crystal growth

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CPC
G01N2223/602

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/602crystal growth

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Patents Grantslast 30 patents

Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,166,006
- Issue date Dec 10, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,132,026
- Issue date Oct 29, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for tuning microfluidic droplet frequency and synchronizing...
- Patent number 12,123,840
- Issue date Oct 22, 2024
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,007,342
- Issue date Jun 11, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
- Patent number 11,933,746
- Issue date Mar 19, 2024
- Paul Scherrer Institut
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Grant
Device for tuning microfluidic droplet frequency and synchronizing...
- Patent number 11,867,644
- Issue date Jan 9, 2024
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Diffraction device and method for non-destructive testing of intern...
- Patent number 11,846,595
- Issue date Dec 19, 2023
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying molecular structure
- Patent number 11,815,475
- Issue date Nov 14, 2023
- The University of Tokyo
- Makoto Fujita
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for accurately characterizing crystal three-dimensional orie...
- Patent number 11,815,474
- Issue date Nov 14, 2023
- Dalian University of Technology
- Guoqing Chen
- G01 - MEASURING TESTING
Information Patent Grant
Image processing device, image processing method and charged partic...
- Patent number 11,430,106
- Issue date Aug 30, 2022
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metal electrode based 3D printed device for tuning microfluidic dro...
- Patent number 10,969,350
- Issue date Apr 6, 2021
- ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STAT
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Microfluidic devices having top and bottom layers of graphene and a...
- Patent number 10,792,657
- Issue date Oct 6, 2020
- University of Massachusetts
- Shuo Sui
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Recrystallization rate measurement method of zirconium alloy claddi...
- Patent number 10,641,719
- Issue date May 5, 2020
- Kepco Nuclear Fuel Co., Ltd.
- Tae Sik Jung
- G01 - MEASURING TESTING
Information Patent Grant
3D printed microfluidic mixers and nozzles for crystallography
- Patent number 10,557,807
- Issue date Feb 11, 2020
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Model creation method and device, and inspection device using the same
- Patent number 10,429,357
- Issue date Oct 1, 2019
- Hitachi, Ltd.
- Hirohisa Mizota
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-function x-ray metrology tool for production inspection/monit...
- Patent number 10,330,612
- Issue date Jun 25, 2019
- Applied Materials, Inc.
- Lin Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Nitride crystal, nitride crystal substrate, epilayer-containing nit...
- Patent number 10,078,059
- Issue date Sep 18, 2018
- Sumitomo Electric Industries, Ltd.
- Keiji Ishibashi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Seed selection and growth methods for reduced-crack group III nitri...
- Patent number 9,909,230
- Issue date Mar 6, 2018
- Sixpoint Materials, Inc.
- Tadao Hashimoto
- C30 - CRYSTAL GROWTH
Information Patent Grant
Analysis device, analysis method, film formation device, and film f...
- Patent number 9,607,909
- Issue date Mar 28, 2017
- Fujitsu Limited
- Kenji Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring scattering of X-rays, its applications and impl...
- Patent number 9,255,898
- Issue date Feb 9, 2016
- Universite de Rouen
- Gerard Coquerel
- G01 - MEASURING TESTING
Information Patent Grant
Continuous lattice constant measurments and apparatus therefor with...
- Patent number 5,046,077
- Issue date Sep 3, 1991
- U.S. Philips Corporation
- Hiromu Murayama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...
- Publication number 20240361260
- Publication date Oct 31, 2024
- TOHOKU UNIVERSITY
- Hiroshi JINNAI
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240328969
- Publication date Oct 3, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240319120
- Publication date Sep 26, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240297142
- Publication date Sep 5, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240290743
- Publication date Aug 29, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240290745
- Publication date Aug 29, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240266313
- Publication date Aug 8, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro UNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR TUNING MICROFLUIDIC DROPLET FREQUENCY AND SYNCHRONIZING...
- Publication number 20240068965
- Publication date Feb 29, 2024
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra ROS
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...
- Publication number 20220404296
- Publication date Dec 22, 2022
- PAUL SCHERRER INSTITUT
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20220146441
- Publication date May 12, 2022
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTION DEVICE AND METHOD FOR NON-DESTRUCTIVE TESTING OF INTERN...
- Publication number 20220074877
- Publication date Mar 10, 2022
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin ZHENG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ACCULATELY CHARACTERIZING CRYSTAL THREE-DIMENSIONAL ORIE...
- Publication number 20220065801
- Publication date Mar 3, 2022
- DALIAN UNIVERSITY OF TECHNOLOGY
- Guoqing CHEN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR TUNING MICROFLUIDIC DROPLET FREQUENCY AND SYNCHRONIZING...
- Publication number 20210302334
- Publication date Sep 30, 2021
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra ROS
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD AND CHARGED PARTIC...
- Publication number 20200219243
- Publication date Jul 9, 2020
- Hitachi High-Technologies Corporation
- Takeyoshi OHASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METAL ELECTRODE BASED 3D PRINTED DEVICE FOR TUNING MICROFLUIDIC DRO...
- Publication number 20200141886
- Publication date May 7, 2020
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra ROS
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
METHOD FOR IDENTIFYING MOLECULAR STRUCTURE
- Publication number 20200096461
- Publication date Mar 26, 2020
- THE UNIVERSITY OF TOKYO
- Makoto Fujita
- G01 - MEASURING TESTING
Information Patent Application
3D PRINTED MICROFLUIDIC MIXERS AND NOZZLES FOR CRYSTALLOGRAPHY
- Publication number 20190178822
- Publication date Jun 13, 2019
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra ROS
- G01 - MEASURING TESTING
Information Patent Application
MICROFLUIDIC DEVICES AND METHODS OF MANUFACTURE AND USE THEREOF
- Publication number 20180214863
- Publication date Aug 2, 2018
- University of Massachusetts
- Shuo Sui
- C30 - CRYSTAL GROWTH
Information Patent Application
NITRIDE CRYSTAL, NITRIDE CRYSTAL SUBSTRATE, EPILAYER-CONTAINING NIT...
- Publication number 20170115239
- Publication date Apr 27, 2017
- Sumitomo Electric Industries, Ltd.
- Keiji ISHIBASHI
- C30 - CRYSTAL GROWTH
Information Patent Application
MODEL CREATION METHOD AND DEVICE, AND INSPECTION DEVICE USING THE SAME
- Publication number 20160320352
- Publication date Nov 3, 2016
- Hitachi, Ltd
- Hirohisa MIZOTA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING SCATTERING OF X-RAYS, ITS APPLICATIONS AND IMPL...
- Publication number 20140185768
- Publication date Jul 3, 2014
- UNIVERSITE DE ROUEN
- Gerard Coquerel
- G01 - MEASURING TESTING
Information Patent Application
Method of Characterizing a Crystalline Specimen by Ion or Atom Scat...
- Publication number 20130105688
- Publication date May 2, 2013
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Denis Jalabert
- G01 - MEASURING TESTING
Information Patent Application
Method For Obtaining And Analyzing Solids, Preferably Crystals
- Publication number 20090205412
- Publication date Aug 20, 2009
- AVANTIUM INTERNATIONAL B.V.
- Danny Dirk Pieter Willem Stam
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Method for high-resolution 3d reconstruction
- Publication number 20060261269
- Publication date Nov 23, 2006
- Ulf Skoglund
- G01 - MEASURING TESTING

crystal growth

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Bonding wire for semiconductor devices

Bonding wire for semiconductor devices

Device for tuning microfluidic droplet frequency and synchronizing...

Serial synchrotron crystallography sample holding system

Device for hosting a probe solution of molecules in a plurality of...

Device for tuning microfluidic droplet frequency and synchronizing...

Diffraction device and method for non-destructive testing of intern...

Method for identifying molecular structure

Method for accurately characterizing crystal three-dimensional orie...

Image processing device, image processing method and charged partic...

Metal electrode based 3D printed device for tuning microfluidic dro...

Microfluidic devices having top and bottom layers of graphene and a...

Recrystallization rate measurement method of zirconium alloy claddi...

3D printed microfluidic mixers and nozzles for crystallography

Model creation method and device, and inspection device using the same

Multi-function x-ray metrology tool for production inspection/monit...

Nitride crystal, nitride crystal substrate, epilayer-containing nit...

Seed selection and growth methods for reduced-crack group III nitri...

Analysis device, analysis method, film formation device, and film f...

Method of measuring scattering of X-rays, its applications and impl...

Continuous lattice constant measurments and apparatus therefor with...

Patents Applicationslast 30 patents

METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

BONDING WIRE FOR SEMICONDUCTOR DEVICES

BONDING WIRE FOR SEMICONDUCTOR DEVICES

BONDING WIRE FOR SEMICONDUCTOR DEVICES

BONDING WIRE FOR SEMICONDUCTOR DEVICES

DEVICE FOR TUNING MICROFLUIDIC DROPLET FREQUENCY AND SYNCHRONIZING...

DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

DIFFRACTION DEVICE AND METHOD FOR NON-DESTRUCTIVE TESTING OF INTERN...

METHOD FOR ACCULATELY CHARACTERIZING CRYSTAL THREE-DIMENSIONAL ORIE...

DEVICE FOR TUNING MICROFLUIDIC DROPLET FREQUENCY AND SYNCHRONIZING...

IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD AND CHARGED PARTIC...

METAL ELECTRODE BASED 3D PRINTED DEVICE FOR TUNING MICROFLUIDIC DRO...

METHOD FOR IDENTIFYING MOLECULAR STRUCTURE

3D PRINTED MICROFLUIDIC MIXERS AND NOZZLES FOR CRYSTALLOGRAPHY

MICROFLUIDIC DEVICES AND METHODS OF MANUFACTURE AND USE THEREOF

NITRIDE CRYSTAL, NITRIDE CRYSTAL SUBSTRATE, EPILAYER-CONTAINING NIT...

MODEL CREATION METHOD AND DEVICE, AND INSPECTION DEVICE USING THE SAME

METHOD OF MEASURING SCATTERING OF X-RAYS, ITS APPLICATIONS AND IMPL...

Method of Characterizing a Crystalline Specimen by Ion or Atom Scat...

Method For Obtaining And Analyzing Solids, Preferably Crystals

Method for high-resolution 3d reconstruction