CPC
G01S7/481
Information
Patent Grant
HERE Global B.V.
Ion Moraru
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Waymo LLC
Pierre-Yves Droz
G01 - MEASURING TESTING
Information
Patent Grant
VELODYNE LIDAR USA, INC.
Nathan Wilkerson
G01 - MEASURING TESTING
Information
Patent Grant
Keyence Corporation
Sohei Kanoda
G01 - MEASURING TESTING
Information
Patent Grant
Continental Autonomous Mobility US, LLC
Patrick B Gilliland
G01 - MEASURING TESTING
Information
Patent Grant
STMicroelectronics (Grenoble 2) SAS
Fabien Quercia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Quanergy Solutions, Inc.
Alfred Riddle
G01 - MEASURING TESTING
Information
Patent Grant
FUJIFILM Business Innovation Corp.
Daisuke Iguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Hyundai Motor Company
Jung Wook Lim
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Hyundai Motor Company
Eun Sang Lee
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
AQRONOS, INC.
Marin Iliev
G01 - MEASURING TESTING
Information
Patent Grant
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Masamune Hamamatsu
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Zoox, Inc.
Scott M. Purdy
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Leica Geosystems AG
Simon Mark
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
AURORA OPERATIONS, INC.
Zeb Barber
G05 - CONTROLLING REGULATING
Information
Patent Grant
SUTENG INNOVATION TECHNOLOGY CO., LTD.
Maonan Huang
G01 - MEASURING TESTING
Information
Patent Grant
Goodrich Corporation
Rajkumar Sengodan
G01 - MEASURING TESTING
Information
Patent Grant
AMS-OSRAM INTERNATIONAL GMBH
Massimo Cataldo Mazzillo
G01 - MEASURING TESTING
Information
Patent Grant
AURORA OPERATIONS, INC.
Scott Boehmke
G01 - MEASURING TESTING
Information
Patent Grant
LYTE AI, INC.
Arman Hajati
G01 - MEASURING TESTING
Information
Patent Grant
Caterpillar Inc.
Adam L. Berry
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Elbit Systems Ltd.
Yoav Ophir
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Mobileye Vision Technologies Ltd.
Kevin Rosenblum
B60 - VEHICLES IN GENERAL
Information
Patent Grant
OPTOELEC CO., LTD
Yong Woo Kim
G01 - MEASURING TESTING
Information
Patent Grant
Wavefront Analysis, Inc.
Rolf Jon Gerchberg
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Mitsushi Tabata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Somar Corporation
Naoki Sakazume
G01 - MEASURING TESTING
Information
Patent Grant
Zoox, Inc.
Daniel Glenn Johnson
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Hamamatsu Photonics K.K.
Shinya Iwashina
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
FUJIFILM Corporation
Hiroshi Sato
G01 - MEASURING TESTING
Information
Patent Application
Koito Manufacturing Co., Ltd.
Hirohisa Deguchi
G01 - MEASURING TESTING
Information
Patent Application
PHOS GLOBAL ENERGY SOLUTIONS, INC.
Eugene Earle Rudolph
G01 - MEASURING TESTING
Information
Patent Application
Murata Manufacturing Co., Ltd.
Hiroshi WATANABE
G01 - MEASURING TESTING
Information
Patent Application
ROBERT BOSCH GmbH
Annette Frederiksen
G01 - MEASURING TESTING
Information
Patent Application
Ouster, Inc.
Angus PACALA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Koito Manufacturing Co., Ltd.
Koji ITABA
G01 - MEASURING TESTING
Information
Patent Application
SK HYNIX INC.
Soon Yeol PARK
G01 - MEASURING TESTING
Information
Patent Application
NEC Laboratories America, Inc.
Yaowen LI
G01 - MEASURING TESTING
Information
Patent Application
GM GLOBAL TECHNOLOGY OPERATIONS LLC
Azeem Sarwar
G01 - MEASURING TESTING
Information
Patent Application
CHANGZHOU HUADA KEJIE OPTO-ELECTRO INSTRUMENT CO., LTD.
Ou ZHANG
G01 - MEASURING TESTING
Information
Patent Application
INFINEON TECHNOLOGIES AG
Boris KIRILLOV
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
BOE TECHNOLOGY GROUP CO., LTD.
Yuehua LIU
G01 - MEASURING TESTING
Information
Patent Application
WAYMO LLC
Mark Alexander Shand
G01 - MEASURING TESTING
Information
Patent Application
UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
Chong Wang
G01 - MEASURING TESTING
Information
Patent Application
Elmos Semiconductor SE
André Srowig
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Aeva, Inc.
Richard L. SEBASTIAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Soya HATAZAKI
G01 - MEASURING TESTING
Information
Patent Application
AURORA OPERATIONS, INC.
Andrew Steil MICHAELS
G01 - MEASURING TESTING
Information
Patent Application
GEOTEKNICA CLIMATE CHANGE SOLUTIONS INC.
Thomas Edward DARCIE
G01 - MEASURING TESTING
Information
Patent Application
STMicroelectronics International N.V.
Yandong MAO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STMicroelectronics International N.V.
Tat Ming TEO
G01 - MEASURING TESTING
Information
Patent Application
FUJIFILM CORPORATION
Koki NAKABAYASHI
G01 - MEASURING TESTING
Information
Patent Application
STMicroelectronics International N.V.
Yandong MAO
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
STMicroelectronics International N.V.
Yandong MAO
G01 - MEASURING TESTING
Information
Patent Application
OPSYS Tech Ltd.
Larry Fabiny
G01 - MEASURING TESTING
Information
Patent Application
SHENZHEN METALENX TECHNOLOGY CO.,LTD
Xiaobo Zhao
G01 - MEASURING TESTING
Information
Patent Application
Microvision, Inc.
Dirk Tenne
G01 - MEASURING TESTING
Information
Patent Application
Aurora Operations, Inc.
Andrew Steil Michaels
G01 - MEASURING TESTING
Information
Patent Application
UNIVERSITÉ D'AIX-MARSEILLE
Stéphane Viollet
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Hesai Technology Co., Ltd.
Kangping LI
G01 - MEASURING TESTING
