Constructional details of contacts

Industry

CPC
G01B5/016

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B5/00Measuring arrangements characterised by the use of mechanical means

Current Industry

G01B5/016Constructional details of contacts

Industries

Patents Grantslast 30 patents

Information Patent Grant
Extended stylus for a coordinate measuring machine
- Patent number 11,940,270
- Issue date Mar 26, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Otto Ruck
- G01 - MEASURING TESTING
Information Patent Grant
Configuration of a non-destructive testing device
- Patent number 11,898,835
- Issue date Feb 13, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Michel Cardoso
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement method and apparatus
- Patent number 11,846,497
- Issue date Dec 19, 2023
- Renishaw plc
- John Charles Ould
- G01 - MEASURING TESTING
Information Patent Grant
Inspection master
- Patent number 11,781,849
- Issue date Oct 10, 2023
- Asanuma Giken Co., Ltd.
- Susumu Asanuma
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing workpieces
- Patent number 11,774,228
- Issue date Oct 3, 2023
- Carl Zeiss Industrielle Messtechnik GmbH
- Günter Haas
- G01 - MEASURING TESTING
Information Patent Grant
Modular configuration for coordinate measuring machine probe
- Patent number 11,733,021
- Issue date Aug 22, 2023
- Mitutoyo Corporation
- Dawn Alisa Keehnel
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring turbine shape
- Patent number 11,719,524
- Issue date Aug 8, 2023
- Mitsubishi Heavy Industries, Ltd.
- Koji Ishibashi
- G01 - MEASURING TESTING
Information Patent Grant
Coupling element for receiving a probe tip in a probe measuring app...
- Patent number 11,585,655
- Issue date Feb 21, 2023
- Haimer GmbH
- Andreas Haimer
- G01 - MEASURING TESTING
Information Patent Grant
Articulating probe
- Patent number 11,543,230
- Issue date Jan 3, 2023
- Carl Zeiss Industrielle Messtechnik GmbH
- Dominik Seitz
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detector, surface shape measuring apparatus, and round...
- Patent number 11,435,175
- Issue date Sep 6, 2022
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detector, surface shape measuring apparatus, and round...
- Patent number 11,397,073
- Issue date Jul 26, 2022
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING
Information Patent Grant
Shape measurement device
- Patent number 11,346,647
- Issue date May 31, 2022
- Jae Eun Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Defect judging unit of measuring probe and defect judging method th...
- Patent number 11,268,874
- Issue date Mar 8, 2022
- Mitutoyo Corporation
- Akinori Saito
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring turbine shape
- Patent number 11,215,437
- Issue date Jan 4, 2022
- MITSUBISHI POWER, LTD.
- Koji Ishibashi
- G01 - MEASURING TESTING
Information Patent Grant
Probe and cap therefor
- Patent number 11,092,420
- Issue date Aug 17, 2021
- Elcometer Limited
- Michael Carrington Sellars
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus for surface or contour measurement
- Patent number 10,928,177
- Issue date Feb 23, 2021
- JENOPTIK Industrial Metrology Germany GmbH
- Philipp Steuer
- G01 - MEASURING TESTING
Information Patent Grant
Inductive position detection configuration for indicating a measure...
- Patent number 10,914,570
- Issue date Feb 9, 2021
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus management system and program
- Patent number 10,900,764
- Issue date Jan 26, 2021
- Mitutoyo Corporation
- Toshiyuki Tamai
- G01 - MEASURING TESTING
Information Patent Grant
Detector, surface property measuring machine, and roundness measuri...
- Patent number 10,724,841
- Issue date Jul 28, 2020
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING
Information Patent Grant
Method for controlling shape measuring apparatus
- Patent number 10,697,748
- Issue date Jun 30, 2020
- Mitutoyo Corporation
- Takashi Noda
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system and measuring method
- Patent number 10,648,792
- Issue date May 12, 2020
- Carl Zeiss Industrielle Messtechnik GmbH
- Tobias Held
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe head for a coordinate measuring machine
- Patent number 10,488,171
- Issue date Nov 26, 2019
- Carl Zeiss Industrielle Messtechnik GmbH
- Otto Ruck
- G01 - MEASURING TESTING
Information Patent Grant
Measurement probe and measuring device
- Patent number 10,415,947
- Issue date Sep 17, 2019
- Mitutoyo Corporation
- Hideyuki Arai
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe
- Patent number 10,393,495
- Issue date Aug 27, 2019
- Mitutoyo Corporation
- Satoshi Koga
- G01 - MEASURING TESTING
Information Patent Grant
Position measurement method of object in machine tool and position...
- Patent number 10,359,266
- Issue date Jul 23, 2019
- Okuma Corporation
- Reiji Kanbe
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Single sensor type three-dimensional micro/nano contact trigger mea...
- Patent number 10,288,403
- Issue date May 14, 2019
- HEFEI UNIVERSITY OF TECHNOLOGY
- Ruijun Li
- G01 - MEASURING TESTING
Information Patent Grant
Internal dimension detection using contact direction sensitive probe
- Patent number 10,274,302
- Issue date Apr 30, 2019
- Amazon Technologies, Inc.
- Jonathan G. McGuire
- G01 - MEASURING TESTING
Information Patent Grant
Probe head of three-dimensional coordinate measuring device and tou...
- Patent number 10,197,375
- Issue date Feb 5, 2019
- Mitutoyo Corporation
- Hisayoshi Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Touch probe for CMM including digital signal communication
- Patent number 10,145,666
- Issue date Dec 4, 2018
- Mitutoyo Corporation
- Bjorn Erik Bertil Jansson
- G01 - MEASURING TESTING
Information Patent Grant
Ball-shaft connection
- Patent number 9,829,301
- Issue date Nov 28, 2017
- Frank Richter
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STORAGE DEVICE AND STORAGE METHOD FOR MEASUREMENT PROBE
- Publication number 20240426589
- Publication date Dec 26, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- TOSHIO SHIBUTANI
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
MEASURING SYSTEM AND MEASUREMENT METHOD
- Publication number 20240240926
- Publication date Jul 18, 2024
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE UPDATE RATE FOR MEASURING PROBE
- Publication number 20240077296
- Publication date Mar 7, 2024
- MITUTOYO CORPORATION
- Scott Allen HARSILA
- G01 - MEASURING TESTING
Information Patent Application
MODULAR CONFIGURATION FOR COORDINATE MEASURING MACHINE PROBE
- Publication number 20230194235
- Publication date Jun 22, 2023
- MITUTOYO CORPORATION
- Dawn Alisa KEEHNEL
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALCULATING COMPENSATION PARAMETER OF MOTION ERROR IN MA...
- Publication number 20230069773
- Publication date Mar 2, 2023
- OKUMA CORPORATION
- Yasunori KONDO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
MANUFACTURING METHOD AND APPARATUS
- Publication number 20220307811
- Publication date Sep 29, 2022
- RENISHAW PLC
- Colin Ray BULLED
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTION MASTER
- Publication number 20220221261
- Publication date Jul 14, 2022
- ASANUMA GIKEN CO., LTD.
- Susumu ASANUMA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT TOOL HAVING TIP PART CONSISTING OF POLYCRYSTALLINE DIAMOND
- Publication number 20220205770
- Publication date Jun 30, 2022
- Sumitomo Electric Industries, Ltd.
- Fumihide SAKANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING TURBINE SHAPE
- Publication number 20220057186
- Publication date Feb 24, 2022
- Mitsubishi Power, Ltd.
- Koji Ishibashi
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURATION OF A NON-DESTRUCTIVE TESTING DEVICE
- Publication number 20210389119
- Publication date Dec 16, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Michel CARDOSO
- G01 - MEASURING TESTING
Information Patent Application
Coupling Element for Receiving a Probe Tip in a Probe Measuring App...
- Publication number 20210356266
- Publication date Nov 18, 2021
- HAIMER GMBH
- Andreas Haimer
- G01 - MEASURING TESTING
Information Patent Application
Extended Stylus for a Coordinate Measuring Machine
- Publication number 20210302144
- Publication date Sep 30, 2021
- Carl Zeiss Industrielle Messtechnik GmbH
- Otto RUCK
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT DETECTOR, SURFACE SHAPE MEASURING APPARATUS, AND ROUND...
- Publication number 20210285751
- Publication date Sep 16, 2021
- TOKYO SEIMITSU CO., LTD.
- Hideki MORII
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND APPARATUS
- Publication number 20210207938
- Publication date Jul 8, 2021
- RENISHAW PLC
- John Charles OULD
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Testing Workpieces
- Publication number 20210180933
- Publication date Jun 17, 2021
- Carl Zeiss Industrielle Messtechnik GmbH
- Günter HAAS
- G01 - MEASURING TESTING
Information Patent Application
Autonomous Instrument For Scanning And Determining The Material Sur...
- Publication number 20210048292
- Publication date Feb 18, 2021
- STC Rainforest Innovations
- Ishtiaque Anwar
- G01 - MEASURING TESTING
Information Patent Application
DEFECT JUDGING UNIT OF MEASURING PROBE AND DEFECT JUDGING METHOD TH...
- Publication number 20200386646
- Publication date Dec 10, 2020
- MITUTOYO CORPORATION
- Akinori SAITO
- G01 - MEASURING TESTING
Information Patent Application
Articulating Probe
- Publication number 20200386531
- Publication date Dec 10, 2020
- Carl Zeiss Industrielle Messtechnik GmbH
- Dominik SEITZ
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASUREMENT DEVICE
- Publication number 20200370875
- Publication date Nov 26, 2020
- Jae Eun HWANG
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Measuring Turbine Shape
- Publication number 20200326172
- Publication date Oct 15, 2020
- MITSUBISHI HITACHI POWER SYSTEMS, LTD.
- Koji ISHIBASHI
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...
- Publication number 20200141717
- Publication date May 7, 2020
- MITUTOYO CORPORATION
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR, SURFACE PROPERTY MEASURING MACHINE, AND ROUNDNESS MEASURI...
- Publication number 20190368855
- Publication date Dec 5, 2019
- TOKYO SEIMITSU CO., LTD.
- Hideki MORII
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND CAP THEREFOR
- Publication number 20190271530
- Publication date Sep 5, 2019
- Elcometer Limited
- Michael Carrington Sellars
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS FOR SURFACE OR CONTOUR MEASUREMENT
- Publication number 20190249975
- Publication date Aug 15, 2019
- JENOPTIK Industrial Metrology Germany GmbH
- Philipp STEUER
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS MANAGEMENT SYSTEM AND PROGRAM
- Publication number 20190017797
- Publication date Jan 17, 2019
- MITUTOYO CORPORATION
- Toshiyuki TAMAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS
- Publication number 20180216924
- Publication date Aug 2, 2018
- MITUTOYO CORPORATION
- Takashi NODA
- G01 - MEASURING TESTING
Information Patent Application
TOUCH PROBE FOR CMM INCLUDING DIGITAL SIGNAL COMMUNICATION
- Publication number 20180172416
- Publication date Jun 21, 2018
- MITUTOYO CORPORATION
- Bjorn Erik Bertil Jansson
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROBE AND MEASURING DEVICE
- Publication number 20180023936
- Publication date Jan 25, 2018
- MITUTOYO CORPORATION
- Hideyuki ARAI
- G01 - MEASURING TESTING
Information Patent Application
POSITION MEASUREMENT METHOD OF OBJECT IN MACHINE TOOL AND POSITION...
- Publication number 20170299366
- Publication date Oct 19, 2017
- OKUMA CORPORATION
- Reiji KANBE
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20170248400
- Publication date Aug 31, 2017
- MITUTOYO CORPORATION
- Satoshi KOGA
- G01 - MEASURING TESTING

Constructional details of contacts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Extended stylus for a coordinate measuring machine

Configuration of a non-destructive testing device

Measurement method and apparatus

Inspection master

Method and apparatus for testing workpieces

Modular configuration for coordinate measuring machine probe

Method and system for measuring turbine shape

Coupling element for receiving a probe tip in a probe measuring app...

Articulating probe

Displacement detector, surface shape measuring apparatus, and round...

Displacement detector, surface shape measuring apparatus, and round...

Shape measurement device

Defect judging unit of measuring probe and defect judging method th...

Method and system for measuring turbine shape

Probe and cap therefor

Measuring apparatus for surface or contour measurement

Inductive position detection configuration for indicating a measure...

Measuring apparatus management system and program

Detector, surface property measuring machine, and roundness measuri...

Method for controlling shape measuring apparatus

Measuring system and measuring method

Probe head for a coordinate measuring machine

Measurement probe and measuring device

Measuring probe

Position measurement method of object in machine tool and position...

Single sensor type three-dimensional micro/nano contact trigger mea...

Internal dimension detection using contact direction sensitive probe

Probe head of three-dimensional coordinate measuring device and tou...

Touch probe for CMM including digital signal communication

Ball-shaft connection

Patents Applicationslast 30 patents

STORAGE DEVICE AND STORAGE METHOD FOR MEASUREMENT PROBE

MEASURING SYSTEM AND MEASUREMENT METHOD

ADJUSTABLE UPDATE RATE FOR MEASURING PROBE

MODULAR CONFIGURATION FOR COORDINATE MEASURING MACHINE PROBE

METHOD FOR CALCULATING COMPENSATION PARAMETER OF MOTION ERROR IN MA...

MANUFACTURING METHOD AND APPARATUS

INSPECTION MASTER

MEASUREMENT TOOL HAVING TIP PART CONSISTING OF POLYCRYSTALLINE DIAMOND

METHOD AND SYSTEM FOR MEASURING TURBINE SHAPE

CONFIGURATION OF A NON-DESTRUCTIVE TESTING DEVICE

Coupling Element for Receiving a Probe Tip in a Probe Measuring App...

Extended Stylus for a Coordinate Measuring Machine

DISPLACEMENT DETECTOR, SURFACE SHAPE MEASURING APPARATUS, AND ROUND...

MEASUREMENT METHOD AND APPARATUS

Method and Apparatus for Testing Workpieces

Autonomous Instrument For Scanning And Determining The Material Sur...

DEFECT JUDGING UNIT OF MEASURING PROBE AND DEFECT JUDGING METHOD TH...

Articulating Probe

SHAPE MEASUREMENT DEVICE

Method and System for Measuring Turbine Shape

INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...

DETECTOR, SURFACE PROPERTY MEASURING MACHINE, AND ROUNDNESS MEASURI...

PROBE AND CAP THEREFOR

MEASURING APPARATUS FOR SURFACE OR CONTOUR MEASUREMENT

MEASURING APPARATUS MANAGEMENT SYSTEM AND PROGRAM

METHOD FOR CONTROLLING SHAPE MEASURING APPARATUS

TOUCH PROBE FOR CMM INCLUDING DIGITAL SIGNAL COMMUNICATION

MEASUREMENT PROBE AND MEASURING DEVICE

POSITION MEASUREMENT METHOD OF OBJECT IN MACHINE TOOL AND POSITION...

MEASURING PROBE