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Detection standards Calibrating baseline adjustment, drift correction
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G01N21/93
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/00
Investigating or analysing materials by the use of optical means
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G01N21/93
Detection standards Calibrating baseline adjustment, drift correction
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last 30 patents
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Patent Grant
Inspection method and apparatus for inspecting containers to determ...
Patent number
12,130,240
Issue date
Oct 29, 2024
Krones Aktiengesellschaft
Christof Will
G01 - MEASURING TESTING
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Patent Grant
Method and system for providing optical distortion information of a...
Patent number
12,117,405
Issue date
Oct 15, 2024
ACR II GLASS AMERICA INC.
Michael Bard
B60 - VEHICLES IN GENERAL
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Patent Grant
Modular optical inspection station
Patent number
11,989,872
Issue date
May 21, 2024
Instrumental, Inc.
Samuel Bruce Weiss
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Optical test platform
Patent number
11,938,483
Issue date
Mar 26, 2024
bioMerieux, Inc.
Jack R. Hoffmann
G01 - MEASURING TESTING
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Patent Grant
Optical device
Patent number
11,921,038
Issue date
Mar 5, 2024
Asahi Kasei Microdevices Corporation
Kengo Sasayama
G01 - MEASURING TESTING
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Patent Grant
Nucleic acid amplification and detection devices, systems and methods
Patent number
11,911,769
Issue date
Feb 27, 2024
Abbott Laboratories
Sonal Sadaria Nana
G01 - MEASURING TESTING
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Patent Grant
Method for quality assessment of a sealing section of a package, an...
Patent number
11,866,213
Issue date
Jan 9, 2024
Tetra Laval Holdings & Finance S.A.
Hans Hallstadius
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Wafer inspection method and apparatus thereof
Patent number
11,852,465
Issue date
Dec 26, 2023
GlobalWafers Co., Ltd.
Shang-Chi Wang
G01 - MEASURING TESTING
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Patent Grant
System and method for material characterization
Patent number
11,796,479
Issue date
Oct 24, 2023
Southern Innovation International Pty Ltd
Paul Scoullar
E21 - EARTH DRILLING MINING
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Patent Grant
Method of automatically setting optical parameters and automated op...
Patent number
11,788,972
Issue date
Oct 17, 2023
Industrial Technology Research Institute
Chi-Chun Hsia
G01 - MEASURING TESTING
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Patent Grant
Apparatus for inspecting printed images and method for validating i...
Patent number
11,787,169
Issue date
Oct 17, 2023
ELEXIS AG
Stephan Krebs
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Calibration device for an optical detector and setting device for s...
Patent number
11,785,683
Issue date
Oct 10, 2023
Merck Patent GmbH
Fabrice Comini
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Grant
Optical density instrument and systems and methods using the same
Patent number
11,779,931
Issue date
Oct 10, 2023
bioMerieux Inc.
Perry D. Stamm
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
Multiparameter standard solution for water-quality analysis
Patent number
11,768,160
Issue date
Sep 26, 2023
U.S. Geological Survey
Brian Anthony Pellerin
G01 - MEASURING TESTING
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Measurement deviation correction method and system for spark discha...
Patent number
11,754,503
Issue date
Sep 12, 2023
NCS TESTING TECHNOLOGY CO., LTD
Yunhai Jia
G01 - MEASURING TESTING
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Patent Grant
Test bottle protocol method
Patent number
11,747,285
Issue date
Sep 5, 2023
Heuft Systemtechnik GmbH
Bernhard Heuft
G01 - MEASURING TESTING
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Patent Grant
EUV in-situ linearity calibration for TDI image sensors using test...
Patent number
11,733,605
Issue date
Aug 22, 2023
KLA Corporation
Haifeng Huang
G01 - MEASURING TESTING
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Patent Grant
Method and devices to construct artificial inline defects to calibr...
Patent number
11,685,129
Issue date
Jun 27, 2023
United States of America as Represented by the Adminstrator of NASA
Peter D. Juarez
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Method, apparatus, and computer program product for controlling com...
Patent number
11,673,141
Issue date
Jun 13, 2023
bioMerieux, Inc.
Joel Patrick Harrison
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
Methods and systems for generating calibration data for wafer analysis
Patent number
11,644,426
Issue date
May 9, 2023
Applied Materials Israel Ltd.
Yariv Simovitch
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Methods and systems for adaptive accuracy control of ultrasonic non...
Patent number
11,573,209
Issue date
Feb 7, 2023
Baker Hughes Oilfield Operations LLC
Andreas Franzen
G01 - MEASURING TESTING
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Method of fabricating particle size standards on substrates
Patent number
11,385,187
Issue date
Jul 12, 2022
KLA Corporation
Farhat Quli
G01 - MEASURING TESTING
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Patent Grant
Methods and systems for adaptive accuracy control of ultrasonic non...
Patent number
11,320,406
Issue date
May 3, 2022
Baker Hughes Oilfield Operations LLC
Andreas Franzen
G01 - MEASURING TESTING
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Patent Grant
Modular optical inspection station
Patent number
11,321,824
Issue date
May 3, 2022
Instrumental, Inc.
Samuel Bruce Weiss
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Systems and methods for inspection and defect detection
Patent number
11,307,149
Issue date
Apr 19, 2022
CAASTLE, INC.
Alyssa Packard
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Dry slide assay using reduced reading window
Patent number
11,293,879
Issue date
Apr 5, 2022
Ortho-Clinical Diagnostics, Inc.
Zhong Ding
G01 - MEASURING TESTING
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Patent Grant
Tip resistant optical testing instrument
Patent number
11,285,487
Issue date
Mar 29, 2022
bioMerieux, Inc.
Jack R. Hoffmann
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
System and method for material characterization
Patent number
11,243,327
Issue date
Feb 8, 2022
Southern Innovation International Pty Ltd
Paul Scoullar
G01 - MEASURING TESTING
Information
Patent Grant
Determining metrology-like information for a specimen using an insp...
Patent number
11,221,300
Issue date
Jan 11, 2022
KLA Corp.
Shifang Li
G01 - MEASURING TESTING
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Patent Grant
Optical detecting device and calibrating method
Patent number
11,209,371
Issue date
Dec 28, 2021
CHROMA ATE INC.
Yu-Hsin Liu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
CARTRIDGES AND USES THEREOF
Publication number
20240377337
Publication date
Nov 14, 2024
INSTRUMENTATION LABORATORY COMPANY
Hansong Zeng
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
ELECTRODE PLATE INSPECTION METHOD, METHOD FOR FABRICATING POWER STO...
Publication number
20240302275
Publication date
Sep 12, 2024
Prime Planet Energy & Solutions, Inc.
Tomomichi YAMAZAKI
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
HYPERSPECTRAL IMAGING AND ARTIFICIAL INTELLIGENCE DETECTION METHODS...
Publication number
20240264088
Publication date
Aug 8, 2024
SHWETA GUPTA
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
MODULAR OPTICAL INSPECTION STATION
Publication number
20240265518
Publication date
Aug 8, 2024
Instrumental, Inc.
Samuel Bruce Weiss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
Publication number
20240230551
Publication date
Jul 11, 2024
HITACHI HIGH-TECH CORPORATION
Yuta URANO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR ELECTROMAGNETIC MONITORING OF ACTIVE CRACKS I...
Publication number
20240219311
Publication date
Jul 4, 2024
TSINGHUA UNIVERSITY
Songling Huang
G01 - MEASURING TESTING
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Patent Application
METHOD AND APPARATUS FOR INSPECTING LACQUERED SURFACES WITH EFFECT...
Publication number
20240183788
Publication date
Jun 6, 2024
BYK-Gardner GmbH
Uwe Sperling
G01 - MEASURING TESTING
Information
Patent Application
SPARK SPECTROMETRY FOR INCLUSIONS CONTENT DISTRIBUTION ON THE SURFA...
Publication number
20240159680
Publication date
May 16, 2024
NCS Testing Technology CO.,LTD
Yunhai Jia
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE
Publication number
20240159662
Publication date
May 16, 2024
ASAHI KASEI MICRODEVICES CORPORATION
Kengo SASAYAMA
G02 - OPTICS
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Patent Application
OPTICAL APPARATUS AND EXAMINATION APPARATUS
Publication number
20240159684
Publication date
May 16, 2024
Lasertec Corporation
Ko GONDAIRA
G01 - MEASURING TESTING
Information
Patent Application
Compact-Cross Direction C-Frame Scanner
Publication number
20240159685
Publication date
May 16, 2024
Honeywell International Inc.
Michael Hughes
G01 - MEASURING TESTING
Information
Patent Application
DETECTION AND REMOVAL ASSESSMENT (DARA) SYSTEM OF STANDARDS FOR SOR...
Publication number
20240151652
Publication date
May 9, 2024
PARACLETE SOLUTIONS
Mark ALPETER
G01 - MEASURING TESTING
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Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
Publication number
20240133824
Publication date
Apr 25, 2024
HITACHI HIGH-TECH CORPORATION
Yuta URANO
G01 - MEASURING TESTING
Information
Patent Application
Defect Inspection Device
Publication number
20240027361
Publication date
Jan 25, 2024
Hitachi High-Tech Corporation
Kazuhide SATO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR REDUCING SAMPLE NOISE USING SELECTIVE MARKERS
Publication number
20230408422
Publication date
Dec 21, 2023
KLA Corporation
Grace Hsiu-Ling Chen
G01 - MEASURING TESTING
Information
Patent Application
EUV In-Situ Linearity Calibration for TDI Image Sensors Using Test...
Publication number
20230341760
Publication date
Oct 26, 2023
KLA Corporation
Haifeng Huang
G01 - MEASURING TESTING
Information
Patent Application
NOISE REDUCTION FOR SENSOR APPARATUS
Publication number
20230314340
Publication date
Oct 5, 2023
Medtronic, Inc.
Luling Wang
G01 - MEASURING TESTING
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Patent Application
OPTICAL SENSING DEVICE AND OPTICAL SENSING METHOD THEREOF
Publication number
20230236130
Publication date
Jul 27, 2023
EMINENT ELECTRONIC TECHNOLOGY CORP. LTD.
Zhong-Hao DENG
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION TIP FOR IMAGING DEVICES
Publication number
20230133106
Publication date
May 4, 2023
Lumicell, Inc.
Michael Bush
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD FOR DISPLAY DEVICE
Publication number
20230123595
Publication date
Apr 20, 2023
SAMSUNG DISPLAY CO., LTD.
Sangjun SEOK
G01 - MEASURING TESTING
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Patent Application
INSPECTION METHOD FOR INSPECTING CONTAINERS
Publication number
20230003665
Publication date
Jan 5, 2023
Krones Aktiengesellschaft
Christof WILL
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF AUTOMATICALLY SETTING OPTICAL PARAMETERS AND AUTOMATED OP...
Publication number
20220373468
Publication date
Nov 24, 2022
Industrial Technology Research Institute
Chi-Chun HSIA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR PROVIDING OPTICAL DISTORTION INFORMATION OF A...
Publication number
20220349837
Publication date
Nov 3, 2022
Central Glass Company, Limited
Michael BARD
B60 - VEHICLES IN GENERAL
Information
Patent Application
Self Calibration Formal Inspection System and Method of using it to...
Publication number
20220349832
Publication date
Nov 3, 2022
Tyco Electronics (Shanghai) Co., Ltd.
Lei (Alex) Zhou
G01 - MEASURING TESTING
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Patent Application
WAFER INSPECTION METHOD AND APPARATUS THEREOF
Publication number
20220316872
Publication date
Oct 6, 2022
GLOBALWAFERS CO., LTD.
Shang-Chi Wang
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION OF SENSORS FOR ROAD SURFACE MONITORING
Publication number
20220299446
Publication date
Sep 22, 2022
RoadCloud Oy
Ari TUONONEN
G08 - SIGNALLING
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Patent Application
SYSTEM AND METHOD OF OBJECT DETECTION USING AI DEEP LEARNING MODELS
Publication number
20220284699
Publication date
Sep 8, 2022
QC HERO, INC.
Michael A. Walt
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Patent Application
MODULAR OPTICAL INSPECTION STATION
Publication number
20220222808
Publication date
Jul 14, 2022
Instrumental, Inc.
Samuel Bruce Weiss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND SYSTEMS FOR ADAPTIVE ACCURACY CONTROL OF ULTRASONIC NON...
Publication number
20220205958
Publication date
Jun 30, 2022
Baker Hughes Oilfield Operations LLC
Andreas Franzen
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR INSPECTION AND DEFECT DETECTION
Publication number
20220196568
Publication date
Jun 23, 2022
CaaStle, Inc.
Alyssa PACKARD
G06 - COMPUTING CALCULATING COUNTING