Constructional adaptation of the sensor to specific applications

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

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G01R33/091Constructional adaptation of the sensor to specific applications

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Patents Grantslast 30 patents

Information Patent Grant
Sensor devices, associated production methods and methods for deter...
- Patent number 12,196,825
- Issue date Jan 14, 2025
- Infineon Technologies AG
- Horst Theuss
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic long-range position sensor
- Patent number 12,189,001
- Issue date Jan 7, 2025
- Bourns, Inc.
- Jay Jamshid Khazaai
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistance bridge circuits with stray field immunity
- Patent number 12,181,538
- Issue date Dec 31, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field closed loop sensors with offset reduction
- Patent number 12,174,275
- Issue date Dec 24, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor including a plurality of magnetoresistive elements...
- Patent number 12,153,104
- Issue date Nov 26, 2024
- TDK Corporation
- Tetsuya Hiraki
- G01 - MEASURING TESTING
Information Patent Grant
Multi-functional magnetic test structure for XMR sensors
- Patent number 12,146,926
- Issue date Nov 19, 2024
- Infineon Technologies AG
- Christoph Schroers
- G01 - MEASURING TESTING
Information Patent Grant
Device, system and method for detecting leakage current for tractio...
- Patent number 12,145,636
- Issue date Nov 19, 2024
- Hatch Ltd.
- Patrick Henry McGinn
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Position sensor system, optical lens system and display
- Patent number 12,140,647
- Issue date Nov 12, 2024
- Infineon Technologies AG
- Gernot Binder
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field current sensor to reduce stray magnetic fields
- Patent number 12,130,342
- Issue date Oct 29, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Rémy Lassalle-Balier
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field detection device and magnetic field detection device...
- Patent number 12,117,506
- Issue date Oct 15, 2024
- TDK Corporation
- Takato Fukui
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic offset and amplitude tracker
- Patent number 12,117,291
- Issue date Oct 15, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Christophe Lutz
- G01 - MEASURING TESTING
Information Patent Grant
Angle sensor
- Patent number 12,111,153
- Issue date Oct 8, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Yannick Vuillermet
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 12,105,164
- Issue date Oct 1, 2024
- TDK Corporation
- Yuichiro Yamaji
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 12,105,165
- Issue date Oct 1, 2024
- TDK Corporation
- Kazuya Watanabe
- G11 - INFORMATION STORAGE
Information Patent Grant
XMR sensors with serial segment strip configurations
- Patent number 12,092,704
- Issue date Sep 17, 2024
- Infineon Technologies AG
- Juergen Zimmer
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor with overcurrent detection
- Patent number 12,078,695
- Issue date Sep 3, 2024
- Analog Devices International Unlimited Company
- Jochen Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Gain-controllable magnetoresistive analog amplifier
- Patent number 12,081,176
- Issue date Sep 3, 2024
- MultiDimension Technology Co., Ltd.
- Zhimin Zhou
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Magnetic sensor
- Patent number 12,072,399
- Issue date Aug 27, 2024
- TDK Corporation
- Kentaro Harada
- G01 - MEASURING TESTING
Information Patent Grant
System and method for hole inspection
- Patent number 12,061,169
- Issue date Aug 13, 2024
- JENTEK Sensors, Inc.
- Todd Dunford
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor and current detecting apparatus including the same
- Patent number 12,044,709
- Issue date Jul 23, 2024
- Alps Alpine Co., Ltd.
- Manabu Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, measuring method and recording medium
- Patent number 12,038,488
- Issue date Jul 16, 2024
- Asahi Kasei Kabushiki Kaisha
- Hideyuki Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistance effect element
- Patent number 12,040,115
- Issue date Jul 16, 2024
- TDK Corporation
- Kazuumi Inubushi
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistance effect element
- Patent number 12,035,635
- Issue date Jul 9, 2024
- TDK Corporation
- Shinto Ichikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Arrangement for measuring a torque acting on a steering shaft of a...
- Patent number 12,025,520
- Issue date Jul 2, 2024
- Schaeffler Technologies AG & Co. KG
- Stephan Neuschaefer-Rube
- G01 - MEASURING TESTING
Information Patent Grant
Length detector with magnetoresitive elements
- Patent number 12,025,683
- Issue date Jul 2, 2024
- Analog Devices International Unlimited Company
- Jochen Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic level gauge
- Patent number 12,018,973
- Issue date Jun 25, 2024
- MultiDimension Technology Co., Ltd.
- Bin Qi
- G01 - MEASURING TESTING
Information Patent Grant
Position sensor system and method
- Patent number 12,007,255
- Issue date Jun 11, 2024
- Melexis Technologies SA
- Christian Schott
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor unit
- Patent number 11,982,525
- Issue date May 14, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Kazuhiro Onaka
- G01 - MEASURING TESTING
Information Patent Grant
Current sensor
- Patent number 11,959,944
- Issue date Apr 16, 2024
- Denso Corporation
- Takuma Esaka
- G01 - MEASURING TESTING
Information Patent Grant
Image blur correction device, imaging device, and lens device
- Patent number 11,962,904
- Issue date Apr 16, 2024
- FUJIFILM Corporation
- Kouhei Awazu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONDUCTOR DESIGN WITH IMPROVED CROSS-TALK ERROR
- Publication number 20250052791
- Publication date Feb 13, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Christian Kasparek
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20250044383
- Publication date Feb 6, 2025
- TDK Corporation
- Tetsuya HIRAKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR HOLE INSPECTION
- Publication number 20250044257
- Publication date Feb 6, 2025
- JENTEK Sensors, Inc.
- Todd Dunford
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD CURRENT SENSOR TO REDUCE STRAY MAGNETIC FIELDS
- Publication number 20250012876
- Publication date Jan 9, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Rémy Lassalle-Balier
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240418804
- Publication date Dec 19, 2024
- TDK Corporation
- Kazuya WATANABE
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC FIELD SENSOR SYSTEM WITH MAGNETIC VORTEX USED FOR B-FIELD...
- Publication number 20240418803
- Publication date Dec 19, 2024
- INFINEON TECHNOLOGIES AG
- Bernhard ENDRES
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR, AND STATE DETECTION APPARATUS AND METHOD
- Publication number 20240377483
- Publication date Nov 14, 2024
- SUZHOU NOVOSENSE MICROELECTRONICS CO., LTD.
- Fute YUAN
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240377484
- Publication date Nov 14, 2024
- TDK Corporation
- Kentaro HARADA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTANCE EFFECT ELEMENT
- Publication number 20240339255
- Publication date Oct 10, 2024
- TDK Corporation
- Kazuumi INUBUSHI
- G11 - INFORMATION STORAGE
Information Patent Application
OPTICAL DETECTION DEVICE AND SIGNAL PROCESSING METHOD
- Publication number 20240329165
- Publication date Oct 3, 2024
- TDK Corporation
- Takekazu YAMANE
- G01 - MEASURING TESTING
Information Patent Application
INDUCING MECHANICAL STRESS IN MAGNETORESISTIVE SENSING ELEMENT TO A...
- Publication number 20240329166
- Publication date Oct 3, 2024
- INFINEON TECHNOLOGIES AG
- Bernhard ENDRES
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTANCE EFFECT ELEMENT
- Publication number 20240334839
- Publication date Oct 3, 2024
- TDK Corporation
- Shinto ICHIKAWA
- G11 - INFORMATION STORAGE
Information Patent Application
CAMERA DEVICE AND OPTICAL INSTRUMENT
- Publication number 20240334057
- Publication date Oct 3, 2024
- LG Innotek Co., Ltd.
- Sang Ok Park
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEVICE FOR THE CONTACTLESS DETECTION OF MOVEMENTS
- Publication number 20240310402
- Publication date Sep 19, 2024
- SCHAEFFLER TECHNOLOGIES AG & CO. KG
- Christian Mock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240310460
- Publication date Sep 19, 2024
- TDK Corporation
- Takehiro ISODA
- G01 - MEASURING TESTING
Information Patent Application
POSITION SENSOR SYSTEM AND METHOD
- Publication number 20240302187
- Publication date Sep 12, 2024
- Melexis Technologies SA
- Christian SCHOTT
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTANCE EFFECT ELEMENT
- Publication number 20240266099
- Publication date Aug 8, 2024
- TDK Corporation
- Kazuumi INUBUSHI
- G11 - INFORMATION STORAGE
Information Patent Application
POSITION DETECTION DEVICE
- Publication number 20240255539
- Publication date Aug 1, 2024
- Proterial, Ltd.
- Yohei SHIRAKAWA
- G01 - MEASURING TESTING
Information Patent Application
REDUCING ANGLE ERROR IN ANGLE SENSOR DUE TO ORTHOGONALITY DRIFT OVE...
- Publication number 20240255592
- Publication date Aug 1, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Samridh Jaiswal
- G01 - MEASURING TESTING
Information Patent Application
SENSOR UNIT
- Publication number 20240219484
- Publication date Jul 4, 2024
- TDK Corporation
- Kunihiro UEDA
- B82 - NANO-TECHNOLOGY
Information Patent Application
MAGNETIC FIELD DETECTION APPARATUS AND CURRENT DETECTION APPARATUS
- Publication number 20240210446
- Publication date Jun 27, 2024
- TDK Corporation
- Norikazu OTA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE BLUR CORRECTION DEVICE, IMAGING DEVICE, AND LENS DEVICE
- Publication number 20240214685
- Publication date Jun 27, 2024
- FUJIFILM CORPORATION
- Kouhei AWAZU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240192029
- Publication date Jun 13, 2024
- TDK Corporation
- Keisuke UCHIDA
- G01 - MEASURING TESTING
Information Patent Application
Current Detection Apparatus and Electronic Device
- Publication number 20240175948
- Publication date May 30, 2024
- Huawei Digital Power Technologies Co., Ltd.
- Shu Zhong
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MAGNETORESISTANCE BRIDGE CIRCUITS WITH STRAY FIELD IMMUNITY
- Publication number 20240175947
- Publication date May 30, 2024
- ALLEGRO MICROSYSTEMS, LLC
- Hernan D. Romero
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20240151785
- Publication date May 9, 2024
- TDK Corporation
- Taiju AKUSHICHI
- G01 - MEASURING TESTING
Information Patent Application
COMPACT CURRENT SENSING FOR PROTECTION AND WIRING DEVICES
- Publication number 20240142500
- Publication date May 2, 2024
- SCHNEIDER ELECTRIC USA, INC.
- Andi Jakupi
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR ELEMENT, MAGNETIC SENSOR, AND MAGNETIC SENSOR DEVICE
- Publication number 20240142549
- Publication date May 2, 2024
- Mitsubishi Electric Corporation
- Kaito TAKESHIMA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTIVE SENSOR
- Publication number 20240125872
- Publication date Apr 18, 2024
- Analog Devices International Unlimited Company
- Fernando Franco
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR TUNNEL MAGNETORESISTANCE MULTI-TURN SENSOR MANUFACTURE...
- Publication number 20240111006
- Publication date Apr 4, 2024
- Analog Devices International Unlimited Company
- Onur Necdet Urs
- G01 - MEASURING TESTING

Constructional adaptation of the sensor to specific applications

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sensor devices, associated production methods and methods for deter...

Magnetic long-range position sensor

Magnetoresistance bridge circuits with stray field immunity

Magnetic field closed loop sensors with offset reduction

Magnetic sensor including a plurality of magnetoresistive elements...

Multi-functional magnetic test structure for XMR sensors

Device, system and method for detecting leakage current for tractio...

Position sensor system, optical lens system and display

Magnetic field current sensor to reduce stray magnetic fields

Magnetic field detection device and magnetic field detection device...

Dynamic offset and amplitude tracker

Angle sensor

Magnetic sensor

Magnetic sensor

XMR sensors with serial segment strip configurations

Magnetic field sensor with overcurrent detection

Gain-controllable magnetoresistive analog amplifier

Magnetic sensor

System and method for hole inspection

Magnetic sensor and current detecting apparatus including the same

Measuring apparatus, measuring method and recording medium

Magnetoresistance effect element

Magnetoresistance effect element

Arrangement for measuring a torque acting on a steering shaft of a...

Length detector with magnetoresitive elements

Magnetic level gauge

Position sensor system and method

Magnetic sensor unit

Current sensor

Image blur correction device, imaging device, and lens device

Patents Applicationslast 30 patents

CONDUCTOR DESIGN WITH IMPROVED CROSS-TALK ERROR

MAGNETIC SENSOR

SYSTEM AND METHOD FOR HOLE INSPECTION

MAGNETIC FIELD CURRENT SENSOR TO REDUCE STRAY MAGNETIC FIELDS

MAGNETIC SENSOR

MAGNETIC FIELD SENSOR SYSTEM WITH MAGNETIC VORTEX USED FOR B-FIELD...

MAGNETIC SENSOR, AND STATE DETECTION APPARATUS AND METHOD

MAGNETIC SENSOR

MAGNETORESISTANCE EFFECT ELEMENT

OPTICAL DETECTION DEVICE AND SIGNAL PROCESSING METHOD

INDUCING MECHANICAL STRESS IN MAGNETORESISTIVE SENSING ELEMENT TO A...

MAGNETORESISTANCE EFFECT ELEMENT

CAMERA DEVICE AND OPTICAL INSTRUMENT

DEVICE FOR THE CONTACTLESS DETECTION OF MOVEMENTS

MAGNETIC SENSOR

POSITION SENSOR SYSTEM AND METHOD

MAGNETORESISTANCE EFFECT ELEMENT

POSITION DETECTION DEVICE

REDUCING ANGLE ERROR IN ANGLE SENSOR DUE TO ORTHOGONALITY DRIFT OVE...

SENSOR UNIT

MAGNETIC FIELD DETECTION APPARATUS AND CURRENT DETECTION APPARATUS

IMAGE BLUR CORRECTION DEVICE, IMAGING DEVICE, AND LENS DEVICE

MAGNETIC SENSOR

Current Detection Apparatus and Electronic Device

MAGNETORESISTANCE BRIDGE CIRCUITS WITH STRAY FIELD IMMUNITY

MAGNETIC SENSOR

COMPACT CURRENT SENSING FOR PROTECTION AND WIRING DEVICES

MAGNETIC SENSOR ELEMENT, MAGNETIC SENSOR, AND MAGNETIC SENSOR DEVICE

MAGNETORESISTIVE SENSOR

METHODS FOR TUNNEL MAGNETORESISTANCE MULTI-TURN SENSOR MANUFACTURE...