detecting image current induced by the movement of charged particles

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H01J49/027

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/027detecting image current induced by the movement of charged particles

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Patents Grantslast 30 patents

Information Patent Grant
Inception electrostatic linear ion trap
- Patent number 12,057,306
- Issue date Aug 6, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for crosstalk compensation
- Patent number 11,817,301
- Issue date Nov 14, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Kholomeev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic trap mass spectrometer with improved ion injection
- Patent number 11,742,192
- Issue date Aug 29, 2023
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for confirming charged-particle generation in an instrument...
- Patent number 11,640,904
- Issue date May 2, 2023
- bioMeriuex, Inc
- James Arthur VanGordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of evaluating performance of an atmospheric pressure ioniza...
- Patent number 11,610,767
- Issue date Mar 21, 2023
- PharmaCadence Analytical Services, LLC
- Richard C. King
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a parameter to perform a mass analysis of sa...
- Patent number 11,515,139
- Issue date Nov 29, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Oliver Lange
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for performing charge detection mass spectrometry
- Patent number 11,450,520
- Issue date Sep 20, 2022
- Thermo Finnigan LLC.
- Michael W. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-frequency analysis
- Patent number 11,410,842
- Issue date Aug 9, 2022
- Shimadzu Corporation
- Aleksandr Rusinov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for crosstalk compensation
- Patent number 11,361,952
- Issue date Jun 14, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Kholomeev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-dimensional fourier transform mass analysis in an electrostatic...
- Patent number 11,145,503
- Issue date Oct 12, 2021
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electro static linear ion trap mass spectrometer
- Patent number 11,069,516
- Issue date Jul 20, 2021
- DH Technologies Development Pte. Ltd.
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of evaluating performance of an atmospheric pressure ioniza...
- Patent number 11,049,703
- Issue date Jun 29, 2021
- PharmaCadence Analytical Services, LLC
- Richard C. King
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus configured to produce an image charge/current signal
- Patent number 11,011,364
- Issue date May 18, 2021
- Shimadzu Corporation
- Aleksandr Rusinov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for detecting charged particles and an apparatus for mass sp...
- Patent number 10,984,999
- Issue date Apr 20, 2021
- ACROMASS TECHNOLOGIES, INC.
- Hung-Liang Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometry data processing device and imaging mass s...
- Patent number 10,950,423
- Issue date Mar 16, 2021
- Shimadzu Corporation
- Masahiro Ikegami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for crosstalk compensation
- Patent number 10,903,061
- Issue date Jan 26, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Kholomeev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for confirming charged-particle generation in an instrument...
- Patent number 10,903,063
- Issue date Jan 26, 2021
- bioMerieux, Inc.
- James Arthur VanGordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quadrupole ion trap apparatus and quadrupole mass spectrometer
- Patent number 10,685,827
- Issue date Jun 16, 2020
- ACROMASS TECHNOLOGIES, INC.
- Chun-Yen Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for processing mass spectrum
- Patent number 10,629,420
- Issue date Apr 21, 2020
- Jeol Ltd.
- Takaya Satoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time versus intensity distribution analysis using a matrix-assisted...
- Patent number 10,497,553
- Issue date Dec 3, 2019
- Highland Innovations, Inc.
- Eung Joon Jo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic trap mass spectrometer with improved ion injection
- Patent number 10,431,442
- Issue date Oct 1, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing an image charge/current signal
- Patent number 10,381,208
- Issue date Aug 13, 2019
- Shimadzu Corporation
- Sergey Smirnov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for ion cyclotron resonance mass spectrometry
- Patent number 10,297,436
- Issue date May 21, 2019
- Ecole Polytechnique Federale de Lausanne (EPFL)
- Yury Tsybin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for examining a gas by mass spectrometry and mass spectrometer
- Patent number 10,141,174
- Issue date Nov 27, 2018
- Carl Zeiss SMT GmbH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyser and method of mass analysis
- Patent number 9,997,343
- Issue date Jun 12, 2018
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexed electrostatic linear ion trap
- Patent number 9,779,930
- Issue date Oct 3, 2017
- DH Technologies Development Pte. Ltd.
- Mircea Guna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection
- Patent number 9,741,551
- Issue date Aug 22, 2017
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic trap mass spectrometer with improved ion injection
- Patent number 9,728,384
- Issue date Aug 8, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyser and method of mass analysis
- Patent number 9,691,596
- Issue date Jun 27, 2017
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection
- Patent number 9,520,280
- Issue date Dec 13, 2016
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR PERFORMING CHARGE DETECTION MASS SPECTROMETRY WITH TEMP...
- Publication number 20240371621
- Publication date Nov 7, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Dmitry Grinfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVEMENTS IN AND RELATING TO ION ANALYSIS
- Publication number 20240297030
- Publication date Sep 5, 2024
- Shimadzu Corporation
- Sergey SMIRNOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVEMENTS IN AND RELATING TO ION ANALYSIS
- Publication number 20240290597
- Publication date Aug 29, 2024
- Shimadzu Corporation
- Sergey SMIRNOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Injecting Ions into an Electrostatic Linear...
- Publication number 20240274429
- Publication date Aug 15, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas DZIEKONSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240136167
- Publication date Apr 25, 2024
- HGSG LTD
- John Brian HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIMODE ION DETECTOR WITH WIDE DYNAMIC RANGE AND AUTOMATIC MODE S...
- Publication number 20240128070
- Publication date Apr 18, 2024
- Kimia Analytics Inc.
- Sina ALAVI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR FOURIER TRANSFORM ELECTROSTATIC ION TRAP WI...
- Publication number 20230377866
- Publication date Nov 23, 2023
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INDUCTIVE DETECTOR WITH INTEGRATED AMPLIFIER
- Publication number 20230187193
- Publication date Jun 15, 2023
- WATERS TECHNOLOGIES CORPORATION
- Joseph A. Jarrell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Determining a Parameter to Perform a Mass Analysis of Sa...
- Publication number 20230098543
- Publication date Mar 30, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Oliver LANGE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR CROSSTALK COMPENSATION
- Publication number 20220301841
- Publication date Sep 22, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander KHOLOMEEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOVEL METHODS OF EVALUATING PERFORMANCE OF AN ATMOSPHERIC PRESSURE...
- Publication number 20220139688
- Publication date May 5, 2022
- RICHARD C. KING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inception Electrostatic Linear Ion Trap
- Publication number 20220068624
- Publication date Mar 3, 2022
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-FREQUENCY ANALYSIS
- Publication number 20210375607
- Publication date Dec 2, 2021
- Shimadzu Corporation
- Aleksandr RUSINOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Determining a Parameter to Perform a Mass Analysis of Sa...
- Publication number 20210287897
- Publication date Sep 16, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Oliver LANGE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR PERFORMING CHARGE DETECTION MASS SPECTROMETRY
- Publication number 20210210331
- Publication date Jul 8, 2021
- Thermo Finnigan LLC
- Michael W. SENKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Device for Crosstalk Compensation
- Publication number 20210142994
- Publication date May 13, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander KHOLOMEEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR CONFIRMING CHARGED-PARTICLE GENERATION IN AN INSTRUMENT...
- Publication number 20210142998
- Publication date May 13, 2021
- bioMerieux, Inc.
- James Arthur VanGordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two-Dimensional Fourier Transform Mass Analysis in an Electrostatic...
- Publication number 20210074536
- Publication date Mar 11, 2021
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS CONFIGURED TO PRODUCE AN IMAGE CHARGE/CURRENT SIGNAL
- Publication number 20210013024
- Publication date Jan 14, 2021
- Shimadzu Corporation
- Aleksandr RUSINOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOVEL METHODS OF EVALUATING PERFORMANCE OF AN ATMOSPHERIC PRESSURE...
- Publication number 20190237314
- Publication date Aug 1, 2019
- PharmaCadence Analytical Services, LLC
- RICHARD C. KING
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Processing Mass Spectrum
- Publication number 20190228956
- Publication date Jul 25, 2019
- JEOL Ltd.
- Takaya Satoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUADRUPOLE ION TRAP APPARATUS AND QUADRUPOLE MASS SPECTROMETER
- Publication number 20190228960
- Publication date Jul 25, 2019
- ACROMASS TECHNOLOGIES, INC.
- Chun-Yen CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Device for Crosstalk Compensation
- Publication number 20190198303
- Publication date Jun 27, 2019
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander KHOLOMEEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING MASS SPECTROMETRY DATA PROCESSING DEVICE AND IMAGING MASS S...
- Publication number 20190189414
- Publication date Jun 20, 2019
- SHIMADZU CORPORATION
- Masahiro IKEGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PROCESSING AN IMAGE CHARGE/CURRENT SIGNAL
- Publication number 20190035615
- Publication date Jan 31, 2019
- SHIMADZU CORPORATION
- Sergey SMIRNOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME VERSUS INTENSITY DISTRIBUTION ANALYSIS USING A MATRIX-ASSISTED...
- Publication number 20180053645
- Publication date Feb 22, 2018
- Eung Joon Jo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Trap Mass Spectrometer With Improved Ion Injection
- Publication number 20170338088
- Publication date Nov 23, 2017
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSER AND METHOD OF MASS ANALYSIS
- Publication number 20170278689
- Publication date Sep 28, 2017
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTION
- Publication number 20170040152
- Publication date Feb 9, 2017
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiplexed Electrostatic Linear Ion Trap
- Publication number 20160336165
- Publication date Nov 17, 2016
- DH TECHNOLOGIES DEVELOPMENT PTD. LTD.
- Mircea GUNA
- H01 - BASIC ELECTRIC ELEMENTS

detecting image current induced by the movement of charged particles

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inception electrostatic linear ion trap

Method and device for crosstalk compensation

Electrostatic trap mass spectrometer with improved ion injection

Methods for confirming charged-particle generation in an instrument...

Methods of evaluating performance of an atmospheric pressure ioniza...

Method for determining a parameter to perform a mass analysis of sa...

Apparatus and method for performing charge detection mass spectrometry

Time-frequency analysis

Method and device for crosstalk compensation

Two-dimensional fourier transform mass analysis in an electrostatic...

Electro static linear ion trap mass spectrometer

Methods of evaluating performance of an atmospheric pressure ioniza...

Apparatus configured to produce an image charge/current signal

Device for detecting charged particles and an apparatus for mass sp...

Imaging mass spectrometry data processing device and imaging mass s...

Methods for crosstalk compensation

Methods for confirming charged-particle generation in an instrument...

Quadrupole ion trap apparatus and quadrupole mass spectrometer

Apparatus and method for processing mass spectrum

Time versus intensity distribution analysis using a matrix-assisted...

Electrostatic trap mass spectrometer with improved ion injection

Method of processing an image charge/current signal

Device and method for ion cyclotron resonance mass spectrometry

Method for examining a gas by mass spectrometry and mass spectrometer

Mass analyser and method of mass analysis

Multiplexed electrostatic linear ion trap

Ion detection

Electrostatic trap mass spectrometer with improved ion injection

Mass analyser and method of mass analysis

Ion detection

Patents Applicationslast 30 patents

METHODS FOR PERFORMING CHARGE DETECTION MASS SPECTROMETRY WITH TEMP...

IMPROVEMENTS IN AND RELATING TO ION ANALYSIS

IMPROVEMENTS IN AND RELATING TO ION ANALYSIS

Methods and Systems for Injecting Ions into an Electrostatic Linear...

MASS SPECTROMETER AND METHOD

MULTIMODE ION DETECTOR WITH WIDE DYNAMIC RANGE AND AUTOMATIC MODE S...

SYSTEMS AND METHODS FOR FOURIER TRANSFORM ELECTROSTATIC ION TRAP WI...

INDUCTIVE DETECTOR WITH INTEGRATED AMPLIFIER

Method for Determining a Parameter to Perform a Mass Analysis of Sa...

METHOD AND DEVICE FOR CROSSTALK COMPENSATION

NOVEL METHODS OF EVALUATING PERFORMANCE OF AN ATMOSPHERIC PRESSURE...

Inception Electrostatic Linear Ion Trap

TIME-FREQUENCY ANALYSIS

Method for Determining a Parameter to Perform a Mass Analysis of Sa...

APPARATUS AND METHOD FOR PERFORMING CHARGE DETECTION MASS SPECTROMETRY

Method and Device for Crosstalk Compensation

METHODS FOR CONFIRMING CHARGED-PARTICLE GENERATION IN AN INSTRUMENT...

Two-Dimensional Fourier Transform Mass Analysis in an Electrostatic...

APPARATUS CONFIGURED TO PRODUCE AN IMAGE CHARGE/CURRENT SIGNAL

NOVEL METHODS OF EVALUATING PERFORMANCE OF AN ATMOSPHERIC PRESSURE...

Apparatus and Method for Processing Mass Spectrum

QUADRUPOLE ION TRAP APPARATUS AND QUADRUPOLE MASS SPECTROMETER

Method and Device for Crosstalk Compensation

IMAGING MASS SPECTROMETRY DATA PROCESSING DEVICE AND IMAGING MASS S...

METHOD OF PROCESSING AN IMAGE CHARGE/CURRENT SIGNAL

TIME VERSUS INTENSITY DISTRIBUTION ANALYSIS USING A MATRIX-ASSISTED...

Electrostatic Trap Mass Spectrometer With Improved Ion Injection

MASS ANALYSER AND METHOD OF MASS ANALYSIS

ION DETECTION

Multiplexed Electrostatic Linear Ion Trap