Detection or location of defective auxiliary circuits

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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/02Detection or location of defective auxiliary circuits

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Trim setting determination for a memory device
- Patent number 12,367,942
- Issue date Jul 22, 2025
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive internal error scrubbing and error handling
- Patent number 12,360,847
- Issue date Jul 15, 2025
- Intel Corporation
- Kuljit S. Bains
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Impedance adjusting circuit and impedance adjusting method for zero...
- Patent number 12,354,685
- Issue date Jul 8, 2025
- NANYA TECHNOLOGY CORPORATION
- Yu-Wei Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and ZQ calibration method
- Patent number 12,354,703
- Issue date Jul 8, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kai Tian
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for memory chip row hammer threat backpressure...
- Patent number 12,347,507
- Issue date Jul 1, 2025
- Intel Corporation
- Kuljit S. Bains
- G11 - INFORMATION STORAGE
Information Patent Grant
Error detection pin encoding scheme to avoid maximum transitions an...
- Patent number 12,347,508
- Issue date Jul 1, 2025
- NVIDIA Corp.
- Sunil Sudhakaran
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory, control apparatus, clock processing method, and electronic...
- Patent number 12,339,699
- Issue date Jun 24, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jingwei Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data integrity checks based on voltage distribution metrics
- Patent number 12,334,166
- Issue date Jun 17, 2025
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Operating and testing semiconductor devices
- Patent number 12,334,170
- Issue date Jun 17, 2025
- Samsung Electronics Co., Ltd.
- Taewook Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Link evaluation for a memory device
- Patent number 12,334,172
- Issue date Jun 17, 2025
- Micron Technology, Inc.
- Markus Balb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Techniques for testing PLP capacitors
- Patent number 12,332,710
- Issue date Jun 17, 2025
- Kioxia Corporation
- Paul Abrahams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Row access strobe (RAS) clobber and row hammer failure mitigation
- Patent number 12,333,022
- Issue date Jun 17, 2025
- Micron Technology, Inc.
- Yang Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Maximum memory clock estimation procedures
- Patent number 12,334,137
- Issue date Jun 17, 2025
- Micron Technology, Inc.
- Erik V. Pohlmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Aging monitoring circuit of semiconductor memory device
- Patent number 12,334,165
- Issue date Jun 17, 2025
- FIDELIX CO., LTD.
- Jae Jin Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Differential strobe fault indication
- Patent number 12,334,175
- Issue date Jun 17, 2025
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with error checking and correcting unit
- Patent number 12,327,600
- Issue date Jun 10, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Weibing Shang
- G11 - INFORMATION STORAGE
Information Patent Grant
Data storage device for checking a defect of row lines and an opera...
- Patent number 12,322,464
- Issue date Jun 3, 2025
- Samsung Electronics Co., Ltd.
- Kyungduk Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory controller for a memory device
- Patent number 12,321,190
- Issue date Jun 3, 2025
- Samsung Electronics Co., Ltd.
- Choongeui Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle memory system based on 3D memory and method operating thereof
- Patent number 12,322,463
- Issue date Jun 3, 2025
- Hyundai Motor Company
- Hong Yeol Lim
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test circuitry
- Patent number 12,315,580
- Issue date May 27, 2025
- Micron Technology, Inc.
- William Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Techniques for determining an interface connection status
- Patent number 12,308,080
- Issue date May 20, 2025
- Micron Technology, Inc.
- Melissa I. Uribe
- G11 - INFORMATION STORAGE
Information Patent Grant
Media scan in memory systems
- Patent number 12,300,336
- Issue date May 13, 2025
- Yangtze Memory Technologies Co., Ltd.
- Hua Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 12,300,352
- Issue date May 13, 2025
- Samsung Electronics Co., Ltd.
- Jaewoo Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory and operation method of memory
- Patent number 12,288,594
- Issue date Apr 29, 2025
- SK Hynix Inc.
- Jin Ho Jeong
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and method of reading a semiconductor m...
- Patent number 12,288,593
- Issue date Apr 29, 2025
- Windbond Electronics Corp.
- Shinya Fujioka
- G11 - INFORMATION STORAGE
Information Patent Grant
Component die validation built-in self-test (VBIST) engine
- Patent number 12,282,064
- Issue date Apr 22, 2025
- Ampere Computing LLC
- Sandeep Brahmadathan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing method, data processing structure and memory
- Patent number 12,277,988
- Issue date Apr 15, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Runjin Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device and method for operating the same including setting a...
- Patent number 12,277,967
- Issue date Apr 15, 2025
- Micron Technology, Inc.
- Marco Sforzin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory controller performing training to improve communication and...
- Patent number 12,272,425
- Issue date Apr 8, 2025
- SK Hynix Inc.
- Nam Hyeok Jeong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Row access strobe (RAS) clobber and row hammer failures using a det...
- Patent number 12,265,630
- Issue date Apr 1, 2025
- Micron Technology, Inc.
- Yang Lu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE AND METHOD FOR OPERATING THE SAME INCLUDING SETTING A...
- Publication number 20250239301
- Publication date Jul 24, 2025
- Micron Technology, Inc.
- Marco Sforzin
- G11 - INFORMATION STORAGE
Information Patent Application
COMPONENT DIE VALIDATION BUILT-IN SELF-TEST (VBIST) ENGINE
- Publication number 20250231236
- Publication date Jul 17, 2025
- Ampere Computing LLC
- Sandeep BRAHMADATHAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY COMPONENT HAVING INTERNAL READ-MODIFY-WRITE OPERATION
- Publication number 20250231714
- Publication date Jul 17, 2025
- Rambus Inc.
- Frederick A. Ware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data Storage Device and Method for Read Disturb Mitigation During L...
- Publication number 20250232829
- Publication date Jul 17, 2025
- Western Digital Technologies, Inc.
- Pawan Kumar Negi
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD, DEVICE, AND APPARATUS WITH MEMORY REPAIR BASED ON EXCLUSIVE-OR
- Publication number 20250226050
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Jaehyuk LEE
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20250226051
- Publication date Jul 10, 2025
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
On-Die Termination of Address and Command Signals
- Publication number 20250226015
- Publication date Jul 10, 2025
- Rambus Inc.
- Ian Shaeffer
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH ENHANCED EARLY PROGRAM TERMINATION MODE FO...
- Publication number 20250226044
- Publication date Jul 10, 2025
- Western Digital Technologies, Inc.
- Xuan Tian
- G11 - INFORMATION STORAGE
Information Patent Application
DEVICE, METHOD AND SYSTEM TO THROTTLE CIRCUIT OPERATIONS BASED ON A...
- Publication number 20250218485
- Publication date Jul 3, 2025
- Intel Corporation
- Yevgeni Sabin
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE THAT DETECTS CONNECTION DEFECTS BETWEEN WORD L...
- Publication number 20250218522
- Publication date Jul 3, 2025
- SK HYNIX INC.
- Tae Sik Yun
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CONTROLLER PERFORMING TRAINING TO IMPROVE COMMUNICATION AND...
- Publication number 20250210079
- Publication date Jun 26, 2025
- SK HYNIX INC.
- Nam Hyeok JEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED ERROR CORRECTION CODE FOR ERROR DETECTION AND CORRECTION I...
- Publication number 20250210126
- Publication date Jun 26, 2025
- TetraMem Inc.
- Lei Liu
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH IMPROVED SENSING STRUCTURE
- Publication number 20250210123
- Publication date Jun 26, 2025
- Lodestar Licensing Group LLC
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Application
FLASH MEMORY AND TESTING METHOD THEREOF
- Publication number 20250191672
- Publication date Jun 12, 2025
- WINBOND ELECTRONICS CORP.
- I-Hsien Tseng
- G11 - INFORMATION STORAGE
Information Patent Application
IMPEDANCE CALIBRATION CIRCUIT, SEMICONDUCTOR MEMORY APPARATUS AND M...
- Publication number 20250191623
- Publication date Jun 12, 2025
- SK HYNIX INC.
- Jae Hyeong HONG
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNOLOGIES FOR DYNAMIC ACCELERATOR SELECTION
- Publication number 20250193295
- Publication date Jun 12, 2025
- Intel Corporation
- Francesc Guim Bernat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY MODULE WITH LOCAL SYNCHRONIZATION
- Publication number 20250181504
- Publication date Jun 5, 2025
- Netlist, Inc.
- Hyun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE THRESHOLD ADJUSTMENT OF STORAGE DEVICES BY AN EXTERNAL CONT...
- Publication number 20250173079
- Publication date May 29, 2025
- PURE STORAGE, INC.
- NENAD MILADINOVIC
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE PERFORMING DATA READ OPERATION AND CONTROLLER...
- Publication number 20250174290
- Publication date May 29, 2025
- SK HYNIX INC.
- Hyung Jin CHOI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING EXTRINSIC BITLINE DEFECTS
- Publication number 20250166718
- Publication date May 22, 2025
- Micron Technology, Inc.
- Tingjun Hu
- G11 - INFORMATION STORAGE
Information Patent Application
TRIM SETTING DETERMINATION FOR A MEMORY DEVICE
- Publication number 20250166719
- Publication date May 22, 2025
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE, MEMORY SYSTEM, AND OPERATION METHOD OF MEMORY DEVICE
- Publication number 20250157504
- Publication date May 15, 2025
- Samsung Electronics Co., Ltd.
- DONGHUN LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SYSTEM AND METHOD
- Publication number 20250157564
- Publication date May 15, 2025
- KIOXIA Corporation
- Motoki SHIMIZU
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE FOR SUPPORTING COMMAND BUS TRAINING MODE AND METHOD O...
- Publication number 20250149076
- Publication date May 8, 2025
- Samsung Electronics Co., Ltd.
- Young-hun Kim
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE REGULATION FOR MEMORY ARRAY TEST PROCEDURES
- Publication number 20250149101
- Publication date May 8, 2025
- Micron Technology, Inc.
- Anjana Karthik Gudipati
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR IDENTIFYING MEMORY DEVICES OF A SEMICON...
- Publication number 20250150081
- Publication date May 8, 2025
- Lodestar Licensing Group LLC
- Dean Gans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE, MEMORY SYSTEM, AND READ OPERATION METHOD THEREOF
- Publication number 20250140329
- Publication date May 1, 2025
- Yangtze Memory Technologies Co., Ltd.
- Hongtao Liu
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR CALIBRATING ADJUSTABLE IMPEDANCES OF A...
- Publication number 20250141432
- Publication date May 1, 2025
- Lodestar Licensing Group LLC
- Dean Gans
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS AND METHOD FOR CHANGING A READ VOLTAGE APPLIED FOR READIN...
- Publication number 20250131969
- Publication date Apr 24, 2025
- SK HYNIX INC.
- Jae Yong SON
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE FOR SUPPORTING COMMAND BUS TRAINING MODE AND METHOD O...
- Publication number 20250124959
- Publication date Apr 17, 2025
- Samsung Electronics Co., Ltd.
- Young-hun Kim
- G11 - INFORMATION STORAGE

Detection or location of defective auxiliary circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Trim setting determination for a memory device

Adaptive internal error scrubbing and error handling

Impedance adjusting circuit and impedance adjusting method for zero...

Memory device and ZQ calibration method

Method and apparatus for memory chip row hammer threat backpressure...

Error detection pin encoding scheme to avoid maximum transitions an...

Memory, control apparatus, clock processing method, and electronic...

Data integrity checks based on voltage distribution metrics

Operating and testing semiconductor devices

Link evaluation for a memory device

Techniques for testing PLP capacitors

Row access strobe (RAS) clobber and row hammer failure mitigation

Maximum memory clock estimation procedures

Aging monitoring circuit of semiconductor memory device

Differential strobe fault indication

Memory with error checking and correcting unit

Data storage device for checking a defect of row lines and an opera...

Memory controller for a memory device

Vehicle memory system based on 3D memory and method operating thereof

Built-in self-test circuitry

Techniques for determining an interface connection status

Media scan in memory systems

Semiconductor device

Memory and operation method of memory

Semiconductor memory device and method of reading a semiconductor m...

Component die validation built-in self-test (VBIST) engine

Data processing method, data processing structure and memory

Memory device and method for operating the same including setting a...

Memory controller performing training to improve communication and...

Row access strobe (RAS) clobber and row hammer failures using a det...

Patents Applicationslast 30 patents

MEMORY DEVICE AND METHOD FOR OPERATING THE SAME INCLUDING SETTING A...

COMPONENT DIE VALIDATION BUILT-IN SELF-TEST (VBIST) ENGINE

MEMORY COMPONENT HAVING INTERNAL READ-MODIFY-WRITE OPERATION

Data Storage Device and Method for Read Disturb Mitigation During L...

METHOD, DEVICE, AND APPARATUS WITH MEMORY REPAIR BASED ON EXCLUSIVE-OR

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

On-Die Termination of Address and Command Signals

NON-VOLATILE MEMORY WITH ENHANCED EARLY PROGRAM TERMINATION MODE FO...

DEVICE, METHOD AND SYSTEM TO THROTTLE CIRCUIT OPERATIONS BASED ON A...

SEMICONDUCTOR DEVICE THAT DETECTS CONNECTION DEFECTS BETWEEN WORD L...

MEMORY CONTROLLER PERFORMING TRAINING TO IMPROVE COMMUNICATION AND...

ENHANCED ERROR CORRECTION CODE FOR ERROR DETECTION AND CORRECTION I...

MEMORY DEVICE WITH IMPROVED SENSING STRUCTURE

FLASH MEMORY AND TESTING METHOD THEREOF

IMPEDANCE CALIBRATION CIRCUIT, SEMICONDUCTOR MEMORY APPARATUS AND M...

TECHNOLOGIES FOR DYNAMIC ACCELERATOR SELECTION

MEMORY MODULE WITH LOCAL SYNCHRONIZATION

VOLTAGE THRESHOLD ADJUSTMENT OF STORAGE DEVICES BY AN EXTERNAL CONT...

SEMICONDUCTOR DEVICE PERFORMING DATA READ OPERATION AND CONTROLLER...

DETECTING EXTRINSIC BITLINE DEFECTS

TRIM SETTING DETERMINATION FOR A MEMORY DEVICE

MEMORY DEVICE, MEMORY SYSTEM, AND OPERATION METHOD OF MEMORY DEVICE

MEMORY SYSTEM AND METHOD

MEMORY DEVICE FOR SUPPORTING COMMAND BUS TRAINING MODE AND METHOD O...

VOLTAGE REGULATION FOR MEMORY ARRAY TEST PROCEDURES

APPARATUSES AND METHODS FOR IDENTIFYING MEMORY DEVICES OF A SEMICON...

MEMORY DEVICE, MEMORY SYSTEM, AND READ OPERATION METHOD THEREOF

APPARATUSES AND METHODS FOR CALIBRATING ADJUSTABLE IMPEDANCES OF A...

APPARATUS AND METHOD FOR CHANGING A READ VOLTAGE APPLIED FOR READIN...

MEMORY DEVICE FOR SUPPORTING COMMAND BUS TRAINING MODE AND METHOD O...