Constructional details of contacts for gauges actuating one or more contacts

Industry

CPC
G01B7/002

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B7/00Measuring arrangements characterised by the use of electric or magnetic means

Current Industry

G01B7/002Constructional details of contacts for gauges actuating one or more contacts

Industries

Patents Grantslast 30 patents

Information Patent Grant
Thickness measuring device
- Patent number 11,549,796
- Issue date Jan 10, 2023
- TECO IMAGE SYSTEMS CO., LTD
- Chien-Ying Chen
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring thickness of dielectric layer in ci...
- Patent number 11,408,720
- Issue date Aug 9, 2022
- Unimicron Technology Corporation
- Cheng-Jui Chang
- G01 - MEASURING TESTING
Information Patent Grant
Thin film strain gauge
- Patent number 10,557,760
- Issue date Feb 11, 2020
- Strain Measurement Devices, Inc.
- Daniel E. Shapiro
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device for geometrically testing parts
- Patent number 10,444,002
- Issue date Oct 15, 2019
- ACTIMESURE
- Samuel Tregret
- G01 - MEASURING TESTING
Information Patent Grant
Workpiece holder and method using same for detecting lateral displa...
- Patent number 9,689,656
- Issue date Jun 27, 2017
- Creative Technology Corporation
- Toshifumi Sugawara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microprobe, measurement system and method
- Patent number 8,484,755
- Issue date Jul 9, 2013
- The Secretary of State for Innovation, Universities and Skills
- Richard Leach
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method for checking mechanical pieces, with wireless sig...
- Patent number 7,350,307
- Issue date Apr 1, 2008
- Marposs Societa per Azioni
- Carlo Carli
- G01 - MEASURING TESTING
Information Patent Grant
Probe for sensing the position of an object
- Patent number 7,316,077
- Issue date Jan 8, 2008
- Renishaw, PLC
- Jonathan Paul Fuge
- G01 - MEASURING TESTING
Information Patent Grant
Touch measurement system
- Patent number 7,259,749
- Issue date Aug 21, 2007
- Dr. Johannes Heidenhain GmbH
- Reinhold Schopf
- G01 - MEASURING TESTING
Information Patent Grant
Measurement probe and using method for the same
- Patent number 7,065,893
- Issue date Jun 27, 2006
- Matsushita Electric Industrial Co., Ltd.
- Takaaki Kassai
- G01 - MEASURING TESTING
Information Patent Grant
Probe triggering
- Patent number 6,941,671
- Issue date Sep 13, 2005
- Renishaw PLC
- Jonathan Paul Fuge
- G01 - MEASURING TESTING
Information Patent Grant
Method for high-accuracy non-contact capacitive displacement measur...
- Patent number 6,714,023
- Issue date Mar 30, 2004
- ADE Technologies
- Roy E. Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Touch probe
- Patent number 6,553,682
- Issue date Apr 29, 2003
- Paradyne
- Timothy R. Willoughby
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting linear dimensions of mechanical workpieces, wi...
- Patent number 6,526,670
- Issue date Mar 4, 2003
- Marposs Societa' per Azioni
- Carlo Carli
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe for machine tools with a tool spindle
- Patent number 6,370,789
- Issue date Apr 16, 2002
- Wolfgang Madlener
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Touch signal probe
- Patent number 6,360,176
- Issue date Mar 19, 2002
- Mitutoyo Corporation
- Nobuhisa Nishioki
- G01 - MEASURING TESTING
Information Patent Grant
Touch signal probe
- Patent number 6,327,789
- Issue date Dec 11, 2001
- Mitutoyo Corp.
- Kunitoshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting a contact position between an object to be mea...
- Patent number 6,191,596
- Issue date Feb 20, 2001
- Advantest Corporation
- Tohru Abiko
- G01 - MEASURING TESTING
Information Patent Grant
Process and device for monitoring objects
- Patent number 6,130,516
- Issue date Oct 10, 2000
- Leukhardt Systemelektronik GmbH
- Manfred Huber
- G05 - CONTROLLING REGULATING
Information Patent Grant
Linear actuator
- Patent number 6,118,360
- Issue date Sep 12, 2000
- Systems, Machines, Automation Components Corporation
- Edward A. Neff
- G05 - CONTROLLING REGULATING
Information Patent Grant
Motion transducer
- Patent number 6,016,097
- Issue date Jan 18, 2000
- Eaton Corporation
- David J. Gardner
- G01 - MEASURING TESTING
Information Patent Grant
Soft landing method for probe assembly
- Patent number 5,952,589
- Issue date Sep 14, 1999
- Systems, Machines, Automation Components Corporation
- Arthur T. Leung
- G05 - CONTROLLING REGULATING
Information Patent Grant
DC level transition detecting circuit for sensor devices
- Patent number 5,949,257
- Issue date Sep 7, 1999
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Amplitude detecting device
- Patent number 5,922,964
- Issue date Jul 13, 1999
- Mitutoyo Corporation
- Nobuhiro Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Micropositioning device for disk head testing system
- Patent number 5,808,435
- Issue date Sep 15, 1998
- KMY Instruments
- Michael Mager
- G05 - CONTROLLING REGULATING
Information Patent Grant
Coordinate measuring apparatus having a probe in the form of a soli...
- Patent number 5,782,004
- Issue date Jul 21, 1998
- Carl-Zeiss-Stiftung
- Karl Schepperle
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for adjusting sectional area ratio of metal-covered elect...
- Patent number 5,779,864
- Issue date Jul 14, 1998
- Sumitomo Electric Industries, Ltd.
- Akira Mikumo
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Contact-type sensor
- Patent number 5,712,961
- Issue date Jan 27, 1998
- Minolta Co., Ltd.
- Takashi Matsuo
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing circuit for trigger probe
- Patent number 5,671,542
- Issue date Sep 30, 1997
- Renishaw, plc
- James Zannis
- G01 - MEASURING TESTING
Information Patent Grant
Trigger probe circuit
- Patent number 5,669,151
- Issue date Sep 23, 1997
- Renishaw plc
- David Collingwood
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Device and Method for Measuring Thickness of Dielectric Layer in Ci...
- Publication number 20220221262
- Publication date Jul 14, 2022
- UNIMICRON TECHNOLOGY CORPORATION
- Cheng-Jui Chang
- G01 - MEASURING TESTING
Information Patent Application
THICKNESS MEASURING DEVICE
- Publication number 20220113123
- Publication date Apr 14, 2022
- Teco Image Systems Co., Ltd.
- Chien-Ying Chen
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM STRAIN GAUGE
- Publication number 20190353541
- Publication date Nov 21, 2019
- STRAIN MEASUREMENT DEVICES, INC.
- Daniel E. Shapiro
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE FOR GEOMETRICALLY TESTING PARTS
- Publication number 20190011245
- Publication date Jan 10, 2019
- ACTIMESURE
- Samuel Tregret
- G01 - MEASURING TESTING
Information Patent Application
WORKPIECE HOLDER AND METHOD USING SAME FOR DETECTING LATERAL DISPLA...
- Publication number 20150268026
- Publication date Sep 24, 2015
- CREATIVE TECHNOLOGY CORPORATION
- Toshifumi Sugawara
- G01 - MEASURING TESTING
Information Patent Application
MICROPROBE, MEASUREMENT SYSTEM AND METHOD
- Publication number 20110047661
- Publication date Feb 24, 2011
- The Secretary of State for Innovations Universities & Skills
- Richard Leach
- G01 - MEASURING TESTING
Information Patent Application
System And Method For Checking Mechanical Pieces, With Wireless Sig...
- Publication number 20070205779
- Publication date Sep 6, 2007
- Carlo Carli
- G01 - MEASURING TESTING
Information Patent Application
Probe for sensing the position of an object
- Publication number 20070068024
- Publication date Mar 29, 2007
- RENISHAW PLC
- Jonathan Paul Fuge
- G01 - MEASURING TESTING
Information Patent Application
Measurement probe and using method for the same
- Publication number 20050204573
- Publication date Sep 22, 2005
- Takaaki Kassai
- G01 - MEASURING TESTING
Information Patent Application
Probe triggering
- Publication number 20040200086
- Publication date Oct 14, 2004
- Jonathan Paul Fuge
- G01 - MEASURING TESTING
Information Patent Application
Touch measurement system
- Publication number 20040183789
- Publication date Sep 23, 2004
- Reinhold Schopf
- G01 - MEASURING TESTING
Information Patent Application
Method for high-accuracy non-contact capacitive displacement measur...
- Publication number 20030141881
- Publication date Jul 31, 2003
- ADE CORPORATION
- Roy E. Mallory
- G01 - MEASURING TESTING

Constructional details of contacts for gauges actuating one or more contacts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Thickness measuring device

Device and method for measuring thickness of dielectric layer in ci...

Thin film strain gauge

Sensor device for geometrically testing parts

Workpiece holder and method using same for detecting lateral displa...

Microprobe, measurement system and method

System and method for checking mechanical pieces, with wireless sig...

Probe for sensing the position of an object

Touch measurement system

Measurement probe and using method for the same

Probe triggering

Method for high-accuracy non-contact capacitive displacement measur...

Touch probe

System for detecting linear dimensions of mechanical workpieces, wi...

Probe for machine tools with a tool spindle

Touch signal probe

Touch signal probe

Method for detecting a contact position between an object to be mea...

Process and device for monitoring objects

Linear actuator

Motion transducer

Soft landing method for probe assembly

DC level transition detecting circuit for sensor devices

Amplitude detecting device

Micropositioning device for disk head testing system

Coordinate measuring apparatus having a probe in the form of a soli...

Apparatus for adjusting sectional area ratio of metal-covered elect...

Contact-type sensor

Signal processing circuit for trigger probe

Trigger probe circuit

Patents Applicationslast 30 patents

Device and Method for Measuring Thickness of Dielectric Layer in Ci...

THICKNESS MEASURING DEVICE

THIN FILM STRAIN GAUGE

SENSOR DEVICE FOR GEOMETRICALLY TESTING PARTS

WORKPIECE HOLDER AND METHOD USING SAME FOR DETECTING LATERAL DISPLA...

MICROPROBE, MEASUREMENT SYSTEM AND METHOD

System And Method For Checking Mechanical Pieces, With Wireless Sig...

Probe for sensing the position of an object

Measurement probe and using method for the same

Probe triggering

Touch measurement system

Method for high-accuracy non-contact capacitive displacement measur...