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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/02Details

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for increasing reaction yield
- Patent number 12,325,012
- Issue date Jun 10, 2025
- Purdue Research Foundation
- Robert Graham Cooks
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Tissue analysis by mass spectrometry or ion mobility spectrometry
- Patent number 12,315,714
- Issue date May 27, 2025
- Micromass UK Limited
- Steven Derek Pringle
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Voltage control for Ion mobility separation
- Patent number 12,300,479
- Issue date May 13, 2025
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with charge measurement arrangement
- Patent number 12,293,908
- Issue date May 6, 2025
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument, including an electrostatic linear ion trap, for analyzi...
- Patent number 12,283,475
- Issue date Apr 22, 2025
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-radioactive plasma ion source device
- Patent number 12,283,473
- Issue date Apr 22, 2025
- MICROPLASMA SYSTEMS, LLC
- James Joseph Alberti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 12,278,098
- Issue date Apr 15, 2025
- STANDARD BIOTOOLS CANADA INC.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-voltage power supply device
- Patent number 12,267,001
- Issue date Apr 1, 2025
- Shimadzu Corporation
- Haruki Osa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,266,518
- Issue date Apr 1, 2025
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-power mass interrogation system and assay for determining vitam...
- Patent number 12,261,032
- Issue date Mar 25, 2025
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument for separating ions including an electrostatic linear io...
- Patent number 12,255,060
- Issue date Mar 18, 2025
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle mass spectrometry
- Patent number 12,243,736
- Issue date Mar 4, 2025
- SHANGHAI POLARIS BIOLOGY CO., LTD.
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switchable ion guide
- Patent number 12,243,734
- Issue date Mar 4, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device, system, and method for ion fragmentation by use of an ion m...
- Patent number 12,230,490
- Issue date Feb 18, 2025
- Ecole Polytechnique Federale de Lausanne (EPFL)
- Stephan Warnke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interactive analysis of mass spectrometry data
- Patent number 12,224,169
- Issue date Feb 11, 2025
- Protein Metrics, LLC
- Yong Joo Kil
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detector having improved performance and service life
- Patent number 12,224,167
- Issue date Feb 11, 2025
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detector
- Patent number 12,224,170
- Issue date Feb 11, 2025
- ADAPTAS SOLUTIONS PTY LTD
- Wayne Sheils
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra low noise floated high voltage supply for mass spectrometer i...
- Patent number 12,191,131
- Issue date Jan 7, 2025
- DH Technologies Development Pte. Ltd.
- Manuel Faur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-domain analysis of signals for charge detection mass spectrometry
- Patent number 12,183,566
- Issue date Dec 31, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for detecting charged particles or light
- Patent number 12,183,837
- Issue date Dec 31, 2024
- Hamamatsu Photonics K.K.
- Sayaka Takatsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization device and mass spectrometer
- Patent number 12,176,199
- Issue date Dec 24, 2024
- LEYBOLD GMBH
- Yessica Brachthaeuser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thread spray ambient ionization
- Patent number 12,169,197
- Issue date Dec 17, 2024
- OHIO STATE INNOVATION FOUNDATION
- Abraham Badu-Tawiah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for two-dimensional mobility based filtering of...
- Patent number 12,163,920
- Issue date Dec 10, 2024
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of characterization of visible and/or sub-visible particles...
- Patent number 12,158,474
- Issue date Dec 3, 2024
- REGENERON PHARMACEUTICALS, INC.
- Xiaobin Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap array for high throughput charge detection mass spectrometry
- Patent number 12,159,780
- Issue date Dec 3, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for tuning a mass spectrometer
- Patent number 12,148,603
- Issue date Nov 19, 2024
- Thermo Finnigan LLC.
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Virtual slit cycloidal mass spectrometer
- Patent number 12,131,894
- Issue date Oct 29, 2024
- Duke University
- M. Bonner Denton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power supply device for triple quadrupole mass spectrometer
- Patent number 12,119,213
- Issue date Oct 15, 2024
- NANJING QLIFE MEDICAL TECHNOLOGY CO., LTD.
- Xiaoliang Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide
- Patent number 12,112,935
- Issue date Oct 8, 2024
- Micromass UK Limited
- Kevin Giles
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for multi-pass encoded frequency pushing
- Patent number 12,100,584
- Issue date Sep 24, 2024
- Leco Corporation
- Peter Markel Willis
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTERACTIVE ANALYSIS OF ANALYTICAL DATA
- Publication number 20250183022
- Publication date Jun 5, 2025
- Protein Metrics, LLC
- Yong Joo KIL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR CONTROLLING THE FLOW OF AEROSOLS
- Publication number 20250183024
- Publication date Jun 5, 2025
- University of Hawaii
- Tyler R. RAY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SIMULTANEOUS ANALYSIS OF MULTIPLE CHARGED PAR...
- Publication number 20250183023
- Publication date Jun 5, 2025
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE, SYSTEM, AND METHOD FOR ION FRAGMENTATION BY USE OF AN ION M...
- Publication number 20250174446
- Publication date May 29, 2025
- ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
- Stephan Warnke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ultra Low Noise Floated High Voltage Supply For Mass Spectrometer I...
- Publication number 20250174447
- Publication date May 29, 2025
- DH Technologies Development Pte. Ltd.
- Manuel FAUR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND WAVE-DETECTION UNIT
- Publication number 20250174448
- Publication date May 29, 2025
- Shimadzu Corporation
- Shiro MIZUTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY AND NOISE ESTIMATION
- Publication number 20250166982
- Publication date May 22, 2025
- DH Technologies Development Pte. Ltd.
- Gordana Ivosev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...
- Publication number 20250166985
- Publication date May 22, 2025
- IONpath, Inc.
- David Stumbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR ONLINE RAPID PRETREATMENT MASS SPECTROMETRY OF MULTI-CEL...
- Publication number 20250155406
- Publication date May 15, 2025
- UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
- Guangming Huang
- G01 - MEASURING TESTING
Information Patent Application
System and Method of Driving Radio Frequency for Multipole Ion Proc...
- Publication number 20250132141
- Publication date Apr 24, 2025
- DH Technologies Development Pte. Ltd.
- Takashi BABA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY DEVICE AND RF TUNING METHOD OF MASS SPECTROMETRY...
- Publication number 20250104987
- Publication date Mar 27, 2025
- HITACHI HIGH-TECH CORPORATION
- Hikaru Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHODS FOR SPATIALLY AND TEMPORARILY SORTING IONS US...
- Publication number 20250069879
- Publication date Feb 27, 2025
- Thermo Finnigan LLC
- Michael W. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATING A MASS SPECTROMETER
- Publication number 20250062108
- Publication date Feb 20, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Hans-Juergen SCHLUETER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20250046594
- Publication date Feb 6, 2025
- Shimadzu Corporation
- Takeshi UCHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Sample Processing System with Multiple Detection Capability
- Publication number 20250027950
- Publication date Jan 23, 2025
- Beckman Coulter, Inc.
- Aaron Hudson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Noise Reduction and Ion Rate Estimation Using an Analog...
- Publication number 20250014880
- Publication date Jan 9, 2025
- DH Technologies Development Pte. Ltd.
- Gordana IVOSEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTOR AND MASS SPECTROMETER
- Publication number 20250006480
- Publication date Jan 2, 2025
- HAMAMATSU PHOTONICS K. K.
- Junichi KONDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTORS
- Publication number 20240420938
- Publication date Dec 19, 2024
- Micromass UK Limited
- David Gordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL SYSTEM AND ANALYTICAL METHOD
- Publication number 20240412964
- Publication date Dec 12, 2024
- Shimadzu Corporation
- Zhi GENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC POSITIONING OF AN ELECTROSPRAY IONIZATION EMITTER
- Publication number 20240404815
- Publication date Dec 5, 2024
- Thermo Finnigan LLC
- Joshua A. Silveira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Segmented Movement Control Electrodes in Ion Traps
- Publication number 20240404819
- Publication date Dec 5, 2024
- Infineon Technologies Austria AG
- Matthias Brandl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240404810
- Publication date Dec 5, 2024
- HGSG LTD
- John HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTOR AND ANALYZER
- Publication number 20240404814
- Publication date Dec 5, 2024
- HAMAMATSU PHOTONICS K. K.
- Junichi KONDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR PROCESSING IN REAL-TIME AND USING GAUSSIAN
- Publication number 20240404811
- Publication date Dec 5, 2024
- DH Technologies Development Pte. Ltd.
- Calin Bradau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Deflector Gates for Ion Beam Intensity Modulation
- Publication number 20240395528
- Publication date Nov 28, 2024
- DH Technologies Development Pte. Ltd.
- Robert HAUFLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLTAGE SUPPLY FOR MASS SPECTROMETER
- Publication number 20240395532
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Philipp Cochems
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS AND DEVICE FOR DETECTING AN OPERATING STATE OF A PHOTOIONIZ...
- Publication number 20240395524
- Publication date Nov 28, 2024
- Drager Safety AG & Co. KGaA
- Andre PAPE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A MULTIPOLE DEVICE
- Publication number 20240395533
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SCREENING METHOD AND SYSTEM FOR MASS SPECTROMETER, HIGH-VOLTAGE...
- Publication number 20240371620
- Publication date Nov 7, 2024
- AUTOBIO LABTEC INSTRUMENTS CO., LTD.
- Keya CAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for increasing reaction yield

Tissue analysis by mass spectrometry or ion mobility spectrometry

Voltage control for Ion mobility separation

Mass spectrometer with charge measurement arrangement

Instrument, including an electrostatic linear ion trap, for analyzi...

Non-radioactive plasma ion source device

High resolution imaging apparatus and method

High-voltage power supply device

Ion analyzer

Low-power mass interrogation system and assay for determining vitam...

Instrument for separating ions including an electrostatic linear io...

Particle mass spectrometry

Switchable ion guide

Device, system, and method for ion fragmentation by use of an ion m...

Interactive analysis of mass spectrometry data

Particle detector having improved performance and service life

Charged particle detector

Ultra low noise floated high voltage supply for mass spectrometer i...

Time-domain analysis of signals for charge detection mass spectrometry

Detector for detecting charged particles or light

Ionization device and mass spectrometer

Thread spray ambient ionization

Systems and methods for two-dimensional mobility based filtering of...

Method of characterization of visible and/or sub-visible particles...

Ion trap array for high throughput charge detection mass spectrometry

Methods and systems for tuning a mass spectrometer

Virtual slit cycloidal mass spectrometer

Power supply device for triple quadrupole mass spectrometer

Ion guide

Methods and systems for multi-pass encoded frequency pushing

Patents Applicationslast 30 patents

INTERACTIVE ANALYSIS OF ANALYTICAL DATA

SYSTEM AND METHOD FOR CONTROLLING THE FLOW OF AEROSOLS

SYSTEM AND METHOD FOR SIMULTANEOUS ANALYSIS OF MULTIPLE CHARGED PAR...

DEVICE, SYSTEM, AND METHOD FOR ION FRAGMENTATION BY USE OF AN ION M...

Ultra Low Noise Floated High Voltage Supply For Mass Spectrometer I...

MASS SPECTROMETER AND WAVE-DETECTION UNIT

MASS SPECTROMETRY AND NOISE ESTIMATION

SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...

DEVICE FOR ONLINE RAPID PRETREATMENT MASS SPECTROMETRY OF MULTI-CEL...

System and Method of Driving Radio Frequency for Multipole Ion Proc...

MASS SPECTROMETRY DEVICE AND RF TUNING METHOD OF MASS SPECTROMETRY...

APPARATUS AND METHODS FOR SPATIALLY AND TEMPORARILY SORTING IONS US...

CALIBRATING A MASS SPECTROMETER

Mass Spectrometer

Integrated Sample Processing System with Multiple Detection Capability

Method for Noise Reduction and Ion Rate Estimation Using an Analog...

ION DETECTOR AND MASS SPECTROMETER

ION DETECTORS

ANALYTICAL SYSTEM AND ANALYTICAL METHOD

AUTOMATIC POSITIONING OF AN ELECTROSPRAY IONIZATION EMITTER

Segmented Movement Control Electrodes in Ion Traps

MASS SPECTROMETER AND METHOD

ION DETECTOR AND ANALYZER

METHODS AND SYSTEMS FOR PROCESSING IN REAL-TIME AND USING GAUSSIAN

Deflector Gates for Ion Beam Intensity Modulation

VOLTAGE SUPPLY FOR MASS SPECTROMETER

PROCESS AND DEVICE FOR DETECTING AN OPERATING STATE OF A PHOTOIONIZ...

METHOD OF OPERATING A MULTIPOLE DEVICE

ION SCREENING METHOD AND SYSTEM FOR MASS SPECTROMETER, HIGH-VOLTAGE...

HIGH RESOLUTION IMAGING APPARATUS AND METHOD