correcting for scatter

Industry

CPC
G01N2223/051

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/051correcting for scatter

Industries

Patents Grantslast 30 patents

Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,867,595
- Issue date Jan 9, 2024
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
Compton scattering correction methods for pixellated radiation dete...
- Patent number 11,701,065
- Issue date Jul 18, 2023
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,579,099
- Issue date Feb 14, 2023
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
Imaging system and method with scatter correction
- Patent number 11,493,458
- Issue date Nov 8, 2022
- GE Sensing & Inspection Technologies GmbH
- Alexander Suppes
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Analysis of X-ray spectra using fitting
- Patent number 11,210,366
- Issue date Dec 28, 2021
- Malvern Panalytical B.V.
- Charalampos Zarkadas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for X-ray scatterometry
- Patent number 11,169,099
- Issue date Nov 9, 2021
- BRUKER TECHNOLOGIES LTD.
- Alex Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying the molecular configuration of ganoderic aci...
- Patent number 10,998,085
- Issue date May 4, 2021
- Tian-Jye Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Imaging system and method with scatter correction
- Patent number 10,746,671
- Issue date Aug 18, 2020
- GE Sensing & Inspection Technologies GmbH
- Alexander Suppes
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for X-ray scatterometry
- Patent number 10,684,238
- Issue date Jun 16, 2020
- BRUKER TECHNOLOGIES LTD.
- Alex Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimation and correction of grid pattern due to scatter
- Patent number 10,098,603
- Issue date Oct 16, 2018
- Toshiba Medical Systems Corporation
- Joseph Manak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for collecting accurate X-ray diffraction data with a scanni...
- Patent number 9,897,559
- Issue date Feb 20, 2018
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
Imaging system and method with scatter correction
- Patent number 9,804,106
- Issue date Oct 31, 2017
- General Electric Company
- Nils Rothe
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and system for improving characteristic peak signals in anal...
- Patent number 9,406,496
- Issue date Aug 2, 2016
- Universitat de Barcelona
- Sonia Estrade Albiol
- G01 - MEASURING TESTING
Information Patent Grant
Determining a material property based on scattered radiation
- Patent number 9,086,366
- Issue date Jul 21, 2015
- L-3 Communications Security and Detection Systems, Inc.
- Michael H. Schmitt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGING SYSTEM AND METHOD WITH SCATTER CORRECTION
- Publication number 20210131980
- Publication date May 6, 2021
- GE SENSING & INSPECTION TECHNOLOGIES GMBH
- Alexander Suppes
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
COMPTON SCATTERING CORRECTION METHODS FOR PIXELLATED RADIATION DETE...
- Publication number 20200367839
- Publication date Nov 26, 2020
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM AND METHOD WITH SCATTER CORRECTION
- Publication number 20180266970
- Publication date Sep 20, 2018
- GE Sensing & Inspection Technolgies GmbH
- Alexander SUPPES
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY
- Publication number 20170199136
- Publication date Jul 13, 2017
- BRUKER JV ISRAEL LTD.
- Alex Krokhmal
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNI...
- Publication number 20170176355
- Publication date Jun 22, 2017
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING DEVICES, IMAGE PROCESSING SYSTEM, IMAGE PROCESSING...
- Publication number 20160349195
- Publication date Dec 1, 2016
- Canon Kabushiki Kaisha
- Noboru Inoue
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANAL...
- Publication number 20130240728
- Publication date Sep 19, 2013
- Universitat De Barcelona
- Sonia Estrade Albiol
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING A MATERIAL PROPERTY BASED ON SCATTERED RADIATION
- Publication number 20130208850
- Publication date Aug 15, 2013
- L-3 Communications Security and Detection Systems, Inc.
- Michael H. Schmitt
- G01 - MEASURING TESTING

correcting for scatter

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray reflectometry apparatus and method thereof for measuring thre...

Compton scattering correction methods for pixellated radiation dete...

X-ray reflectometry apparatus and method thereof for measuring thre...

Imaging system and method with scatter correction

Analysis of X-ray spectra using fitting

Method and apparatus for X-ray scatterometry

Method for identifying the molecular configuration of ganoderic aci...

Imaging system and method with scatter correction

Method and apparatus for X-ray scatterometry

Method for estimation and correction of grid pattern due to scatter

Method for collecting accurate X-ray diffraction data with a scanni...

Imaging system and method with scatter correction

Method and system for improving characteristic peak signals in anal...

Determining a material property based on scattered radiation

Patents Applicationslast 30 patents

IMAGING SYSTEM AND METHOD WITH SCATTER CORRECTION

COMPTON SCATTERING CORRECTION METHODS FOR PIXELLATED RADIATION DETE...

IMAGING SYSTEM AND METHOD WITH SCATTER CORRECTION

METHOD AND APPARATUS FOR X-RAY SCATTEROMETRY

METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNI...

IMAGE PROCESSING DEVICES, IMAGE PROCESSING SYSTEM, IMAGE PROCESSING...

METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANAL...

DETERMINING A MATERIAL PROPERTY BASED ON SCATTERED RADIATION