Detection or location of defective memory elements

Industry

CPC
G11C29/04

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/04Detection or location of defective memory elements

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for defect-tolerant memory-based artificial ne...
- Patent number 12,205,017
- Issue date Jan 21, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Win-San Khwa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Managing memory leakages of a system for evaluating manufactured items
- Patent number 12,190,971
- Issue date Jan 7, 2025
- Applied Materials Israel Ltd.
- Elad Levi
- G11 - INFORMATION STORAGE
Information Patent Grant
Block family error avoidance bin scans after memory device power-on
- Patent number 12,183,413
- Issue date Dec 31, 2024
- Micron Technology, Inc.
- Guang Hu
- G11 - INFORMATION STORAGE
Information Patent Grant
Read calibration by sector of memory
- Patent number 12,153,490
- Issue date Nov 26, 2024
- Micron Technology, Inc.
- Priya Venkataraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory fault notification
- Patent number 12,154,639
- Issue date Nov 26, 2024
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional semiconductor memory device and method of detecti...
- Patent number 12,144,178
- Issue date Nov 12, 2024
- Samsung Electronics Co., Ltd.
- Taeyoung Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic mirrored ROM
- Patent number 11,984,175
- Issue date May 14, 2024
- Advanced Micro Devices, Inc.
- Cai YongFeng
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for repairing defective memory cells based...
- Patent number 11,984,186
- Issue date May 14, 2024
- Micron Technology, Inc.
- David Hulton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for activity-based memory maintenance operations and memory...
- Patent number 11,947,412
- Issue date Apr 2, 2024
- Dean D. Gans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory using dual sense amplifiers for error detection and correction
- Patent number 11,935,612
- Issue date Mar 19, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jia Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Fast and efficient system and method for detecting and predicting r...
- Patent number 11,887,686
- Issue date Jan 30, 2024
- University of Florida Research Foundation, Incorporated
- Yier Jin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with post-packaging master die selection
- Patent number 11,868,252
- Issue date Jan 9, 2024
- Micron Technology, Inc.
- Evan C. Pearson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data sampling circuit and semiconductor memory
- Patent number 11,854,636
- Issue date Dec 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Zhiqiang Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Reclaimable semiconductor device package and associated systems and...
- Patent number 11,854,635
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Yueping Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory devices with ECC engine defect determination b...
- Patent number 11,841,763
- Issue date Dec 12, 2023
- Samsung Electronics Co., Ltd.
- Yeonggeol Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Redundancy schemes for repairing column defects
- Patent number 11,815,995
- Issue date Nov 14, 2023
- Macronix International Co., Ltd.
- Che-Wei Liang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining sense boundary of sense amplif...
- Patent number 11,798,617
- Issue date Oct 24, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xikun Chu
- G11 - INFORMATION STORAGE
Information Patent Grant
Hierarchical ROM encoder system for performing address fault detect...
- Patent number 11,798,644
- Issue date Oct 24, 2023
- Silicon Storage Technology, Inc.
- Xiaozhou Qian
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for defect-tolerant memory based artificial ne...
- Patent number 11,797,831
- Issue date Oct 24, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Win-San Khwa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 11,783,910
- Issue date Oct 10, 2023
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Behavior-driven die management on solid-state drives
- Patent number 11,734,103
- Issue date Aug 22, 2023
- Microsoft Technology Licensing, LLC
- Jelena Ilic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storage circuit provided with variable resistance type elements, an...
- Patent number 11,705,176
- Issue date Jul 18, 2023
- Tohoku University
- Tetsuo Endoh
- G11 - INFORMATION STORAGE
Information Patent Grant
Metal isolation testing in the context of memory cells
- Patent number 11,631,682
- Issue date Apr 18, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Te-Hsin Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus performing repair operation
- Patent number 11,626,186
- Issue date Apr 11, 2023
- SK hynix Inc.
- Dong Beom Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer-yields and write-QoS in flash-based solid state drives
- Patent number 11,610,641
- Issue date Mar 21, 2023
- SK Hynix Inc.
- Aman Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing through-silicon-vias
- Patent number 11,600,349
- Issue date Mar 7, 2023
- RAMBUS INC.
- Thomas Vogelsang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of operating storage device for improving reliability, stora...
- Patent number 11,593,242
- Issue date Feb 28, 2023
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Embedded memory device and method for embedding memory device in a...
- Patent number 11,562,993
- Issue date Jan 24, 2023
- Intel Corporation
- Andrew Collins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for activity-based memory maintenance operations and memory...
- Patent number 11,550,650
- Issue date Jan 10, 2023
- Micron Technology, Inc.
- Dean D. Gans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performing a decoding operation to simulate switching a bit of an i...
- Patent number 11,551,772
- Issue date Jan 10, 2023
- Micron Technology, Inc.
- Yingquan Wu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE
- Publication number 20250056795
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Changyoung Lee
- G11 - INFORMATION STORAGE
Information Patent Application
TEST SYSTEM AND TEST METHOD FOR DYNAMIC RANDOM ACCESS MEMORY MODULE...
- Publication number 20240386986
- Publication date Nov 21, 2024
- SQ TECHNOLOGY (SHANGHAI) CORPORATION
- WEI-GUO ZHAO
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING MEMORY LEAKAGES OF A SYSTEM FOR EVALUATING MANUFACTURED ITEMS
- Publication number 20240233848
- Publication date Jul 11, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Elad Levi
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS FOR ACTIVITY-BASED MEMORY MAINTENANCE OPERATIONS AND MEMORY...
- Publication number 20240202056
- Publication date Jun 20, 2024
- Lodestar Licensing Group LLC
- Dean D. Gans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE
- Publication number 20240170081
- Publication date May 23, 2024
- Rohm Co., Ltd.
- Yuichi Kokusho
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH POST-PACKAGING MASTER DIE SELECTION
- Publication number 20240126692
- Publication date Apr 18, 2024
- Micron Technology, Inc.
- Evan C. Pearson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BLOCK FAMILY ERROR AVOIDANCE BIN SCANS AFTER MEMORY DEVICE POWER-ON
- Publication number 20240071554
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Guang Hu
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20240071559
- Publication date Feb 29, 2024
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY FAULT NOTIFICATION
- Publication number 20230420065
- Publication date Dec 28, 2023
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR DEFECT-TOLERANT MEMORY-BASED ARTIFICIAL NE...
- Publication number 20230385623
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Win-San KHWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC MIRRORED ROM
- Publication number 20230386593
- Publication date Nov 30, 2023
- ADVANCED MICRO DEVICES, INC.
- Cai YongFeng
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING REPAIR STORAGE
- Publication number 20230307076
- Publication date Sep 28, 2023
- Samsung Electronics Co., Ltd.
- YOSEOP LIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METAL ISOLATION TESTING IN THE CONTEXT OF MEMORY CELLS
- Publication number 20230255012
- Publication date Aug 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Te-Hsin Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Hierarchical ROM Encoder System For Performing Address Fault Detect...
- Publication number 20230170035
- Publication date Jun 1, 2023
- Silicon Storage Technology, Inc.
- Xiaozhou Qian
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS FOR ACTIVITY-BASED MEMORY MAINTENANCE OPERATIONS AND MEMORY...
- Publication number 20230144541
- Publication date May 11, 2023
- Micron Technology, Inc.
- Dean D. Gans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA SAMPLING CIRCUIT AND SEMICONDUCTOR MEMORY
- Publication number 20230101821
- Publication date Mar 30, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Zhiqiang ZHANG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICES
- Publication number 20220405165
- Publication date Dec 22, 2022
- Samsung Electronics Co., Ltd.
- Yeonggeol Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DEFECT-TOLERANT MEMORY BASED ARTIFICIAL NE...
- Publication number 20220383085
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Co., LTD
- Win-San KHWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BEHAVIOR-DRIVEN DIE MANAGEMENT ON SOLID-STATE DRIVES
- Publication number 20220327018
- Publication date Oct 13, 2022
- Microsoft Technology Licensing, LLC
- Jelena Ilic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20220238177
- Publication date Jul 28, 2022
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE CIRCUIT PROVIDED WITH VARIABLE RESISTANCE TYPE ELEMENTS, AN...
- Publication number 20220172761
- Publication date Jun 2, 2022
- TOHOKU UNIVERSITY
- Tetsuo Endoh
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR REPAIRING DEFECTIVE MEMORY CELLS BASED...
- Publication number 20220068430
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- DAVID HULTON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20210407619
- Publication date Dec 30, 2021
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
PROCESSING-IN-MEMORY (PIM) DEVICES AND METHODS OF TESTING THE PIM D...
- Publication number 20210382692
- Publication date Dec 9, 2021
- SK HYNIX INC.
- Jeong Jun LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND METHOD OF DETECTI...
- Publication number 20210351199
- Publication date Nov 11, 2021
- Samsung Electronics Co., Ltd.
- Taeyoung KIM
- G11 - INFORMATION STORAGE
Information Patent Application
IDENTIFYING HIGH IMPEDANCE FAULTS IN A MEMORY DEVICE
- Publication number 20210335410
- Publication date Oct 28, 2021
- Micron Technology, Inc.
- Daniel S. Miller
- G11 - INFORMATION STORAGE
Information Patent Application
MEDIA ERROR REPORTING IMPROVEMENTS FOR STORAGE DRIVES
- Publication number 20210287756
- Publication date Sep 16, 2021
- Toshiba Memory Corporation
- Neil Buxton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING THROUGH-SILICON-VIAS
- Publication number 20210233599
- Publication date Jul 29, 2021
- Rambus Inc.
- Thomas Vogelsang
- G01 - MEASURING TESTING
Information Patent Application
EMBEDDED MEMORY DEVICE AND METHOD FOR EMBEDDING MEMORY DEVICE IN A...
- Publication number 20210225828
- Publication date Jul 22, 2021
- Intel Corporation
- Andrew Collins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEHAVIOR-DRIVEN DIE MANAGEMENT ON SOLID-STATE DRIVES
- Publication number 20210182188
- Publication date Jun 17, 2021
- Microsoft Technology Licensing, LLC
- Jelena Ilic
- G06 - COMPUTING CALCULATING COUNTING

Detection or location of defective memory elements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for defect-tolerant memory-based artificial ne...

Managing memory leakages of a system for evaluating manufactured items

Block family error avoidance bin scans after memory device power-on

Read calibration by sector of memory

Memory fault notification

Three-dimensional semiconductor memory device and method of detecti...

Automatic mirrored ROM

Apparatuses and methods for repairing defective memory cells based...

Methods for activity-based memory maintenance operations and memory...

Memory using dual sense amplifiers for error detection and correction

Fast and efficient system and method for detecting and predicting r...

Memory with post-packaging master die selection

Data sampling circuit and semiconductor memory

Reclaimable semiconductor device package and associated systems and...

Semiconductor memory devices with ECC engine defect determination b...

Redundancy schemes for repairing column defects

Method and apparatus for determining sense boundary of sense amplif...

Hierarchical ROM encoder system for performing address fault detect...

Method and apparatus for defect-tolerant memory based artificial ne...

Controller to detect malfunctioning address of memory device

Behavior-driven die management on solid-state drives

Storage circuit provided with variable resistance type elements, an...

Metal isolation testing in the context of memory cells

Apparatus performing repair operation

Wafer-yields and write-QoS in flash-based solid state drives

Testing through-silicon-vias

Method of operating storage device for improving reliability, stora...

Embedded memory device and method for embedding memory device in a...

Methods for activity-based memory maintenance operations and memory...

Performing a decoding operation to simulate switching a bit of an i...

Patents Applicationslast 30 patents

MEMORY DEVICE

TEST SYSTEM AND TEST METHOD FOR DYNAMIC RANDOM ACCESS MEMORY MODULE...

MANAGING MEMORY LEAKAGES OF A SYSTEM FOR EVALUATING MANUFACTURED ITEMS

METHODS FOR ACTIVITY-BASED MEMORY MAINTENANCE OPERATIONS AND MEMORY...

MEMORY DEVICE

MEMORY WITH POST-PACKAGING MASTER DIE SELECTION

BLOCK FAMILY ERROR AVOIDANCE BIN SCANS AFTER MEMORY DEVICE POWER-ON

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

MEMORY FAULT NOTIFICATION

METHOD AND APPARATUS FOR DEFECT-TOLERANT MEMORY-BASED ARTIFICIAL NE...

AUTOMATIC MIRRORED ROM

SEMICONDUCTOR DEVICE INCLUDING REPAIR STORAGE

METAL ISOLATION TESTING IN THE CONTEXT OF MEMORY CELLS

Hierarchical ROM Encoder System For Performing Address Fault Detect...

METHODS FOR ACTIVITY-BASED MEMORY MAINTENANCE OPERATIONS AND MEMORY...

DATA SAMPLING CIRCUIT AND SEMICONDUCTOR MEMORY

SEMICONDUCTOR MEMORY DEVICES

METHOD AND APPARATUS FOR DEFECT-TOLERANT MEMORY BASED ARTIFICIAL NE...

BEHAVIOR-DRIVEN DIE MANAGEMENT ON SOLID-STATE DRIVES

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

STORAGE CIRCUIT PROVIDED WITH VARIABLE RESISTANCE TYPE ELEMENTS, AN...

APPARATUSES AND METHODS FOR REPAIRING DEFECTIVE MEMORY CELLS BASED...

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

PROCESSING-IN-MEMORY (PIM) DEVICES AND METHODS OF TESTING THE PIM D...

THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND METHOD OF DETECTI...

IDENTIFYING HIGH IMPEDANCE FAULTS IN A MEMORY DEVICE

MEDIA ERROR REPORTING IMPROVEMENTS FOR STORAGE DRIVES

TESTING THROUGH-SILICON-VIAS

EMBEDDED MEMORY DEVICE AND METHOD FOR EMBEDDING MEMORY DEVICE IN A...

BEHAVIOR-DRIVEN DIE MANAGEMENT ON SOLID-STATE DRIVES