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Industry

  • CPC
  • H03M2201/4266
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Patents Grantslast 30 patents

  • Information Patent Grant

    Variable current source

    • Patent number 4,349,777
    • Issue date Sep 14, 1982
    • Takeda Riken Kogyo Kabushikikaisha
    • Masakazu Mitamura
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    3872726

    • Patent number 3,872,726
    • Issue date Mar 25, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3872288

    • Patent number 3,872,288
    • Issue date Mar 18, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3865305

    • Patent number 3,865,305
    • Issue date Feb 11, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3851976

    • Patent number 3,851,976
    • Issue date Dec 3, 1974
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    3843872

    • Patent number 3,843,872
    • Issue date Oct 22, 1974
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    3815126

    • Patent number 3,815,126
    • Issue date Jun 4, 1974
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3809864

    • Patent number 3,809,864
    • Issue date May 7, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3792352

    • Patent number 3,792,352
    • Issue date Feb 12, 1974
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3790886

    • Patent number 3,790,886
    • Issue date Feb 5, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3787835

    • Patent number 3,787,835
    • Issue date Jan 22, 1974
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    3774018

    • Patent number 3,774,018
    • Issue date Nov 20, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3766543

    • Patent number 3,766,543
    • Issue date Oct 16, 1973
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    3750142

    • Patent number 3,750,142
    • Issue date Jul 31, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3750156

    • Patent number 3,750,156
    • Issue date Jul 31, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3745560

    • Patent number 3,745,560
    • Issue date Jul 10, 1973
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3743429

    • Patent number 3,743,429
    • Issue date Jul 3, 1973
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3742489

    • Patent number 3,742,489
    • Issue date Jun 26, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3737891

    • Patent number 3,737,891
    • Issue date Jun 5, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3729621

    • Patent number 3,729,621
    • Issue date Apr 24, 1973
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3719807

    • Patent number 3,719,807
    • Issue date Mar 6, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3717869

    • Patent number 3,717,869
    • Issue date Feb 20, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3713023

    • Patent number 3,713,023
    • Issue date Jan 23, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3711851

    • Patent number 3,711,851
    • Issue date Jan 16, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3710360

    • Patent number 3,710,360
    • Issue date Jan 9, 1973
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    3709309

    • Patent number 3,709,309
    • Issue date Jan 9, 1973
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3710374

    • Patent number 3,710,374
    • Issue date Jan 9, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3707713

    • Patent number 3,707,713
    • Issue date Dec 26, 1972
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3686487

    • Patent number 3,686,487
    • Issue date Aug 22, 1972
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3681577

    • Patent number 3,681,577
    • Issue date Aug 1, 1972
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents