-
-
-
-
-
-
-
DISTANCE MEASURING SYSTEM
-
Publication number 20240402308
-
Publication date Dec 5, 2024
-
RICOH COMPANY, LTD.
-
Hiroyoshi Sekiguchi
-
G01 - MEASURING TESTING
-
-
OPTICAL COMPONENT
-
Publication number 20240363786
-
Publication date Oct 31, 2024
-
Universitat Siegen
-
Andreas BABLICH
-
H01 - BASIC ELECTRIC ELEMENTS
-
-
-
RANGING DEVICE
-
Publication number 20240353564
-
Publication date Oct 24, 2024
-
DENSO CORPORATION
-
Takayoshi FUJISAWA
-
G01 - MEASURING TESTING
-
RANGING DEVICE
-
Publication number 20240345252
-
Publication date Oct 17, 2024
-
DENSO CORPORATION
-
Takayoshi FUJISAWA
-
G01 - MEASURING TESTING
-
-
-
-
-
CLOUD PHASE DETECTION
-
Publication number 20240319379
-
Publication date Sep 26, 2024
-
Rosemount Aerospace Inc.
-
Mark D. Ray
-
G01 - MEASURING TESTING
-
-
-
-
Optoelectronic sensor
-
Publication number 20240302503
-
Publication date Sep 12, 2024
-
Balluff GmbH
-
Tobias Reissing
-
G01 - MEASURING TESTING
-
-
PHOTODETECTOR CROSSTALK REDUCTION
-
Publication number 20240280674
-
Publication date Aug 22, 2024
-
Continental Autonomous Mobility US, LLC
-
Roger Frederick DuPont
-
G01 - MEASURING TESTING
-
-
PULSED LIDAR SYSTEM
-
Publication number 20240264287
-
Publication date Aug 8, 2024
-
OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES
-
Laurent LOMBARD
-
G01 - MEASURING TESTING
-
SENSOR DEVICE
-
Publication number 20240255619
-
Publication date Aug 1, 2024
-
Omron Corporation
-
Norihiro Tomago
-
G01 - MEASURING TESTING
-
-
LIGHT-RECEIVING ELEMENT
-
Publication number 20240244349
-
Publication date Jul 18, 2024
-
Sony Semiconductor Solutions Corporation
-
Oichi Kumagai
-
H01 - BASIC ELECTRIC ELEMENTS
-