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G01J2004/001
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2004/001
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Patents Grants
last 30 patents
Information
Patent Grant
Light line triangulation apparatus
Patent number
11,567,203
Issue date
Jan 31, 2023
Sick AG
Romain Müller
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for detecting thermodynamic phase of clouds wit...
Patent number
11,499,911
Issue date
Nov 15, 2022
Montana State University
Joseph A. Shaw
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Micro-level polarization scanning and multispectral scanning within...
Patent number
11,474,365
Issue date
Oct 18, 2022
BAE Systems Information and Electronic Systems Integration Inc.
Michael J. Choiniere
G01 - MEASURING TESTING
Information
Patent Grant
Beam focusing and reflective optics
Patent number
10,989,601
Issue date
Apr 27, 2021
J. A. Woollam Co., Inc.
Martin M. Liphardt
G01 - MEASURING TESTING
Information
Patent Grant
Retardation profile for stress characterization of tubing
Patent number
10,871,400
Issue date
Dec 22, 2020
Corning Incorporated
William John Furnas
G01 - MEASURING TESTING
Information
Patent Grant
Method for imaging biological tissue using polarized Majorana photons
Patent number
10,733,729
Issue date
Aug 4, 2020
Robert R. Alfano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Thin-film broadband and wide-angle devices for generating and sampl...
Patent number
10,718,889
Issue date
Jul 21, 2020
The Arizona Board of Regents on behalf of the University of Arizona
Stanley Pau
G01 - MEASURING TESTING
Information
Patent Grant
System for measuring transport properties of materials and related...
Patent number
10,690,588
Issue date
Jun 23, 2020
Xiao-ping Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Polarization tracking device, optical receiving device, and polariz...
Patent number
10,547,380
Issue date
Jan 28, 2020
KDDI Corporation
Shota Ishimura
G02 - OPTICS
Information
Patent Grant
Mitigating meniscus effects in vertically oriented circular dichroi...
Patent number
10,436,644
Issue date
Oct 8, 2019
Baoliang Wang
G01 - MEASURING TESTING
Information
Patent Grant
Thin-film broadband and wide-angle devices for generating and sampl...
Patent number
10,254,453
Issue date
Apr 9, 2019
Arizona Board of Regents on behalf of the University of Arizona
Stanley Pau
G01 - MEASURING TESTING
Information
Patent Grant
Optical element rotation type Mueller-matrix ellipsometer and metho...
Patent number
10,145,785
Issue date
Dec 4, 2018
Korea Research Institute of Standards and Science
Yong Jai Cho
G01 - MEASURING TESTING
Information
Patent Grant
Circular polarizing filter and application thereof
Patent number
10,139,533
Issue date
Nov 27, 2018
FUJIFILM Corporation
Mitsuyoshi Ichihashi
G02 - OPTICS
Information
Patent Grant
Combined use of oscillating means and ellipsometry to determine unc...
Patent number
10,048,059
Issue date
Aug 14, 2018
J. A. Woollam Co., Inc.
Mathias M. Schubert
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Grant
Method of obtaining micrographs of transparent or semi-transparent...
Patent number
10,026,167
Issue date
Jul 17, 2018
Board of Regents of the University of Nebraska
Tino Hofmann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Surface inspecting method
Patent number
10,001,444
Issue date
Jun 19, 2018
Samsung Electronics Co., Ltd.
Kang-woong Ko
G01 - MEASURING TESTING
Information
Patent Grant
Cavity enhanced polarimeter and related methods
Patent number
9,903,805
Issue date
Feb 27, 2018
Theodore Peter Rakitzis
G01 - MEASURING TESTING
Information
Patent Grant
Long wave infrared imaging polarimeter, and method of assembly
Patent number
9,829,384
Issue date
Nov 28, 2017
Polaris Sensor Technologies, Inc.
J Larry Pezzaniti
G02 - OPTICS
Information
Patent Grant
Cavity enhanced polarimeter and related methods
Patent number
9,702,812
Issue date
Jul 11, 2017
Theodore Peter Rakitzis
G01 - MEASURING TESTING
Information
Patent Grant
Optical device, particularly a polarimeter, for detecting inhomogen...
Patent number
9,448,161
Issue date
Sep 20, 2016
Anton Paar GmbH
Martin Ostermeyer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
POLARIZATION IMAGING DEVICE AND METHOD FOR POLARIZATION IMAGING
Publication number
20230026636
Publication date
Jan 26, 2023
SONY GROUP CORPORATION
Yalcin INCESU
G02 - OPTICS
Information
Patent Application
Modified Rectangular Wave Polarization Control (MRWPC) System
Publication number
20220397459
Publication date
Dec 15, 2022
Omidreza Moghbeli
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND ELECTRONIC DEVICE FOR DETECTING WEARING USING POLARIZATION
Publication number
20220364924
Publication date
Nov 17, 2022
Samsung Electronics Co., Ltd.
Jeahyuck LEE
G01 - MEASURING TESTING
Information
Patent Application
POLARIMETER AND METHOD OF DETERMINING A STATE OF POLARIZATION OF AN...
Publication number
20220228914
Publication date
Jul 21, 2022
Universite Laval
Zhongjin LIN
G01 - MEASURING TESTING
Information
Patent Application
POLARIMETRIC IMAGING CAMERA
Publication number
20210333150
Publication date
Oct 28, 2021
Facebook Technologies, LLC
Scott Charles McEldowney
G01 - MEASURING TESTING
Information
Patent Application
LIGHT LINE TRIANGULATION APPARATUS
Publication number
20200292705
Publication date
Sep 17, 2020
SICK AG
Romain MÜLLER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR IMAGING BIOLOGICAL TISSUE USING POLARIZED MAJORANA PHOTONS
Publication number
20200090329
Publication date
Mar 19, 2020
Research Foundation of the City University of New York
Robert R. Alfano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Retardation Profile for Stress Characterization of Tubing
Publication number
20200064197
Publication date
Feb 27, 2020
Corning Incorporated
William John Furnas
G01 - MEASURING TESTING
Information
Patent Application
GENE SEQUENCING CHIP, DEVICE AND METHOD
Publication number
20190256902
Publication date
Aug 22, 2019
BOE TECHNOLOGY GROUP CO., LTD.
Peizhi CAI
G01 - MEASURING TESTING
Information
Patent Application
System for measuring transport properties of materials and related...
Publication number
20190025196
Publication date
Jan 24, 2019
Ningbo Molian Materials Technology Inc.
Xiao-ping WANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MITIGATING MENISCUS EFFECTS IN VERTICALLY ORIENTED CIRCULAR DICHROI...
Publication number
20180283948
Publication date
Oct 4, 2018
HINDS INSTRUMENTS, INC
Baoliang Wang
G01 - MEASURING TESTING
Information
Patent Application
LIVENESS AUTHENTICATION METHOD AND APPARATUS
Publication number
20160320238
Publication date
Nov 3, 2016
BEIJING KUANGSHI TECHNOLOGY CO., LTD.
Shuchang ZHOU
G01 - MEASURING TESTING
Information
Patent Application
THIN-FILM BROADBAND AND WIDE-ANGLE DEVICES FOR GENERATING AND SAMPL...
Publication number
20160170110
Publication date
Jun 16, 2016
THE ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIVERSITY OF ARIZONA
Stanley Pau
G02 - OPTICS
Information
Patent Application
CIRCULAR POLARIZING FILTER AND APPLICATION THEREOF
Publication number
20160154156
Publication date
Jun 2, 2016
FUJIFILM CORPORATION
Mitsuyoshi ICHIHASHI
G02 - OPTICS
Information
Patent Application
FOCUSED BEAM SCATTEROMETRY APPARATUS AND METHOD
Publication number
20160061723
Publication date
Mar 3, 2016
University of Rochester
Miguel A. Alonso
G01 - MEASURING TESTING
Information
Patent Application
LONG WAVE INFRARED IMAGING POLARIMETER, AND METHOD OF ASSEMBLY
Publication number
20160003677
Publication date
Jan 7, 2016
POLARIS SENSOR TECHNOLOGIES, INC.
J. Larry Pezzaniti
G01 - MEASURING TESTING
Information
Patent Application
Method Using Laser Ellipsometry for Determining the Quality of Liqu...
Publication number
20150185135
Publication date
Jul 2, 2015
Paul A. Martino
G01 - MEASURING TESTING
Information
Patent Application
SUB-WAVELENGTH STRUCTURES, DEVICES AND METHODS FOR LIGHT CONTROL IN...
Publication number
20140332077
Publication date
Nov 13, 2014
Research Foundation of the City University of New York
David Thomas Crouse
B82 - NANO-TECHNOLOGY
Information
Patent Application
Optical Device, Particularly a Polarimeter, for Detecting Inhomogen...
Publication number
20130258336
Publication date
Oct 3, 2013
ANTON PAAR GMBH
Martin Ostermeyer
G01 - MEASURING TESTING
Information
Patent Application
SUB-WAVELENGTH STRUCTURES, DEVICES AND METHODS FOR LIGHT CONTROL IN...
Publication number
20110019189
Publication date
Jan 27, 2011
Research Foundation of the City University of New York
David Thomas Crouse
G02 - OPTICS