Conductive probes

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CPC
G01Q60/40

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/40Conductive probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Probe tip X-Y location identification using a charged particle beam
- Patent number 12,169,208
- Issue date Dec 17, 2024
- Innovatum Instruments Inc.
- Richard E Stallcup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing process with atomic level inspection
- Patent number 12,131,957
- Issue date Oct 29, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe for scanning probe microscope and binary state scanning probe...
- Patent number 11,860,188
- Issue date Jan 2, 2024
- Industry-Academic Cooperation Foundation, Yonsei University
- Wooyoung Shim
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope equipped with optical measurement device an...
- Patent number 11,619,649
- Issue date Apr 4, 2023
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for characterizing processes of submicron semiconductor...
- Patent number 11,579,171
- Issue date Feb 14, 2023
- Meta Platforms Technologies, LLC
- Christopher Percival
- G02 - OPTICS
Information Patent Grant
Multifunctional nanoprobes for scanning probe microscopy
- Patent number 11,454,648
- Issue date Sep 27, 2022
- GETEC MICROSCOPY GMBH
- Harald Plank
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Array atomic force microscopy for enabling simultaneous multi-point...
- Patent number 11,287,444
- Issue date Mar 29, 2022
- The Regents of the University of California
- Ratneshwar Lal
- G01 - MEASURING TESTING
Information Patent Grant
Surface plasmon-optical-electrical hybrid conduction nano heterostr...
- Patent number 11,099,323
- Issue date Aug 24, 2021
- Southeast University
- Xiaoyang Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Detection systems in semiconductor metrology tools
- Patent number 11,087,956
- Issue date Aug 10, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe manufacturing method and probe
- Patent number 10,900,905
- Issue date Jan 26, 2021
- Horiba, Ltd.
- Masayuki Nishi
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting electrical characteristics of individual soot...
- Patent number 10,788,511
- Issue date Sep 29, 2020
- Tianjin University
- Chonglin Song
- B82 - NANO-TECHNOLOGY
Information Patent Grant
VCSEL-based resonant-cavity-enhanced atomic force microscopy active...
- Patent number 10,663,485
- Issue date May 26, 2020
- ACTOPROBE LLC
- Alexander A. Ukhanov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact probe for atomic-force microscopy and atomic-force microsco...
- Patent number 10,527,645
- Issue date Jan 7, 2020
- VMICRO
- Benjamin Walter
- G01 - MEASURING TESTING
Information Patent Grant
Tip enhanced laser assisted sample transfer for biomolecule mass sp...
- Patent number 10,107,835
- Issue date Oct 23, 2018
- Board of Supervisors of Louisiana State University
- Kermit King Murray
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Membrane electrochemical signal detection system
- Patent number 9,823,270
- Issue date Nov 21, 2017
- National Tsing Hua University
- Fan-Gang Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Methods, systems, and computer readable media for dual resonance fr...
- Patent number 9,395,388
- Issue date Jul 19, 2016
- The University of North Carolina at Chapel Hill
- Dong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Electrochemically-grown nanowires and uses thereof
- Patent number 9,267,964
- Issue date Feb 23, 2016
- Kansas State University Research Foundation
- Bret Flanders
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Conductive atomic force microscope and method of operating the same
- Patent number 9,261,532
- Issue date Feb 16, 2016
- Samsung Electronics Co., Ltd.
- Hyun-woo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Atom probe tomography sample preparation for three-dimensional (3D)...
- Patent number 9,201,112
- Issue date Dec 1, 2015
- International Business Machines Corporation
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Grant
High frequency capacitance-voltage nanoprobing characterization
- Patent number 9,170,273
- Issue date Oct 27, 2015
- GlobalFoundries U.S. 2 LLC
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Grant
Methods for obtaining hollow nano-structures
- Patent number 9,067,242
- Issue date Jun 30, 2015
- Fondazione Istituto Italiano di Tecnologia
- Francesco De Angelis
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Image force microscopy of molecular resonance
- Patent number 8,739,311
- Issue date May 27, 2014
- H. Kumar Wickramasinghe
- G01 - MEASURING TESTING
Information Patent Grant
Thermionic emission device
- Patent number 8,716,938
- Issue date May 6, 2014
- Tsinghua University
- Yang Wei
- G01 - MEASURING TESTING
Information Patent Grant
Microcantilever microwave probe
- Patent number 8,661,560
- Issue date Feb 25, 2014
- PrimeNano, Inc.
- Xinxin Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for attaching a particle to a scanning probe tip through eut...
- Patent number 8,656,511
- Issue date Feb 18, 2014
- National Tsing Hua University
- Fan Gang Tseng
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thermal probe
- Patent number 8,578,511
- Issue date Nov 5, 2013
- National Cheng Kung University
- Bernard HaoChih Liu
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope probe
- Patent number 8,516,611
- Issue date Aug 20, 2013
- Tsinghua University
- Yang Wei
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for cost-efficient manufacturing diamond tips for ultra-high...
- Patent number 8,484,761
- Issue date Jul 9, 2013
- IMEC
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micro/nano devices fabricated from Cu-Hf thin films
- Patent number 8,458,811
- Issue date Jun 4, 2013
- The Governors of the University of Alberta
- Erik J. Luber
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micro contact prober
- Patent number 8,438,660
- Issue date May 7, 2013
- Hitachi High-Technologies Corporation
- Motoyuki Hirooka
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
HIGH TEMPERATURE SUPERCONDUCTING DEVICES AND METHODS THEREOF
- Publication number 20240389476
- Publication date Nov 21, 2024
- The Regents of the University of California
- Shane Cybart
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION
- Publication number 20240371707
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH-FREQUENCY ENHANCED ELECTROCHEMICAL STRAIN MICROSCOPE AND HIGH-...
- Publication number 20240094241
- Publication date Mar 21, 2024
- TOHOKU UNIVERSITY
- Yoshiomi HIRANAGA
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION
- Publication number 20230386941
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE TIP X-Y LOCATION IDENTIFICATION USING A CHARGED PARTICLE BEAM
- Publication number 20230168274
- Publication date Jun 1, 2023
- Innovatum Instruments Inc.
- Richard E Stallcup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe for Scanning Probe Microscope and Binary State Scanning Probe...
- Publication number 20220308086
- Publication date Sep 29, 2022
- Industry-Academic Cooperation Foundation, Yonsei University
- Wooyoung Shim
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION
- Publication number 20220238390
- Publication date Jul 28, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- I-Che Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIFUNCTIONAL NANOPROBES FOR SCANNING PROBE MICROSCOPY
- Publication number 20220163560
- Publication date May 26, 2022
- GETec Microscopy GmbH
- Harald Plank
- G01 - MEASURING TESTING
Information Patent Application
ARRAY ATOMIC FORCE MICROSCOPY FOR ENABLING SIMULTANEOUS MULTI-POINT...
- Publication number 20210396783
- Publication date Dec 23, 2021
- The Regents of the University of California
- Ratneshwar Lal
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEMS IN SEMICONDUCTOR METROLOGY TOOLS
- Publication number 20210366687
- Publication date Nov 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE PLASMON-OPTICAL-ELECTRICAL HYBRID CONDUCTION NANO HETEROSTR...
- Publication number 20200400887
- Publication date Dec 24, 2020
- SOUTHEAST UNIVERSITY
- Xiaoyang ZHANG
- G02 - OPTICS
Information Patent Application
METHOD FOR DETECTING ELECTRICAL CHARACTERISTICS OF INDIVIDUAL SOOT...
- Publication number 20200241039
- Publication date Jul 30, 2020
- TIANJIN UNIVERSITY
- Chonglin SONG
- B82 - NANO-TECHNOLOGY
Information Patent Application
DETECTION SYSTEMS IN SEMICONDUCTOR METROLOGY TOOLS
- Publication number 20200006033
- Publication date Jan 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei Hung
- G01 - MEASURING TESTING
Information Patent Application
PROBE MANUFACTURING METHOD AND PROBE
- Publication number 20190170651
- Publication date Jun 6, 2019
- KYOTO UNIVERSITY
- Masayuki NISHI
- G01 - MEASURING TESTING
Information Patent Application
COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCO...
- Publication number 20180203037
- Publication date Jul 19, 2018
- CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Benjamin WALTER
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic force balance microscopy
- Publication number 20180136252
- Publication date May 17, 2018
- Yemaya Candace Bordain
- G01 - MEASURING TESTING
Information Patent Application
TIP ENHANCED LASER ASSISTED SAMPLE TRANSFER FOR BIOMOLECULE MASS SP...
- Publication number 20180003735
- Publication date Jan 4, 2018
- BOARD OF SUPERVISORS OF LOUISIANA STATE UNIVERSITY AND AGRICUL TURAL AND MECH...
- KERMIT KING MURRAY
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
CONDUCTIVE ATOMIC FORCE MICROSCOPE AND METHOD OF OPERATING THE SAME
- Publication number 20160033550
- Publication date Feb 4, 2016
- Samsung Electronics Co., Ltd.
- Hyun-woo KIM
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR DUAL RESONANCE FR...
- Publication number 20150241470
- Publication date Aug 27, 2015
- Dong Wu
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY CAPACITANCE-VOLTAGE NANOPROBING CHARACTERIZATION
- Publication number 20150160261
- Publication date Jun 11, 2015
- International Business Machines Corporation
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Application
ELECTROCHEMICALLY-GROWN NANOWIRES AND USES THEREOF
- Publication number 20140173786
- Publication date Jun 19, 2014
- Kansas State University Research Foundation
- Bret Flanders
- B82 - NANO-TECHNOLOGY
Information Patent Application
THERMIONIC EMISSION DEVICE
- Publication number 20130342106
- Publication date Dec 26, 2013
- HON HAI Precision Industry CO., LTD.
- Yang Wei
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHODS FOR OBTAINING HOLLOW NANO-STRUCTURES
- Publication number 20130284696
- Publication date Oct 31, 2013
- Fondazione Istituto Italiano Di Tecnologia
- Francesco De Angelis
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
IMAGE FORCE MICROSCOPY OF MOLECULAR RESONANCE
- Publication number 20130283487
- Publication date Oct 24, 2013
- H. Kumar Wickramasinghe
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE PROBE
- Publication number 20130227749
- Publication date Aug 29, 2013
- HON HAI Precision Industry CO., LTD.
- Yang Wei
- B82 - NANO-TECHNOLOGY
Information Patent Application
THERMAL PROBE
- Publication number 20130019353
- Publication date Jan 17, 2013
- Bernard HaoChih LIU
- B82 - NANO-TECHNOLOGY
Information Patent Application
MEASUREMENT OF THE SURFACE POTENTIAL OF A MATERIAL
- Publication number 20120304342
- Publication date Nov 29, 2012
- UNIVERSITE DES SCIENCES ET TECHNOLOGIES DE LILLE
- Thierry Melin
- B82 - NANO-TECHNOLOGY
Information Patent Application
Fabrication of a microcantilever microwave probe
- Publication number 20120192319
- Publication date Jul 26, 2012
- PRIMENANO, INC.
- Xinxin Li
- G01 - MEASURING TESTING
Information Patent Application
High Frequency Deflection Measurement of IR Absorption
- Publication number 20120167261
- Publication date Jun 28, 2012
- Mikhail Belkin
- G01 - MEASURING TESTING
Information Patent Application
MICROCONTACT PROBER
- Publication number 20120090056
- Publication date Apr 12, 2012
- Hitachi High-Technologies Corporation
- Motoyuki Hirooka
- G01 - MEASURING TESTING

Conductive probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe tip X-Y location identification using a charged particle beam

Manufacturing process with atomic level inspection

Probe for scanning probe microscope and binary state scanning probe...

Atomic force microscope equipped with optical measurement device an...

Probe card for characterizing processes of submicron semiconductor...

Multifunctional nanoprobes for scanning probe microscopy

Array atomic force microscopy for enabling simultaneous multi-point...

Surface plasmon-optical-electrical hybrid conduction nano heterostr...

Detection systems in semiconductor metrology tools

Probe manufacturing method and probe

Method for detecting electrical characteristics of individual soot...

VCSEL-based resonant-cavity-enhanced atomic force microscopy active...

Compact probe for atomic-force microscopy and atomic-force microsco...

Tip enhanced laser assisted sample transfer for biomolecule mass sp...

Membrane electrochemical signal detection system

Methods, systems, and computer readable media for dual resonance fr...

Electrochemically-grown nanowires and uses thereof

Conductive atomic force microscope and method of operating the same

Atom probe tomography sample preparation for three-dimensional (3D)...

High frequency capacitance-voltage nanoprobing characterization

Methods for obtaining hollow nano-structures

Image force microscopy of molecular resonance

Thermionic emission device

Microcantilever microwave probe

Method for attaching a particle to a scanning probe tip through eut...

Thermal probe

Atomic force microscope probe

Method for cost-efficient manufacturing diamond tips for ultra-high...

Micro/nano devices fabricated from Cu-Hf thin films

Micro contact prober

Patents Applicationslast 30 patents

HIGH TEMPERATURE SUPERCONDUCTING DEVICES AND METHODS THEREOF

MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION

HIGH-FREQUENCY ENHANCED ELECTROCHEMICAL STRAIN MICROSCOPE AND HIGH-...

MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION

PROBE TIP X-Y LOCATION IDENTIFICATION USING A CHARGED PARTICLE BEAM

Probe for Scanning Probe Microscope and Binary State Scanning Probe...

MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION

MULTIFUNCTIONAL NANOPROBES FOR SCANNING PROBE MICROSCOPY

ARRAY ATOMIC FORCE MICROSCOPY FOR ENABLING SIMULTANEOUS MULTI-POINT...

DETECTION SYSTEMS IN SEMICONDUCTOR METROLOGY TOOLS

SURFACE PLASMON-OPTICAL-ELECTRICAL HYBRID CONDUCTION NANO HETEROSTR...

METHOD FOR DETECTING ELECTRICAL CHARACTERISTICS OF INDIVIDUAL SOOT...

DETECTION SYSTEMS IN SEMICONDUCTOR METROLOGY TOOLS

PROBE MANUFACTURING METHOD AND PROBE

COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCO...

Electrostatic force balance microscopy

TIP ENHANCED LASER ASSISTED SAMPLE TRANSFER FOR BIOMOLECULE MASS SP...

CONDUCTIVE ATOMIC FORCE MICROSCOPE AND METHOD OF OPERATING THE SAME

METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR DUAL RESONANCE FR...

HIGH FREQUENCY CAPACITANCE-VOLTAGE NANOPROBING CHARACTERIZATION

ELECTROCHEMICALLY-GROWN NANOWIRES AND USES THEREOF

THERMIONIC EMISSION DEVICE

METHODS FOR OBTAINING HOLLOW NANO-STRUCTURES

IMAGE FORCE MICROSCOPY OF MOLECULAR RESONANCE

ATOMIC FORCE MICROSCOPE PROBE

THERMAL PROBE

MEASUREMENT OF THE SURFACE POTENTIAL OF A MATERIAL

Fabrication of a microcantilever microwave probe

High Frequency Deflection Measurement of IR Absorption

MICROCONTACT PROBER