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G01J2003/283
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/283
computer-interfaced
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Patents Grants
last 30 patents
Information
Patent Grant
Heat assisted detection and ranging based on spectropolarimetric im...
Patent number
12,135,240
Issue date
Nov 5, 2024
Purdue Research Foundation
Zubin Jacob
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Imaging assisted scanning spectroscopy for gem identification
Patent number
12,085,511
Issue date
Sep 10, 2024
Gemological Institute of America, Inc. (GIA)
Tsung-Han Tsai
G01 - MEASURING TESTING
Information
Patent Grant
Compact spectral analyzer
Patent number
12,061,116
Issue date
Aug 13, 2024
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Image processing method, and spectral camera system
Patent number
12,039,761
Issue date
Jul 16, 2024
Seiko Epson Corporation
Kei Kudo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Totagraphy: coherent diffractive/digital information reconstruction...
Patent number
12,031,868
Issue date
Jul 9, 2024
Wavefront Analysis Systems LLC
Okan Ersoy
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating optical sensor, optical sensor and related e...
Patent number
11,994,429
Issue date
May 28, 2024
BEIJING XIAOMI MOBILE SOFTWARE CO., LTD.
Chaoxi Chen
G01 - MEASURING TESTING
Information
Patent Grant
Spectrally resolved imaging for agricultural product assessment
Patent number
11,982,616
Issue date
May 14, 2024
Headwall Photonics Inc.
Kwok-Keung Wong
G01 - MEASURING TESTING
Information
Patent Grant
Carbon fiber classification using raman spectroscopy
Patent number
11,982,624
Issue date
May 14, 2024
Battelle Savannah River Alliance, LLC
Amanda L. Houk
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods of imaging with multi-domain image sensor
Patent number
11,982,527
Issue date
May 14, 2024
QUALCOMM Incorporated
Yun-Chieh Chang
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for in situ optimization of tunable light emitt...
Patent number
11,982,568
Issue date
May 14, 2024
ChemImage Corporation
Shawna Tazik
G01 - MEASURING TESTING
Information
Patent Grant
Optical technique for material characterization
Patent number
11,927,481
Issue date
Mar 12, 2024
Nova Ltd.
Gilad Barak
G01 - MEASURING TESTING
Information
Patent Grant
Rolling principal component analysis for dynamic process monitoring...
Patent number
11,920,980
Issue date
Mar 5, 2024
Viavi Solutions Inc.
Lan Sun
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement system, optical measurement method, and non-tra...
Patent number
11,892,281
Issue date
Feb 6, 2024
Otsuka Electronics Co., Ltd.
Shiro Kawaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Cellphone-based raman spectrometer system for the detection and ide...
Patent number
11,879,777
Issue date
Jan 23, 2024
The Texas A&M University System
Peter M. Rentzepis
G01 - MEASURING TESTING
Information
Patent Grant
Divided-aperture infra-red spectral imaging system
Patent number
11,867,564
Issue date
Jan 9, 2024
Rebellion Photonics, Inc.
Robert Timothy Kester
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Blending process end point detection
Patent number
11,860,035
Issue date
Jan 2, 2024
Viavi Solutions Inc.
Chang Meng Hsiung
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device and method for spectral model explanation
Patent number
11,852,532
Issue date
Dec 26, 2023
Coretronic Corporation
Feng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Integrated, portable sample analysis system and method
Patent number
11,796,486
Issue date
Oct 24, 2023
Spectro Scientific, Inc.
Patrick F. Henning
G01 - MEASURING TESTING
Information
Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
Patent number
11,796,390
Issue date
Oct 24, 2023
KLA Corporation
Tianhan Wang
G01 - MEASURING TESTING
Information
Patent Grant
Sensor device and methods of use
Patent number
11,796,389
Issue date
Oct 24, 2023
Viavi Solutions Inc.
William D. Houck
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
On-premises calibrator system for optical modules
Patent number
11,788,890
Issue date
Oct 17, 2023
Randy Yousey
G01 - MEASURING TESTING
Information
Patent Grant
Imaging assisted scanning spectroscopy for gem identification
Patent number
11,754,506
Issue date
Sep 12, 2023
Gemological Institute of America, Inc. (GIA)
Tsung-Han Tsai
G01 - MEASURING TESTING
Information
Patent Grant
Imaging apparatus and spectral density reconstruction method
Patent number
11,740,125
Issue date
Aug 29, 2023
Sony Corporation
Alexander Gatto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Compact computational spectrometer using solid wedged low finesse e...
Patent number
11,733,094
Issue date
Aug 22, 2023
Massachusetts Institute of Technology
Shawn Redmond
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral sensing system and method for qualitative analysis of...
Patent number
11,650,145
Issue date
May 16, 2023
SAFENET INTERNATIONAL LLC
Joseph Y. Fang
G01 - MEASURING TESTING
Information
Patent Grant
High resolution multi-pass optical spectrum analyzer
Patent number
11,639,873
Issue date
May 2, 2023
Viavi Solutions Inc.
Driss Touahri
G01 - MEASURING TESTING
Information
Patent Grant
Remote spectrometer control system
Patent number
11,619,547
Issue date
Apr 4, 2023
GREENTROPISM
Pierre Gauvain
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-layer spectral modulation spectrometer
Patent number
11,609,117
Issue date
Mar 21, 2023
ams AG
Ruitao Zheng
G01 - MEASURING TESTING
Information
Patent Grant
Learning method, management device, and management program
Patent number
11,556,853
Issue date
Jan 17, 2023
Tokyo Electron Limited
Yuki Kataoka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spectral camera control device, spectral camera control system, sto...
Patent number
11,542,035
Issue date
Jan 3, 2023
National University Corporation Hokkaido University
Yukihiro Takahashi
B64 - AIRCRAFT AVIATION COSMONAUTICS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR CALIBRATING A SPECTROMETER DEVICE
Publication number
20240426661
Publication date
Dec 26, 2024
trinamiX GmbH
Sebastian Stephan WINKLER
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PROCESSING METHOD, CONTROLLER, AND NON-TRANSITORY COMPUTER RE...
Publication number
20240412709
Publication date
Dec 12, 2024
REALTEK SEMICONDUCTOR CORPORATION
Te Yu LIN
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
SYSTEM AND METHOD FOR SPECTROSCOPIC DETERMINATION OF INTENSITY LEVE...
Publication number
20240393179
Publication date
Nov 28, 2024
Thermo Scientific Portable Analytical Instruments Inc.
Rafet MALTAS
G01 - MEASURING TESTING
Information
Patent Application
IMAGING ASSISTED SCANNING SPECTROSCOPY FOR GEM IDENTIFICATION
Publication number
20240385119
Publication date
Nov 21, 2024
GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
Tsung-Han TSAI
G01 - MEASURING TESTING
Information
Patent Application
ROBOTICALLY MANIPULATED SENSORS FOR AGRICULTURAL HABITATS
Publication number
20240338040
Publication date
Oct 10, 2024
Sensei Ag Holdings, Inc.
W. Daniel Hillis
G01 - MEASURING TESTING
Information
Patent Application
COLORANT COMPENSATION USING RELATIVE COLORANT VOLUMES
Publication number
20240308233
Publication date
Sep 19, 2024
Hewlett-Packard Development Company, L.P.
Jan Morovic
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Application
METHOD OF PERFORMING COLOR CALIBRATION OF MULTISPECTRAL IMAGE SENSO...
Publication number
20240302210
Publication date
Sep 12, 2024
Samsung Electronics Co., Ltd.
Woo-Shik KIM
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION
Publication number
20240295436
Publication date
Sep 5, 2024
NOVA LTD
Gilad BARAK
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL DATA AND IMAGE ANALYSIS USING MACHINE LEARNING
Publication number
20240288308
Publication date
Aug 29, 2024
MLVX Technologies Inc.
Migel Dileepa TISSERA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CAMERA SYSTEM
Publication number
20240263998
Publication date
Aug 8, 2024
Sony Semiconductor Solutions Corporation
MASAHIKO NAKAMIZO
G01 - MEASURING TESTING
Information
Patent Application
DIVIDED-APERTURE INFRA-RED SPECTRAL IMAGING SYSTEM
Publication number
20240230417
Publication date
Jul 11, 2024
REBELLION PHOTONICS, INC.
Robert Timothy Kester
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SPECTROGRAPH STABILIZATION USING A SINGLE-DELAY INTERFEROMETER
Publication number
20240201014
Publication date
Jun 20, 2024
LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
David J. Erskine
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL FREQUENCY SENSORS BASED ON PRE-MODULATED QUADRATURE-SELF-HE...
Publication number
20240183714
Publication date
Jun 6, 2024
Technion Research & Development Foundation Limited
Moshe Nazarathy
G01 - MEASURING TESTING
Information
Patent Application
ROLLING PRINCIPAL COMPONENT ANALYSIS FOR DYNAMIC PROCESS MONITORING...
Publication number
20240167872
Publication date
May 23, 2024
VIAVI SOLUTIONS INC.
Lan SUN
G01 - MEASURING TESTING
Information
Patent Application
ESTIMATING GAS QUANTITY IN A PIXEL BASED ON SPECTRAL MATCHED FILTERING
Publication number
20240077416
Publication date
Mar 7, 2024
Maxar Technologies Holdings Inc.
Joseph Christy
G01 - MEASURING TESTING
Information
Patent Application
BLENDING PROCESS END POINT DETECTION
Publication number
20240068869
Publication date
Feb 29, 2024
VIAVI SOLUTIONS INC.
Chang Meng HSIUNG
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM ARCHITECTURE FOR IoT SPECTROSCOPY
Publication number
20240064204
Publication date
Feb 22, 2024
SENORICS GMBH
Rick-Rainer LUDWIG
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEMS AND METHODS FOR DETECTING PARTICLES OF INTEREST USING SPECT...
Publication number
20240027266
Publication date
Jan 25, 2024
Hyperspectral Corp.
Euan F. Mowat
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE AND METHODS OF USE
Publication number
20240027267
Publication date
Jan 25, 2024
VIAVI SOLUTIONS INC.
William D. Houck
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RECONSTRUCTION METHOD AND DEVICE FOR SPECTRAL IMAGE
Publication number
20240027269
Publication date
Jan 25, 2024
TSINGHUA UNIVERSITY
Kaiyu CUI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPECTROSCOPIC ANALYSIS SYSTEM AND SPECTROSCOPIC ANALYSIS METHOD
Publication number
20240011833
Publication date
Jan 11, 2024
HITACHI HIGH-TECH SCIENCE CORPORATION
Akihiro Nojima
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR RECONSTRUCTING SPECTRUM, SPECTROMETER, NON-TR...
Publication number
20230375405
Publication date
Nov 23, 2023
SHANGHAI INSTITUTE OF TECHNICAL PHYSICS, CHINESE ACADEMY OF SCIENCES
Shaowei WANG
G01 - MEASURING TESTING
Information
Patent Application
IMAGING ASSISTED SCANNING SPECTROSCOPY FOR GEM IDENTIFICATION
Publication number
20230366830
Publication date
Nov 16, 2023
GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
Tsung-Han TSAI
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR DUAL COMB SPECTROSCOPY
Publication number
20230349761
Publication date
Nov 2, 2023
Government of the United States of America, as Represented by the Secretary o...
Ian Robert Coddington
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION
Publication number
20230296434
Publication date
Sep 21, 2023
NOVA LTD
Gilad BARAK
G01 - MEASURING TESTING
Information
Patent Application
ROLLING PRINCIPAL COMPONENT ANALYSIS FOR DYNAMIC PROCESS MONITORING...
Publication number
20230243699
Publication date
Aug 3, 2023
VIAVI Solutions Inc.
Lan SUN
G01 - MEASURING TESTING
Information
Patent Application
BLENDING PROCESS END POINT DETECTION
Publication number
20230204417
Publication date
Jun 29, 2023
VIAVI Solutions Inc.
Chang Meng HSIUNG
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SYSTEM
Publication number
20230175889
Publication date
Jun 8, 2023
VIAVI SOLUTIONS INC.
William D. HOUCK
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PROCESSING METHOD, AND SPECTRAL CAMERA SYSTEM
Publication number
20230137388
Publication date
May 4, 2023
SEIKO EPSON CORPORATION
Kei KUDO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ILLUMINANT CORRECTION IN AN IMAGING SYSTEM
Publication number
20230082539
Publication date
Mar 16, 2023
SPECTRICITY
Jonathan Borremans
G01 - MEASURING TESTING