Differential detectors

Industry

CPC
G02B21/247

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G02Optics G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS G02B21/00Microscopes

Current Industry

G02B21/247Differential detectors

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Systems, devices and methods for automatic microscope focus
- Patent number 11,796,785
- Issue date Oct 24, 2023
- Nanotronics Imaging, Inc.
- John B. Putman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems, devices and methods for automatic microscope focus
- Patent number 11,520,133
- Issue date Dec 6, 2022
- Nanotronics Imaging, Inc.
- John B. Putman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Digital microscope apparatus, method of searching for in-focus posi...
- Patent number 11,156,823
- Issue date Oct 26, 2021
- Sony Corporation
- Takashi Yamamoto
- G02 - OPTICS
Information Patent Grant
Systems, devices and methods for automatic microscope focus
- Patent number 10,670,850
- Issue date Jun 2, 2020
- Nanotronics Imaging, Inc.
- John B. Putman
- G01 - MEASURING TESTING
Information Patent Grant
Autofocus method and autofocus device
- Patent number 10,495,867
- Issue date Dec 3, 2019
- Sakura Finetek U.S.A., Inc.
- Paul Hing
- G02 - OPTICS
Information Patent Grant
Method for refocusing an optical assembly
- Patent number 10,393,582
- Issue date Aug 27, 2019
- Centre National de la Recherche Scientifique
- Arnaud Devos
- G01 - MEASURING TESTING
Information Patent Grant
Digital microscope apparatus, method of searching for in-focus posi...
- Patent number 10,371,931
- Issue date Aug 6, 2019
- Sony Corporation
- Takashi Yamamoto
- G02 - OPTICS
Information Patent Grant
Focus monitoring arrangement and inspection apparatus including suc...
- Patent number 10,215,954
- Issue date Feb 26, 2019
- ASML Netherlands B.V.
- Gerbrand Van Der Zouw
- G01 - MEASURING TESTING
Information Patent Grant
Optical microscope and method for detecting lens immersion
- Patent number 9,977,231
- Issue date May 22, 2018
- General Electric Company
- William Michael Dougherty
- G02 - OPTICS
Information Patent Grant
Autofocus mechanism
- Patent number 9,638,911
- Issue date May 2, 2017
- Mitutoyo Corporation
- Shohei Udo
- G02 - OPTICS
Information Patent Grant
Microscope and ghosting elimination method
- Patent number 9,465,211
- Issue date Oct 11, 2016
- Sony Corporation
- Norihiro Tanabe
- G02 - OPTICS
Information Patent Grant
Focusing device including a differential interference prism
- Patent number 9,366,567
- Issue date Jun 14, 2016
- Olympus Corporation
- Yosuke Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Digital microscope apparatus, method of searching for in-focus posi...
- Patent number 9,341,836
- Issue date May 17, 2016
- Sony Corporation
- Takashi Yamamoto
- G02 - OPTICS
Information Patent Grant
Autofocus mechanism with a first and second amplification rate
- Patent number 9,341,812
- Issue date May 17, 2016
- Mitutoyo Corporation
- Shohei Udo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Autofocus method and autofocus device
- Patent number 9,310,598
- Issue date Apr 12, 2016
- Sakura Finetek U.S.A., Inc.
- Paul Hing
- G02 - OPTICS
Information Patent Grant
Focus control apparatus and method
- Patent number 9,256,061
- Issue date Feb 9, 2016
- Samsung Electronics Co., Ltd.
- Mitsuhiro Togashi
- G02 - OPTICS
Information Patent Grant
Imaging method and microscope device
- Patent number 8,908,026
- Issue date Dec 9, 2014
- Olympus Corporation
- Shuzo Hiraide
- G02 - OPTICS
Information Patent Grant
Focusing methods and optical systems and assemblies using the same
- Patent number 8,446,573
- Issue date May 21, 2013
- Illumina, Inc.
- Dale Buermann
- G02 - OPTICS
Information Patent Grant
Focusing methods and optical systems and assemblies using the same
- Patent number 8,422,031
- Issue date Apr 16, 2013
- Illumina, Inc.
- Dale Buermann
- G02 - OPTICS
Information Patent Grant
Automatic focus control unit, electronic device and automatic focus...
- Patent number 8,071,929
- Issue date Dec 6, 2011
- Sony Corporation
- Hideki Sato
- G02 - OPTICS
Information Patent Grant
Microscope automatic focusing device and method thereof
- Patent number 7,851,735
- Issue date Dec 14, 2010
- Technology Research Center National Applied Research Laboratories
- Wei-Yao Hsu
- G02 - OPTICS
Information Patent Grant
Focusing system and method
- Patent number 7,804,641
- Issue date Sep 28, 2010
- Nanometrics Incorporated
- Michael J. Hammond
- G02 - OPTICS
Information Patent Grant
Autofocus mechanism for spectroscopic system
- Patent number 7,663,748
- Issue date Feb 16, 2010
- Koninklijke Philips Electronics N.V.
- Michael Cornelis Van Beek
- G01 - MEASURING TESTING
Information Patent Grant
Focal point detection apparatus
- Patent number 7,580,121
- Issue date Aug 25, 2009
- Nikon Corporation
- Tatsuo Fukui
- G02 - OPTICS
Information Patent Grant
Autofocus module and method for a microscope-based system
- Patent number 6,879,440
- Issue date Apr 12, 2005
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G02 - OPTICS
Information Patent Grant
Autofocus module for microscope-based systems
- Patent number 6,875,972
- Issue date Apr 5, 2005
- Leica Microsystems Wetzlar GmbH
- Albert Kreh
- G02 - OPTICS
Information Patent Grant
Autofocus module for microscope-based systems
- Patent number 6,812,446
- Issue date Nov 2, 2004
- Leica Microsystems Semiconductor GmbH
- Albert Kreh
- G02 - OPTICS
Information Patent Grant
Embedded interferometer for reference-mirror calibration of interfe...
- Patent number 6,545,761
- Issue date Apr 8, 2003
- Veeco Instruments, Inc.
- David J. Aziz
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting an in-focus position of a substrate surface...
- Patent number 5,483,079
- Issue date Jan 9, 1996
- Nikon Corporation
- Yasuo Yonezawa
- G02 - OPTICS
Information Patent Grant
Focusing degree-detecting device with a reduction optical system
- Patent number 4,769,530
- Issue date Sep 6, 1988
- Olympus Optical Co., Ltd.
- Noriyuki Miyahara
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS, DEVICES AND METHODS FOR AUTOMATIC MICROSCOPE FOCUS
- Publication number 20230113528
- Publication date Apr 13, 2023
- Nanotronics Imaging, Inc.
- John B. Putman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS, DEVICES AND METHODS FOR AUTOMATIC MICROSCOPE FOCUS
- Publication number 20210011271
- Publication date Jan 14, 2021
- Nanotronics Imaging, Inc.
- John B. Putman
- G02 - OPTICS
Information Patent Application
DIGITAL MICROSCOPE APPARATUS, METHOD OF SEARCHING FOR IN-FOCUS POSI...
- Publication number 20190293918
- Publication date Sep 26, 2019
- SONY CORPORATION
- Takashi Yamamoto
- G02 - OPTICS
Information Patent Application
METHOD FOR REFOCUSING AN OPTICAL ASSEMBLY
- Publication number 20170350757
- Publication date Dec 7, 2017
- Centre National de la Recherche Scientifique
- Arnaud DEVOS
- G02 - OPTICS
Information Patent Application
OPTICAL MICROSCOPE AND METHOD FOR DETECTING LENS IMMERSION
- Publication number 20170153437
- Publication date Jun 1, 2017
- GENERAL ELECTRIC COMPANY
- William Michael Dougherty
- G02 - OPTICS
Information Patent Application
MICROSCOPE AND GHOSTING ELIMINATION METHOD
- Publication number 20150286052
- Publication date Oct 8, 2015
- SONY CORPORATION
- Norihiro Tanabe
- G02 - OPTICS
Information Patent Application
FOCUSING DEVICE
- Publication number 20140368833
- Publication date Dec 18, 2014
- OLYMPUS CORPORATION
- Yosuke TAMURA
- G02 - OPTICS
Information Patent Application
DIGITAL MICROSCOPE APPARATUS, METHOD OF SEARCHING FOR IN-FOCUS POSI...
- Publication number 20140267673
- Publication date Sep 18, 2014
- SONY CORPORATION
- Takashi Yamamoto
- G02 - OPTICS
Information Patent Application
FOCUS CONTROL APPARATUS AND METHOD
- Publication number 20140160558
- Publication date Jun 12, 2014
- Samsung Electronics Co., Ltd.
- Mitsuhiro Togashi
- G02 - OPTICS
Information Patent Application
AUTO FOCUS CONTROL APPARATUS, SEMICONDUCTOR INSPECTING APPARATUS AN...
- Publication number 20140152796
- Publication date Jun 5, 2014
- Samsung Electronics Co., Ltd.
- Togashi Mitsuhiro
- G02 - OPTICS
Information Patent Application
IMAGING METHOD AND MICROSCOPE DEVICE
- Publication number 20120075455
- Publication date Mar 29, 2012
- OLYMPUS CORPORATION
- Shuzo Hiraide
- G02 - OPTICS
Information Patent Application
MICROSCOPE AND GHOSTING ELIMINATION METHOD
- Publication number 20120038978
- Publication date Feb 16, 2012
- SONY CORPORATION
- Norihiro Tanabe
- G02 - OPTICS
Information Patent Application
AUTOFOCUS METHOD AND AUTOFOCUS DEVICE
- Publication number 20120038979
- Publication date Feb 16, 2012
- Paul Hing
- G02 - OPTICS
Information Patent Application
FOCUSING METHODS AND OPTICAL SYSTEMS AND ASSEMBLIES USING THE SAME
- Publication number 20110188053
- Publication date Aug 4, 2011
- Illumina, Inc.
- DALE BUERMANN
- G02 - OPTICS
Information Patent Application
AUTOMATIC FOCUS CONTROL UNIT, ELECTRONIC DEVICE AND AUTOMATIC FOCUS...
- Publication number 20090256058
- Publication date Oct 15, 2009
- SONY CORPORATION
- Hideki Sato
- G02 - OPTICS
Information Patent Application
AUTOMATIC FOCUS DEVICE AND METHOD THEREOF
- Publication number 20080135724
- Publication date Jun 12, 2008
- TECHNOLOGY RESEARCH CENTER NATIONAL APPLIED RESEARCH LABORATORIES
- Wei-Yao Hsu
- G02 - OPTICS
Information Patent Application
Focal Point Detection Device
- Publication number 20070258084
- Publication date Nov 8, 2007
- Tatsuo Fukui
- G02 - OPTICS
Information Patent Application
Autofocus Mechanism for Spectroscopic System
- Publication number 20070252984
- Publication date Nov 1, 2007
- Koninklijke Philips Electronics N.V.
- Michael Cornelis Van Beek
- G02 - OPTICS
Information Patent Application
Observation apparatus with focal position control mechanism
- Publication number 20070164194
- Publication date Jul 19, 2007
- OLYMPUS CORPORATION
- Shunsuke Kurata
- G02 - OPTICS
Information Patent Application
Focusing system and method
- Publication number 20070081153
- Publication date Apr 12, 2007
- AOTI OPERATING COMPANY, INC.
- Michael John Hammond
- G02 - OPTICS
Information Patent Application
Autofocus module for microscope-based systems
- Publication number 20040135061
- Publication date Jul 15, 2004
- Albert Kreh
- G02 - OPTICS
Information Patent Application
Autofocus module for microscope-based systems
- Publication number 20040124334
- Publication date Jul 1, 2004
- Albert Kreh
- G02 - OPTICS
Information Patent Application
Microscopy system
- Publication number 20040090667
- Publication date May 13, 2004
- Carl-Zeiss-Stiftung trading as Carl Zeiss
- Hartmut Gartner
- G02 - OPTICS
Information Patent Application
Autofocus module and method for a microscope-based system
- Publication number 20030147134
- Publication date Aug 7, 2003
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G02 - OPTICS

Differential detectors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems, devices and methods for automatic microscope focus

Systems, devices and methods for automatic microscope focus

Digital microscope apparatus, method of searching for in-focus posi...

Systems, devices and methods for automatic microscope focus

Autofocus method and autofocus device

Method for refocusing an optical assembly

Digital microscope apparatus, method of searching for in-focus posi...

Focus monitoring arrangement and inspection apparatus including suc...

Optical microscope and method for detecting lens immersion

Autofocus mechanism

Microscope and ghosting elimination method

Focusing device including a differential interference prism

Digital microscope apparatus, method of searching for in-focus posi...

Autofocus mechanism with a first and second amplification rate

Autofocus method and autofocus device

Focus control apparatus and method

Imaging method and microscope device

Focusing methods and optical systems and assemblies using the same

Focusing methods and optical systems and assemblies using the same

Automatic focus control unit, electronic device and automatic focus...

Microscope automatic focusing device and method thereof

Focusing system and method

Autofocus mechanism for spectroscopic system

Focal point detection apparatus

Autofocus module and method for a microscope-based system

Autofocus module for microscope-based systems

Autofocus module for microscope-based systems

Embedded interferometer for reference-mirror calibration of interfe...

Apparatus for detecting an in-focus position of a substrate surface...

Focusing degree-detecting device with a reduction optical system

Patents Applicationslast 30 patents

SYSTEMS, DEVICES AND METHODS FOR AUTOMATIC MICROSCOPE FOCUS

SYSTEMS, DEVICES AND METHODS FOR AUTOMATIC MICROSCOPE FOCUS

DIGITAL MICROSCOPE APPARATUS, METHOD OF SEARCHING FOR IN-FOCUS POSI...

METHOD FOR REFOCUSING AN OPTICAL ASSEMBLY

OPTICAL MICROSCOPE AND METHOD FOR DETECTING LENS IMMERSION

MICROSCOPE AND GHOSTING ELIMINATION METHOD

FOCUSING DEVICE

DIGITAL MICROSCOPE APPARATUS, METHOD OF SEARCHING FOR IN-FOCUS POSI...

FOCUS CONTROL APPARATUS AND METHOD

AUTO FOCUS CONTROL APPARATUS, SEMICONDUCTOR INSPECTING APPARATUS AN...

IMAGING METHOD AND MICROSCOPE DEVICE

MICROSCOPE AND GHOSTING ELIMINATION METHOD

AUTOFOCUS METHOD AND AUTOFOCUS DEVICE

FOCUSING METHODS AND OPTICAL SYSTEMS AND ASSEMBLIES USING THE SAME

AUTOMATIC FOCUS CONTROL UNIT, ELECTRONIC DEVICE AND AUTOMATIC FOCUS...

AUTOMATIC FOCUS DEVICE AND METHOD THEREOF

Focal Point Detection Device

Autofocus Mechanism for Spectroscopic System

Observation apparatus with focal position control mechanism

Focusing system and method

Autofocus module for microscope-based systems

Autofocus module for microscope-based systems

Microscopy system

Autofocus module and method for a microscope-based system