details concerning resolution or correction, including general design of CSOM objectives

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G02B21/0072

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GPHYSICS G02Optics G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS G02B21/00Microscopes

Current Industry

G02B21/0072details concerning resolution or correction, including general design of CSOM objectives

Industries

Patents Grantslast 30 patents

Information Patent Grant
Machine learning assisted super resolution microscopy
- Patent number 12,159,369
- Issue date Dec 3, 2024
- Purdue Research Foundation
- Zhaxylyk A. Kudyshev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for confocal microscopy
- Patent number 12,135,411
- Issue date Nov 5, 2024
- Purdue Research Foundation
- Meng Cui
- G02 - OPTICS
Information Patent Grant
Line excitation array detection microscopy
- Patent number 12,133,714
- Issue date Nov 5, 2024
- Board of Regents, The University of Texas System
- Adela Ben-Yakar
- G02 - OPTICS
Information Patent Grant
Laser scanning microscope and method for determining a position of...
- Patent number 12,111,454
- Issue date Oct 8, 2024
- Leica Microsystems CMS GmbH
- Arnold Giske
- G01 - MEASURING TESTING
Information Patent Grant
Handheld confocal scanning optical microscope systems having oscill...
- Patent number 12,053,261
- Issue date Aug 6, 2024
- CALIBER IMAGING & DIAGNOSTICS, INC.
- William J. Fox
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and light microscope for a high-resolution examination of a...
- Patent number 12,055,728
- Issue date Aug 6, 2024
- ABBERIOR INSTRUMENTS GMBH
- Roman Schmidt
- G02 - OPTICS
Information Patent Grant
High-resolution, real-time imaging with adaptive optics and lattice...
- Patent number 12,001,004
- Issue date Jun 4, 2024
- Howard Hughes Medical Institute
- Robert Eric Betzig
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device and process
- Patent number 11,921,042
- Issue date Mar 5, 2024
- BioAxial SAS
- Gabriel Y Sirat
- G01 - MEASURING TESTING
Information Patent Grant
Auto-focus methods and systems for multi-spectral imaging
- Patent number 11,914,130
- Issue date Feb 27, 2024
- Ventana Medical Systems, Inc.
- Joerg Bredno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Background-suppressed STED nanoscope
- Patent number 11,914,129
- Issue date Feb 27, 2024
- The Johns Hopkins University
- Taekjip Ha
- G01 - MEASURING TESTING
Information Patent Grant
Two-photon stimulated emission depletion composite microscope using...
- Patent number 11,906,429
- Issue date Feb 20, 2024
- SUZHOU INSTITUTE OF BIOMEDICAL ENGINEERING AND TECHNOLOGY, CHINESE ACADEMY OF...
- Yunhai Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for superresolution optical measurement using sin...
- Patent number 11,852,459
- Issue date Dec 26, 2023
- BioAxial SAS
- Gabriel Y. Sirat
- G01 - MEASURING TESTING
Information Patent Grant
Low-noise spectroscopic imaging system with steerable substantially...
- Patent number 11,803,044
- Issue date Oct 31, 2023
- Daylight Solutions, Inc.
- Jeremy A. Rowlette
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for capturing an image
- Patent number 11,714,269
- Issue date Aug 1, 2023
- Carl Zeiss Microscopy GmbH
- Oliver Holub
- G02 - OPTICS
Information Patent Grant
Immersion objective
- Patent number 11,703,674
- Issue date Jul 18, 2023
- Carl Zeiss Microscopy
- Alexander Epple
- G02 - OPTICS
Information Patent Grant
Beam manipulation device for a scanning microscope, and microscope
- Patent number 11,668,916
- Issue date Jun 6, 2023
- Carl Zeiss Microscopy GmbH
- Matthias Wald
- G02 - OPTICS
Information Patent Grant
Enhanced sample imaging using structured illumination microscopy
- Patent number 11,604,341
- Issue date Mar 14, 2023
- Thermo Electron Scientific Instruments LLC
- Michael S. Georgiadis
- G02 - OPTICS
Information Patent Grant
Method and device for superresolution optical measurement using sin...
- Patent number 11,598,630
- Issue date Mar 7, 2023
- BioAxial SAS
- Gabriel Y. Sirat
- G01 - MEASURING TESTING
Information Patent Grant
Method for operating a light microscope with structured illuminatio...
- Patent number 11,598,941
- Issue date Mar 7, 2023
- Carl Zeiss Microscopy GmbH
- Ralf Netz
- G02 - OPTICS
Information Patent Grant
High-resolution scanning microscopy with discrimination between at...
- Patent number 11,573,412
- Issue date Feb 7, 2023
- Carl Zeiss Microscopy GmbH
- Ingo Kleppe
- G02 - OPTICS
Information Patent Grant
Microscope having an imaging optical unit for recording
- Patent number 11,531,194
- Issue date Dec 20, 2022
- Carl Zeiss Meditec AG
- Alois Regensburger
- G02 - OPTICS
Information Patent Grant
Assembly for increasing the resolution of a laser scanning microscope
- Patent number 11,525,988
- Issue date Dec 13, 2022
- Carl Zeiss Microscopy GmbH
- Kai Wicker
- G02 - OPTICS
Information Patent Grant
Optical super-resolution microscopic imaging system
- Patent number 11,506,879
- Issue date Nov 22, 2022
- Beijing Century Sunny Technology Co., Ltd.
- Bo Lai
- G01 - MEASURING TESTING
Information Patent Grant
Auto-focus methods and systems for multi-spectral imaging
- Patent number 11,467,390
- Issue date Oct 11, 2022
- Ventana Medical Systems, Inc.
- Joerg Bredno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing device, information processing method, infor...
- Patent number 11,428,920
- Issue date Aug 30, 2022
- Nikon Corporation
- Wataru Tomosugi
- G02 - OPTICS
Information Patent Grant
Microscope and method for determining an aberration in a microscope
- Patent number 11,415,789
- Issue date Aug 16, 2022
- Leica Microsystems CMS GmbH
- Christian Schumann
- G02 - OPTICS
Information Patent Grant
Method for deconvolving image data
- Patent number 11,386,531
- Issue date Jul 12, 2022
- Carl Zeiss Microscopy GmbH
- Stanislav Kalinin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High-resolution scanning microscopy
- Patent number 11,372,223
- Issue date Jun 28, 2022
- Carl Zeiss Microscopy GmbH
- Ingo Kleppe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Stimulated emission depletion super-resolution microscope using qui...
- Patent number 11,366,300
- Issue date Jun 21, 2022
- SUZHOU INSTITUTE OF BIOMEDICAL ENGINEERING AND TECHNOLOGY, CHINESE ACADEMY OF...
- Yuguo Tang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for single frame autofocusing based on color- m...
- Patent number 11,356,593
- Issue date Jun 7, 2022
- University of Connecticut
- Guoan Zheng
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Optical Measuring Process Using Dark Helix
- Publication number 20240402085
- Publication date Dec 5, 2024
- Bioaxial SAS
- Gabriel Y Sirat
- G02 - OPTICS
Information Patent Application
OPTICAL MICROSCOPE COMPRISING AN OPTOMECHANICAL FINE-ADJUSTMENT DEV...
- Publication number 20240393574
- Publication date Nov 28, 2024
- HORIBA FRANCE SAS
- Vasily GAVRILYUK
- G02 - OPTICS
Information Patent Application
FAST SCANNING MICROSCOPE SYSTEMS, AND RELATED OPTICS AND METHODS
- Publication number 20240369817
- Publication date Nov 7, 2024
- Roger James Zemp
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NANOSCALE AXIAL LOCALIZATION AND SUPER RESOLU...
- Publication number 20240345376
- Publication date Oct 17, 2024
- THE GEORGE WASHINGTON UNIVERSITY
- Inhee Chung
- G02 - OPTICS
Information Patent Application
METHOD OF PROVIDING AN ASSEMBLED IMAGE USING DIGITAL MICROSCOPE, DI...
- Publication number 20240176126
- Publication date May 30, 2024
- PreciPoint GmbH
- Ludwig Wildner
- G02 - OPTICS
Information Patent Application
AUTO-FOCUS METHODS AND SYSTEMS FOR MULTI-SPECTRAL IMAGING
- Publication number 20240151958
- Publication date May 9, 2024
- Ventana Medical Systems, Inc.
- Joerg Bredno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND LIGHT MICROSCOPE FOR A HIGH-RESOLUTION EXAMINATION OF A...
- Publication number 20240085680
- Publication date Mar 14, 2024
- Abberior Instruments GmbH
- Roman SCHMIDT
- G02 - OPTICS
Information Patent Application
Method and Device for Superresolution Optical Measurement using Sin...
- Publication number 20240053138
- Publication date Feb 15, 2024
- Bioaxial SAS
- Gabriel Y. Sirat
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND LIGHT MICROSCOPE FOR LOCALIZING INDIVIDUAL EMITTERS IN A...
- Publication number 20240045190
- Publication date Feb 8, 2024
- Abberior Instruments GmbH
- Roman SCHMIDT
- G02 - OPTICS
Information Patent Application
CONFOCAL MICROSCOPE WITH PHOTON RE-ALLOCATION
- Publication number 20240045188
- Publication date Feb 8, 2024
- Centre National de la Recherche Scientifique
- Alberto AGUILAR
- G02 - OPTICS
Information Patent Application
MICROSCOPE OBJECTIVE LENS, MICROSCOPE OPTICAL SYSTEM, AND MICROSCOP...
- Publication number 20240019676
- Publication date Jan 18, 2024
- Nikon Corporation
- Hidetsugu Takagi
- G02 - OPTICS
Information Patent Application
CALCULATION METHOD, IMAGE-CAPTURING METHOD, AND IMAGE-CAPTURING APP...
- Publication number 20230392919
- Publication date Dec 7, 2023
- Lasertec Corporation
- Yoshihiro NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
POINT-SCANNING STRUCTURED ILLUMINATION-BASED SUPER-RESOLUTION MICRO...
- Publication number 20230384572
- Publication date Nov 30, 2023
- Shenzhen University
- Yonghong SHAO
- G02 - OPTICS
Information Patent Application
CALCULATION METHOD, IMAGING-CAPTURING METHOD, AND IMAGE-CAPTURING A...
- Publication number 20230375816
- Publication date Nov 23, 2023
- Lasertec Corporation
- Yoshihiro NISHIMURA
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR HIGH-RESOLUTION LOCALIZATION OF A SINGLE E...
- Publication number 20230350179
- Publication date Nov 2, 2023
- Abberior Instruments GmbH
- Roman Schmidt
- G01 - MEASURING TESTING
Information Patent Application
PHOTOELECTRON EMISSION MICROSCOPE
- Publication number 20230305281
- Publication date Sep 28, 2023
- HITACHI HIGH-TECH CORPORATION
- Takeshi MORIMOTO
- G02 - OPTICS
Information Patent Application
SUPER-RESOLUTION MICROSCOPIC IMAGING METHOD AND APPARATUS BASED ON...
- Publication number 20230296871
- Publication date Sep 21, 2023
- Zhejiang University
- Cuifang KUANG
- G02 - OPTICS
Information Patent Application
A WHOLE SLIDE IMAGING METHOD FOR A MICROSCOPE
- Publication number 20230288688
- Publication date Sep 14, 2023
- FFEI LIMITED
- Martin Philip GOUCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROSCOPE
- Publication number 20230280575
- Publication date Sep 7, 2023
- Nikon Corporation
- Yosuke FUJIKAKE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONFOCAL MICROSCOPY
- Publication number 20230273417
- Publication date Aug 31, 2023
- Purdue Research Foundation
- Meng Cui
- G02 - OPTICS
Information Patent Application
METHOD, APPARATUS AND COMPUTER PROGRAM FOR LOCALIZING AN EMITTER IN...
- Publication number 20230251479
- Publication date Aug 10, 2023
- Abberior Instruments GmbH
- Roman SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
METHOD, ARRANGEMENT AND MICROSCOPE FOR THREE-DIMENSIONAL IMAGING IN...
- Publication number 20230236400
- Publication date Jul 27, 2023
- CARL ZEISS MICROSCOPY GMBH
- Thomas Kalkbrenner
- G02 - OPTICS
Information Patent Application
Method and Device for Superresolution Optical Measurement using Sin...
- Publication number 20230228561
- Publication date Jul 20, 2023
- Bioaxial, SAS
- Gabriel Y Sirat
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING ASSISTED SUPER RESOLUTION MICROSCOPY
- Publication number 20230177642
- Publication date Jun 8, 2023
- Purdue Research Foundation
- Zhaxylyk A. Kudyshev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROSCOPE SYSTEM AND MICROSCOPE CONTROL DEVICE
- Publication number 20230168481
- Publication date Jun 1, 2023
- Evident Corporation
- Koji IMAZEKI
- G02 - OPTICS
Information Patent Application
Auto-Focus Methods and Systems for Multi-Spectral Imaging
- Publication number 20230114003
- Publication date Apr 13, 2023
- Ventana Medical Systems, Inc.
- Joerg Bredno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND ILLUMINATION APPARATUS OF THE ADAPTIVE OPTICS IN REFLECT...
- Publication number 20230098493
- Publication date Mar 30, 2023
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- JOHANNES DOMINIK SEELIG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER SCANNING MICROSCOPE AND METHOD FOR DETERMINING A POSITION OF...
- Publication number 20230008453
- Publication date Jan 12, 2023
- Leica Microsystems CMS GmbH
- Arnold GISKE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DISTURBANCE CORRECTION, AND LASER SCANNING MICROSCOPE HAV...
- Publication number 20230003651
- Publication date Jan 5, 2023
- Abberior Instruments GmbH
- Benjamin HARKE
- G01 - MEASURING TESTING
Information Patent Application
High-Resolution, Real-Time Imaging With Adaptive Optics and Lattice...
- Publication number 20220317433
- Publication date Oct 6, 2022
- HOWARD HUGHES MEDICAL INSTITUTE
- Robert Eric Betzig
- G02 - OPTICS

details concerning resolution or correction, including general design of CSOM objectives

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Machine learning assisted super resolution microscopy

Systems and methods for confocal microscopy

Line excitation array detection microscopy

Laser scanning microscope and method for determining a position of...

Handheld confocal scanning optical microscope systems having oscill...

Method and light microscope for a high-resolution examination of a...

High-resolution, real-time imaging with adaptive optics and lattice...

Optical measuring device and process

Auto-focus methods and systems for multi-spectral imaging

Background-suppressed STED nanoscope

Two-photon stimulated emission depletion composite microscope using...

Method and device for superresolution optical measurement using sin...

Low-noise spectroscopic imaging system with steerable substantially...

Apparatus and method for capturing an image

Immersion objective

Beam manipulation device for a scanning microscope, and microscope

Enhanced sample imaging using structured illumination microscopy

Method and device for superresolution optical measurement using sin...

Method for operating a light microscope with structured illuminatio...

High-resolution scanning microscopy with discrimination between at...

Microscope having an imaging optical unit for recording

Assembly for increasing the resolution of a laser scanning microscope

Optical super-resolution microscopic imaging system

Auto-focus methods and systems for multi-spectral imaging

Information processing device, information processing method, infor...

Microscope and method for determining an aberration in a microscope

Method for deconvolving image data

High-resolution scanning microscopy

Stimulated emission depletion super-resolution microscope using qui...

Methods and systems for single frame autofocusing based on color- m...

Patents Applicationslast 30 patents

Optical Measuring Process Using Dark Helix

OPTICAL MICROSCOPE COMPRISING AN OPTOMECHANICAL FINE-ADJUSTMENT DEV...

FAST SCANNING MICROSCOPE SYSTEMS, AND RELATED OPTICS AND METHODS

SYSTEM AND METHOD FOR NANOSCALE AXIAL LOCALIZATION AND SUPER RESOLU...

METHOD OF PROVIDING AN ASSEMBLED IMAGE USING DIGITAL MICROSCOPE, DI...

AUTO-FOCUS METHODS AND SYSTEMS FOR MULTI-SPECTRAL IMAGING

METHOD AND LIGHT MICROSCOPE FOR A HIGH-RESOLUTION EXAMINATION OF A...

Method and Device for Superresolution Optical Measurement using Sin...

METHOD AND LIGHT MICROSCOPE FOR LOCALIZING INDIVIDUAL EMITTERS IN A...

CONFOCAL MICROSCOPE WITH PHOTON RE-ALLOCATION

MICROSCOPE OBJECTIVE LENS, MICROSCOPE OPTICAL SYSTEM, AND MICROSCOP...

CALCULATION METHOD, IMAGE-CAPTURING METHOD, AND IMAGE-CAPTURING APP...

POINT-SCANNING STRUCTURED ILLUMINATION-BASED SUPER-RESOLUTION MICRO...

CALCULATION METHOD, IMAGING-CAPTURING METHOD, AND IMAGE-CAPTURING A...

METHOD AND APPARATUS FOR HIGH-RESOLUTION LOCALIZATION OF A SINGLE E...

PHOTOELECTRON EMISSION MICROSCOPE

SUPER-RESOLUTION MICROSCOPIC IMAGING METHOD AND APPARATUS BASED ON...

A WHOLE SLIDE IMAGING METHOD FOR A MICROSCOPE

MICROSCOPE

SYSTEMS AND METHODS FOR CONFOCAL MICROSCOPY

METHOD, APPARATUS AND COMPUTER PROGRAM FOR LOCALIZING AN EMITTER IN...

METHOD, ARRANGEMENT AND MICROSCOPE FOR THREE-DIMENSIONAL IMAGING IN...

Method and Device for Superresolution Optical Measurement using Sin...

MACHINE LEARNING ASSISTED SUPER RESOLUTION MICROSCOPY

MICROSCOPE SYSTEM AND MICROSCOPE CONTROL DEVICE

Auto-Focus Methods and Systems for Multi-Spectral Imaging

METHOD AND ILLUMINATION APPARATUS OF THE ADAPTIVE OPTICS IN REFLECT...

LASER SCANNING MICROSCOPE AND METHOD FOR DETERMINING A POSITION OF...

METHOD OF DISTURBANCE CORRECTION, AND LASER SCANNING MICROSCOPE HAV...

High-Resolution, Real-Time Imaging With Adaptive Optics and Lattice...