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G01M11/0207
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PHYSICS
G01
Measuring instruments
G01M
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
G01M11/00
Testing of optical apparatus Testing structures by optical methods not otherwise provided for
Current Industry
G01M11/0207
Details of measuring devices
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Patents Grants
last 30 patents
Information
Patent Grant
Automated testing of optical assemblies
Patent number
11,971,322
Issue date
Apr 30, 2024
IONQ, INC.
Jonathan Albert Mizrahi
G01 - MEASURING TESTING
Information
Patent Grant
Endpoint detection system for enhanced spectral data collection
Patent number
11,965,798
Issue date
Apr 23, 2024
Applied Materials, Inc.
Pengyu Han
G01 - MEASURING TESTING
Information
Patent Grant
Comprehensive test platform for fluorescence microscope objective l...
Patent number
11,959,821
Issue date
Apr 16, 2024
MLOptic Corp.
Bin Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring optical characteristics of augme...
Patent number
11,953,401
Issue date
Apr 9, 2024
SOOKMYUNG WOMEN'S UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION
Young Ju Jeong
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Individual channel characterization of collimator
Patent number
11,948,290
Issue date
Apr 2, 2024
Siemens Medical Solutions USA, Inc.
Alexander Hans Vija
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for determining at least one optical parameter of...
Patent number
11,892,366
Issue date
Feb 6, 2024
Carl Zeiss Vision International GmbH
Alexander Leube
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Method to measure light loss of optical films and optical substrates
Patent number
11,892,367
Issue date
Feb 6, 2024
Applied Materials, Inc.
Jinxin Fu
G01 - MEASURING TESTING
Information
Patent Grant
Heterodyne one-dimensional grating measuring device and measuring m...
Patent number
11,860,057
Issue date
Jan 2, 2024
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of...
Wenhao Li
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for wavefront reconstruction based on rotation...
Patent number
11,846,558
Issue date
Dec 19, 2023
Zhejiang University
Jian Bai
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for detecting absolute or relative temperature an...
Patent number
11,846,559
Issue date
Dec 19, 2023
Adtran Networks SE
Benjamin Wohlfeil
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical measurement method and system and optical device manufactur...
Patent number
11,841,288
Issue date
Dec 12, 2023
SHANGHAI INTELIGHT ELECTRONIC TECHNOLOGY CO., LTD.
Shunyi Tan
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring optical characteristics of a test optical e...
Patent number
11,808,938
Issue date
Nov 7, 2023
Young Optics Inc.
Wei-Ting Chiu
G01 - MEASURING TESTING
Information
Patent Grant
Backscattering optical amplification device, optical pulse testing...
Patent number
11,802,809
Issue date
Oct 31, 2023
Nippon Telegraph and Telephone Corporation
Keiji Okamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection system for concentrating photovoltaic apparatus and insp...
Patent number
11,799,421
Issue date
Oct 24, 2023
Sumitomo Electric Industries, Ltd.
Kenji Saito
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Optical measuring device and method for measuring an optical element
Patent number
11,774,322
Issue date
Oct 3, 2023
Moller-Wedel Optical GmbH
Michael Dahl
G01 - MEASURING TESTING
Information
Patent Grant
Blocker having light transmission and reflection device
Patent number
11,768,390
Issue date
Sep 26, 2023
Huvitz Co., Ltd.
Dong Kun Oh
G01 - MEASURING TESTING
Information
Patent Grant
Configurable camera stimulation and metrology apparatus and method...
Patent number
11,689,711
Issue date
Jun 27, 2023
Optikos Corporation
John Price
G01 - MEASURING TESTING
Information
Patent Grant
Testing box proofed against light flares during the testing of imag...
Patent number
11,674,866
Issue date
Jun 13, 2023
TRIPLE WIN TECHNOLOGY(SHENZHEN) CO. LTD.
Xin-Ru Chang
G01 - MEASURING TESTING
Information
Patent Grant
System and a method for monitoring the position of a blocking devic...
Patent number
11,668,955
Issue date
Jun 6, 2023
Essilor International
Laurent Roussel
G02 - OPTICS
Information
Patent Grant
Optical deflector parameter measurement device, method, and program
Patent number
11,656,073
Issue date
May 23, 2023
Nippon Telegraph and Telephone Corporation
Masahiro Ueno
G01 - MEASURING TESTING
Information
Patent Grant
Optical probe, optical probe array, test system and test method
Patent number
11,624,679
Issue date
Apr 11, 2023
Kabushiki Kaisha Nihon Micronics
Michitaka Okuta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical path test system and method for return light resistance of...
Patent number
11,619,563
Issue date
Apr 4, 2023
SHENZHEN XING HAN LASER TECHNOLOGY CO.LTD.
Shao Feng Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Loopback waveguide
Patent number
11,614,584
Issue date
Mar 28, 2023
Suresh Venkatesan
G01 - MEASURING TESTING
Information
Patent Grant
Pinhole mitigation for optical devices
Patent number
11,550,197
Issue date
Jan 10, 2023
View, Inc.
Robin Friedman
G01 - MEASURING TESTING
Information
Patent Grant
Optical test apparatus and optical test method
Patent number
11,536,652
Issue date
Dec 27, 2022
Kabushiki Kaisha Toshiba
Hiroshi Ohno
G01 - MEASURING TESTING
Information
Patent Grant
Lens inspection module
Patent number
11,499,888
Issue date
Nov 15, 2022
Alcon Inc.
Bernhard Pfaff
B08 - CLEANING
Information
Patent Grant
Method for replacing a mirror in a projection exposure apparatus, a...
Patent number
11,500,294
Issue date
Nov 15, 2022
Carl Zeiss SMT GmbH
Christoph Petri
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Laser measuring system
Patent number
11,486,790
Issue date
Nov 1, 2022
CHANGZHOU HUADA KEJIE OPTO-ELECTRO INSTRUMENT CO., LTD.
Ou Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Test method performed using lens
Patent number
11,474,378
Issue date
Oct 18, 2022
Toyoda Gosei Co., Ltd.
Seitaro Taki
G01 - MEASURING TESTING
Information
Patent Grant
Glass sheet acquisition and positioning system and associated metho...
Patent number
11,465,928
Issue date
Oct 11, 2022
Glasstech, Inc.
Michael Vild
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Patents Applications
last 30 patents
Information
Patent Application
METHOD TO MEASURE LIGHT LOSS OF OPTICAL FILMS AND OPTICAL SUBSTRATES
Publication number
20240125670
Publication date
Apr 18, 2024
Applied Materials, Inc.
Jinxin FU
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS AND METHOD FOR MEASURING A MODULATION TRANSFER...
Publication number
20240085271
Publication date
Mar 14, 2024
Trioptics GmbH
Josef HEINISCH
G01 - MEASURING TESTING
Information
Patent Application
ACQUIRING APPARATUS, ACQUIRING METHOD, AND OPTICAL SYSTEM MANUFACTU...
Publication number
20240085269
Publication date
Mar 14, 2024
Canon Kabushiki Kaisha
Tomohiro SUGIMOTO
G01 - MEASURING TESTING
Information
Patent Application
Method and Device for Detecting Absolute or Relative Temperature an...
Publication number
20240085267
Publication date
Mar 14, 2024
Adtran Networks SE
Benjamin Wohlfeil
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM FOR ASSISTING IN DETERMINING A FINAL OPTICAL PRESCRIPTION FO...
Publication number
20240077379
Publication date
Mar 7, 2024
Luneau Technology Operations
Frederic Albert André LAMBERT
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASURING DEVICE, MEASURING METHOD, AND ELECTRONIC DEVICE
Publication number
20240035923
Publication date
Feb 1, 2024
SONY GROUP CORPORATION
HIROSHI MORITA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
DEVICE FOR VERIFYING VEHICLE LAMP OPERATION
Publication number
20230408370
Publication date
Dec 21, 2023
John C. Dunham
G01 - MEASURING TESTING
Information
Patent Application
LOOPBACK WAVEGUIDE
Publication number
20230384515
Publication date
Nov 30, 2023
POET Technologies, Inc.
Suresh Venkatesan
G01 - MEASURING TESTING
Information
Patent Application
LOOPBACK WAVEGUIDE
Publication number
20230384516
Publication date
Nov 30, 2023
POET Technologies, Inc.
Suresh Venkatesan
G01 - MEASURING TESTING
Information
Patent Application
DUAL-DIAL MEASUREMENT DEVICE AND MEASUREMENT METHOD FOR VIEWING ANG...
Publication number
20230375438
Publication date
Nov 23, 2023
SOUTHWEST PETROLEUM UNIVERSITY
Yi Qiu
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING PARAMETERS OF ROADWAY LOW-POSITION LIGHTING FI...
Publication number
20230358634
Publication date
Nov 9, 2023
BEIJING UNIVERSITY OF TECHNOLOGY
Jiangbi HU
G01 - MEASURING TESTING
Information
Patent Application
LENSMETER CAPABLE OF MEASURING NEAR-INFRARED TRANSMITTANCE OF EYEGL...
Publication number
20230324256
Publication date
Oct 12, 2023
Sang Jeon PARK
G01 - MEASURING TESTING
Information
Patent Application
SEVERAL MODE FIBER TEST METHOD AND SEVERAL MODE FIBER TEST DEVICE
Publication number
20230288289
Publication date
Sep 14, 2023
Nippon Telegraph and Telephone Corporation
Atsushi NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING A ROUNDED VALUE OF AN OPTICAL FEA...
Publication number
20230266198
Publication date
Aug 24, 2023
Essilor International
Helene STARYNKEVITCH
G01 - MEASURING TESTING
Information
Patent Application
HIGH-PRECISION AND HIGH-THROUGHPUT MEASUREMENT OF PERCENTAGE LIGHT...
Publication number
20230251161
Publication date
Aug 10, 2023
Applied Materials, Inc.
Baochen WU
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING AT LEAST ONE OPTICAL PARAMETER OF...
Publication number
20230243717
Publication date
Aug 3, 2023
CARL ZEISS VISION INTERNATIONAL GMBH
Alexander Leube
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Non Rotating Lens Centering Device
Publication number
20230236085
Publication date
Jul 27, 2023
Oren Aharon
G01 - MEASURING TESTING
Information
Patent Application
SPATIAL PROPERTY OR COLOR IMPLEMENTATION PROPERTY MEASUREMENT DEVIC...
Publication number
20230204454
Publication date
Jun 29, 2023
KOREA PHOTONICS TECHNOLOGY INSTITUTE
Kwang Hoon LEE
G01 - MEASURING TESTING
Information
Patent Application
Apparatuses for Testing the lateral and Axial Confocality of a Scan...
Publication number
20230194383
Publication date
Jun 22, 2023
Abberior Instruments GmbH
Joachim Fischer
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR MEASUREMENT OF OPTICAL VIGNETTING
Publication number
20230160778
Publication date
May 25, 2023
MOTIONAL AD LLC
Yew Kwang Low
G01 - MEASURING TESTING
Information
Patent Application
PINHOLE MITIGATION FOR OPTICAL DEVICES
Publication number
20230144015
Publication date
May 11, 2023
VIEW, INC.
Robin Sean Friedman
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
Publication number
20230099653
Publication date
Mar 30, 2023
Kabushiki Kaisha Toshiba
Hiroshi OHNO
G01 - MEASURING TESTING
Information
Patent Application
DETECTION DEVICE AND DETECTION METHOD
Publication number
20230091748
Publication date
Mar 23, 2023
Shenzhen china Star Optoelectronics Semiconductor Display Technology Co., Ltd.
Bo HE
G01 - MEASURING TESTING
Information
Patent Application
HIGH-THROUGHPUT TESTING AND MODULE INTEGRATION OF ROTATIONALLY VARI...
Publication number
20230073048
Publication date
Mar 9, 2023
Meta Platforms Technologies, LLC
Di XU
G01 - MEASURING TESTING
Information
Patent Application
EYEGLASSES LENS MEASUREMENT DEVICE AND NON-TRANSITORY COMPUTER-READ...
Publication number
20230034573
Publication date
Feb 2, 2023
NIDEK CO., LTD.
Katsuyasu MIZUNO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR TESTING GRATINGS
Publication number
20220412840
Publication date
Dec 29, 2022
Google LLC
Timothy Bodiya
G01 - MEASURING TESTING
Information
Patent Application
ENDPOINT DETECTION SYSTEM FOR ENHANCED SPECTRAL DATA COLLECTION
Publication number
20220397482
Publication date
Dec 15, 2022
Applied Materials, Inc.
Pengyu Han
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETERMINING AN IMAGING QUALITY OF AN OPTICAL SYSTEM WHEN...
Publication number
20220390320
Publication date
Dec 8, 2022
Carl Zeiss SMT GMBH
Markus Koch
G01 - MEASURING TESTING
Information
Patent Application
COMPREHENSIVE TEST PLATFORM FOR FLUORESCENCE MICROSCOPE OBJECTIVE L...
Publication number
20220341811
Publication date
Oct 27, 2022
Bin Zhang
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR PULLING OUT OPTICAL FIBER, METHOD FOR PULLING OUT OPTICA...
Publication number
20220341814
Publication date
Oct 27, 2022
FUJIKURA LTD.
Shengyang Luo
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL