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Correcting for reflection of the emitter radiation
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G01J2005/0059
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2005/0059
Correcting for reflection of the emitter radiation
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Patents Grants
last 30 patents
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Patent Grant
Apparatus and method for online and real-time detection of temperat...
Patent number
10,908,024
Issue date
Feb 2, 2021
AK OPTICS TECHNOLOGY CO., LTD.
Dong Yan
G01 - MEASURING TESTING
Information
Patent Grant
Passive millimeter wave radiometer system for calibration of infrar...
Patent number
10,876,898
Issue date
Dec 29, 2020
National Technology & Engineering Solutions of Sandia, LLC
Ryan D. Murphy
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring heat radiation of object to be measured, metho...
Patent number
9,638,580
Issue date
May 2, 2017
Tokyo University of Agriculture and Technology
Kenji Ikushima
G02 - OPTICS
Information
Patent Grant
Maximum blade surface temperature estimation for advanced stationar...
Patent number
7,887,234
Issue date
Feb 15, 2011
Siemens Corporation
Vinay Jonnalagadda
G01 - MEASURING TESTING
Information
Patent Grant
Method for repeatable temperature measurement using surface reflect...
Patent number
5,350,236
Issue date
Sep 27, 1994
Micron Semiconductor, Inc.
Randhir P. S. Thakur
G01 - MEASURING TESTING
Information
Patent Grant
Triple spectral area pyrometer
Patent number
5,125,739
Issue date
Jun 30, 1992
United Technologies Corporation
Ernesto Suarez-Gonzalez
G01 - MEASURING TESTING
Information
Patent Grant
Reflection corrected radiosity optical pyrometer
Patent number
4,708,474
Issue date
Nov 24, 1987
United Technologies Corporation
Ernesto Suarez-Gonzalez
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PYROMETRY ERROR DETECTION SENSOR FOR RTP TEMPERATURE CONTROL SYSTEM
Publication number
20230051521
Publication date
Feb 16, 2023
Applied Material, Inc.
Wolfgang Aderhold
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHOD FOR ONLINE AND REAL-TIME DETECTION OF TEMPERAT...
Publication number
20190346308
Publication date
Nov 14, 2019
BEI OPTICS TECHNOLOGY COMPANY LIMITED
DONG YAN
G01 - MEASURING TESTING
Information
Patent Application
Maximum Blade Surface Temperature Estimation for Advanced Stationar...
Publication number
20080095212
Publication date
Apr 24, 2008
SIEMENS CORPORATE RESEARCH, INC.
Vinay Jonnalagadda
G01 - MEASURING TESTING