CPC
G01N27/423
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Patent Grant
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G01 - MEASURING TESTING
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Patent Grant
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H01 - BASIC ELECTRIC ELEMENTS
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G01 - MEASURING TESTING
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Hach Company
Dan Kroll
G01 - MEASURING TESTING
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Kwok-Fan Chow
G01 - MEASURING TESTING
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C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
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C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
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King Fahd University of Petroleum & Minerals
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C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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G01 - MEASURING TESTING
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University of Louisville Research Foundation, Inc.
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G01 - MEASURING TESTING
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PPG Industries Ohio, Inc.
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B60 - VEHICLES IN GENERAL
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Polestar Technologies, Inc.
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G01 - MEASURING TESTING
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St. Jude Children's Research Hospital
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A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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BIOPTIK TECHNOLOGY, INC.
Ya-Yuan Chang
G01 - MEASURING TESTING
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Boehringer Ingelheim Vetmedica GmbH
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C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
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Kyoto Electronics Manufacturing Co., Ltd.
Ikumi Kurose
G01 - MEASURING TESTING
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Chang Gung University
Mu-Yi Hua
B82 - NANO-TECHNOLOGY
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Patent Grant
Chang Gung University
Mu-Yi Hua
B82 - NANO-TECHNOLOGY
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Patent Grant
Chang Gung University
Mu-Yi Hua
B82 - NANO-TECHNOLOGY
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Hitachi Chemical Company, Ltd.
Hidehiro Nakamura
G01 - MEASURING TESTING
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Keio University
Yasuaki Einaga
G01 - MEASURING TESTING
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Patent Grant
Mocon, Inc.
Daniel W. Mayer
G01 - MEASURING TESTING
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JFE Steel Corporation
Kyoko Fujimoto
G01 - MEASURING TESTING
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General Electric Company
Young Jin Kim
G01 - MEASURING TESTING
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Patent Grant
David Macdonald Bonnick
G01 - MEASURING TESTING
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Nakano Vinegar Co., Ltd.
Shunichi Uchiyama
G01 - MEASURING TESTING
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Nakano Vinegar Co., Ltd.
Shunichi Uchiyama
G01 - MEASURING TESTING
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Meeco, Incorporated
Jacob Mettes
G01 - MEASURING TESTING
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Pacesetter AB
Walter Preidel
G01 - MEASURING TESTING
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Patent Grant
Helmut Fischer
G01 - MEASURING TESTING
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Patent Application
SIEMENS AKTIENGESELLSCHAFT
Alexander Polleti
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Analytik Jena GmbH
Heiko Henneberg
G01 - MEASURING TESTING
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Patent Application
Sensor-Kinesis Corp.
Josh Shachar
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Giner, Inc
Badawi M. Dweik
G01 - MEASURING TESTING
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Patent Application
KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS
Md. Abdul Aziz
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Patent Application
Hach Company
Dan J Kroll
G01 - MEASURING TESTING
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Patent Application
University of Massachusetts
Kwok-Fan Chow
G01 - MEASURING TESTING
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Patent Application
Toppan Printing Co., Ltd.
Masahiro KOSUGI
G01 - MEASURING TESTING
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Patent Application
ATOMIC ENERGY OF CANADA LIMITED
Zhang He
C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
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Patent Application
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Mohamed M. Marei
G01 - MEASURING TESTING
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Patent Application
St. Jude Children's Research Hospital
Amar K. Pani
G01 - MEASURING TESTING
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Patent Application
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Hidehiro NAKAMURA
G01 - MEASURING TESTING
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Patent Application
KYOTO ELECTRONICS MANUFACTURING CO., LTD.
Ikumi Kurose
G01 - MEASURING TESTING
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Patent Application
Buckman Laboratories International, Inc.
Thomas E. McNeel
G01 - MEASURING TESTING
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Patent Application
Bioptik Technology, INC.
Ya-Yuan CHANG
G01 - MEASURING TESTING
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Patent Application
Alexander Frey
G01 - MEASURING TESTING
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Patent Application
Chang Gung University
Mu-Yi Hua
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
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Patent Application
Chang Gung University
Mu-Yi Hua
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
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Patent Application
Chang Gung University
Mu-Yi Hua
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
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Patent Application
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Marie-Claude Laurence Clochard
G01 - MEASURING TESTING
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Patent Application
Akihiro Miyauchi
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Application
Hidehiro Nakamura
G01 - MEASURING TESTING
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Patent Application
KEIO UNIVERSITY
Yasuaki Einaga
G01 - MEASURING TESTING
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Patent Application
Rohm and Haas Electronic Materials, L.L.C.
Wade Sonnenberg
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
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Patent Application
Mocon, Inc.
Daniel W. Mayer
G01 - MEASURING TESTING
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Patent Application
Akihiro Miyauchi
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Application
Avinash Dalmia
G01 - MEASURING TESTING
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Patent Application
Akihiro Miyauchi
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Patent Application
Kyoko Fujimoto
G01 - MEASURING TESTING
