computer simulations

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CPC
G01N2223/305

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/305computer simulations

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Patents Grantslast 30 patents

Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 12,281,893
- Issue date Apr 22, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scattering measurement analysis method, scattering measurement anal...
- Patent number 12,175,173
- Issue date Dec 24, 2024
- Rigaku Corporation
- Tomoyuki Iwata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Scan procedure generation systems and methods to generate scan proc...
- Patent number 12,092,591
- Issue date Sep 17, 2024
- Illinois Tool Works Inc.
- Jackson Turner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
System and method for crack detection
- Patent number 11,946,883
- Issue date Apr 2, 2024
- United States as represented by the Administrator of NASA
- Ajay M Koshti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,906,451
- Issue date Feb 20, 2024
- Nova Ltd.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,782,000
- Issue date Oct 10, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
System and method for predicting the presence of rare earth elements
- Patent number 11,733,184
- Issue date Aug 22, 2023
- MICROBEAM TECHNOLOGIES, INC.
- Matthew Fuka
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,698,353
- Issue date Jul 11, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,668,663
- Issue date Jun 6, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Loosely-coupled inspection and metrology system for high-volume pro...
- Patent number 11,562,289
- Issue date Jan 24, 2023
- KLA Corporation
- Song Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for real time measurement control
- Patent number 11,519,869
- Issue date Dec 6, 2022
- KLA-Tencor Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method for fine structure, and apparatus and program thereof
- Patent number 11,408,837
- Issue date Aug 9, 2022
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting an anomaly in a single crystal structure
- Patent number 11,099,143
- Issue date Aug 24, 2021
- Rolls-Royce PLC
- Jacqueline Griffiths
- G01 - MEASURING TESTING
Information Patent Grant
Dual scan method for detecting a fibre misalignment in an elongated...
- Patent number 11,054,373
- Issue date Jul 6, 2021
- LM WIND POWER US TECHNOLOGY APS
- Klavs Jespersen
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Multi-zone automatic magnetoscop inspection system
- Patent number 11,002,638
- Issue date May 11, 2021
- Raytheon Technologies Corporation
- Zhong Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Methods for assigning attributes to an image of an object scanned w...
- Patent number 10,901,114
- Issue date Jan 26, 2021
- VOTI INC.
- Emmanuel St-Aubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for the inspection of contained materials
- Patent number 10,852,257
- Issue date Dec 1, 2020
- Kromek Limited
- Andrew Keith Powell
- G01 - MEASURING TESTING
Information Patent Grant
Methods for reconstructing an unknown object in a scanned image
- Patent number 10,809,414
- Issue date Oct 20, 2020
- VOTI INC.
- Emmanuel St-Aubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for removing a background object from an image
- Patent number 10,795,047
- Issue date Oct 6, 2020
- VOTI INC.
- Emmanuel St-Aubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for assigning a threat or safe condition to an object in an...
- Patent number 10,795,049
- Issue date Oct 6, 2020
- VOTI INC.
- Emmanuel St-Aubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for extending a range for assigning attributes to an object...
- Patent number 10,795,048
- Issue date Oct 6, 2020
- VOTI INC.
- Emmanuel St-Aubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of analysing a drill core sample
- Patent number 10,620,181
- Issue date Apr 14, 2020
- Corex (UK) Limited
- Brett Louis Clark
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 10,533,961
- Issue date Jan 14, 2020
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- G01 - MEASURING TESTING
Information Patent Grant
Digital pore alteration methods and systems
- Patent number 10,198,852
- Issue date Feb 5, 2019
- Halliburton Energy Services, Inc.
- Joel Walls
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray fluorescence spectrometer and program used therein
- Patent number 7,961,842
- Issue date Jun 14, 2011
- Rigaku Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of macromolecules, ligands and macromolecule-ligand complexes
- Patent number 7,469,036
- Issue date Dec 23, 2008
- LOS ALAMOS NATIONAL SECURITY, LLC
- Robert B. Von Dreele
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA
- Publication number 20250164653
- Publication date May 22, 2025
- Shanghai United Imaging Healthcare Co., Ltd.
- Zhi SHI
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...
- Publication number 20250130185
- Publication date Apr 24, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Uri Hadar
- G01 - MEASURING TESTING
Information Patent Application
SPECTRA DELTA METROLOGY
- Publication number 20250123225
- Publication date Apr 17, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD
- Publication number 20250067688
- Publication date Feb 27, 2025
- Hitachi, Ltd
- Akinori ASAHARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM
- Publication number 20240264098
- Publication date Aug 8, 2024
- Rigaku Corporation
- Tsutomu TADA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING LOCAL FOCUS POINTS DURING INSPECT...
- Publication number 20240183806
- Publication date Jun 6, 2024
- ASML NETHERLANDS B.V.
- Te-Sheng WANG
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240094150
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods And Systems For X-Ray Scatterometry Measurements Employing...
- Publication number 20240060914
- Publication date Feb 22, 2024
- KLA Corporation
- Mohsen Mahvash
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PREDICTING THE PRESENCE OF RARE EARTH ELEMENTS
- Publication number 20240003836
- Publication date Jan 4, 2024
- MICROBEAM TECHNOLOGIES, INC.
- Matthew Fuka
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20230408430
- Publication date Dec 21, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
- Publication number 20230366838
- Publication date Nov 16, 2023
- Anritsu Corporation
- Masaru ISHIDA
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NO...
- Publication number 20230194443
- Publication date Jun 22, 2023
- Rigaku Corporation
- Akihiro HIMEDA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PREDICTING THE PRESENCE OF RARE EARTH ELEMENTS
- Publication number 20220252530
- Publication date Aug 11, 2022
- MICROBEAM TECHNOLOGIES, INC.
- Matthew Fuka
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20220074878
- Publication date Mar 10, 2022
- NOVA LTD
- Wei Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scattering Measurement Analysis Method, Scattering Measurement Anal...
- Publication number 20210200922
- Publication date Jul 1, 2021
- Rigaku Corporation
- Tomoyuki IWATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FULL-VIEW-FIELD QUANTITATIVE STATISTICAL DISTRIBUTION REPRESENTATIO...
- Publication number 20210033549
- Publication date Feb 4, 2021
- Central Iron & Steel Research Institute
- Weihao Wan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-ZONE AUTOMATIC MAGNETOSCOP INSPECTION SYSTEM
- Publication number 20200300731
- Publication date Sep 24, 2020
- United Technologies Corporation
- Zhong Ouyang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20200191734
- Publication date Jun 18, 2020
- Nova Measuring Instruments, Inc.
- Wei Ti Lee
- G01 - MEASURING TESTING
Information Patent Application
Loosely-Coupled Inspection and Metrology System for High-Volume Pro...
- Publication number 20200184372
- Publication date Jun 11, 2020
- KLA-Tencor Corporation
- Song Wu
- G01 - MEASURING TESTING
Information Patent Application
A SYSTEM AND A METHOD FOR COMPOSITIONAL ANALYSIS
- Publication number 20200064281
- Publication date Feb 27, 2020
- Sensinite Oy
- Jan KARLSSON
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20180172609
- Publication date Jun 21, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Wei Ti LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYSING A DRILL CORE SAMPLE
- Publication number 20170108483
- Publication date Apr 20, 2017
- COREX (UK) LIMITED
- Brett Louis Clark
- G01 - MEASURING TESTING
Information Patent Application
OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS, OPERATION GUIDE METHOD T...
- Publication number 20170038315
- Publication date Feb 9, 2017
- Rigaku Corporation
- Akito SASAKI
- G01 - MEASURING TESTING
Information Patent Application
Process for Performing Automated Mineralogy
- Publication number 20140183357
- Publication date Jul 3, 2014
- Michael D. Smith
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN
- Publication number 20090041184
- Publication date Feb 12, 2009
- RIGAKU INDUSTRIAL CORPORATION
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Application
Analysis of macromolecules, ligands and macromolecule-ligand complexes
- Publication number 20030198997
- Publication date Oct 23, 2003
- The Regents of the University of California.
- Robert B. Von Dreele
- G01 - MEASURING TESTING

computer simulations

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Characterizing and measuring in small boxes using XPS with multiple...

Scattering measurement analysis method, scattering measurement anal...

X-ray spectrometer and pulse height prediction program

Scan procedure generation systems and methods to generate scan proc...

Method and system for non-destructive metrology of thin layers

Characterizing and measuring in small boxes using XPS with multiple...

System and method for crack detection

Method and system for non-destructive metrology of thin layers

Quantitative analysis method, quantitative analysis program, and X-...

System and method for predicting the presence of rare earth elements

Quantitative analysis method, quantitative analysis program, and X-...

Method and system for non-destructive metrology of thin layers

Loosely-coupled inspection and metrology system for high-volume pro...

Methods and systems for real time measurement control

Analysis method for fine structure, and apparatus and program thereof

Method of detecting an anomaly in a single crystal structure

Dual scan method for detecting a fibre misalignment in an elongated...

Multi-zone automatic magnetoscop inspection system

Methods for assigning attributes to an image of an object scanned w...

Method and apparatus for the inspection of contained materials

Methods for reconstructing an unknown object in a scanned image

Methods for removing a background object from an image

Methods for assigning a threat or safe condition to an object in an...

Methods for extending a range for assigning attributes to an object...

Method of analysing a drill core sample

Method and system for non-destructive metrology of thin layers

Digital pore alteration methods and systems

X-ray fluorescence spectrometer and program used therein

Analysis of macromolecules, ligands and macromolecule-ligand complexes

Patents Applicationslast 30 patents

METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA

NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...

SPECTRA DELTA METROLOGY

PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM

SYSTEM AND METHOD FOR DETERMINING LOCAL FOCUS POINTS DURING INSPECT...

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

Methods And Systems For X-Ray Scatterometry Measurements Employing...

SYSTEM AND METHOD FOR PREDICTING THE PRESENCE OF RARE EARTH ELEMENTS

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NO...

SYSTEM AND METHOD FOR PREDICTING THE PRESENCE OF RARE EARTH ELEMENTS

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

Scattering Measurement Analysis Method, Scattering Measurement Anal...

FULL-VIEW-FIELD QUANTITATIVE STATISTICAL DISTRIBUTION REPRESENTATIO...

MULTI-ZONE AUTOMATIC MAGNETOSCOP INSPECTION SYSTEM

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

Loosely-Coupled Inspection and Metrology System for High-Volume Pro...

A SYSTEM AND A METHOD FOR COMPOSITIONAL ANALYSIS

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

METHOD OF ANALYSING A DRILL CORE SAMPLE

OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS, OPERATION GUIDE METHOD T...

Process for Performing Automated Mineralogy

X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN

Analysis of macromolecules, ligands and macromolecule-ligand complexes