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H01J49/02

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

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H01J49/02Details

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Ionization device and mass spectrometer
- Patent number 12,176,199
- Issue date Dec 24, 2024
- LEYBOLD GMBH
- Yessica Brachthaeuser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thread spray ambient ionization
- Patent number 12,169,197
- Issue date Dec 17, 2024
- OHIO STATE INNOVATION FOUNDATION
- Abraham Badu-Tawiah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for two-dimensional mobility based filtering of...
- Patent number 12,163,920
- Issue date Dec 10, 2024
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of characterization of visible and/or sub-visible particles...
- Patent number 12,158,474
- Issue date Dec 3, 2024
- REGENERON PHARMACEUTICALS, INC.
- Xiaobin Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap array for high throughput charge detection mass spectrometry
- Patent number 12,159,780
- Issue date Dec 3, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for tuning a mass spectrometer
- Patent number 12,148,603
- Issue date Nov 19, 2024
- Thermo Finnigan LLC.
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Virtual slit cycloidal mass spectrometer
- Patent number 12,131,894
- Issue date Oct 29, 2024
- Duke University
- M. Bonner Denton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power supply device for triple quadrupole mass spectrometer
- Patent number 12,119,213
- Issue date Oct 15, 2024
- NANJING QLIFE MEDICAL TECHNOLOGY CO., LTD.
- Xiaoliang Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide
- Patent number 12,112,935
- Issue date Oct 8, 2024
- Micromass UK Limited
- Kevin Giles
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for multi-pass encoded frequency pushing
- Patent number 12,100,584
- Issue date Sep 24, 2024
- Leco Corporation
- Peter Markel Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,100,582
- Issue date Sep 24, 2024
- Shimadzu Corporation
- Masaru Nishiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometry device and analysis method
- Patent number 12,087,569
- Issue date Sep 10, 2024
- Shimadzu Corporation
- Takuro Kishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide with reduced noding effect
- Patent number 12,087,567
- Issue date Sep 10, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for transferring ions between trapping devices of variable...
- Patent number 12,080,535
- Issue date Sep 3, 2024
- Thermo Finnigan LLC.
- Jesse D. Canterbury
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scintillator, measuring device, mass spectrometer, and electron mic...
- Patent number 12,072,454
- Issue date Aug 27, 2024
- HITACHI HIGH-TECH CORPORATION
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector
- Patent number 12,074,016
- Issue date Aug 27, 2024
- Hamamatsu Photonics K.K.
- Hiroshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal detection device, measurement device, and mass spectrometer
- Patent number 12,066,582
- Issue date Aug 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Takuma Nishimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector
- Patent number 12,061,166
- Issue date Aug 13, 2024
- Micromass UK Limited
- David Gordon
- G01 - MEASURING TESTING
Information Patent Grant
Two dimensional MSMS
- Patent number 12,062,532
- Issue date Aug 13, 2024
- Micromass UK Limited
- Keith Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inception electrostatic linear ion trap
- Patent number 12,057,306
- Issue date Aug 6, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power supply module and mass spectrometer
- Patent number 12,051,581
- Issue date Jul 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Zihao Ong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods of operation of linear ion traps in dual balanc...
- Patent number 12,040,174
- Issue date Jul 16, 2024
- Thermo Finnigan LLC.
- Viatcheslav V. Kovtoun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,031,943
- Issue date Jul 9, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transformer for applying an ac voltage to electrodes
- Patent number 12,033,840
- Issue date Jul 9, 2024
- Micromass UK Limited
- Kenneth Worthington
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Increased dynamic range for the attenuation of an ion beam
- Patent number 12,027,357
- Issue date Jul 2, 2024
- DH Technologies Development Pte. Ltd.
- Bruce Collings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source-detector synchronization in multiplexed secondary ion mass s...
- Patent number 12,020,920
- Issue date Jun 25, 2024
- IONpath, Inc.
- David Stumbo
- G01 - MEASURING TESTING
Information Patent Grant
Ion traps with y-directional ion manipulation for mass spectrometry...
- Patent number 12,014,915
- Issue date Jun 18, 2024
- The University of North Carolina at Chapel Hill
- John Michael Ramsey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus
- Patent number 12,009,197
- Issue date Jun 11, 2024
- FASMATECH SCIENCE AND TECHNOLOGY SA
- Dimitris Papanastasiou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compensation voltage adjustment for ion mobility separation
- Patent number 12,007,359
- Issue date Jun 11, 2024
- Thermo Finnigan LLC.
- Bennett S. Kalafut
- G01 - MEASURING TESTING
Information Patent Grant
Method of gain calibration
- Patent number 11,996,277
- Issue date May 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ION DETECTORS
- Publication number 20240420938
- Publication date Dec 19, 2024
- Micromass UK Limited
- David Gordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL SYSTEM AND ANALYTICAL METHOD
- Publication number 20240412964
- Publication date Dec 12, 2024
- Shimadzu Corporation
- Zhi GENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC POSITIONING OF AN ELECTROSPRAY IONIZATION EMITTER
- Publication number 20240404815
- Publication date Dec 5, 2024
- Thermo Finnigan LLC
- Joshua A. Silveira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Segmented Movement Control Electrodes in Ion Traps
- Publication number 20240404819
- Publication date Dec 5, 2024
- Infineon Technologies Austria AG
- Matthias Brandl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240404810
- Publication date Dec 5, 2024
- HGSG LTD
- John HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTOR AND ANALYZER
- Publication number 20240404814
- Publication date Dec 5, 2024
- HAMAMATSU PHOTONICS K. K.
- Junichi KONDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR PROCESSING IN REAL-TIME AND USING GAUSSIAN
- Publication number 20240404811
- Publication date Dec 5, 2024
- DH Technologies Development Pte. Ltd.
- Calin Bradau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLTAGE SUPPLY FOR MASS SPECTROMETER
- Publication number 20240395532
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Philipp Cochems
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Deflector Gates for Ion Beam Intensity Modulation
- Publication number 20240395528
- Publication date Nov 28, 2024
- DH Technologies Development Pte. Ltd.
- Robert HAUFLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS AND DEVICE FOR DETECTING AN OPERATING STATE OF A PHOTOIONIZ...
- Publication number 20240395524
- Publication date Nov 28, 2024
- Drager Safety AG & Co. KGaA
- Andre PAPE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A MULTIPOLE DEVICE
- Publication number 20240395533
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SCREENING METHOD AND SYSTEM FOR MASS SPECTROMETER, HIGH-VOLTAGE...
- Publication number 20240371620
- Publication date Nov 7, 2024
- AUTOBIO LABTEC INSTRUMENTS CO., LTD.
- Keya CAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR PERFORMING CHARGE DETECTION MASS SPECTROMETRY WITH TEMP...
- Publication number 20240371621
- Publication date Nov 7, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWO DIMENSIONAL MSMS
- Publication number 20240363321
- Publication date Oct 31, 2024
- Micromass UK Limited
- Keith Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Improved Low-Power Mass Interrogation System and Assay For Determin...
- Publication number 20240347330
- Publication date Oct 17, 2024
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer Components Including Programmable Elements and De...
- Publication number 20240347332
- Publication date Oct 17, 2024
- PERKINELMER SCIENTIFIC CANADA ULC
- Tak Shun Cheung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SPECTROMETER
- Publication number 20240331993
- Publication date Oct 3, 2024
- SCIENTA OMICRON AB
- Patrik KARLSSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Quadrupole-Mass-Filter Driving Method and Quadrupole Mass Spectrometer
- Publication number 20240331995
- Publication date Oct 3, 2024
- Shimadzu Corporation
- Manabu UEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY VIA FREQUENCY TAGGING
- Publication number 20240304434
- Publication date Sep 12, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVEMENTS IN AND RELATING TO ION ANALYSIS
- Publication number 20240297030
- Publication date Sep 5, 2024
- Shimadzu Corporation
- Sergey SMIRNOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYSIS
- Publication number 20240297032
- Publication date Sep 5, 2024
- Micromass UK Limited
- Emrys Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240290605
- Publication date Aug 29, 2024
- HGSG LTD
- John Brian HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CALIBRATING A MASS SPECTROMETER
- Publication number 20240290596
- Publication date Aug 29, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Erik COUZIJN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIRTUAL SLIT CYCLOIDAL MASS SPECTROMETER
- Publication number 20240290604
- Publication date Aug 29, 2024
- DUKE UNIVERSITY
- M. Bonner Denton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVEMENTS IN AND RELATING TO ION ANALYSIS
- Publication number 20240290597
- Publication date Aug 29, 2024
- Shimadzu Corporation
- Sergey SMIRNOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF AMPLITUDE AUTO-CALIBRATION FOR MASS SPECTROMETRY
- Publication number 20240282562
- Publication date Aug 22, 2024
- DH TECHNOLOGIES DEVELOPMENT PTD. LTD.
- Manuel Faur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Injecting Ions into an Electrostatic Linear...
- Publication number 20240274429
- Publication date Aug 15, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas DZIEKONSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector Having Improved Construction
- Publication number 20240266157
- Publication date Aug 8, 2024
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM SYSTEM FOR A MASS SPECTROMETER
- Publication number 20240266162
- Publication date Aug 8, 2024
- Micromass UK Limited
- Andrew Whatley
- H01 - BASIC ELECTRIC ELEMENTS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Ionization device and mass spectrometer

Thread spray ambient ionization

Systems and methods for two-dimensional mobility based filtering of...

Method of characterization of visible and/or sub-visible particles...

Ion trap array for high throughput charge detection mass spectrometry

Methods and systems for tuning a mass spectrometer

Virtual slit cycloidal mass spectrometer

Power supply device for triple quadrupole mass spectrometer

Ion guide

Methods and systems for multi-pass encoded frequency pushing

Ion analyzer

Time-of-flight mass spectrometry device and analysis method

Ion guide with reduced noding effect

Methods for transferring ions between trapping devices of variable...

Scintillator, measuring device, mass spectrometer, and electron mic...

Ion detector

Signal detection device, measurement device, and mass spectrometer

Ion detector

Two dimensional MSMS

Inception electrostatic linear ion trap

Power supply module and mass spectrometer

Systems and methods of operation of linear ion traps in dual balanc...

Ion analyzer

Transformer for applying an ac voltage to electrodes

Increased dynamic range for the attenuation of an ion beam

Source-detector synchronization in multiplexed secondary ion mass s...

Ion traps with y-directional ion manipulation for mass spectrometry...

Method and apparatus

Compensation voltage adjustment for ion mobility separation

Method of gain calibration

Patents Applicationslast 30 patents

ION DETECTORS

ANALYTICAL SYSTEM AND ANALYTICAL METHOD

AUTOMATIC POSITIONING OF AN ELECTROSPRAY IONIZATION EMITTER

Segmented Movement Control Electrodes in Ion Traps

MASS SPECTROMETER AND METHOD

ION DETECTOR AND ANALYZER

METHODS AND SYSTEMS FOR PROCESSING IN REAL-TIME AND USING GAUSSIAN

VOLTAGE SUPPLY FOR MASS SPECTROMETER

Deflector Gates for Ion Beam Intensity Modulation

PROCESS AND DEVICE FOR DETECTING AN OPERATING STATE OF A PHOTOIONIZ...

METHOD OF OPERATING A MULTIPOLE DEVICE

ION SCREENING METHOD AND SYSTEM FOR MASS SPECTROMETER, HIGH-VOLTAGE...

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

METHODS FOR PERFORMING CHARGE DETECTION MASS SPECTROMETRY WITH TEMP...

TWO DIMENSIONAL MSMS

Improved Low-Power Mass Interrogation System and Assay For Determin...

Mass Spectrometer Components Including Programmable Elements and De...

CHARGED PARTICLE SPECTROMETER

Quadrupole-Mass-Filter Driving Method and Quadrupole Mass Spectrometer

MASS SPECTROMETRY VIA FREQUENCY TAGGING

IMPROVEMENTS IN AND RELATING TO ION ANALYSIS

SAMPLE ANALYSIS

MASS SPECTROMETER AND METHOD

METHOD OF CALIBRATING A MASS SPECTROMETER

VIRTUAL SLIT CYCLOIDAL MASS SPECTROMETER

IMPROVEMENTS IN AND RELATING TO ION ANALYSIS

RF AMPLITUDE AUTO-CALIBRATION FOR MASS SPECTROMETRY

Methods and Systems for Injecting Ions into an Electrostatic Linear...

Detector Having Improved Construction

VACUUM SYSTEM FOR A MASS SPECTROMETER