cooling, cryostats

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CPC
G01N2223/3103

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/3103cooling, cryostats

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Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for 3D structure estimation using non-uniform r...
- Patent number 11,680,914
- Issue date Jun 20, 2023
- The Governing Council of the University of Toronto
- Ali Punjani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Qualification process for cryo-electron microscopy samples as well...
- Patent number 11,609,171
- Issue date Mar 21, 2023
- Xtal Concepts GmbH
- Annette Eckhardt
- G01 - MEASURING TESTING
Information Patent Grant
Systems for imaging
- Patent number 11,585,953
- Issue date Feb 21, 2023
- Shanghai United Imaging Healthcare Co., Ltd.
- Ting Ye
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging system containing x-ray apparatus having gratings and...
- Patent number 11,530,994
- Issue date Dec 20, 2022
- Konica Minolta, Inc.
- Mitsuharu Kitamura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Electromagnetic X-ray control
- Patent number 11,315,751
- Issue date Apr 26, 2022
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for determining the microstructure of a metal pro...
- Patent number 11,249,037
- Issue date Feb 15, 2022
- SMS group GMBH
- Mostafa Biglari
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Device for clamping and controlling the temperature of planar sampl...
- Patent number 10,948,433
- Issue date Mar 16, 2021
- Helmholtz-Zentrum Geesthacht Zentrum Für Material—und Küstenforschung GmbH
- Armin Kriele
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector monitoring device
- Patent number 10,837,925
- Issue date Nov 17, 2020
- Shimadzu Corporation
- Keijiro Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector and X-ray CT apparatus
- Patent number 10,823,684
- Issue date Nov 3, 2020
- Canon Medical Systems Corporation
- Minoru Horinouchi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for preparing cryo-em grids
- Patent number 10,770,265
- Issue date Sep 8, 2020
- Neptune Fluid Flow Systems LLC
- Trevor Allen McQueen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation imaging system, radiation imaging method, and non-transit...
- Patent number 10,768,122
- Issue date Sep 8, 2020
- Canon Kabushiki Kaisha
- Toshikazu Tamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray imaging system containing X-ray apparatus having gratings and...
- Patent number 10,732,133
- Issue date Aug 4, 2020
- Konica Minolta, Inc.
- Mitsuharu Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray analytical instrument with improved control of detector cooli...
- Patent number 10,267,925
- Issue date Apr 23, 2019
- Olympus Scientific Solutions Americas Inc.
- Marc Battyani
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analytical instrument with improved control of detector cooli...
- Patent number 10,094,936
- Issue date Oct 9, 2018
- Olympus Scientific Solutions Americas Inc.
- Marc Battyani
- G01 - MEASURING TESTING
Information Patent Grant
Computed tomography system having cooling system
- Patent number 10,058,296
- Issue date Aug 28, 2018
- Samsung Electronics Co., Ltd.
- Alexander Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray analyzer
- Patent number 10,048,216
- Issue date Aug 14, 2018
- Hitachi High-Tech Science Corporation
- Keiichi Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Open-air crystallization plate cooler
- Patent number 9,995,696
- Issue date Jun 12, 2018
- Daniel Marc Himmel
- G01 - MEASURING TESTING
Information Patent Grant
X-ray laser microscopy sample analysis system and method
- Patent number 9,859,029
- Issue date Jan 2, 2018
- Allison Sihan Jia
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray laser microscopy system and method
- Patent number 9,583,229
- Issue date Feb 28, 2017
- Yiying Cao
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of making an imaging inspection apparatus with improved cooling
- Patent number 7,490,984
- Issue date Feb 17, 2009
- Endicott Interconnect Technologies, Inc.
- Ashwinkumar C. Bhatt
- G01 - MEASURING TESTING
Information Patent Grant
Imaging inspection apparatus with improved cooling
- Patent number 7,354,197
- Issue date Apr 8, 2008
- Endicott Interconnect Technologies, Inc.
- Ashwinkumar C. Bhatt
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of fluids
- Patent number 4,795,903
- Issue date Jan 3, 1989
- United Kingdom Atomic Energy Authority
- Colin G. Clayton
- G01 - MEASURING TESTING
Information Patent Grant
Low-temperature goniometer for X-ray and neutron diffractometry
- Patent number 4,644,761
- Issue date Feb 24, 1987
- Kernforschungsanlage Julich Gesellschaft mit beschrankter Haftung
- Johann Chatzipetros
- G01 - MEASURING TESTING
Information Patent Grant
X-ray chemical analyzer for field applications
- Patent number 4,063,089
- Issue date Dec 13, 1977
- The United States of America as represented by the United States Energy Resea...
- Otto O. M. Gamba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR SCANNING A COMPONENT
- Publication number 20240361218
- Publication date Oct 31, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240288592
- Publication date Aug 29, 2024
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20240219324
- Publication date Jul 4, 2024
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR 3D STRUCTURE ESTIMATION USING NON-UNIFORM R...
- Publication number 20230333035
- Publication date Oct 19, 2023
- The Governing Council of the University of Toronto
- Ali PUNJANI
- G01 - MEASURING TESTING
Information Patent Application
CRYOGENIC SAMPLE HANDLING AND STORAGE SYSTEM
- Publication number 20230296639
- Publication date Sep 21, 2023
- FEI Company
- Vojtech DOLEZAL
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
HIGH THROUGHPUT MICROCRYSTAL SOAKING FOR STRUCTURAL ANALYSIS OF PRO...
- Publication number 20230213463
- Publication date Jul 6, 2023
- California Institute of Technology
- Jessica Burch
- G01 - MEASURING TESTING
Information Patent Application
BRAKING RESISTOR ARRANGEMENT IN A COMPUTED TOMOGRAPHY GANTRY
- Publication number 20230007811
- Publication date Jan 5, 2023
- Siemens Healthcare GmbH
- Florian KIESSLING
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
IN-SITU X-RAY DIFFRACTION ANALYSIS APPARATUS INCLUDING PELTIER-TYPE...
- Publication number 20220140418
- Publication date May 5, 2022
- Seoul National University R&DB Foundation
- Yung-Eun Sung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUALIFICATION PROCESS FOR CRYO-ELECTRON MICROSCOPY SAMPLES AS WELL...
- Publication number 20200363345
- Publication date Nov 19, 2020
- Xtal Concepts GmbH
- Annette Eckhardt
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC X-RAY CONTROL
- Publication number 20200343070
- Publication date Oct 29, 2020
- The Boeing Company
- Morteza Safai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS AND SYSTEMS FOR 3D STRUCTURE ESTIMATION USING NON-UNIFORM R...
- Publication number 20200333270
- Publication date Oct 22, 2020
- Ali PUNJANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY IMAGING SYSTEM CONTAINING X-RAY APPARATUS HAVING GRATINGS AND...
- Publication number 20200319120
- Publication date Oct 8, 2020
- Konica Minolta, Inc.
- Mitsuharu KITAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PREPARING CRYO-EM GRIDS
- Publication number 20200303162
- Publication date Sep 24, 2020
- Neptune Fluid Flow Systems LLC
- Trevor Allen McQueen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device For Clamping And Controlling The Temperature Of Planar Sampl...
- Publication number 20200150061
- Publication date May 14, 2020
- Helmholtz-Zentrum Geesthacht Zentrum fur Material-und Kustenforschung GmbH
- Armin Kriele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY DETECTOR AND X-RAY CT APPARATUS
- Publication number 20200011813
- Publication date Jan 9, 2020
- Canon Medical Systems Corporation
- Minoru HORINOUCHI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETERMINING THE MICROSTRUCTURE OF A METAL PRO...
- Publication number 20190292624
- Publication date Sep 26, 2019
- SMS group GMBH
- Mostafa BIGLARI
- C21 - METALLURGY OF IRON
Information Patent Application
X-RAY ANALYTICAL INSTRUMENT WITH IMPROVED CONTROL OF DETECTOR COOLI...
- Publication number 20190004184
- Publication date Jan 3, 2019
- Olympus Scientific Solutions Americas Inc.
- Marc Battyani
- G01 - MEASURING TESTING
Information Patent Application
Deep Water Radiography
- Publication number 20180120240
- Publication date May 3, 2018
- VAREX IMAGING CORPORATION
- Gongyin Chen
- G01 - MEASURING TESTING
Information Patent Application
OPEN-AIR CRYSTALLIZATION PLATE COOLER
- Publication number 20170299527
- Publication date Oct 19, 2017
- Daniel Marc Himmel
- G01 - MEASURING TESTING
Information Patent Application
X-RAY LASER MICROSCOPY SAMPLE ANALYSIS SYSTEM AND METHOD
- Publication number 20170169910
- Publication date Jun 15, 2017
- Rising Star Pathway, a California Corporation
- Allison Sihan Jia
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYTICAL INSTRUMENT WITH IMPROVED CONTROL OF DETECTOR COOLI...
- Publication number 20170123075
- Publication date May 4, 2017
- Olympus Scientific Solutions Americas Inc.
- Marc Battyani
- G01 - MEASURING TESTING
Information Patent Application
Method of making an imaging inspection apparatus with improved cooling
- Publication number 20080144768
- Publication date Jun 19, 2008
- Endicott Interconnect Technologies, Inc.
- Ashwinkumar C. Bhatt
- G01 - MEASURING TESTING
Information Patent Application
Imaging inspection apparatus with improved cooling
- Publication number 20060274891
- Publication date Dec 7, 2006
- Endicott Interconnect Technologies, Inc.
- Ashwinkumar C. Bhatt
- G01 - MEASURING TESTING

cooling, cryostats

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray fluorescence analyzer

Methods and systems for 3D structure estimation using non-uniform r...

Qualification process for cryo-electron microscopy samples as well...

Systems for imaging

X-ray imaging system containing x-ray apparatus having gratings and...

Electromagnetic X-ray control

Device and method for determining the microstructure of a metal pro...

Device for clamping and controlling the temperature of planar sampl...

X-ray detector monitoring device

X-ray detector and X-ray CT apparatus

System and method for preparing cryo-em grids

Radiation imaging system, radiation imaging method, and non-transit...

X-ray imaging system containing X-ray apparatus having gratings and...

X-ray analytical instrument with improved control of detector cooli...

X-ray analytical instrument with improved control of detector cooli...

Computed tomography system having cooling system

X-ray analyzer

Open-air crystallization plate cooler

X-ray laser microscopy sample analysis system and method

X-ray laser microscopy system and method

Method of making an imaging inspection apparatus with improved cooling

Imaging inspection apparatus with improved cooling

Analysis of fluids

Low-temperature goniometer for X-ray and neutron diffractometry

X-ray chemical analyzer for field applications

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR SCANNING A COMPONENT

X-RAY INSPECTION APPARATUS

X-RAY INSPECTION DEVICE

METHODS AND SYSTEMS FOR 3D STRUCTURE ESTIMATION USING NON-UNIFORM R...

CRYOGENIC SAMPLE HANDLING AND STORAGE SYSTEM

HIGH THROUGHPUT MICROCRYSTAL SOAKING FOR STRUCTURAL ANALYSIS OF PRO...

BRAKING RESISTOR ARRANGEMENT IN A COMPUTED TOMOGRAPHY GANTRY

IN-SITU X-RAY DIFFRACTION ANALYSIS APPARATUS INCLUDING PELTIER-TYPE...

QUALIFICATION PROCESS FOR CRYO-ELECTRON MICROSCOPY SAMPLES AS WELL...

ELECTROMAGNETIC X-RAY CONTROL

METHODS AND SYSTEMS FOR 3D STRUCTURE ESTIMATION USING NON-UNIFORM R...

X-RAY IMAGING SYSTEM CONTAINING X-RAY APPARATUS HAVING GRATINGS AND...

SYSTEM AND METHOD FOR PREPARING CRYO-EM GRIDS

Device For Clamping And Controlling The Temperature Of Planar Sampl...

X-RAY DETECTOR AND X-RAY CT APPARATUS

DEVICE AND METHOD FOR DETERMINING THE MICROSTRUCTURE OF A METAL PRO...

X-RAY ANALYTICAL INSTRUMENT WITH IMPROVED CONTROL OF DETECTOR COOLI...

Deep Water Radiography

OPEN-AIR CRYSTALLIZATION PLATE COOLER

X-RAY LASER MICROSCOPY SAMPLE ANALYSIS SYSTEM AND METHOD

X-RAY ANALYTICAL INSTRUMENT WITH IMPROVED CONTROL OF DETECTOR COOLI...

Method of making an imaging inspection apparatus with improved cooling

Imaging inspection apparatus with improved cooling