Detectors specially adapted to particle spectrometers

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H01J49/025

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/025Detectors specially adapted to particle spectrometers

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Tissue analysis by mass spectrometry or ion mobility spectrometry
- Patent number 12,315,714
- Issue date May 27, 2025
- Micromass UK Limited
- Steven Derek Pringle
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Mass spectrometer with charge measurement arrangement
- Patent number 12,293,908
- Issue date May 6, 2025
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument, including an electrostatic linear ion trap, for analyzi...
- Patent number 12,283,475
- Issue date Apr 22, 2025
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 12,278,098
- Issue date Apr 15, 2025
- STANDARD BIOTOOLS CANADA INC.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,266,518
- Issue date Apr 1, 2025
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-power mass interrogation system and assay for determining vitam...
- Patent number 12,261,032
- Issue date Mar 25, 2025
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument for separating ions including an electrostatic linear io...
- Patent number 12,255,060
- Issue date Mar 18, 2025
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle mass spectrometry
- Patent number 12,243,736
- Issue date Mar 4, 2025
- SHANGHAI POLARIS BIOLOGY CO., LTD.
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detector having improved performance and service life
- Patent number 12,224,167
- Issue date Feb 11, 2025
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detector
- Patent number 12,224,170
- Issue date Feb 11, 2025
- ADAPTAS SOLUTIONS PTY LTD
- Wayne Sheils
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-domain analysis of signals for charge detection mass spectrometry
- Patent number 12,183,566
- Issue date Dec 31, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for detecting charged particles or light
- Patent number 12,183,837
- Issue date Dec 31, 2024
- Hamamatsu Photonics K.K.
- Sayaka Takatsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization device and mass spectrometer
- Patent number 12,176,199
- Issue date Dec 24, 2024
- LEYBOLD GMBH
- Yessica Brachthaeuser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for two-dimensional mobility based filtering of...
- Patent number 12,163,920
- Issue date Dec 10, 2024
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap array for high throughput charge detection mass spectrometry
- Patent number 12,159,780
- Issue date Dec 3, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for tuning a mass spectrometer
- Patent number 12,148,603
- Issue date Nov 19, 2024
- Thermo Finnigan LLC.
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Virtual slit cycloidal mass spectrometer
- Patent number 12,131,894
- Issue date Oct 29, 2024
- Duke University
- M. Bonner Denton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide
- Patent number 12,112,935
- Issue date Oct 8, 2024
- Micromass UK Limited
- Kevin Giles
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for multi-pass encoded frequency pushing
- Patent number 12,100,584
- Issue date Sep 24, 2024
- Leco Corporation
- Peter Markel Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scintillator, measuring device, mass spectrometer, and electron mic...
- Patent number 12,072,454
- Issue date Aug 27, 2024
- HITACHI HIGH-TECH CORPORATION
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector
- Patent number 12,074,016
- Issue date Aug 27, 2024
- Hamamatsu Photonics K.K.
- Hiroshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal detection device, measurement device, and mass spectrometer
- Patent number 12,066,582
- Issue date Aug 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Takuma Nishimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector
- Patent number 12,061,166
- Issue date Aug 13, 2024
- Micromass UK Limited
- David Gordon
- G01 - MEASURING TESTING
Information Patent Grant
Two dimensional MSMS
- Patent number 12,062,532
- Issue date Aug 13, 2024
- Micromass UK Limited
- Keith Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,031,943
- Issue date Jul 9, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source-detector synchronization in multiplexed secondary ion mass s...
- Patent number 12,020,920
- Issue date Jun 25, 2024
- IONpath, Inc.
- David Stumbo
- G01 - MEASURING TESTING
Information Patent Grant
Method of gain calibration
- Patent number 11,996,277
- Issue date May 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated sample processing system with multiple detection capability
- Patent number 11,988,670
- Issue date May 21, 2024
- Beckman Coulter, Inc.
- Aaron Hudson
- G01 - MEASURING TESTING
Information Patent Grant
Method of control of a spectrometer
- Patent number 11,982,656
- Issue date May 14, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Holger Jeglinski
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometry via frequency tagging
- Patent number 11,984,311
- Issue date May 14, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
An Improved Low-Power Mass Interrogation System and Assay For Deter...
- Publication number 20250191902
- Publication date Jun 12, 2025
- Leidos, Inc.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SIMULTANEOUS ANALYSIS OF MULTIPLE CHARGED PAR...
- Publication number 20250183023
- Publication date Jun 5, 2025
- THE TRUSTEES OF INDIANA UNIVERSITY
- Martin F. JARROLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND WAVE-DETECTION UNIT
- Publication number 20250174448
- Publication date May 29, 2025
- Shimadzu Corporation
- Shiro MIZUTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...
- Publication number 20250166985
- Publication date May 22, 2025
- IONpath, Inc.
- David Stumbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY DEVICE AND RF TUNING METHOD OF MASS SPECTROMETRY...
- Publication number 20250104987
- Publication date Mar 27, 2025
- HITACHI HIGH-TECH CORPORATION
- Hikaru Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATING A MASS SPECTROMETER
- Publication number 20250062108
- Publication date Feb 20, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Hans-Juergen SCHLUETER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Sample Processing System with Multiple Detection Capability
- Publication number 20250027950
- Publication date Jan 23, 2025
- Beckman Coulter, Inc.
- Aaron Hudson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Noise Reduction and Ion Rate Estimation Using an Analog...
- Publication number 20250014880
- Publication date Jan 9, 2025
- DH Technologies Development Pte. Ltd.
- Gordana IVOSEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTOR AND MASS SPECTROMETER
- Publication number 20250006480
- Publication date Jan 2, 2025
- HAMAMATSU PHOTONICS K. K.
- Junichi KONDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTORS
- Publication number 20240420938
- Publication date Dec 19, 2024
- Micromass UK Limited
- David Gordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL SYSTEM AND ANALYTICAL METHOD
- Publication number 20240412964
- Publication date Dec 12, 2024
- Shimadzu Corporation
- Zhi GENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC POSITIONING OF AN ELECTROSPRAY IONIZATION EMITTER
- Publication number 20240404815
- Publication date Dec 5, 2024
- Thermo Finnigan LLC
- Joshua A. Silveira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240404810
- Publication date Dec 5, 2024
- HGSG LTD
- John HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTOR AND ANALYZER
- Publication number 20240404814
- Publication date Dec 5, 2024
- HAMAMATSU PHOTONICS K. K.
- Junichi KONDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS AND DEVICE FOR DETECTING AN OPERATING STATE OF A PHOTOIONIZ...
- Publication number 20240395524
- Publication date Nov 28, 2024
- Drager Safety AG & Co. KGaA
- Andre PAPE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWO DIMENSIONAL MSMS
- Publication number 20240363321
- Publication date Oct 31, 2024
- Micromass UK Limited
- Keith Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Improved Low-Power Mass Interrogation System and Assay For Determin...
- Publication number 20240347330
- Publication date Oct 17, 2024
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SPECTROMETER
- Publication number 20240331993
- Publication date Oct 3, 2024
- SCIENTA OMICRON AB
- Patrik KARLSSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY VIA FREQUENCY TAGGING
- Publication number 20240304434
- Publication date Sep 12, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240290605
- Publication date Aug 29, 2024
- HGSG LTD
- John Brian HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIRTUAL SLIT CYCLOIDAL MASS SPECTROMETER
- Publication number 20240290604
- Publication date Aug 29, 2024
- DUKE UNIVERSITY
- M. Bonner Denton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector Having Improved Construction
- Publication number 20240266157
- Publication date Aug 8, 2024
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIGNAL DETECTION DEVICE, MEASUREMENT DEVICE, AND MASS SPECTROMETER
- Publication number 20240241273
- Publication date Jul 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Takuma NISHIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer and Mass Spectrometry Method
- Publication number 20240242954
- Publication date Jul 18, 2024
- Shimadzu Corporation
- Kazutaka MITSUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Precise Tuning of MCP-Based Ion Detector Using Isotope Ratios with...
- Publication number 20240242948
- Publication date Jul 18, 2024
- DH Technologies Development Pte. Ltd.
- Douglas Arnold Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR RESOLVING CHARGE-STATE AMBIGUITIES IN HIGH AND ULTRA-HI...
- Publication number 20240234115
- Publication date Jul 11, 2024
- Thermo Finnigan LLC
- Paul R. GAZIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated oscillating field ION spectrometry device and method of...
- Publication number 20240234116
- Publication date Jul 11, 2024
- Volatylix, Inc.
- Kenneth A. MARKOSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20240177980
- Publication date May 30, 2024
- Shimadzu Corporation
- Hidenori TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...
- Publication number 20240128071
- Publication date Apr 18, 2024
- Micromass UK Limited
- Zoltán TAKÁTS
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...

Detectors specially adapted to particle spectrometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Tissue analysis by mass spectrometry or ion mobility spectrometry

Mass spectrometer with charge measurement arrangement

Instrument, including an electrostatic linear ion trap, for analyzi...

High resolution imaging apparatus and method

Ion analyzer

Low-power mass interrogation system and assay for determining vitam...

Instrument for separating ions including an electrostatic linear io...

Particle mass spectrometry

Particle detector having improved performance and service life

Charged particle detector

Time-domain analysis of signals for charge detection mass spectrometry

Detector for detecting charged particles or light

Ionization device and mass spectrometer

Systems and methods for two-dimensional mobility based filtering of...

Ion trap array for high throughput charge detection mass spectrometry

Methods and systems for tuning a mass spectrometer

Virtual slit cycloidal mass spectrometer

Ion guide

Methods and systems for multi-pass encoded frequency pushing

Scintillator, measuring device, mass spectrometer, and electron mic...

Ion detector

Signal detection device, measurement device, and mass spectrometer

Ion detector

Two dimensional MSMS

Ion analyzer

Source-detector synchronization in multiplexed secondary ion mass s...

Method of gain calibration

Integrated sample processing system with multiple detection capability

Method of control of a spectrometer

Mass spectrometry via frequency tagging

Patents Applicationslast 30 patents

An Improved Low-Power Mass Interrogation System and Assay For Deter...

SYSTEM AND METHOD FOR SIMULTANEOUS ANALYSIS OF MULTIPLE CHARGED PAR...

MASS SPECTROMETER AND WAVE-DETECTION UNIT

SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...

MASS SPECTROMETRY DEVICE AND RF TUNING METHOD OF MASS SPECTROMETRY...

CALIBRATING A MASS SPECTROMETER

Integrated Sample Processing System with Multiple Detection Capability

Method for Noise Reduction and Ion Rate Estimation Using an Analog...

ION DETECTOR AND MASS SPECTROMETER

ION DETECTORS

ANALYTICAL SYSTEM AND ANALYTICAL METHOD

AUTOMATIC POSITIONING OF AN ELECTROSPRAY IONIZATION EMITTER

MASS SPECTROMETER AND METHOD

ION DETECTOR AND ANALYZER

PROCESS AND DEVICE FOR DETECTING AN OPERATING STATE OF A PHOTOIONIZ...

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

TWO DIMENSIONAL MSMS

Improved Low-Power Mass Interrogation System and Assay For Determin...

CHARGED PARTICLE SPECTROMETER

MASS SPECTROMETRY VIA FREQUENCY TAGGING

MASS SPECTROMETER AND METHOD

VIRTUAL SLIT CYCLOIDAL MASS SPECTROMETER

Detector Having Improved Construction

SIGNAL DETECTION DEVICE, MEASUREMENT DEVICE, AND MASS SPECTROMETER

Mass Spectrometer and Mass Spectrometry Method

Precise Tuning of MCP-Based Ion Detector Using Isotope Ratios with...

METHODS FOR RESOLVING CHARGE-STATE AMBIGUITIES IN HIGH AND ULTRA-HI...

Integrated oscillating field ION spectrometry device and method of...

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...