publication date
Aug 14, 2003
Alan P. Lundstedt
G01 - MEASURING TESTING
Information
Patent Application
Extensible modular communication executive with active message queu...
Publication number
20030135547
Publication date
Jul 17, 2003
J. Thomas Kent
G01 - MEASURING TESTING