Cylindric surface

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G01J2003/1852

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2003/1852Cylindric surface

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Patents Grantslast 30 patents

Information Patent Grant
Spectroscope
- Patent number 11,262,240
- Issue date Mar 1, 2022
- Hamamatsu Photonics K.K.
- Takafumi Yokino
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscope
- Patent number 10,883,877
- Issue date Jan 5, 2021
- Hamamatsu Photonics K.K.
- Takafumi Yokino
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscope
- Patent number 10,184,834
- Issue date Jan 22, 2019
- Hamamatsu Photonics K.K.
- Takafumi Yokino
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscope
- Patent number 9,222,831
- Issue date Dec 29, 2015
- Hamamatsu Photonics K.K.
- Takafumi Yokino
- G01 - MEASURING TESTING
Information Patent Grant
Varied space diffraction grating and in-focus monochromator
- Patent number 4,991,934
- Issue date Feb 12, 1991
- Michael C. Hettrick
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SPECTROSCOPE
- Publication number 20210010863
- Publication date Jan 14, 2021
- HAMAMATSU PHOTONICS K. K.
- Takafumi Yokino
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPE
- Publication number 20190154504
- Publication date May 23, 2019
- HAMAMATSU PHOTONICS K. K.
- Takafumi Yokino
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPE
- Publication number 20140268138
- Publication date Sep 18, 2014
- Hamamatsu Photonics K.K.
- Takafumi Yokino
- G01 - MEASURING TESTING