Constructional details of contacts

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CPC
G01B7/016

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B7/00Measuring arrangements characterised by the use of electric or magnetic means

Current Industry

G01B7/016Constructional details of contacts

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Measuring probe with sensing coils and temperature compensation
- Patent number 12,174,013
- Issue date Dec 24, 2024
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Modular configuration for coordinate measuring machine probe
- Patent number 11,733,021
- Issue date Aug 22, 2023
- Mitutoyo Corporation
- Dawn Alisa Keehnel
- G01 - MEASURING TESTING
Information Patent Grant
Articulating probe
- Patent number 11,543,230
- Issue date Jan 3, 2023
- Carl Zeiss Industrielle Messtechnik GmbH
- Dominik Seitz
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system with a ball bearing guide unit for a measuring ins...
- Patent number 10,962,347
- Issue date Mar 30, 2021
- Carl Mahr Holding GmbH
- Matthias Rudkowski
- G01 - MEASURING TESTING
Information Patent Grant
Metrology apparatus
- Patent number 9,052,177
- Issue date Jun 9, 2015
- Renishaw plc
- David Roberts McMurtry
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Touch probe and related checking method
- Patent number 9,015,953
- Issue date Apr 28, 2015
- Marposs Societa per Azioni
- Antonio Gambini
- G01 - MEASURING TESTING
Information Patent Grant
Sensor
- Patent number 7,770,302
- Issue date Aug 10, 2010
- Murata Machinery, Ltd.
- Makoto Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Probe including pressure sensitive sensors
- Patent number 7,516,672
- Issue date Apr 14, 2009
- Dr. Johannes Heidenhain GmbH
- Thomas Schroll
- G01 - MEASURING TESTING
Information Patent Grant
Probe head
- Patent number 7,464,484
- Issue date Dec 16, 2008
- Dr. Johannes Heidenhain GmbH
- Reinhold Schopf
- G01 - MEASURING TESTING
Information Patent Grant
Probe head
- Patent number 7,392,596
- Issue date Jul 1, 2008
- Dr. Johannes Heidenhain GmbH
- Reinhold Schopf
- G01 - MEASURING TESTING
Information Patent Grant
Sensor and method for locating a discontinuity
- Patent number 6,782,634
- Issue date Aug 31, 2004
- United Dominion Industries, Inc.
- Daniel L. Morneweck
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Reseat system of touch signal probe
- Patent number 6,678,966
- Issue date Jan 20, 2004
- Mitutoyo Corporation
- Satoshi Koga
- G01 - MEASURING TESTING
Information Patent Grant
Vibration-type contact detection sensor
- Patent number 6,516,669
- Issue date Feb 11, 2003
- Mitutoyo Corporation
- Kaoru Matsuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Touch probe
- Patent number 6,275,053
- Issue date Aug 14, 2001
- Renishaw PLC
- Robert B Morrison
- G01 - MEASURING TESTING
Information Patent Grant
Process for coordinate measurement on workpieces
- Patent number 5,862,604
- Issue date Jan 26, 1999
- Carl-Zeiss-Stiftung
- Anton Fuchs
- G01 - MEASURING TESTING
Information Patent Grant
Touch probe with reseat position system
- Patent number 5,756,886
- Issue date May 26, 1998
- Mitutoyo Corporation
- Kunitoshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Coupler for use in the sensor head of a measuring device
- Patent number 5,664,949
- Issue date Sep 9, 1997
- Hermann LeGuin
- G01 - MEASURING TESTING
Information Patent Grant
Touch sensor
- Patent number 4,734,549
- Issue date Mar 29, 1988
- Rin Ei Seiki Kabushiki Kaisha
- Suguru Naoi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
A SCANNING PROBE
- Publication number 20250130032
- Publication date Apr 24, 2025
- RENISHAW PLC
- Jamie John BUCKINGHAM
- G01 - MEASURING TESTING
Information Patent Application
IMAGE MEASUREMENT APPARATUS
- Publication number 20250035422
- Publication date Jan 30, 2025
- KEYENCE CORPORATION
- Takashi Naruse
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE WITH SENSING COILS AND TEMPERATURE COMPENSATION
- Publication number 20240219164
- Publication date Jul 4, 2024
- MITUTOYO CORPORATION
- Christopher Richard HAMNER
- G01 - MEASURING TESTING
Information Patent Application
TOUCH TRIGGER PROBE WITH CAPACITIVE SENSOR
- Publication number 20240200924
- Publication date Jun 20, 2024
- HEXAGON TECHNOLOGY CENTER GMBH
- Marcel ROHNER
- G01 - MEASURING TESTING
Information Patent Application
CONTROL METHOD OF AN AUTOMATIC INSIDE-DIAMETER MEASURING APPARATUS...
- Publication number 20230304785
- Publication date Sep 28, 2023
- MITUTOYO CORPORATION
- Keita OGAWA
- G01 - MEASURING TESTING
Information Patent Application
A sensor module for detecting unevenness of a surface, an apparatus...
- Publication number 20230221104
- Publication date Jul 13, 2023
- RAYONG ENGINEERING AND PLANT SERVICE CO., LTD.
- Paisal PANDUM
- G01 - MEASURING TESTING
Information Patent Application
MODULAR CONFIGURATION FOR COORDINATE MEASURING MACHINE PROBE
- Publication number 20230194235
- Publication date Jun 22, 2023
- MITUTOYO CORPORATION
- Dawn Alisa KEEHNEL
- G01 - MEASURING TESTING
Information Patent Application
Measuring System With A Ball Bearing Guide Unit For A Measuring Ins...
- Publication number 20190003819
- Publication date Jan 3, 2019
- CARL MAHR HOLDING GMBH
- Matthias Rudkowski
- G01 - MEASURING TESTING
Information Patent Application
TOUCH PROBE AND RELATED CHECKING METHOD
- Publication number 20130205609
- Publication date Aug 15, 2013
- MARPOSS SOCIETA' PER AZIONI
- Antonio Gambini
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS
- Publication number 20130111774
- Publication date May 9, 2013
- RENISHAW PLC
- David Roberts McMurtry
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20090133277
- Publication date May 28, 2009
- Makoto Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Probe
- Publication number 20070283762
- Publication date Dec 13, 2007
- Thomas Schroll
- G01 - MEASURING TESTING
Information Patent Application
Stylus tip for workpiece contacting probe
- Publication number 20070137057
- Publication date Jun 21, 2007
- RENISHAW PLC
- Magdalena Lewicka-Schafer
- G01 - MEASURING TESTING
Information Patent Application
Probe head
- Publication number 20070062057
- Publication date Mar 22, 2007
- Reinhold Schopf
- G01 - MEASURING TESTING
Information Patent Application
Probe head
- Publication number 20070051005
- Publication date Mar 8, 2007
- Reinhold Schopf
- G01 - MEASURING TESTING
Information Patent Application
Sensor and method for locating a discontinuity
- Publication number 20020184781
- Publication date Dec 12, 2002
- United Dominion Industries, Inc.
- Daniel L. Morneweck
- G01 - MEASURING TESTING
Information Patent Application
Vibration-type contact detection sensor
- Publication number 20020005062
- Publication date Jan 17, 2002
- Kaoru Matsuki
- G01 - MEASURING TESTING

Constructional details of contacts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measuring probe with sensing coils and temperature compensation

Modular configuration for coordinate measuring machine probe

Articulating probe

Measuring system with a ball bearing guide unit for a measuring ins...

Metrology apparatus

Touch probe and related checking method

Sensor

Probe including pressure sensitive sensors

Probe head

Probe head

Sensor and method for locating a discontinuity

Reseat system of touch signal probe

Vibration-type contact detection sensor

Touch probe

Process for coordinate measurement on workpieces

Touch probe with reseat position system

Coupler for use in the sensor head of a measuring device

Touch sensor

Patents Applicationslast 30 patents

A SCANNING PROBE

IMAGE MEASUREMENT APPARATUS

MEASURING PROBE WITH SENSING COILS AND TEMPERATURE COMPENSATION

TOUCH TRIGGER PROBE WITH CAPACITIVE SENSOR

CONTROL METHOD OF AN AUTOMATIC INSIDE-DIAMETER MEASURING APPARATUS...

A sensor module for detecting unevenness of a surface, an apparatus...

MODULAR CONFIGURATION FOR COORDINATE MEASURING MACHINE PROBE

Measuring System With A Ball Bearing Guide Unit For A Measuring Ins...

TOUCH PROBE AND RELATED CHECKING METHOD

METROLOGY APPARATUS

SENSOR

Probe

Stylus tip for workpiece contacting probe

Probe head

Probe head

Sensor and method for locating a discontinuity

Vibration-type contact detection sensor