comprising means

Industry

CPC
G01R33/0011

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

Current Industry

G01R33/0011comprising means

Industries

Patents Grantslast 30 patents

Information Patent Grant
Device, system and method for detecting leakage current for tractio...
- Patent number 12,145,636
- Issue date Nov 19, 2024
- Hatch Ltd.
- Patrick Henry McGinn
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Magnetic field sensor with overcurrent detection
- Patent number 12,146,928
- Issue date Nov 19, 2024
- Analog Devices International Unlimited Company
- Jochen Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device with sensor and current converter
- Patent number 12,117,505
- Issue date Oct 15, 2024
- Robert Bosch GmbH
- Ralf Kienzle
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field measurement device, magnetic field measurement metho...
- Patent number 12,082,915
- Issue date Sep 10, 2024
- Asahi Kasei Microdevices Corporation
- Shigeki Okatake
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Magnetic sensor, torque sensing device and steering apparatus
- Patent number 12,072,395
- Issue date Aug 27, 2024
- Denso Corporation
- Ken Tanaka
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Grant
Magnetic field generator for a magnetic field measurement system
- Patent number 12,007,453
- Issue date Jun 11, 2024
- HI LLC
- Jamu Alford
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Angle sensor system
- Patent number 12,007,236
- Issue date Jun 11, 2024
- TDK Corporation
- Yongfu Cai
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field measuring apparatus
- Patent number 11,927,646
- Issue date Mar 12, 2024
- Asahi Kasei Microdevices Corporation
- Shigeki Okatake
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor and its manufacturing method
- Patent number 11,899,079
- Issue date Feb 13, 2024
- TDK Corporation
- Makoto Kameno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with passivated magnetic concentrator
- Patent number 11,864,471
- Issue date Jan 2, 2024
- Texas Instruments Incorporated
- Rafael Jose Lizares Guevara
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor packaging structure with hysteresis coil
- Patent number 11,852,698
- Issue date Dec 26, 2023
- MultiDimension Technology Co., Ltd.
- James Geza Deak
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor integrated circuit with integral ferromagneti...
- Patent number 11,828,819
- Issue date Nov 28, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Ravi Vig
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic sensor and torque sensing device having the same
- Patent number 11,808,648
- Issue date Nov 7, 2023
- Denso Corporation
- Ken Tanaka
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Grant
Systems and methods for submucosal tissue separation
- Patent number 11,793,539
- Issue date Oct 24, 2023
- Boston Scientific Scimed, Inc.
- Shawn Ryan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field measuring apparatus, magnetic field measuring method...
- Patent number 11,774,518
- Issue date Oct 3, 2023
- Asahi Kasei Microdevices Corporation
- Shigeki Okatake
- G01 - MEASURING TESTING
Information Patent Grant
System, method and device for fluid conduit inspection
- Patent number 11,773,716
- Issue date Oct 3, 2023
- INGU Solutions Inc.
- Zachary Shand
- G01 - MEASURING TESTING
Information Patent Grant
Nanowire characterization and identification
- Patent number 11,748,583
- Issue date Sep 5, 2023
- Regents of The University of Minnesota
- Rhonda R. Franklin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for measuring current output by a photodetector...
- Patent number 11,733,320
- Issue date Aug 22, 2023
- HI LLC
- Stephen Garber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing an integrated magnetoresistive sensor
- Patent number 11,737,369
- Issue date Aug 22, 2023
- STMicroelectronics S.r.l.
- Dario Paci
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic sensor and inspection device
- Patent number 11,726,149
- Issue date Aug 15, 2023
- Kabushiki Kaisha Toshiba
- Akira Kikitsu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field concentrating and or guiding devices and methods
- Patent number 11,703,552
- Issue date Jul 18, 2023
- Varian medical Systems Particle Therapy GmbH & Co. KG
- Arno Godeke
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for concentrating alkali metal within a vapor c...
- Patent number 11,698,419
- Issue date Jul 11, 2023
- HI LLC
- Stephen Garber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field measurement apparatus, magnetic field measurement me...
- Patent number 11,668,771
- Issue date Jun 6, 2023
- Asahi Kasei Microdevices Corporation
- Takenobu Nakamura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Semiconductor device with embedded magnetic flux concentrator
- Patent number 11,668,766
- Issue date Jun 6, 2023
- Melexis Technologies SA
- Appolonius Jacobus Van Der Wiel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field measurement device, magnetic field measurement metho...
- Patent number 11,668,772
- Issue date Jun 6, 2023
- Asahi Kasei Microdevices Corporation
- Makoto Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Three-axis magnetic sensor
- Patent number 11,579,209
- Issue date Feb 14, 2023
- Zhenghong Qian
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 11,567,148
- Issue date Jan 31, 2023
- TDK Corporation
- Chengbin Lin
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 11,561,266
- Issue date Jan 24, 2023
- Showa Denko K.K.
- Daizo Endo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive Z-axis gradient sensor chip
- Patent number 11,536,779
- Issue date Dec 27, 2022
- MultiDimension Technology Co., Ltd.
- James Geza Deak
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus, measurement method, and computer-readable re...
- Patent number 11,531,074
- Issue date Dec 20, 2022
- Fujitsu Limited
- Minoru Hoshina
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC SENSOR AND MAGNETIC FIELD MEASUREMENT DEVICE USING THE SAME
- Publication number 20240329159
- Publication date Oct 3, 2024
- TDK Corporation
- Tomohiko SHIBUYA
- G01 - MEASURING TESTING
Information Patent Application
HALL SENSOR WITH MAGNETIC FLUX CONCENTRATOR
- Publication number 20240329164
- Publication date Oct 3, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Dok Won Lee
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...
- Publication number 20240255588
- Publication date Aug 1, 2024
- Sumida Corporation
- Shingo HAMADA
- G01 - MEASURING TESTING
Information Patent Application
SELF-CALIBRATING MAGNETORESISTANCE-BASED MAGNETIC FIELD SENSORS
- Publication number 20240230791
- Publication date Jul 11, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC DETECTION DEVICE
- Publication number 20240219488
- Publication date Jul 4, 2024
- Rohm Co., Ltd.
- Eiji KUWAHARA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE WITH INTEGRATED SOFT-MAGNETIC COMPONENT, AND M...
- Publication number 20240224815
- Publication date Jul 4, 2024
- Melexis Technologies SA
- Guido DUPONT
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC DETECTION DEVICE
- Publication number 20240210494
- Publication date Jun 27, 2024
- Rohm Co., Ltd.
- Eiji KUWAHARA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FLUX BIAS CIRCUIT
- Publication number 20240202560
- Publication date Jun 20, 2024
- NEC Corporation
- Naoki TAKEUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Extended Closure Sensor Design for an Electronic Device
- Publication number 20240175946
- Publication date May 30, 2024
- Google LLC
- Qi Qi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240111002
- Publication date Apr 4, 2024
- Resonac Corporation
- Daizo Endo
- G01 - MEASURING TESTING
Information Patent Application
SENSOR AND INSPECTION DEVICE
- Publication number 20240003999
- Publication date Jan 4, 2024
- Kabushiki Kaisha Toshiba
- Akira KIKITSU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SUBMUCOSAL TISSUE SEPARATION
- Publication number 20240000473
- Publication date Jan 4, 2024
- Boston Scientific Scimed, Inc.
- Shawn Ryan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS, MAGNETIC FIELD MEASUREMENT ME...
- Publication number 20230324476
- Publication date Oct 12, 2023
- ASAHI KASEI MICRODEVICES CORPORATION
- Takenobu NAKAMURA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SEMICONDUCTOR DEVICE WITH EMBEDDED MAGNETIC FLUX CONCENTRATOR
- Publication number 20230273272
- Publication date Aug 31, 2023
- Melexis Technologies SA
- Appolonius Jacobus VAN DER WIEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC SENSOR ARRAY
- Publication number 20230258743
- Publication date Aug 17, 2023
- TDK Corporation
- Tomohiko SHIBUYA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THICKNESS OF TUBINGS IN DOWNHOLE...
- Publication number 20230221385
- Publication date Jul 13, 2023
- GOWELL INTERNATIONAL, LLC
- Ryan Rugg
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR PACKAGING STRUCTURE WITH HYSTERESIS COIL
- Publication number 20230176148
- Publication date Jun 8, 2023
- Multidimension Technology Co., Ltd
- James Geza Deak
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE WITH PASSIVATED MAGNETIC CONCENTRATOR
- Publication number 20230135922
- Publication date May 4, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Rafael Jose Lizares Guevara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR DETECTING LEAKAGE CURRENT FOR TRACTIO...
- Publication number 20230084963
- Publication date Mar 16, 2023
- Hatch Ltd.
- Matthew Gorczyca
- B60 - VEHICLES IN GENERAL
Information Patent Application
MAGNETIC FIELD SENSOR INTEGRATED CIRCUIT WITH INTEGRAL FERROMAGNETI...
- Publication number 20230057390
- Publication date Feb 23, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Ravi Vig
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOWIRE CHARACTERIZATION AND IDENTIFICATION
- Publication number 20230026610
- Publication date Jan 26, 2023
- Regents of the University of Minnesota
- Rhonda R. Franklin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MAGNETIC FIELD MEASURING APPARATUS, MAGNETIC FIELD MEASURING METHOD...
- Publication number 20230023436
- Publication date Jan 26, 2023
- ASAHI KASEI MICRODEVICES CORPORATION
- Shigeki OKATAKE
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE WITH SENSOR AND CURRENT CONVERTER
- Publication number 20220373617
- Publication date Nov 24, 2022
- ROBERT BOSCH GmbH
- Ralf Kienzle
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Measuring device and method for determining magnetic properties of...
- Publication number 20220342013
- Publication date Oct 27, 2022
- BS & T Frankfurt am Main GmbH
- Jun Chao SUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC FIELD SENSOR WITH OVERCURRENT DETECTION
- Publication number 20220326322
- Publication date Oct 13, 2022
- Jochen Schmitt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANGLE SENSOR SYSTEM
- Publication number 20220268564
- Publication date Aug 25, 2022
- TDK Corporation
- Yongfu CAI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND COMPUTER-READABLE RE...
- Publication number 20220236343
- Publication date Jul 28, 2022
- Fujitsu Limited
- Minoru Hoshina
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD MEASUREMENT DEVICE, MAGNETIC FIELD MEASUREMENT METHO...
- Publication number 20220229125
- Publication date Jul 21, 2022
- ASAHI KASEI MICRODEVICES CORPORATION
- Makoto KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR AND INSPECTION DEVICE
- Publication number 20220221536
- Publication date Jul 14, 2022
- Kabushiki Kaisha Toshiba
- Akira Kikitsu
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD CONCENTRATING AND OR GUIDING DEVICES AND METHODS
- Publication number 20220187386
- Publication date Jun 16, 2022
- Varian Medical Systems Particle Therapy GMBH
- Arno GODEKE
- G01 - MEASURING TESTING

comprising means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device, system and method for detecting leakage current for tractio...

Magnetic field sensor with overcurrent detection

Sensor device with sensor and current converter

Magnetic field measurement device, magnetic field measurement metho...

Magnetic sensor, torque sensing device and steering apparatus

Magnetic field generator for a magnetic field measurement system

Angle sensor system

Magnetic field measuring apparatus

Magnetic sensor and its manufacturing method

Semiconductor device with passivated magnetic concentrator

Magnetic sensor packaging structure with hysteresis coil

Magnetic field sensor integrated circuit with integral ferromagneti...

Magnetic sensor and torque sensing device having the same

Systems and methods for submucosal tissue separation

Magnetic field measuring apparatus, magnetic field measuring method...

System, method and device for fluid conduit inspection

Nanowire characterization and identification

Systems and methods for measuring current output by a photodetector...

Method for manufacturing an integrated magnetoresistive sensor

Magnetic sensor and inspection device

Magnetic field concentrating and or guiding devices and methods

Systems and methods for concentrating alkali metal within a vapor c...

Magnetic field measurement apparatus, magnetic field measurement me...

Semiconductor device with embedded magnetic flux concentrator

Magnetic field measurement device, magnetic field measurement metho...

Three-axis magnetic sensor

Magnetic sensor

Magnetic sensor

Magnetoresistive Z-axis gradient sensor chip

Measurement apparatus, measurement method, and computer-readable re...

Patents Applicationslast 30 patents

MAGNETIC SENSOR AND MAGNETIC FIELD MEASUREMENT DEVICE USING THE SAME

HALL SENSOR WITH MAGNETIC FLUX CONCENTRATOR

MAGNETIC FIELD MEASUREMENT APPARATUS AND MAGNETIC FIELD MEASUREMENT...

SELF-CALIBRATING MAGNETORESISTANCE-BASED MAGNETIC FIELD SENSORS

MAGNETIC DETECTION DEVICE

SEMICONDUCTOR DEVICE WITH INTEGRATED SOFT-MAGNETIC COMPONENT, AND M...

MAGNETIC DETECTION DEVICE

MAGNETIC FLUX BIAS CIRCUIT

Extended Closure Sensor Design for an Electronic Device

MAGNETIC SENSOR

SENSOR AND INSPECTION DEVICE

SYSTEMS AND METHODS FOR SUBMUCOSAL TISSUE SEPARATION

MAGNETIC FIELD MEASUREMENT APPARATUS, MAGNETIC FIELD MEASUREMENT ME...

SEMICONDUCTOR DEVICE WITH EMBEDDED MAGNETIC FLUX CONCENTRATOR

MAGNETIC SENSOR ARRAY

APPARATUS AND METHOD FOR MEASURING THICKNESS OF TUBINGS IN DOWNHOLE...

MAGNETIC SENSOR PACKAGING STRUCTURE WITH HYSTERESIS COIL

SEMICONDUCTOR DEVICE WITH PASSIVATED MAGNETIC CONCENTRATOR

DEVICE, SYSTEM AND METHOD FOR DETECTING LEAKAGE CURRENT FOR TRACTIO...

MAGNETIC FIELD SENSOR INTEGRATED CIRCUIT WITH INTEGRAL FERROMAGNETI...

NANOWIRE CHARACTERIZATION AND IDENTIFICATION

MAGNETIC FIELD MEASURING APPARATUS, MAGNETIC FIELD MEASURING METHOD...

SENSOR DEVICE WITH SENSOR AND CURRENT CONVERTER

Measuring device and method for determining magnetic properties of...

MAGNETIC FIELD SENSOR WITH OVERCURRENT DETECTION

ANGLE SENSOR SYSTEM

MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND COMPUTER-READABLE RE...

MAGNETIC FIELD MEASUREMENT DEVICE, MAGNETIC FIELD MEASUREMENT METHO...

MAGNETIC SENSOR AND INSPECTION DEVICE

MAGNETIC FIELD CONCENTRATING AND OR GUIDING DEVICES AND METHODS