detector fixed source and body moving

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G01N2223/3305

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/3305detector fixed source and body moving

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Patents Grantslast 30 patents

Information Patent Grant
Inspection device, inspection method, and method for producing obje...
- Patent number 11,639,904
- Issue date May 2, 2023
- Nikon Corporation
- Takeshi Ohbayashi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction apparatus
- Patent number 10,732,134
- Issue date Aug 4, 2020
- Rigaku Corporation
- Takeshi Osakabe
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Selectable ROI and flexible detector for X-ray imaging
- Patent number 10,674,992
- Issue date Jun 9, 2020
- General Electric Company
- Nicholas Konkle
- G01 - MEASURING TESTING
Information Patent Grant
Core sample analysis
- Patent number 10,001,446
- Issue date Jun 19, 2018
- GE Energy Oilfield Technology, Inc.
- Thomas Szudajski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240248048
- Publication date Jul 25, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS
- Publication number 20190293575
- Publication date Sep 26, 2019
- Rigaku Corporation
- TAKESHI OSAKABE
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING