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H01J2237/2602

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2602Details

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Patents Grantslast 30 patents

Information Patent Grant
Observation carrier for microscope
- Patent number 12,046,444
- Issue date Jul 23, 2024
- FlowVIEW Tek
- Po-Yang Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample preparation system and method for electron microscope observ...
- Patent number 11,990,314
- Issue date May 21, 2024
- SANYU ELECTRON CO., LTD.
- Shinsuke Shibata
- G01 - MEASURING TESTING
Information Patent Grant
System comprising a multi-beam particle microscope and method for o...
- Patent number 11,935,721
- Issue date Mar 19, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated multi-grid handling apparatus
- Patent number 11,881,377
- Issue date Jan 23, 2024
- Richard Joseph Pickreign
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Navigation for electron microscopy
- Patent number 11,688,582
- Issue date Jun 27, 2023
- Oxford Instruments Nanotechnology Tools Limited
- Anthony Hyde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting an EUV mask
- Patent number 11,662,323
- Issue date May 30, 2023
- ASML Netherlands B.V.
- Guochong Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Identifying fiducial markers in microscope images
- Patent number 11,469,075
- Issue date Oct 11, 2022
- Applied Materials, Inc.
- Yun-Ching Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated multi-grid handling apparatus
- Patent number 11,450,507
- Issue date Sep 20, 2022
- Richard Joseph Pickreign
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated multi-grid handling apparatus
- Patent number 11,075,055
- Issue date Jul 27, 2021
- Richard Joseph Pickreign
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for charged particle beam modulation
- Patent number 11,049,689
- Issue date Jun 29, 2021
- ASML Netherlands B.V.
- Ehud Shaked
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscope sample preparation device
- Patent number 10,788,404
- Issue date Sep 29, 2020
- The Florida State University Research Foundation, Inc.
- Michael G. Roper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting an EUV mask
- Patent number 10,775,325
- Issue date Sep 15, 2020
- ASML Netherlands B.V.
- Guochong Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Examination container and electron microscope
- Patent number 10,607,808
- Issue date Mar 31, 2020
- TAIWAN ELECTRON MICROSCOPE INSTRUMENT CORPORATION
- Tsu-Wei Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing a sample for microstructure diagnostics, and sa...
- Patent number 10,591,393
- Issue date Mar 17, 2020
- Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung E.V.
- Michael Krause
- G01 - MEASURING TESTING
Information Patent Grant
Measuring spherical and chromatic aberrations in cathode lens elect...
- Patent number 10,593,510
- Issue date Mar 17, 2020
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of generating a zoom sequence and microscope system configur...
- Patent number 10,468,229
- Issue date Nov 5, 2019
- Carl Zeiss Microscopy GmbH
- Giuseppe Pavia
- G02 - OPTICS
Information Patent Grant
Systems and methods for charged particle beam modulation
- Patent number 10,403,471
- Issue date Sep 3, 2019
- ASML Netherlands B.V.
- Ehud Shaked
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Workpiece transport and positioning apparatus
- Patent number 10,361,060
- Issue date Jul 23, 2019
- Howard Hughes Medical Institute
- John H. Price
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holder device for electron microscope
- Patent number 10,312,050
- Issue date Jun 4, 2019
- SNU R&DB Foundation
- Young Woon Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for characterizing two dimensional nanomaterial
- Patent number 10,297,417
- Issue date May 21, 2019
- Tsinghua University
- Peng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring spherical and chromatic aberrations in cathode lens elect...
- Patent number 10,283,315
- Issue date May 7, 2019
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Workpiece holder for workpiece transport apparatus
- Patent number 10,186,397
- Issue date Jan 22, 2019
- Howard Hughes Medical Institute
- John H. Price
- G01 - MEASURING TESTING
Information Patent Grant
Cryogenic specimen processing in a charged particle microscope
- Patent number 10,170,275
- Issue date Jan 1, 2019
- FEI Company
- John Mitchels
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting an EUV mask
- Patent number 10,088,438
- Issue date Oct 2, 2018
- Hermes-Microvision, Inc.
- Guochong Weng
- G01 - MEASURING TESTING
Information Patent Grant
Structure electron beam inspection system for inspecting extreme ul...
- Patent number 10,054,556
- Issue date Aug 21, 2018
- Hermes Microvision Inc.
- You-Jin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and method for controlling same
- Patent number 10,014,160
- Issue date Jul 3, 2018
- Hitachi High-Technologies Corporation
- Kaori Shirahata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopy support structures
- Patent number 9,984,850
- Issue date May 29, 2018
- Protochips, Inc.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscope sample preparation device
- Patent number 9,958,362
- Issue date May 1, 2018
- The Florida State University Research Foundation, Inc.
- Michael G. Roper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Preparation of specimen arrays on an EM grid
- Patent number 9,952,128
- Issue date Apr 24, 2018
- The Scripps Research Institute
- Bridget Carragher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Graphene modification
- Patent number 9,947,505
- Issue date Apr 17, 2018
- Medical Research Council
- Christopher J. Russo
- B08 - CLEANING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...
- Publication number 20240429020
- Publication date Dec 26, 2024
- Hitachi, Ltd
- Akira SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated Multi-Grid Handling Apparatus
- Publication number 20240212972
- Publication date Jun 27, 2024
- Richard Joseph Pickreign
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM COMPRISING A MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR O...
- Publication number 20240212977
- Publication date Jun 27, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated Multi-Grid Handling Apparatus
- Publication number 20220415607
- Publication date Dec 29, 2022
- RICHARD JOSEPH PICKREIGN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORTS AND SAMPLE COOLING SYSTEMS FOR CRYO-ELECTRON MICROS...
- Publication number 20220291098
- Publication date Sep 15, 2022
- MITEGEN, LLC
- David Closs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBSERVATION CARRIER FOR MICROSCOPE
- Publication number 20220148846
- Publication date May 12, 2022
- FlowVIEW Tek
- Po-Yang Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE PREPARATION SYSTEM AND METHOD FOR ELECTRON MICROSCOPE OBSERV...
- Publication number 20220068598
- Publication date Mar 3, 2022
- SANYU ELECTRON CO., LTD.
- Shinsuke SHIBATA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM COMPRISING A MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR O...
- Publication number 20210343499
- Publication date Nov 4, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated Multi-Grid Handling Apparatus
- Publication number 20210343498
- Publication date Nov 4, 2021
- RICHARD JOSEPH PICKREIGN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING AN EUV MASK
- Publication number 20210172891
- Publication date Jun 10, 2021
- ASML NETHERLANDS B.V.
- Guochong Weng
- G01 - MEASURING TESTING
Information Patent Application
NAVIGATION FOR ELECTRON MICROSCOPY
- Publication number 20210151287
- Publication date May 20, 2021
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Anthony Hyde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED MULTI-GRID HANDLING APPARATUS
- Publication number 20210082657
- Publication date Mar 18, 2021
- RICHARD JOSEPH PICKREIGN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IDENTIFYING FIDUCIAL MARKERS IN MICROSCOPE IMAGES
- Publication number 20200294763
- Publication date Sep 17, 2020
- Yun-Ching Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE BEAM MODULATION
- Publication number 20200176219
- Publication date Jun 4, 2020
- ASML NETHERLANDS B.V.
- Ehud Shaked
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING SPHERICAL AND CHROMATIC ABERRATIONS IN CATHODE LENS ELECT...
- Publication number 20190206655
- Publication date Jul 4, 2019
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING AN EUV MASK
- Publication number 20190170671
- Publication date Jun 6, 2019
- HERMES MICROVISION, INC.
- Guochong Weng
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE BEAM MODULATION
- Publication number 20190164721
- Publication date May 30, 2019
- HERMES MICROVISION, INC.
- Ehud SHAKED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXAMINATION CONTAINER AND ELECTRON MICROSCOPE
- Publication number 20190080881
- Publication date Mar 14, 2019
- Taiwan Electron Microscope Instrument Corporation
- Tsu-Wei Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING SPHERICAL AND CHROMATIC ABERRATIONS IN CATHODE LENS ELECT...
- Publication number 20180337017
- Publication date Nov 22, 2018
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPE SAMPLE PREPARATION DEVICE
- Publication number 20180209880
- Publication date Jul 26, 2018
- Michael G. Roper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYOGENIC SPECIMEN PROCESSING IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20180114671
- Publication date Apr 26, 2018
- FEI Company
- John Mitchels
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PROCESSING OR IMAGING A SAMPLE
- Publication number 20180033586
- Publication date Feb 1, 2018
- MAPPER LITHOGRAPHY IP BV
- Paul IJmert SCHEFFERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CHARACTERIZING TWO DIMENSIONAL NANOMATERIAL
- Publication number 20170358420
- Publication date Dec 14, 2017
- TSINGHUA UNIVERSITY
- PENG LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR CONTROLLING SAME
- Publication number 20170186583
- Publication date Jun 29, 2017
- Hitachi High-Technologies Corporation
- Kaori Shirahata
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPY SPECIMEN AND METHOD OF FABRICATION
- Publication number 20170069457
- Publication date Mar 9, 2017
- The Board of Trustees of the Leland Stanford Junior University
- Timothy Stephen English
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
STRUCTURE ELECTRON BEAM INSPECTION SYSTEM FOR INSPECTING EXTREME UL...
- Publication number 20170053774
- Publication date Feb 23, 2017
- HERMES MICROVISION INC.
- You-Jin WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING AND/OR IMAGI...
- Publication number 20170047192
- Publication date Feb 16, 2017
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Jürgen FROSIEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING PROBE LITHOGRAPHY METHODS
- Publication number 20170047199
- Publication date Feb 16, 2017
- The Trustees of Princeton University, Office of Technology and Trademark Lice...
- Nan Yao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE COLLECTION DEVICE AND SAMPLE COLLECTION DEVICE ARRAY
- Publication number 20160377513
- Publication date Dec 29, 2016
- BIO MATERIALS ANALYSIS TECHNOLOGY INC.
- Pin Chang
- G01 - MEASURING TESTING
Information Patent Application
WORKPIECE TRANSPORT AND POSITIONING APPARATUS
- Publication number 20160372302
- Publication date Dec 22, 2016
- HOWARD HUGHES MEDICAL INSTITUTE
- John H. Price
- H01 - BASIC ELECTRIC ELEMENTS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Observation carrier for microscope

Sample preparation system and method for electron microscope observ...

System comprising a multi-beam particle microscope and method for o...

Automated multi-grid handling apparatus

Navigation for electron microscopy

Method and system for inspecting an EUV mask

Identifying fiducial markers in microscope images

Automated multi-grid handling apparatus

Automated multi-grid handling apparatus

Systems and methods for charged particle beam modulation

Microscope sample preparation device

Method and system for inspecting an EUV mask

Examination container and electron microscope

Method of preparing a sample for microstructure diagnostics, and sa...

Measuring spherical and chromatic aberrations in cathode lens elect...

Method of generating a zoom sequence and microscope system configur...

Systems and methods for charged particle beam modulation

Workpiece transport and positioning apparatus

Holder device for electron microscope

Method for characterizing two dimensional nanomaterial

Measuring spherical and chromatic aberrations in cathode lens elect...

Workpiece holder for workpiece transport apparatus

Cryogenic specimen processing in a charged particle microscope

Method and system for inspecting an EUV mask

Structure electron beam inspection system for inspecting extreme ul...

Scanning electron microscope and method for controlling same

Microscopy support structures

Microscope sample preparation device

Preparation of specimen arrays on an EM grid

Graphene modification

Patents Applicationslast 30 patents

SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...

Automated Multi-Grid Handling Apparatus

SYSTEM COMPRISING A MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR O...

Automated Multi-Grid Handling Apparatus

SAMPLE SUPPORTS AND SAMPLE COOLING SYSTEMS FOR CRYO-ELECTRON MICROS...

OBSERVATION CARRIER FOR MICROSCOPE

SAMPLE PREPARATION SYSTEM AND METHOD FOR ELECTRON MICROSCOPE OBSERV...

SYSTEM COMPRISING A MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR O...

Automated Multi-Grid Handling Apparatus

METHOD AND SYSTEM FOR INSPECTING AN EUV MASK

NAVIGATION FOR ELECTRON MICROSCOPY

AUTOMATED MULTI-GRID HANDLING APPARATUS

IDENTIFYING FIDUCIAL MARKERS IN MICROSCOPE IMAGES

SYSTEMS AND METHODS FOR CHARGED PARTICLE BEAM MODULATION

MEASURING SPHERICAL AND CHROMATIC ABERRATIONS IN CATHODE LENS ELECT...

METHOD AND SYSTEM FOR INSPECTING AN EUV MASK

SYSTEMS AND METHODS FOR CHARGED PARTICLE BEAM MODULATION

EXAMINATION CONTAINER AND ELECTRON MICROSCOPE

MEASURING SPHERICAL AND CHROMATIC ABERRATIONS IN CATHODE LENS ELECT...

MICROSCOPE SAMPLE PREPARATION DEVICE

CRYOGENIC SPECIMEN PROCESSING IN A CHARGED PARTICLE MICROSCOPE

APPARATUS AND METHOD FOR PROCESSING OR IMAGING A SAMPLE

METHOD FOR CHARACTERIZING TWO DIMENSIONAL NANOMATERIAL

SCANNING ELECTRON MICROSCOPE AND METHOD FOR CONTROLLING SAME

ELECTRON MICROSCOPY SPECIMEN AND METHOD OF FABRICATION

STRUCTURE ELECTRON BEAM INSPECTION SYSTEM FOR INSPECTING EXTREME UL...

CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING AND/OR IMAGI...

SCANNING PROBE LITHOGRAPHY METHODS

SAMPLE COLLECTION DEVICE AND SAMPLE COLLECTION DEVICE ARRAY

WORKPIECE TRANSPORT AND POSITIONING APPARATUS