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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

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Patents Grantslast 30 patents

Information Patent Grant
Nanomechanical profiling of breast cancer molecular subtypes
- Patent number 12,196,740
- Issue date Jan 14, 2025
- Universitat Basel
- Marija Plodinec
- G01 - MEASURING TESTING
Information Patent Grant
Large radius probe
- Patent number 11,953,517
- Issue date Apr 9, 2024
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Modified method to fit cell elastic modulus based on Sneddon model
- Patent number 11,860,187
- Issue date Jan 2, 2024
- Dalian University of Technology
- Wei Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thin free-standing oxide membranes
- Patent number 11,821,081
- Issue date Nov 21, 2023
- The Regents of the University of California
- Yi-Hsien Lu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Nanomechanical profiling of breast cancer molecular subtypes
- Patent number 11,686,720
- Issue date Jun 27, 2023
- Universitat Basel
- Marija Plodinec
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne scanning probe microscopy method and scanning probe micr...
- Patent number 11,635,448
- Issue date Apr 25, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Sri Ram Shankar Rajadurai
- G01 - MEASURING TESTING
Information Patent Grant
Large radius probe
- Patent number 11,448,664
- Issue date Sep 20, 2022
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
MEMS-based nanoindentation force sensor with electro-thermal tip he...
- Patent number 11,435,378
- Issue date Sep 6, 2022
- Femto Tools AG
- Felix Beyeler
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and a method for operating thereof
- Patent number 11,402,404
- Issue date Aug 2, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Jan Jacobus Benjamin Biemond
- G01 - MEASURING TESTING
Information Patent Grant
MEMS nanoindenter chip with indenter probe and reference probe
- Patent number 11,307,125
- Issue date Apr 19, 2022
- FemtoTools AG
- David Beyeler
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for testing mechanical properties of ultra-soft...
- Patent number 11,275,007
- Issue date Mar 15, 2022
- The Florida International University Board of Trustees
- Arvind Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring the absorption of a laser emission by a sample
- Patent number 11,237,105
- Issue date Feb 1, 2022
- Centre National de la Recherche Scientifique
- Alexandre Dazzi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for two dimensional nanoindentation
- Patent number 10,996,152
- Issue date May 4, 2021
- KLA-Tencor Corporation
- Warren C. Oliver
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy tips for interconnection
- Patent number 10,989,735
- Issue date Apr 27, 2021
- Facebook Technologies, LLC
- Ali Sengül
- G01 - MEASURING TESTING
Information Patent Grant
Large radius probe
- Patent number 10,802,045
- Issue date Oct 13, 2020
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Grant
Method for in-line measurement of quality of microarray
- Patent number 10,732,166
- Issue date Aug 4, 2020
- Centrillion Technologies Taiwan Co. LTD.
- Tzu-Kun Ku
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,712,363
- Issue date Jul 14, 2020
- Hitachi High-Tech Science Corporation
- Masayuki Iwasa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for the volumetric analysis of an organic or inorganic sample
- Patent number 10,598,692
- Issue date Mar 24, 2020
- Universite de Bourgogne
- Eric Bourillot
- G01 - MEASURING TESTING
Information Patent Grant
Surface measurement probe
- Patent number 10,436,562
- Issue date Oct 8, 2019
- ANTON PAAR TRITEC SA
- Bertrand Bellaton
- G01 - MEASURING TESTING
Information Patent Grant
Dual-probe scanning probe microscope
- Patent number 10,197,595
- Issue date Feb 5, 2019
- Bruker Nano, Inc.
- Chanmin Su
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Arrangement and method for the synchronous determination of the she...
- Patent number 10,151,645
- Issue date Dec 11, 2018
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Kong Boon Yeap
- G01 - MEASURING TESTING
Information Patent Grant
Wear-less operation of a material surface with a scanning probe mic...
- Patent number 9,977,050
- Issue date May 22, 2018
- SWISSLITHO AG
- Urs T. Duerig
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Measuring head for nanoindentation instrument and measuring method
- Patent number 9,970,851
- Issue date May 15, 2018
- ANTON PAAR TRITEC SA
- Bertrand Bellaton
- G01 - MEASURING TESTING
Information Patent Grant
Instrument changing assembly and methods
- Patent number 9,902,027
- Issue date Feb 27, 2018
- Hysitron, Inc.
- Rajiv Dama
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automatic gain tuning in atomic force microscopy
- Patent number 9,689,891
- Issue date Jun 27, 2017
- Keysight Technologies, Inc.
- Christopher Ryan Moon
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Analysis of ex vivo cells for disease state detection and therapeut...
- Patent number 9,678,105
- Issue date Jun 13, 2017
- The Regents of the University of California
- James K. Gimzewski
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoindenter multimodal microscope objective for mechanobiology
- Patent number 9,588,327
- Issue date Mar 7, 2017
- The Board of Trustees of the University of Illinois
- Kimani Toussaint
- G02 - OPTICS
Information Patent Grant
Interface of a microfabricated scanning force sensor for combined f...
- Patent number 9,535,086
- Issue date Jan 3, 2017
- FemtoTools AG
- Felix Beyeler
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Probe tip heating assembly
- Patent number 9,476,816
- Issue date Oct 25, 2016
- Hysitron, Inc.
- Roger William Schmitz
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical transducer and test system
- Patent number 9,404,841
- Issue date Aug 2, 2016
- Hysitron, Inc.
- Yunje Oh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NANOMECHANICAL PROFILING OF BREAST CANCER MOLECULAR SUBTYPES
- Publication number 20230358724
- Publication date Nov 9, 2023
- UNIVERSITAT BASEL
- Marija PLODINEC
- G01 - MEASURING TESTING
Information Patent Application
Large Radius Probe
- Publication number 20230021148
- Publication date Jan 19, 2023
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHODS OF PRODUCING SINGLE PHOTON EMITTERS ON SUBSTRATES, AND DEVI...
- Publication number 20220406962
- Publication date Dec 22, 2022
- Purdue Research Foundation
- Xiaohui Xu
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION
- Publication number 20220163559
- Publication date May 26, 2022
- attocube systems AG
- Alexander A. GOVYADINOV
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR MEASURING THE ABSORPTION OF A LASER EMISSION BY A SAMPLE
- Publication number 20210341385
- Publication date Nov 4, 2021
- Centre National de la Recherche Scientifique
- Alexandre DAZZI
- G01 - MEASURING TESTING
Information Patent Application
A SCANNING PROBE MICROSCOPE AND A METHOD FOR OPERATING THEREOF
- Publication number 20210311090
- Publication date Oct 7, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Jan Jacobus Benjamin BIEMOND
- G01 - MEASURING TESTING
Information Patent Application
TRUNCATED NONLINEAR INTERFEROMETER-BASED ATOMIC FORCE MICROSCOPES
- Publication number 20210190819
- Publication date Jun 24, 2021
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Application
Large Radius Probe
- Publication number 20210132110
- Publication date May 6, 2021
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY TIPS FOR INTERCONNECTION
- Publication number 20210055327
- Publication date Feb 25, 2021
- Facebook Technologies, LLC
- Ali Sengül
- G01 - MEASURING TESTING
Information Patent Application
MEMS-BASED NANOINDENTATION FORCE SENSOR WITH ELECTRO-THERMAL TIP HE...
- Publication number 20200249254
- Publication date Aug 6, 2020
- FEMTO TOOLS AG
- FELIX BEYELER
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190234992
- Publication date Aug 1, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masayuki IWASA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR THE VOLUMETRIC ANALYSIS OF AN ORGANIC OR INORGANIC SAMPLE
- Publication number 20190227098
- Publication date Jul 25, 2019
- UNIVERSITE DE BOURGOGNE
- Eric Bourillot
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREDICTING CANCER PROGRESSION BY NANOMECHANICAL PROFILING
- Publication number 20170299570
- Publication date Oct 19, 2017
- UNIVERSITAT BASEL
- Marko LOPARIC
- G01 - MEASURING TESTING
Information Patent Application
Dual-Probe Scanning Probe Microscope
- Publication number 20160274143
- Publication date Sep 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR DUAL RESONANCE FR...
- Publication number 20150241470
- Publication date Aug 27, 2015
- Dong Wu
- G01 - MEASURING TESTING
Information Patent Application
DETERMATION OF LOCAL CONTACT POTENTIAL DIFFERENCE BY NONCONTACT ATO...
- Publication number 20150121576
- Publication date Apr 30, 2015
- International Business Machines Corporation
- Leo Gross
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE FIXING MEMBER FOR NANO INDENTER
- Publication number 20150064439
- Publication date Mar 5, 2015
- NITTO DENKO CORPORATION
- Youhei Maeno
- B82 - NANO-TECHNOLOGY
Information Patent Application
PROBE TIP HEATING ASSEMBLY
- Publication number 20140326707
- Publication date Nov 6, 2014
- Roger William Schmitz
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED NANO WEAR TESTING APPARATUS
- Publication number 20140298897
- Publication date Oct 9, 2014
- Nanovea, Inc.
- Pierre Leroux
- G01 - MEASURING TESTING
Information Patent Application
NANOMECHANICAL TESTING SYSTEM
- Publication number 20140293293
- Publication date Oct 2, 2014
- HYSITRON, INC.
- David James Vodnick
- G01 - MEASURING TESTING
Information Patent Application
THREE DIMENSIONAL TRANSDUCER
- Publication number 20140150562
- Publication date Jun 5, 2014
- HYSITRON, INC.
- Oden Lee Warren
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS OF EX VIVO CELLS FOR DISEASE STATE DETECTION AND THERAPEUT...
- Publication number 20140123347
- Publication date May 1, 2014
- The Regents of the University of California
- James K. Gimzewski
- B82 - NANO-TECHNOLOGY
Information Patent Application
MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SEN...
- Publication number 20140020141
- Publication date Jan 16, 2014
- University of Tennessee Research Foundation
- Ali Passian
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR ELIMINATING HORIZONTAL OFFSET OF TRACTION TESTING DEVICE...
- Publication number 20140007648
- Publication date Jan 9, 2014
- Weixiong Bin
- Weixiong Bin
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR STAGING CANCER PROGRESSION BY AFM
- Publication number 20140007309
- Publication date Jan 2, 2014
- UNIVERSITAT BASEL
- Marija Plodinec
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus for Nanomechanical Measurement Using an Atomic...
- Publication number 20130347147
- Publication date Dec 26, 2013
- Qingze Zou
- B82 - NANO-TECHNOLOGY
Information Patent Application
ATOMIC FORCE MICROSCOPY CONTROLLER AND METHOD
- Publication number 20130333076
- Publication date Dec 12, 2013
- AGILENT TECHNOLOGIES ,INC.
- Christopher Ryan Moon
- B82 - NANO-TECHNOLOGY
Information Patent Application
MECHANICAL TESTING INSTRUMENTS INCLUDING ONBOARD DATA
- Publication number 20130332100
- Publication date Dec 12, 2013
- Christopher David Young
- B82 - NANO-TECHNOLOGY
Information Patent Application
NANOMECHANICAL TESTING SYSTEM
- Publication number 20130319127
- Publication date Dec 5, 2013
- HYSITRON, INC.
- David James Vodnick
- G01 - MEASURING TESTING
Information Patent Application
NANOMECHANICAL TESTING SYSTEM
- Publication number 20130319071
- Publication date Dec 5, 2013
- HYSITRON, INC.
- David James Vodnick
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nanomechanical profiling of breast cancer molecular subtypes

Large radius probe

Modified method to fit cell elastic modulus based on Sneddon model

Thin free-standing oxide membranes

Nanomechanical profiling of breast cancer molecular subtypes

Heterodyne scanning probe microscopy method and scanning probe micr...

Large radius probe

MEMS-based nanoindentation force sensor with electro-thermal tip he...

Scanning probe microscope and a method for operating thereof

MEMS nanoindenter chip with indenter probe and reference probe

Systems and methods for testing mechanical properties of ultra-soft...

System for measuring the absorption of a laser emission by a sample

Apparatus and method for two dimensional nanoindentation

Atomic force microscopy tips for interconnection

Large radius probe

Method for in-line measurement of quality of microarray

Scanning probe microscope

Device for the volumetric analysis of an organic or inorganic sample

Surface measurement probe

Dual-probe scanning probe microscope

Arrangement and method for the synchronous determination of the she...

Wear-less operation of a material surface with a scanning probe mic...

Measuring head for nanoindentation instrument and measuring method

Instrument changing assembly and methods

Automatic gain tuning in atomic force microscopy

Analysis of ex vivo cells for disease state detection and therapeut...

Nanoindenter multimodal microscope objective for mechanobiology

Interface of a microfabricated scanning force sensor for combined f...

Probe tip heating assembly

Microelectromechanical transducer and test system

Patents Applicationslast 30 patents

NANOMECHANICAL PROFILING OF BREAST CANCER MOLECULAR SUBTYPES

Large Radius Probe

METHODS OF PRODUCING SINGLE PHOTON EMITTERS ON SUBSTRATES, AND DEVI...

ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION

SYSTEM FOR MEASURING THE ABSORPTION OF A LASER EMISSION BY A SAMPLE

A SCANNING PROBE MICROSCOPE AND A METHOD FOR OPERATING THEREOF

TRUNCATED NONLINEAR INTERFEROMETER-BASED ATOMIC FORCE MICROSCOPES

Large Radius Probe

ATOMIC FORCE MICROSCOPY TIPS FOR INTERCONNECTION

MEMS-BASED NANOINDENTATION FORCE SENSOR WITH ELECTRO-THERMAL TIP HE...

SCANNING PROBE MICROSCOPE

DEVICE FOR THE VOLUMETRIC ANALYSIS OF AN ORGANIC OR INORGANIC SAMPLE

METHOD FOR PREDICTING CANCER PROGRESSION BY NANOMECHANICAL PROFILING

Dual-Probe Scanning Probe Microscope

METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR DUAL RESONANCE FR...

DETERMATION OF LOCAL CONTACT POTENTIAL DIFFERENCE BY NONCONTACT ATO...

SAMPLE FIXING MEMBER FOR NANO INDENTER

PROBE TIP HEATING ASSEMBLY

HIGH SPEED NANO WEAR TESTING APPARATUS

NANOMECHANICAL TESTING SYSTEM

THREE DIMENSIONAL TRANSDUCER

ANALYSIS OF EX VIVO CELLS FOR DISEASE STATE DETECTION AND THERAPEUT...

MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SEN...

METHOD FOR ELIMINATING HORIZONTAL OFFSET OF TRACTION TESTING DEVICE...

METHOD FOR STAGING CANCER PROGRESSION BY AFM

Method and Apparatus for Nanomechanical Measurement Using an Atomic...

ATOMIC FORCE MICROSCOPY CONTROLLER AND METHOD

MECHANICAL TESTING INSTRUMENTS INCLUDING ONBOARD DATA

NANOMECHANICAL TESTING SYSTEM

NANOMECHANICAL TESTING SYSTEM