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Detection of MR without the use of RF or microwaves
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Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R33/00
Arrangements or instruments for measuring magnetic variables
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G01R33/323
Detection of MR without the use of RF or microwaves
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Patents Grants
last 30 patents
Information
Patent Grant
Nanoscale scanning sensors
Patent number
12,169,209
Issue date
Dec 17, 2024
President and Fellows of Harvard College
Michael S. Grinolds
G01 - MEASURING TESTING
Information
Patent Grant
Magnon excitation and detection systems, apparatus, and methods
Patent number
12,158,511
Issue date
Dec 3, 2024
The United States of America, Represented by the Secretary of the Navy
Chidubem A. Nwokoye
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Portable magnetic resonance imager
Patent number
12,153,106
Issue date
Nov 26, 2024
Microtesla Systems, Inc.
Russell L. Case
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring phase currents of a device under test, in part...
Patent number
12,140,649
Issue date
Nov 12, 2024
Robert Bosch GmbH
Andreas Brenneis
G01 - MEASURING TESTING
Information
Patent Grant
Parallelized magnetic sensing of samples using solidstate spin systems
Patent number
12,130,344
Issue date
Oct 29, 2024
Technische Universitat Munchen
Andreas Deeg
G01 - MEASURING TESTING
Information
Patent Grant
NV center-based microwave-free galvanically isolated magnetometer
Patent number
12,092,709
Issue date
Sep 17, 2024
Elmos Semiconductor SE
Bernd Burchard
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System based on readout of microwave resonant circuit
Patent number
12,078,693
Issue date
Sep 3, 2024
PURPLE MOUNTAIN OBSERVATORY, CHINESE ACADEMY OF SCIENCES
Wei Miao
G01 - MEASURING TESTING
Information
Patent Grant
Sample holder for measurements of optically detected magnetic reson...
Patent number
12,044,758
Issue date
Jul 23, 2024
Uniwersytet Warszawski
Mateusz Goryca
G01 - MEASURING TESTING
Information
Patent Grant
Sensor for measuring magnetic field by utilizing principle of optic...
Patent number
12,032,046
Issue date
Jul 9, 2024
Tokyo Institute of Technology
Yuji Hatano
G01 - MEASURING TESTING
Information
Patent Grant
Cryogenic integrated circuits architecture for multiplexed chemical...
Patent number
12,019,130
Issue date
Jun 25, 2024
Massachusetts Institute of Technology
Dirk Robert Englund
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device and measuring method
Patent number
11,988,729
Issue date
May 21, 2024
Kyoto University
Norikazu Mizuochi
G01 - MEASURING TESTING
Information
Patent Grant
Magnon excitation and detection systems, apparatus, and methods
Patent number
11,971,464
Issue date
Apr 30, 2024
The United States of America, Represented by the Secretary of the Navy
Chidubem A. Nwokoye
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Process for determining the type of a diamond
Patent number
11,879,859
Issue date
Jan 23, 2024
GOLDWAY TECHNOLOGY LIMITED
Ka Wing Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale scanning sensors
Patent number
11,815,528
Issue date
Nov 14, 2023
President and Fellows of Harvard College
Michael S. Grinolds
G01 - MEASURING TESTING
Information
Patent Grant
Magnetometry based on electron spin defects
Patent number
11,774,526
Issue date
Oct 3, 2023
X Development LLC
Stefan Bogdanovic
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring magnetic field strength
Patent number
11,762,046
Issue date
Sep 19, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Baohua Niu
G01 - MEASURING TESTING
Information
Patent Grant
Real-time methods for magnetic resonance spectra acquisition
Patent number
11,707,634
Issue date
Jul 25, 2023
Elegant Mathematics LLC
Olena Ibragimova
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Proteomic assay using quantum sensors
Patent number
11,698,373
Issue date
Jul 11, 2023
Somalogic Operating Co., Inc.
Jason Paul Cleveland
G01 - MEASURING TESTING
Information
Patent Grant
High-frequency magnetic field generating device
Patent number
11,668,778
Issue date
Jun 6, 2023
Sumida Corporation
Yoshiharu Yoshii
G01 - MEASURING TESTING
Information
Patent Grant
Quantum processing apparatus with downsampling analog-to-digital co...
Patent number
11,621,720
Issue date
Apr 4, 2023
International Business Machines Corporation
Peter Mueller
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for magnetic multi-bead assays
Patent number
11,513,115
Issue date
Nov 29, 2022
Quantum Diamond Technologies Inc.
Colin B. Connolly
G01 - MEASURING TESTING
Information
Patent Grant
Spin-based electrometry with solid-state defects
Patent number
11,448,676
Issue date
Sep 20, 2022
Massachusetts Institute of Technology
Danielle Ann Braje
G01 - MEASURING TESTING
Information
Patent Grant
System and method for sensing spin
Patent number
11,402,455
Issue date
Aug 2, 2022
SOCPRA Sciences et Genie S.E.C.
Dany Lachance-Quirion
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for optically detecting magnetic resonance
Patent number
11,346,904
Issue date
May 31, 2022
Massachusetts Institute of Technology
Linh M. Pham
G01 - MEASURING TESTING
Information
Patent Grant
Magnetometer for measuring an unknown external magnetic field
Patent number
11,340,320
Issue date
May 24, 2022
Danmarks Tekniske Universitet
Alexander Huck
G01 - MEASURING TESTING
Information
Patent Grant
Optical nuclear magnetic resonance microscope and measurement methods
Patent number
11,313,817
Issue date
Apr 26, 2022
UNM Rainforest Innovations
Victor Marcel Acosta
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Proteomic assay using quantum sensors
Patent number
11,249,080
Issue date
Feb 15, 2022
SomaLogic, Inc.
Jason Paul Cleveland
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for controlling neural activity in the brain
Patent number
11,234,631
Issue date
Feb 1, 2022
Magstim Group, Incorporated
Don M. Tucker
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and assembly for measuring diffusion in nanoporous media
Patent number
11,119,062
Issue date
Sep 14, 2021
The Board of Regents of the University of Oklahoma
Carl H. Sondergeld
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for the hyperpolarization of a material sample
Patent number
11,119,177
Issue date
Sep 14, 2021
NVision Imaging Technolgies GmbH
Ilai Schwartz
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR A 2D-MATERIAL-BASED QUANTUM SENSOR CHIP WIT...
Publication number
20240402264
Publication date
Dec 5, 2024
Toyota Motor Engineering & Manufacturing North America, Inc.
Biswajit Sahoo
G01 - MEASURING TESTING
Information
Patent Application
NV CENTER BASED MICROWAVE FREE AND GALVANICALLY ISOLATED MAGNETOMETER
Publication number
20240402271
Publication date
Dec 5, 2024
Elmos Semiconductor SE
Bernd Burchard
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PORTABLE MAGNETIC RESONANCE IMAGER
Publication number
20240302461
Publication date
Sep 12, 2024
MicroTesla Systems, Inc.
Russell L. Case
G01 - MEASURING TESTING
Information
Patent Application
QUANTUM MAGNETIC SENSING TECHNOLOGIES, SYSTEMS AND METHODS USING TH...
Publication number
20240288519
Publication date
Aug 29, 2024
Battelle Memorial Institute
Steven M. Risser
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ GRAPHENE JOSEPHSON JUNCTION DETECTION SYSTEM BASED ON REA...
Publication number
20240272246
Publication date
Aug 15, 2024
Purple Mountain Observatory, Chinese Academy of Sciences
Wei MIAO
G01 - MEASURING TESTING
Information
Patent Application
MRI AND MEG DETECTION WITH A SINGLE OPTICALLY PUMPED MAGNETOMETER
Publication number
20240255593
Publication date
Aug 1, 2024
Honeywell International Inc.
Mary Salit
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL LOCK-IN FOR MAGNETIC IMAGING WITH NITROGEN VACANCY CENTERS...
Publication number
20240192294
Publication date
Jun 13, 2024
The MITRE Corporation
Dmitro Jaroslau Martynowych
G01 - MEASURING TESTING
Information
Patent Application
Sensor Device for Magnetic Field Measurement by Means of Optical Ma...
Publication number
20240142396
Publication date
May 2, 2024
ROBERT BOSCH GmbH
Tino Fuchs
G01 - MEASURING TESTING
Information
Patent Application
PROCESS FOR DETERMINING THE TYPE OF A DIAMOND
Publication number
20240102951
Publication date
Mar 28, 2024
GOLDWAY TECHNOLOGY LIMITED
Ka Wing Cheng
G01 - MEASURING TESTING
Information
Patent Application
MAGNETOMETRY BASED ON ELECTRON SPIN DEFECTS
Publication number
20240004002
Publication date
Jan 4, 2024
X Development LLC
Stefan Bogdanovic
G01 - MEASURING TESTING
Information
Patent Application
MAGNETOMETRY BASED ON ELECTRON SPIN DEFECTS
Publication number
20230408607
Publication date
Dec 21, 2023
X Development LLC
Stefan Bogdanovic
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
Publication number
20230358829
Publication date
Nov 9, 2023
Taiwan Semiconductor Manufacturing company Ltd.
Baohua NIU
G01 - MEASURING TESTING
Information
Patent Application
PROTEOMIC ASSAY USING QUANTUM SENSORS
Publication number
20230349896
Publication date
Nov 2, 2023
SomaLogic Operating Co., Inc.
Jason Paul CLEVELAND
G01 - MEASURING TESTING
Information
Patent Application
NV CENTER-BASED MICROWAVE-FREE GALVANICALLY ISOLATED MAGNETOMETER
Publication number
20230349989
Publication date
Nov 2, 2023
Elmos Semiconductor SE
Bernd Burchard
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
VECTORIAL MAGNETOMETER AND ASSOCIATED METHOD FOR DISTINGUISHING SPI...
Publication number
20230314536
Publication date
Oct 5, 2023
SB TECHNOLOGIES INC.
Zackary FLANSBERRY
G01 - MEASURING TESTING
Information
Patent Application
HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE
Publication number
20230258755
Publication date
Aug 17, 2023
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING
Information
Patent Application
Parallelized magnetic sensing of samples using solidstate spin systems
Publication number
20230204695
Publication date
Jun 29, 2023
TECHNISCHE UNIVERSITÄT MÜNCHEN
Andreas DEEG
G01 - MEASURING TESTING
Information
Patent Application
SENSOR
Publication number
20230204696
Publication date
Jun 29, 2023
TOKYO INSTITUTE OF TECHNOLOGY
Yuji HATANO
G01 - MEASURING TESTING
Information
Patent Application
Method for Measuring Phase Currents of a Device Under Test, in Part...
Publication number
20230176154
Publication date
Jun 8, 2023
ROBERT BOSCH GmbH
Andreas Brenneis
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR MAGNETIC MULTI-BEAD ASSAYS
Publication number
20230071162
Publication date
Mar 9, 2023
Quantum Diamond Technologies Inc.
Colin B. Connolly
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE HOLDER FOR MEASUREMENTS OF OPTICALLY DETECTED MAGNETIC RESON...
Publication number
20220404444
Publication date
Dec 22, 2022
UNIWERSYTET WARSZAWSKI
Mateusz GORYCA
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE AND MEASURING METHOD
Publication number
20220349964
Publication date
Nov 3, 2022
KYOTO UNIVERSITY
Norikazu MIZUOCHI
G01 - MEASURING TESTING
Information
Patent Application
DIAMOND AUTHENTICATION PROCESS AND SYSTEM THEREFORE
Publication number
20220268718
Publication date
Aug 25, 2022
GOLDWAY TECHNOLOGY LIMITED
Ka Wing CHENG
G01 - MEASURING TESTING
Information
Patent Application
PROTEOMIC ASSAY USING QUANTUM SENSORS
Publication number
20220170927
Publication date
Jun 2, 2022
SomaLogic, Inc.
Jason Paul CLEVELAND
G01 - MEASURING TESTING
Information
Patent Application
Cryogenic Integrated Circuits Architecture for Multiplexed Chemical...
Publication number
20220137169
Publication date
May 5, 2022
Massachusetts Institute of Technology
Dirk Robert ENGLUND
G01 - MEASURING TESTING
Information
Patent Application
MAGNETOMETRY BASED ON ELECTRON SPIN DEFECTS
Publication number
20220075013
Publication date
Mar 10, 2022
X Development LLC
Stefan Bogdanovic
G01 - MEASURING TESTING
Information
Patent Application
Microwave Resonator Readout of an Ensemble Solid State Spin Sensor
Publication number
20210255258
Publication date
Aug 19, 2021
Massachusetts Institute of Technology
John F. Barry
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL NUCLEAR MAGNETIC RESONANCE MICROSCOPE AND MEASUREMENT METHODS
Publication number
20210255126
Publication date
Aug 19, 2021
Victor Marcel Acosta
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR SENSING SPIN
Publication number
20210208231
Publication date
Jul 8, 2021
Socpra Sciences et Genie s.e.c.
Dany LACHANCE-QUIRION
G01 - MEASURING TESTING
Information
Patent Application
HIGH-FREQUENCY MAGNETIC FIELD GENERATING DEVICE
Publication number
20210199744
Publication date
Jul 1, 2021
Sumida Corporation
Yoshiharu YOSHII
G01 - MEASURING TESTING